| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/03/2007 | CN200956044Y DVD pick-up servo coil measuring device |
| 10/03/2007 | CN200956035Y 可替换式探针结构 Replaceable probe structure |
| 10/03/2007 | CN200956034Y Pneumatic press control device for air conditioning electronic control board test tool |
| 10/03/2007 | CN200955942Y Motor axial displacement measuring instrument |
| 10/03/2007 | CN101048780A A method and apparatus for calibrating and/or deskewing communications channels |
| 10/03/2007 | CN101048670A Kelvin connector including temperature sensor |
| 10/03/2007 | CN101047272A Battery leakage detection system |
| 10/03/2007 | CN101047148A Manufacturing method of semiconductor device and semiconductor device corresponding to loop back test |
| 10/03/2007 | CN101046930A Picture quality controlling method and flat panel display using the same |
| 10/03/2007 | CN101046505A Battery capacity calculation method |
| 10/03/2007 | CN101046504A Method of predicting life of cell in digital camera |
| 10/03/2007 | CN101046503A Method for testing explosion cause of lithium ion cell explotion |
| 10/03/2007 | CN101046502A Cable running safety evaluating method |
| 10/03/2007 | CN101046501A Cable running safety monitoring method |
| 10/03/2007 | CN101046500A Current transformer saturation detecting technology based on correlation coefficient process |
| 10/03/2007 | CN101046499A Method of detecting triphase asymmetry failure in low voltage line and comprehensive protection module |
| 10/03/2007 | CN101046498A System for testing multi-wire cable |
| 10/03/2007 | CN101046497A Method of detecting local discharge signal in electric power equipment |
| 10/03/2007 | CN101046496A Methods of detecting arc faults characterized by consecutive periods of arcing |
| 10/03/2007 | CN101046495A Trimming system and method for PCB measurement |
| 10/03/2007 | CN101046494A Verticality locator |
| 10/03/2007 | CN101046493A Track plate insulation detecting method |
| 10/03/2007 | CN101046492A Double-port network parameter measuring method |
| 10/03/2007 | CN101046485A Abrupt voltage wave calculating system and process |
| 10/03/2007 | CN101046482A Space convertor base plate, its forming method and contact pad structure |
| 10/03/2007 | CN101046372A Crystal chip bearing tray detecting process |
| 10/03/2007 | CN101046369A Device and process of measuring surface smoothness of double plate in fuel cell |
| 10/03/2007 | CN100341131C Handler for testing semiconductor device |
| 10/03/2007 | CN100341110C Manufacturing method and apparatus to avoid prototype-hold in ASIC/SOC manufacturing |
| 10/03/2007 | CN100340865C Automatic testing method of filter |
| 10/03/2007 | CN100340864C Apparatus and method for testing circuit board |
| 10/03/2007 | CN100340863C Automatic tester for semiconductor epitaxial sheet performance and testing method thereof |
| 10/02/2007 | US7278123 System-level test architecture for delivery of compressed tests |
| 10/02/2007 | US7278079 Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices |
| 10/02/2007 | US7278078 Built-in self-test arrangement for integrated circuit memory devices |
| 10/02/2007 | US7278077 IBIST test for synchronous lines at multiple frequencies |
| 10/02/2007 | US7278076 System and scanout circuits with error resilience circuit |
| 10/02/2007 | US7278075 Scan path circuit having a selection circuit for delivering an input signal to selected scan chain circuits |
| 10/02/2007 | US7278074 System and shadow circuits with output joining circuit |
| 10/02/2007 | US7278073 Diagnostic data capture within an integrated circuit |
| 10/02/2007 | US7278069 Data transmission apparatus for high-speed transmission of digital data and method for automatic skew calibration |
| 10/02/2007 | US7277840 Method for detecting bus contention from RTL description |
| 10/02/2007 | US7277812 Data generator |
| 10/02/2007 | US7277391 Active queue management using proportional control and rate-based information |
| 10/02/2007 | US7277384 Program and method for preventing overload in a packet telephony gateway |
| 10/02/2007 | US7277338 Method and device for testing semiconductor memory devices |
| 10/02/2007 | US7277322 Semiconductor memory device having ECC circuit |
| 10/02/2007 | US7277264 Semiconductor integrated circuit having current detection functionality and power supply unit equipped with the same |
| 10/02/2007 | US7277261 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system |
| 10/02/2007 | US7276930 Circuit and method for detecting skew of transistor in semiconductor device |
| 10/02/2007 | US7276929 Inspection system, inspection method, and method for manufacturing semiconductor device |
| 10/02/2007 | US7276928 System and method for testing devices utilizing capacitively coupled signaling |
| 10/02/2007 | US7276927 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 10/02/2007 | US7276926 Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 10/02/2007 | US7276925 Operating an integrated circuit at a minimum supply voltage |
| 10/02/2007 | US7276924 Electrical connecting method |
| 10/02/2007 | US7276923 Semiconductor device test probe |
| 10/02/2007 | US7276922 Closed-grid bus architecture for wafer interconnect structure |
| 10/02/2007 | US7276921 Probe of under side of component through opening in a printed circuit board |
| 10/02/2007 | US7276920 Packaging and interconnection of contact structure |
| 10/02/2007 | US7276919 High density integral test probe |
| 10/02/2007 | US7276914 System and method for guided TDR/TDT computerized tomography |
| 10/02/2007 | US7276913 Cable tester |
| 10/02/2007 | US7276911 Detection of malfunctioning bulbs in decorative light strings |
| 10/02/2007 | US7276896 Test apparatus and method for testing circuit units to be tested |
| 10/02/2007 | US7276895 Adjustable test head docking apparatus |
| 10/02/2007 | US7276894 Dynamic cradle assembly positioner system for positioning an electronic device test head |
| 10/02/2007 | US7276693 Inspection method and apparatus using charged particle beam |
| 10/02/2007 | US7276672 Method for sorting integrated circuit devices |
| 09/27/2007 | WO2007109682A2 Improved system and method for manufacturing laminated circuit boards |
| 09/27/2007 | WO2007109322A2 Speeding up defect diagnosis techniques |
| 09/27/2007 | WO2007109276A2 Rf sensor for use in plasma processing tools |
| 09/27/2007 | WO2007108493A1 Probability density function isolating device, probability density function isolating method, test device, bit error ratio measuring device, electronic device, and program |
| 09/27/2007 | WO2007108492A1 Probability density function isolating device, probability density function isolating method, noise isolating device, noise isolating method, test device, test method, calculation device, calculation method, program, and recording medium |
| 09/27/2007 | WO2007108400A1 Testing apparatus, memory device and testing method |
| 09/27/2007 | WO2007108303A1 Testing apparatus and performance board |
| 09/27/2007 | WO2007108289A1 Semiconductor integrated circuit and method for testing same |
| 09/27/2007 | WO2007108252A1 Ic socket and semiconductor integrated circuit testing apparatus |
| 09/27/2007 | WO2007107872A2 Universal monitoring and diagnostic control system for a transformer or tap- changer |
| 09/27/2007 | WO2007107614A1 Test bench for electromagnetic compatibility measurements |
| 09/27/2007 | WO2007106990A1 Thermal pre-scanning of electric circuits using thermally-trimmable resistors |
| 09/27/2007 | WO2007059409A3 Determining frequency components of jitter |
| 09/27/2007 | WO2007055719A3 System and method for a gatekeeper in a communications network |
| 09/27/2007 | WO2006055661A3 Maximum and minimum power limit calculator for batteries and battery subpacks |
| 09/27/2007 | US20070226574 Automated high voltage defibrillator tester |
| 09/27/2007 | US20070226573 System on chip having test circuit |
| 09/27/2007 | US20070226572 Soft error rate analysis system |
| 09/27/2007 | US20070226571 Protocol analyzer for consumer electronics |
| 09/27/2007 | US20070226570 Speeding up defect diagnosis techniques |
| 09/27/2007 | US20070226569 Film-type semiconductor package and method using test pads shared by output channels, and test device, semiconductor device and method using patterns shared by test channels |
| 09/27/2007 | US20070226568 Semiconductor integrated circuit and design apparatus thereof |
| 09/27/2007 | US20070226567 High speed bist utilizing clock multiplication |
| 09/27/2007 | US20070226566 Iterative process for identifying systematics in data |
| 09/27/2007 | US20070226565 Semiconductor integrated circuit device and method of testing same |
| 09/27/2007 | US20070226564 Efficient scan chain insertion using broadcast scan for reduced bit collisions |
| 09/27/2007 | US20070226563 Test Method and Test Device for Testing an Integrated Circuit |
| 09/27/2007 | US20070226562 Method and apparatus for secure scan testing |
| 09/27/2007 | US20070226561 Testing of data retention latches in circuit devices |
| 09/27/2007 | US20070226560 Electronic circuit and integrated circuit including scan testing circuit, and power consumption reducing method used for integrated circuit |
| 09/27/2007 | US20070226559 Multimedia device testing method |