Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2007
10/11/2007US20070236240 Device for the testing of packaging material
10/11/2007US20070236239 Integrated circuit having a semiconductor device and integrated circut test method
10/11/2007US20070236238 Systems and methods for reducing testing times on integrated circuit dies
10/11/2007US20070236237 A test structure and method for detecting charge effects during semiconductor processing using a delayed inversion point technique
10/11/2007US20070236236 Electronic device test set and contact used therein
10/11/2007US20070236235 Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments
10/11/2007US20070236234 Method and system for the optical inspection of contact faces at semiconductor devices with different appearances
10/11/2007US20070236233 Probe interposers and methods of fabricating probe interposers
10/11/2007US20070236232 System and apparatus for using test structures inside of a chip during the fabrication of the chip
10/11/2007US20070236228 Baggage compartment, in particular an enclosed compartment for an aircraft cabin
10/11/2007US20070236227 Waveform converting apparatus, waveform converting method test apparatus and test method
10/11/2007US20070236210 Transmission line pulse (TLP) system calabration technique
10/11/2007US20070236209 Measuring device
10/11/2007US20070236207 Systems and methods for evaluating electromagnetic interference
10/11/2007DE60309761T2 Methode und Vorrichtung zum Testen von Hochgeschwindigkeits-Verbindungsschaltungen Method and apparatus for testing high-speed circuits compound
10/11/2007DE112005002863T5 Verfahren und Vorrichtung zur wiederholten Prüfung eines elektrischen Bauelements Method and device for repeatedly checking of an electrical component
10/11/2007DE112005002862T5 Vakuumringkonstruktionen zur Verbesserung der elektrischen Kontaktierung Vacuum ring designs to improve the electrical contact
10/11/2007DE10209037B4 Verfahren und Vorrichtung zum Überwachen der Spannung einer Batterie A method and apparatus for monitoring the voltage of a battery
10/11/2007DE102007013254A1 Electronic control device testing or examining method, involves charging discharge point with voltage surge adapted for testing of electronic control device, and automatically contacting electronic control device with testing point
10/11/2007DE102006016303A1 Modern integrated circuit e.g. modern system on chip, for use in controller, has interface module connected with signal lines for transmission of data of different content categories with test interface
10/11/2007DE102006015365A1 Verfahren und Vorrichtung zum Temperieren von elektronischen Bauelementen Method and apparatus for controlling the temperature of electronic components
10/11/2007DE102006015363A1 Testvorrichtung zum Testen von elektronischen Bauelementen Test device for testing electronic components
10/11/2007DE102006014733A1 Integrierte Schaltungsanordnung mit einer Mehrzahl extern gespeister Stromversorgungsnetze An integrated circuit device having a plurality of externally-powered power supply networks
10/11/2007CA2647482A1 Circuit for measuring and controlling differential voltages
10/10/2007EP1843164A1 Secondary cell charge/discharge electricity amount estimation method and device, secondary cell polarization voltage estimation method and device, and secondary cell remaining capacity estimation method and device
10/10/2007EP1843163A1 Conduction-cooled accelerated test fixture
10/10/2007EP1843162A1 Semiconductor device card
10/10/2007EP1843139A2 Ultra-low power programmable timer and low voltage detection circuits
10/10/2007EP1842276A1 Device for detecting an electrical power supply failure
10/10/2007EP1842073A2 Probe head arrays
10/10/2007EP1842033A1 Position detector
10/10/2007EP1702218B1 Delay fault test circuitry and related method
10/10/2007CN200959027Y Power-supply electromotive-force and internal-resistance measuring equipment
10/10/2007CN200959026Y Universal circuit maintenance equipment
10/10/2007CN200959025Y LED testing operation platform
10/10/2007CN200959024Y Railway-signal filament monitor
10/10/2007CN200959017Y Probe applicating mechanism
10/10/2007CN200959016Y PCB universal pneumatic tester
10/10/2007CN101053205A Efficient protection mechanisms in a ring topology network utilizing label switching protocols
10/10/2007CN101052889A Wireless battery status management for medical devices
10/10/2007CN101052888A Charging method and circuit using indirect current sensing
10/10/2007CN101052887A Measurable integrate circuit
10/10/2007CN101052886A Replaceable probe apparatus for probing semiconductor wafer
10/10/2007CN101052292A Electromagnetic compatible shield device and measuring method for electromagnetic shield effect
10/10/2007CN101051760A Battery pack and electric device using the same
10/10/2007CN101051619A Substrate check device and substrate check method
10/10/2007CN101051591A Method for detecting and broken line repairing aluminum film electrode fault and detector
10/10/2007CN101051525A Semiconductor storage device, and control method and test method of semiconductor storage device
10/10/2007CN101051474A Test system of optical disc machine
10/10/2007CN101051435A Copying and detecting system for flat panel display product EDID
10/10/2007CN101051434A Copying and detecting method for flat panel display product EDID
10/10/2007CN101051288A System and its method for regulating and correcting computer executable signal gain
10/10/2007CN101051072A Barrier test qigong remote distance ray board
10/10/2007CN101051071A Multiple input path modular high frequency isolation single phase power feedback type electronic load
10/10/2007CN101051070A One chip voltage high speed cruising inspection system facing fuel cell
10/10/2007CN101051069A Detection method and system for AC coupling differential circuit receiver connection state
10/10/2007CN101051068A Group distributing system and its method capable of wire group positioning
10/10/2007CN101051067A Comprehensive detection control device design method for electric connector
10/10/2007CN101051066A Detection device for panel display test and its production method
10/10/2007CN101051065A Apparatus and method for testing a chip and methods of making the apparatus
10/10/2007CN101051064A Device and method for measuring power amplifier performance parameter
10/10/2007CN101051054A Device and method for detecting heavy gas flow speed value of gas relay
10/10/2007CN101050991A High voltage leakage detector for medical transfusion soft bag
10/10/2007CN101050593A Detecting method for washing volume in washing machine
10/10/2007CN101050577A Detecting mechanism for needle lifting position of electronic jacquard machine
10/10/2007CN101049596A Apparatus for dual electronic part inspection and method
10/10/2007CN100342428C Head suspension assembly for slider tester
10/10/2007CN100342241C 电子装置 Electronic devices
10/10/2007CN100342240C Method for testing dynamic memory circuit and testing circuit
10/10/2007CN100342239C Switch equipment provided with integrated tester
10/10/2007CN100342238C Multicore cable automatic testing method and apparatus
10/10/2007CN100342237C Transformer overload automatic test method
10/10/2007CN100342236C Method and circuit arrangement for determining the average current consumption of a battery-operated apparatus
10/09/2007US7281249 Computer forming logical partitions
10/09/2007US7281185 Method and apparatus for maximizing and managing test coverage
10/09/2007US7281184 Test system and method for testing a circuit
10/09/2007US7281183 Data retaining boundary scan cell
10/09/2007US7281182 Method and circuit using boundary scan cells for design library analysis
10/09/2007US7281181 Systems, methods and computer programs for calibrating an automated circuit test system
10/09/2007US7281179 Memory device and input signal control method of a memory device
10/09/2007US7281136 LSI design method and verification method
10/09/2007US7281076 Form factor converter and tester in an open architecture modular computing system
10/09/2007US7280993 Reachability-based verification of a circuit using one or more multiply rooted binary decision diagrams
10/09/2007US7280526 Fast and scalable approximation methods for finding minimum cost flows with shared recovery strategies, and system using same
10/09/2007US7280485 Method and apparatus for diagnosing FC-AL system link
10/09/2007US7280472 Protection switching at a network node
10/09/2007US7280470 Ring network for sharing protection resource by working communication paths
10/09/2007US7280302 Disk drive using loopback to calibrate transmission amplitude
10/09/2007US7279923 LSI inspection method and defect inspection data analysis apparatus
10/09/2007US7279922 Sub-sampling of weakly-driven nodes
10/09/2007US7279921 Apparatus and method for testing power and ground pins on a semiconductor integrated circuit
10/09/2007US7279920 Expeditious and low cost testing of RFID ICs
10/09/2007US7279919 Systems and methods of allocating device testing resources to sites of a probe card
10/09/2007US7279918 Methods for wafer level burn-in
10/09/2007US7279917 Stacked tip cantilever electrical connector
10/09/2007US7279915 Test method for electronic modules using movable test contactors
10/09/2007US7279914 Circuit board checker and circuit board checking method
10/09/2007US7279913 Testing assembly for electrical test of electronic package and testing socket thereof
10/09/2007US7279912 Dual arcuate blade probe tip
10/09/2007US7279911 Probe card assembly with dielectric structure
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