| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/12/2007 | CN100337385C Test by using independently controllable voltage islands |
| 09/12/2007 | CN100337147C Display panel inspection apparatus and inspection method |
| 09/12/2007 | CN100337119C Detecting method for integrated circuit |
| 09/12/2007 | CN100337118C Clamp tool for testing electrode free illumination appliances |
| 09/12/2007 | CN100336681C Power supply for vehicle |
| 09/11/2007 | US7269780 Power management for circuits with inactive state data save and restore scan chain |
| 09/11/2007 | US7269772 Method and apparatus for built-in self-test (BIST) of integrated circuit device |
| 09/11/2007 | US7269771 Semiconductor device adapted for forming multiple scan chains |
| 09/11/2007 | US7269770 AC coupled line testing using boundary scan test methodology |
| 09/11/2007 | US7269769 AC propagation testing preventing sampling test data at Capture-DR state |
| 09/11/2007 | US7269767 Magnetic disk apparatus, preventive maintenance detection method and program therefor |
| 09/11/2007 | US7269766 Method and apparatus for memory self testing |
| 09/11/2007 | US7269465 Control system for controlling safety-critical processes |
| 09/11/2007 | US7269243 Method and apparatus for controlling electron beam motion based on calibration information |
| 09/11/2007 | US7269152 Method and apparatus for transmitting information within a communication system |
| 09/11/2007 | US7269140 Suspend packet transmitter |
| 09/11/2007 | US7269138 Distributed MAC protocol facilitating collaborative ranging in communications networks |
| 09/11/2007 | US7269132 Method and apparatus for achieving transparent redundancy at a hierarchical boundary |
| 09/11/2007 | US7269129 Transmitting apparatus |
| 09/11/2007 | US7269128 System and method for proactive scheduling of system maintenance |
| 09/11/2007 | US7268941 Module inspection fixture |
| 09/11/2007 | US7268867 Apparatus and method for inspecting a semiconductor component |
| 09/11/2007 | US7268754 AM-OEL display, electronic system comprising the AM-OEL display and a testing method thereof |
| 09/11/2007 | US7268575 Method of NBTI prediction |
| 09/11/2007 | US7268574 Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces |
| 09/11/2007 | US7268573 Apparatus for generating test stimulus signal having current regardless of internal impedance changes of device under test |
| 09/11/2007 | US7268571 Method for validating and monitoring automatic test equipment contactor |
| 09/11/2007 | US7268570 Apparatus and method for customized burn-in of cores on a multicore microprocessor integrated circuit chip |
| 09/11/2007 | US7268569 Leakage current management |
| 09/11/2007 | US7268568 Probe card |
| 09/11/2007 | US7268567 Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
| 09/11/2007 | US7268562 Low cost detectible pipe and electric fencing manufactured from conductive loaded resin-based materials |
| 09/11/2007 | US7268561 USB attach detection for USB 1.1 and USB OTG devices |
| 09/11/2007 | US7268560 Wideband device modeling method |
| 09/11/2007 | US7268559 Intelligent life testing methods and apparatus for leakage current protection |
| 09/11/2007 | US7268558 Circuit breaker tester including a pulse width modulation circuit |
| 09/11/2007 | US7268535 Hi-pot testing device with transfer table automatically connecting to testing signal generator |
| 09/11/2007 | US7268534 Sorting handler for burn-in tester |
| 09/11/2007 | US7268533 Optical testing device |
| 09/11/2007 | US7268532 Apparatus and method for calculating offset value for an electric sensor |
| 09/11/2007 | US7268322 Semiconductor heating apparatus |
| 09/11/2007 | US7268003 Method of evaluating semiconductor device |
| 09/11/2007 | US7266879 Method for magnetically establishing an electrical connection with a contact of a semiconductor device component |
| 09/10/2007 | CA2581911A1 Apparatus and method for remote battery tester/charger control |
| 09/07/2007 | WO2007100319A1 Non contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctions |
| 09/07/2007 | WO2007100189A1 System and method for determining both an estimated battery state vector and an estimated battery parameter vector |
| 09/07/2007 | WO2007100059A1 Conductive contact unit |
| 09/07/2007 | WO2007100054A1 Semiconductor integrated circuit |
| 09/07/2007 | WO2007099971A1 Measuring device, test device, electronic device, program, and recording medium |
| 09/07/2007 | WO2007099970A1 Measuring device, test device, electronic device, measuring method, program, and recording medium |
| 09/07/2007 | WO2007099918A1 Measuring device, test device, and electronic device |
| 09/07/2007 | WO2007099917A1 Measuring device, measuring method, test device, test method, and electronic device |
| 09/07/2007 | WO2007099898A1 Battery pack, electronic device and method for detecting remaining quantity in battery |
| 09/07/2007 | WO2007099878A1 Measuring device, measuring method, test device, test method, and electronic device |
| 09/07/2007 | WO2007099666A1 Semiconductor integrated circuit, inspection program verification method, and method for verifying remedy result by redundant memory cell |
| 09/07/2007 | WO2007099123A1 Method for analysing the electrolyte system of a battery and associated device |
| 09/07/2007 | WO2007099122A1 Method and system for determining the electrolyte filling level of a lead battery |
| 09/07/2007 | WO2007098807A1 Calibrating signals by time adjustment |
| 09/07/2007 | WO2007059025A3 Method and system for testing backplanes utilizing a boundary scan protocol |
| 09/07/2007 | WO2006072598A8 Method and device for testing semiconductor wafers using a chuck device whose temperature can be regulated |
| 09/06/2007 | US20070208985 Multi-stream interface for parallel test processing |
| 09/06/2007 | US20070208984 Methods and apparatus using a service to launch and/or monitor data formatting processes |
| 09/06/2007 | US20070208983 Self learning signatures |
| 09/06/2007 | US20070208982 Semiconductor device |
| 09/06/2007 | US20070208981 Systems, devices, and methods for arc fault detection |
| 09/06/2007 | US20070208980 Method of transmitting data between different clock domains |
| 09/06/2007 | US20070208979 Split clock scan flip-flop |
| 09/06/2007 | US20070208978 DVI link with circuit and method for test |
| 09/06/2007 | US20070208977 Methods and apparatus for error injection |
| 09/06/2007 | US20070208976 Low overhead input and output boundary scan cells |
| 09/06/2007 | US20070208975 Parallel architecture for low power linear feedback shift registers |
| 09/06/2007 | US20070208974 Electronic circuit |
| 09/06/2007 | US20070208973 PCI-E debug card |
| 09/06/2007 | US20070208972 Method and machine-readable media for inferring relationships between test results |
| 09/06/2007 | US20070208971 Test circuit and method for hierarchical core |
| 09/06/2007 | US20070208970 Test architecture and method |
| 09/06/2007 | US20070208969 Testing apparatus and testing method |
| 09/06/2007 | US20070208966 Test circuit for semiconductor device |
| 09/06/2007 | US20070208526 Probeless DC testing of CMOS I/O circuits |
| 09/06/2007 | US20070208520 Systems, devices, and methods for arc fault management |
| 09/06/2007 | US20070207559 Fabrication method of semiconductor integrated circuit device |
| 09/06/2007 | US20070206967 Image sensor test system |
| 09/06/2007 | US20070206846 Time resolved non-invasive diagnostics system |
| 09/06/2007 | US20070206493 Flexible Open Ring Optical Network and Method |
| 09/06/2007 | US20070205798 Three phase motor diagnostics and phase voltage feedback utilizing a single A/D input |
| 09/06/2007 | US20070205797 Functional and stress testing of lga devices |
| 09/06/2007 | US20070205796 Functional and stress testing of lga devices |
| 09/06/2007 | US20070205795 Bi-convex solid immersion lens |
| 09/06/2007 | US20070205794 Semiconductor device |
| 09/06/2007 | US20070205793 Method and apparatus for silent current detection |
| 09/06/2007 | US20070205792 Semiconductor packages, methods of forming semiconductor packages, and methods of cooling semiconductor dies |
| 09/06/2007 | US20070205791 Method and apparatus for strain monitoring of printed circuit board assemblies |
| 09/06/2007 | US20070205790 Semiconductor Device Testing Apparatus And Device Interface Board |
| 09/06/2007 | US20070205789 Device for final inspection |
| 09/06/2007 | US20070205788 Wafer holder, and wafer prober provided therewith |
| 09/06/2007 | US20070205787 Wafer holder, and heater unit and wafer prober provided therewith |
| 09/06/2007 | US20070205786 Functional and stress testing of lga devices |
| 09/06/2007 | US20070205785 Robot for ultrasonic examination |
| 09/06/2007 | US20070205784 Switched suspended conductor and connection |
| 09/06/2007 | US20070205783 Sheet-Like Probe, Method Of Producing The Probe, And Application Of The Probe |