| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 09/25/2007 | US7275186 Memory bus checking procedure |
| 09/25/2007 | US7275124 Method and system for controlling forwarding or terminating of a request at a bus interface based on buffer availability |
| 09/25/2007 | US7275009 Fault diagnosis apparatus |
| 09/25/2007 | US7275003 Harmonic diagnosing method for electric facility |
| 09/25/2007 | US7274999 Brownout detector system and method |
| 09/25/2007 | US7274669 Facilitating digital subscriber line services via a subscriber premise network interface device |
| 09/25/2007 | US7274667 Monitoring and allocating access across a shared communications medium |
| 09/25/2007 | US7274660 Method of flow control |
| 09/25/2007 | US7274656 Protection system and method for resilient packet ring (RPR) interconnection |
| 09/25/2007 | US7274655 Method and system for rehoming a digital subscriber line access Multiplexer |
| 09/25/2007 | US7274352 Combining detection circuit for a display panel |
| 09/25/2007 | US7274223 Semiconductor device |
| 09/25/2007 | US7274206 Output power detection circuit |
| 09/25/2007 | US7274205 System and method for testing devices utilizing capacitively coupled signaling |
| 09/25/2007 | US7274204 System and method for testing devices utilizing capacitively coupled signaling |
| 09/25/2007 | US7274203 Design-for-test circuit for low pin count devices |
| 09/25/2007 | US7274202 Carousel device, system and method for electronic circuit tester |
| 09/25/2007 | US7274201 Method and system for stressing semiconductor wafers during burn-in |
| 09/25/2007 | US7274200 Semiconductor circuit, method of monitoring semiconductor-circuit performance, method of testing semiconductor circuit, equipment for testing semiconductor circuit, and program for testing semiconductor circuit |
| 09/25/2007 | US7274199 Method and arrangement of testing device in mobile station |
| 09/25/2007 | US7274197 Contact system for interfacing a semiconductor wafer to an electrical tester |
| 09/25/2007 | US7274196 Apparatus and method for testing electrical characteristics of semiconductor workpiece |
| 09/25/2007 | US7274195 Semiconductor device test probe |
| 09/25/2007 | US7274194 Apparatuses and methods for repairing defects in a circuit |
| 09/25/2007 | US7273761 Box-in-box field-to-field alignment structure |
| 09/20/2007 | WO2007106759A2 Method to reduce cross talk in a multi column e-beam test system |
| 09/20/2007 | WO2007106277A2 Electrical connectors |
| 09/20/2007 | WO2007106015A1 Method and device for indicating an electric discharge inside a bearing of an electric drive system |
| 09/20/2007 | WO2007105595A1 Battery state judging device |
| 09/20/2007 | WO2007105563A1 Electronic device, testing apparatus and testing method |
| 09/20/2007 | WO2007105562A1 Calibration apparatus, testing apparatus, calibration method and testing method |
| 09/20/2007 | WO2007105456A1 Battery service life judging device and battery service life judging method |
| 09/20/2007 | WO2007105435A1 Moving apparatus and electronic component testing apparatus |
| 09/20/2007 | WO2007105387A1 Semiconductor inspecting system |
| 09/20/2007 | WO2007105036A1 Device and method for testing a device |
| 09/20/2007 | WO2007104229A1 Method and system for evaluating the corrosion risk of a circuit board |
| 09/20/2007 | WO2007090772A3 Circuit and testing device |
| 09/20/2007 | WO2007090200A3 Battery management |
| 09/20/2007 | WO2007063029B1 Nanoscale fault isolation and measurement system |
| 09/20/2007 | WO2006116446A3 High-speed level sensitive scan design test scheme with pipelined test clocks |
| 09/20/2007 | WO2006109273A3 Method and apparatus for providing stable voltage to analytical system |
| 09/20/2007 | WO2006086512A8 High density interconnect system for ic packages and interconnect assemblies |
| 09/20/2007 | WO2005041553A3 Fixed filter assembly for proof of performance testing on catv systems |
| 09/20/2007 | US20070220392 Method and apparatus for automatic generation of system test libraries |
| 09/20/2007 | US20070220391 Integrated circuit with scan-based debugging and debugging method thereof |
| 09/20/2007 | US20070220390 Method and system for verifying equivalence of two representations of a stimulus pattern for testing a design |
| 09/20/2007 | US20070220389 Integrated circuit device, diagnosis method and diagnosis circuit for the same |
| 09/20/2007 | US20070220388 Apparatus and method for adjusting an operating parameter of an integrated circuit |
| 09/20/2007 | US20070220387 Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets |
| 09/20/2007 | US20070220386 Verification of the design of an integrated circuit background |
| 09/20/2007 | US20070220385 Semiconductor device provided with function for screening test regarding operating speed |
| 09/20/2007 | US20070220384 Isolating the location of defects in scan chains |
| 09/20/2007 | US20070220383 Systems and methods for identifying errors in LBIST testing |
| 09/20/2007 | US20070220382 Negative edge flip-flops for muxscan and edge clock compatible lssd |
| 09/20/2007 | US20070220381 Enhanced diagnosis with limited failure cycles |
| 09/20/2007 | US20070220380 Message system for logical synchronization of multiple tester chips |
| 09/20/2007 | US20070219741 Methods and apparatus for hybrid outlier detection |
| 09/20/2007 | US20070218571 Disabling poorly testing RFID ICs |
| 09/20/2007 | US20070216440 Sensor unit and image display apparatus |
| 09/20/2007 | US20070216439 MOS transistor characteristic detection apparatus and CMOS circuit characteristic automatic adjustment apparatus |
| 09/20/2007 | US20070216438 Ultra low pin count interface for die testing |
| 09/20/2007 | US20070216437 Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assemblies |
| 09/20/2007 | US20070216436 Structure and fabricating method of conductive trace |
| 09/20/2007 | US20070216435 Apparatus of measuring characteristics of semiconductor devices |
| 09/20/2007 | US20070216434 Method for validating and monitoring automatic test equipment contactor |
| 09/20/2007 | US20070216433 Probe For Electric Test |
| 09/20/2007 | US20070216432 Space transformers employing wire bonds for interconnections with fine pitch contacts |
| 09/20/2007 | US20070216431 Automated probe card planarization and alignment methods and tools |
| 09/20/2007 | US20070216430 Probe Card |
| 09/20/2007 | US20070216429 Probe card, method of designing the probe card, and method of testing semiconductor chips using the probe card |
| 09/20/2007 | US20070216428 Method to reduce cross talk in a multi column e-beam test system |
| 09/20/2007 | US20070216427 Method and apparatus for predicting the reliability of electronic systems |
| 09/20/2007 | US20070216419 Apparatuses and methods for repairing defects in a circuit |
| 09/20/2007 | US20070216408 Magnetic Field Sensor |
| 09/20/2007 | US20070216395 Method and Circuit Arrangement for the Self-Testing of a Reference Voltage in Electronic Components |
| 09/20/2007 | US20070216249 Transverse flux machine and turbine-type machine having such a transverse flux machine |
| 09/20/2007 | US20070214894 Method of making pressure sensor assemblies |
| 09/20/2007 | US20070214634 Method of manufacturing a magnetic head |
| 09/20/2007 | US20070214623 Nondestructive reliability monitoring method for adhesively bonded structures whose sensitivity is improved by using piezoelectric or conductive materials |
| 09/20/2007 | DE19826236B4 Vorrichtung und Verfahren zum Berechnen der Elektromagnetischen Feldstärke Apparatus and method for calculating the electromagnetic field strength |
| 09/20/2007 | DE102006025850B3 Test pin for testing plugs of wiring harness, has core shaped piston lengthwise-slidably received at needle body in spring prestressed manner, and test needle that is spring prestressed |
| 09/20/2007 | DE102006011726A1 Schaltungsanordnung mit umschaltbarer Funktionalität und elektronisches Bauteil A circuit arrangement with switchable functionality and electronic component |
| 09/20/2007 | DE102006011706A1 Semiconductor component e.g. static RAM, testing method, involves transmitting test-signal applied to terminal of component to another terminal of component instead of switching core during test operating mode of component |
| 09/20/2007 | DE102006011548A1 Electronic circuit testing method, involves placing electronic circuit as test specimen in test arrangement with lateral supports, and detecting amount of deflection of test specimen based on applied force |
| 09/19/2007 | EP1835598A1 Method and device for indicating an electric discharge inside a bearing of an electric drive system |
| 09/19/2007 | EP1835297A1 A method and device for determining characteristics of an unknown battery |
| 09/19/2007 | EP1835296A1 Method of characterising a bit detection instant |
| 09/19/2007 | EP1835295A1 Test connector, kit and method for distinguishing a group of wires from other wires of a multi-wire cable |
| 09/19/2007 | EP1834187A1 Method for determining a battery internal resistance |
| 09/19/2007 | EP1834168A2 Method and device for the independent extraction of carrier concentration level and electrical junction depth in a semiconductor substrate from a single measurement |
| 09/19/2007 | EP1532461B1 Circuit for simultaneous testing of electricity meters with interconnected current and voltage circuits |
| 09/19/2007 | CN200950531Y Synthesized security control alarm for cooking facilities |
| 09/19/2007 | CN200950460Y System for detecting and recovering lead-acid accumulator |
| 09/19/2007 | CN200950446Y Bottom-abrading and electricity-testing integration machine of battery |
| 09/19/2007 | CN200950368Y Alarm linking control device for cable pressure resistant testing machine and wire-rewinding machine |
| 09/19/2007 | CN200950162Y Full online type batteries discharging test system |
| 09/19/2007 | CN200950161Y Battery testing machine |
| 09/19/2007 | CN200950160Y Battery testing machine |
| 09/19/2007 | CN200950159Y Anti-theft device for road lamp cable |
| 09/19/2007 | CN200950158Y Device for detecting convolving quality of battery electrode |