| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/19/2007 | CN200950157Y Capacitance discharging test device |
| 09/19/2007 | CN200950152Y Low voltage multi-loop electricity-stolen detector |
| 09/19/2007 | CN200950150Y Auxiliary device for detection |
| 09/19/2007 | CN200950148Y Test device for peripheral apparatus extended port of printed circuit boards |
| 09/19/2007 | CN200950147Y Power supply slot testing device for printed circuit boards |
| 09/19/2007 | CN101040471A Ethernet extension for the data center |
| 09/19/2007 | CN101040191A Vehicle battery arrangement comprising electronic components |
| 09/19/2007 | CN101039106A Analytical method for electromagnetic bearing switch power amplifier |
| 09/19/2007 | CN101039037A 充电管理芯片 Charge Management IC |
| 09/19/2007 | CN101039032A Device for parallel connection of a plurality of electrical feeder units |
| 09/19/2007 | CN101039021A Novel fault protection process for intelligent circuit breakers |
| 09/19/2007 | CN101038714A 显示装置 Display device |
| 09/19/2007 | CN101038713A Pattern generation system process and storage medium for display apparatus test |
| 09/19/2007 | CN101038588A Data tree structure for automatic retention of context information |
| 09/19/2007 | CN101038328A Systems and methods for battery status indication |
| 09/19/2007 | CN101038327A Method for recognizing dynamic parameter of electrical system non-invasive induction motor dynamic parameter |
| 09/19/2007 | CN101038326A Test system, added apparatus, and test method |
| 09/19/2007 | CN101038325A Method and device for testing chip |
| 09/19/2007 | CN101038324A Testing method capable of configuring FPGA interconnection resource with four times |
| 09/19/2007 | CN101038323A Testing method capable of configuring FPGA configurable logic block with five times |
| 09/19/2007 | CN101038322A Testing device and testing method |
| 09/19/2007 | CN101038321A Probe block and probe assembly having the block |
| 09/19/2007 | CN101038320A Method for generating testing vector |
| 09/19/2007 | CN101038319A Method of inspecting quiescent power supply current in semiconductor integrated circuit and device for executing the method |
| 09/19/2007 | CN101038318A Method of testing for power and ground continuity of a semiconductor device |
| 09/19/2007 | CN101038317A Voltage transformer wireless monitoring system and method |
| 09/19/2007 | CN101038316A Circuit protection order component phase selectiing method using both end information |
| 09/19/2007 | CN101038315A Scanning tester and method for plane display device |
| 09/19/2007 | CN101038306A Device for online monitoring and overcurrent limiting power transformer iron core grounding current |
| 09/19/2007 | CN101038302A Probe card, method of designing the probe card, and method of testing semiconductor chips using the probe card |
| 09/19/2007 | CN101038300A Detecting circuit arrangement and manufacturing method of liquid crystal display panel |
| 09/19/2007 | CN101038233A Method for detecting display panel |
| 09/19/2007 | CN101038216A Multi-layered thermal sensor for integrated circuits and other layered structures |
| 09/19/2007 | CN100338987C Base board operation result checking device and method and electric circuit producing system and method |
| 09/19/2007 | CN100338975C Coating technique on surface of testing covering plate and is manufacturing method |
| 09/19/2007 | CN100338792C Method of fast inserting type test wire connection for fuel cell set |
| 09/19/2007 | CN100338753C Device and method for nondestructive inspection on semiconductor device |
| 09/19/2007 | CN100338505C Apparatus for automatically displaying the grade of liquid crystal display device and operating method thereof |
| 09/19/2007 | CN100338472C Zero sequence direction measurement method with zero sequence voltage compensation |
| 09/19/2007 | CN100338471C Method and apparatus for controlling magnetically actuated power switching device |
| 09/19/2007 | CN100337591C Method and equipment for controlling electron beam motion based on correcting information |
| 09/18/2007 | US7272767 Methods and apparatus for incorporating IDDQ testing into logic BIST |
| 09/18/2007 | US7272765 Test apparatus and test method for testing plurality of devices in parallel |
| 09/18/2007 | US7272764 Method, system, and program product for boundary I/O testing employing a logic built-in self-test of an integrated circuit |
| 09/18/2007 | US7272763 Built-in self test circuitry for process monitor circuit for rapidchip and ASIC devices |
| 09/18/2007 | US7272762 Method and apparatus for testing an ultrasound system |
| 09/18/2007 | US7272761 Method, system, and program product for controlling test data of a logic built-in self-test of an integrated circuit |
| 09/18/2007 | US7272760 Curve tracing device and method |
| 09/18/2007 | US7272759 Method and apparatus for system monitoring with reduced function cores |
| 09/18/2007 | US7272756 Exploitive test pattern apparatus and method |
| 09/18/2007 | US7272534 Circuit for producing a variable frequency clock signal having a high frequency low jitter pulse component |
| 09/18/2007 | US7272528 Reloadable word recognizer for logic analyzer |
| 09/18/2007 | US7272519 Systems and methods for monitoring and storing performance and maintenance data related to an electrical component |
| 09/18/2007 | US7272515 Digital signal processor implementation of high impedance fault algorithms |
| 09/18/2007 | US7272115 Method and apparatus for enforcing service level agreements |
| 09/18/2007 | US7272057 Memory apparatus |
| 09/18/2007 | US7271714 Push button control device |
| 09/18/2007 | US7271612 Method for measuring thin film transistor array of active matrix display panel |
| 09/18/2007 | US7271611 Method for testing semiconductor components using bonded electrical connections |
| 09/18/2007 | US7271610 Using a parametric measurement unit to sense a voltage at a device under test |
| 09/18/2007 | US7271609 Method of automatically creating a semiconductor processing prober device file |
| 09/18/2007 | US7271608 Prognostic cell for predicting failure of integrated circuits |
| 09/18/2007 | US7271607 Electrical, high temperature test probe with conductive driven guard |
| 09/18/2007 | US7271606 Spring-based probe pin that allows kelvin testing |
| 09/18/2007 | US7271605 Burn-in apparatus |
| 09/18/2007 | US7271604 Method and apparatus for testing semiconductor wafers by means of a temperature-regulated chuck device |
| 09/18/2007 | US7271603 Shielded probe for testing a device under test |
| 09/18/2007 | US7271602 Probe card assembly and method of attaching probes to the probe card assembly |
| 09/18/2007 | US7271600 Semiconductor switch circuit |
| 09/18/2007 | US7271598 Conductor coil defect identifier |
| 09/18/2007 | US7271597 Electronic device, transmission system, and method for determining connection condition |
| 09/18/2007 | US7271596 Method and system for testing a signal path having an operational signal |
| 09/18/2007 | US7271595 Sensor detection apparatus and sensor |
| 09/18/2007 | US7271581 Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device |
| 09/18/2007 | US7271580 Apparatus and method for programmable trip settings in a faulted circuit indicator |
| 09/18/2007 | US7271577 Testing loop impedance in an RCCB electrical test circuit |
| 09/18/2007 | US7271574 Evanescent microwave probe with enhanced resolution and sensitivity |
| 09/18/2007 | US7271559 Method and switching apparatus for recording the current in an electrical device |
| 09/18/2007 | US7271385 Inspection method and inspection apparatus using electron beam |
| 09/18/2007 | US7271016 Methods and apparatus for a flexible circuit interposer |
| 09/18/2007 | US7271015 Manufacturing method of semiconductor integrated circuit device and probe card |
| 09/18/2007 | US7271014 Fabrication method of semiconductor integrated circuit device including inspecting using probe card |
| 09/18/2007 | US7271012 Failure analysis methods and systems |
| 09/15/2007 | CA2540238A1 Method and system for locating a structure of interest in an integrated circuit |
| 09/13/2007 | WO2007104004A2 Method and apparatus for dissipating heat from an integrated circuit |
| 09/13/2007 | WO2007103748A1 Dual-path, multimode sequential storage element |
| 09/13/2007 | WO2007103591A2 Method and apparatus for testing a data processing system |
| 09/13/2007 | WO2007103551A2 Apparatus and method for testing semiconductor devices |
| 09/13/2007 | WO2007102998A2 Stacked guard structures |
| 09/13/2007 | WO2007102856A1 V/i source and test system incorporating the same |
| 09/13/2007 | WO2007102847A2 Excess overdrive detector for probe cards |
| 09/13/2007 | WO2007102834A2 Optically enhanced probe alignment |
| 09/13/2007 | WO2007102757A1 Charge controller |
| 09/13/2007 | WO2007102671A1 Voltage sensing member and battery module employed with the same |
| 09/13/2007 | WO2007102485A1 Test signal generation device |
| 09/13/2007 | WO2007102401A1 Conductive contact unit |
| 09/13/2007 | WO2007101345A1 Method and apparatus for interrogating an electronic component |
| 09/13/2007 | WO2007079006A3 Connection verification technique |
| 09/13/2007 | WO2007047178A3 Integrated circuit package resistance measurement |
| 09/13/2007 | WO2007002376A3 Method of preparing electrode |