Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2007
09/27/2007US20070226558 Semiconductor integrated circuit device
09/27/2007US20070226557 Semiconductor integrated circuit and semiconductor integrated circuit device
09/27/2007US20070226556 Methods and systems for repairing an integrated circuit device
09/27/2007US20070226555 Graphical presentation of semiconductor test results
09/27/2007US20070226554 High-efficiency time-series archival system for telemetry signals
09/27/2007US20070224712 Method of monitoring a semiconductor processing system using a wireless sensor network
09/27/2007US20070223804 CAM reference for inspection of contour images
09/27/2007US20070222999 Apparatus for monitoring a density profile of impurities
09/27/2007US20070222474 Device for Detecting a Fixed Image on a Liquid Crystal Display Screen
09/27/2007US20070222473 Multilayer printed wiring board and method of measuring characteristic impedance
09/27/2007US20070222472 Carbon nanotube-based stress sensor
09/27/2007US20070222471 Front and back side dynamically-biased photon emission microscopy
09/27/2007US20070222470 Buried short location determination using voltage contrast inspection
09/27/2007US20070222469 Circuit board assembly and inverter utilizing the same
09/27/2007US20070222468 High bandwidth probe system
09/27/2007US20070222467 Dermal phase meter with improved replaceable probe tips
09/27/2007US20070222466 Approach for fabricating probe elements for probe card assemblies using a reusable substrate
09/27/2007US20070222465 Probe head with vertical probes, method for manufacturing the probe head and probe card using the probe head
09/27/2007US20070222464 Method and apparatus for reviewing defects by detecting images having voltage contrast
09/27/2007US20070222457 Method and system for non-destructive evaluation of conducting structures
09/27/2007US20070222455 Fixture Characteristic Measuring Device, Method, Program, Recording Medium, Network Analyzer, And Semiconductor Test Device
09/27/2007US20070222428 High performance miniature RF sensor for use in microelectronics plasma processing tools
09/27/2007US20070222427 State Grasp Device, and Switching Control Device of Power Switching Apparatus Employing the State Grasp Device
09/27/2007US20070222418 Method for Managing a Pool or Rechargeable Batteries
09/27/2007US20070220737 Integrated circuit test result communication
09/27/2007DE112005002538T5 Prüfvorrichtung und Prüfverfahren Tester and test methods
09/27/2007DE112004000676T5 Prüfvorrichtung Tester
09/27/2007DE10330043B4 System und Kalibrierverfahren System and calibration
09/27/2007DE102006013911A1 Electrical load`s power consumption determining method for use in electrical system of motor vehicle, involves controlling selected load to periodically switch on and off loads with preset frequency during measuring period
09/27/2007DE102006005595A1 Verfahren und Anordnung zur Messung von Störemissionen in Realzeit Method and apparatus for measurement of spurious emissions in real time
09/27/2007DE102005040316B4 Vorrichtung und Verfahren zur Messung eines in einem elektrischen Leiter fließenden Stromes Apparatus and method for measuring a current flowing in an electric conductor current
09/27/2007DE102005029153B4 Vefahren zum Test eines Supraleiters unter erhöhter Stromauslastung in einem aktiv abgeschirmten supraleitenden NMR-Serienmagneten Vefahren to test a superconductor under increased current capacity utilization in an actively shielded superconducting NMR magnet series
09/27/2007DE102005021247B4 Eigenschaftsmessverfahren für Hochfrequenzschaltung, Kalibriermuster und Kalibriervorrichtung Property Measuring method for high frequency circuit calibration pattern and calibration
09/27/2007DE102004022719B4 Datengewinnungsverfahren zur Qualitätsbewertung von Elektroenergie Data recovery method for evaluating the quality of electric energy
09/27/2007DE10153753B4 Speichertester unterläßt ein Programmieren von Adressen in erfaßten schlechten Spalten Memory tester fails, programming of addresses in the detected bad columns
09/27/2007CA2646121A1 Method for distinguishing a first group of wires from other wires of a multi-wire cable, test connector for use in this method and a kit comprising such a multiwire cable and testconnector
09/27/2007CA2645868A1 Universal monitoring and diagnostic control system for a transformer or tap-changer
09/27/2007CA2541046A1 Power supply testing architecture
09/26/2007EP1837973A2 Charging control device with memory for cycle count
09/26/2007EP1837672A1 Fault detection method and apparatus
09/26/2007EP1837671A1 Fault detection method and apparatus
09/26/2007EP1837670A1 Fault detection method and apparatus
09/26/2007EP1837669A1 Signal transmission system, signal output circuit board, signal receiving circuit board, signal output method and signal receiving method
09/26/2007EP1837668A1 Semiconductor device, test apparatus and measuring method
09/26/2007EP1837667A2 Method of measuring stray emissions and harmonics of a mobile telephone handset, associated measurement system
09/26/2007EP1837666A1 Electromagnetic field distribution measuring method and apparatus thereof, computer program and information recording medium
09/26/2007EP1836768A2 Latch circuit including a data retention latch
09/26/2007EP1836515A1 Apparatus and method for using a counter-propagating signal method for locating events
09/26/2007EP1836504A2 Remote test facility with wireless interface to local test facilities
09/26/2007EP1836503A2 Scaleable controlled interconnect with optical and wireless applications
09/26/2007EP1836502A2 Bi-directional buffer for interfacing test system channel
09/26/2007EP1836501A1 Allocating device testing resources
09/26/2007EP1692526B1 Apparatus for testing a device with a high frequency signal
09/26/2007EP1362242B1 Test circuit for hvdc thyristor valves
09/26/2007EP1311866B1 Current compensation method and device for power system protection
09/26/2007CN200953413Y Electrical leakage protection socket with service life stopping detection and detection result prompting function
09/26/2007CN200953044Y Digital control system electric source anti-interference state on-line detector
09/26/2007CN200953043Y Electric machine current stability performance testing frame
09/26/2007CN200953042Y Driving electric machine for fuel battery vehicle and control system test platform
09/26/2007CN200953041Y Piezo-resistance tester
09/26/2007CN200953040Y Turn-to-turn compact resistance voltage testing instrument
09/26/2007CN200953039Y Electric protection line wiring analyser
09/26/2007CN200953037Y Electric source internal resistance test circuit
09/26/2007CN200953034Y Loading box and power generator circuit testing device
09/26/2007CN200953030Y Wafer test card
09/26/2007CN200953029Y 弹簧测试针 Spring testing needle
09/26/2007CN101044728A Fast reroute (frr) protection at the edge of a rfc 2547 network
09/26/2007CN101044411A Self-test circuit for high-definition multimedia interface integrated circuits
09/26/2007CN101044410A Partial discharge detection apparatus and detection method of electrical rotating machine
09/26/2007CN101044407A Contact unit and inspection system using it
09/26/2007CN101043142A DC power cabinet
09/26/2007CN101043137A Converter drive circuit having disconnection inducing function and its disconnection inducing method
09/26/2007CN101043094A Battery voltage measurement circuit, battery voltage measurement method, and battery electric control unit
09/26/2007CN101042690A Method and system for recognizing common characteristics in data
09/26/2007CN101042517A 风扇异常检测装置 Fan abnormality detection device
09/26/2007CN101042426A Methods and apparatus for frequency rectification
09/26/2007CN101042425A AC motor equipment exception signal extraction method
09/26/2007CN101042424A Method and apparatus for detecting application-specific integrated circuits
09/26/2007CN101042423A Method for detecting the defect on chip
09/26/2007CN101042422A Graphical presentation of semiconductor test results
09/26/2007CN101042421A Circuit for protecting dut, method for protecting dut, testing apparatus and testing method
09/26/2007CN101042420A Method, system and device for line detection
09/26/2007CN101042419A Method for using neutral line distribution circuit fault signal and application thereof
09/26/2007CN101042418A Leakage detection circuit and battery electronic control unit
09/26/2007CN101042417A Modelling method and route selecting method for single-phase grounding of low current neutral grounding system
09/26/2007CN101042412A Electric loading switching equipment
09/26/2007CN101042356A Method for confirming maintenance station and making substrates as defect
09/26/2007CN100340047C Device, system and method for monitoring a household electric appliance
09/26/2007CN100340045C Electric device, cell unit, cell charger and composed device system
09/26/2007CN100339690C Temperature detection device, temperature detection method, and computer-readable computer program product containing temperature detection program
09/25/2007US7275202 Method, system and program product for autonomous error recovery for memory devices
09/25/2007US7275198 Apparatus and method for transmitting/receiving error detection information in a communication system
09/25/2007US7275197 Testing apparatus
09/25/2007US7275196 Runtime reconfiguration of reconfigurable circuits
09/25/2007US7275195 Programmable built-in self-test circuit for serializer/deserializer circuits and method
09/25/2007US7275194 Clock duty cycle based access timer combined with standard stage clocked output register
09/25/2007US7275193 Method and apparatus for measuring crosstalk on a programmable logic device
09/25/2007US7275192 Method and system for on demand selective rerouting of logical circuit data in a data network
09/25/2007US7275191 Coverage decoder circuit for performance counter
09/25/2007US7275187 Test circuit for memory