Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2007
10/09/2007US7279910 Sanitary probe seal
10/09/2007US7279905 Method and an apparatus for supervising the operation of current transformers
10/09/2007US7279902 Battery characteristic evaluation device and battery characteristic evaluating method
10/09/2007US7279888 Handling unit for electronic devices
10/09/2007US7279887 In-process system level test before surface mount
10/09/2007US7279886 Slidable mounting plate
10/09/2007US7279785 Stacked die package system
10/09/2007US7279703 Self-heating burn-in
10/09/2007US7279668 Sequential read-out method and system that employs a single amplifier for multiple columns
10/09/2007US7279048 Semiconductor manufacturing apparatus
10/09/2007US7278868 Socket for semiconductor device
10/09/2007CA2264382C Miniature air gap inspection device
10/04/2007WO2007111685A2 Ground testing method and apparatus
10/04/2007WO2007111288A1 Generating device, generating method, program and recording medium
10/04/2007WO2007110159A1 Coupling apparatus having a pluggable module for coupling a diagnostic device
10/04/2007WO2007109876A1 Power supply testing architecture
10/04/2007WO2007092146A3 Method and apparatus for inspection of multi-junction solar cells
10/04/2007WO2007032904A3 Shared bond pad for testing a memory within a packaged semiconductor device
10/04/2007WO2005109011A3 Integrated acceptance testing
10/04/2007US20070234249 Method and apparatus for supporting verification, and computer product
10/04/2007US20070234169 Generating masking control circuits for test response compactors
10/04/2007US20070234168 Semiconductor integrated circuit device and inspection method therefor
10/04/2007US20070234167 Semiconductor device
10/04/2007US20070234166 Inverter and display device having the same
10/04/2007US20070234165 Input circuit of semiconductor memory device and test system having the same
10/04/2007US20070234164 Reading method of a memory device with embedded error-correcting code and memory device with embedded error-correcting code
10/04/2007US20070234163 On-chip comparison and response collection tools and techniques
10/04/2007US20070234162 Integrated Semiconductor Memory and Methods for Testing and Operating the Same
10/04/2007US20070234161 Using neighborhood functions to extract logical models of physical failures using layout based diagnosis
10/04/2007US20070234160 Self test device and self test method for reconfigurable device mounted board
10/04/2007US20070234159 Method and apparatus for testing a ring of non-scan latches with logic built-in self-test
10/04/2007US20070234158 Method of testing a semiconductor memory device, method of data serialization and data serializer
10/04/2007US20070234157 Multi-stage test response compactors
10/04/2007US20070234156 Electronic circuit comprising a test mode secured by the breaking of a test chain, and associated electronic circuit
10/04/2007US20070234155 Probeless testing of pad buffers on wafer
10/04/2007US20070234154 Scan testing using scan frames with embedded commands
10/04/2007US20070234153 Semiconductor integrated circuit apparatus and control method thereof
10/04/2007US20070234152 Data driver and flat panel display device using the same
10/04/2007US20070234151 Thin film transistor array substrate and electronic ink display device
10/04/2007US20070234150 Scan Tests Tolerant to Indeterminate States When Employing Signature Analysis to Analyze Test Outputs
10/04/2007US20070234149 Checking the integrity of programs or the sequencing of a state machine
10/04/2007US20070234148 Early Detection of Storage Device Degradation
10/04/2007US20070234147 Circuit analysis device
10/04/2007US20070234146 Test method, test system and assist board
10/04/2007US20070234145 Reduced pattern memory in digital test equipment
10/04/2007US20070234139 Method and apparatus for verifying the correctness of FTAP data packets received on the FLO waveform
10/04/2007US20070234120 Semiconductor storage device
10/04/2007US20070234096 Method and system for monitoring module power status in a communication device
10/04/2007US20070233445 Testing Suite for Product Functionality Assurance and Guided Troubleshooting
10/04/2007US20070232031 UV assisted low temperature epitaxial growth of silicon-containing films
10/04/2007US20070231937 Electronic apparatus and method of manufacturing electronic apparatus
10/04/2007US20070231936 Fabrication Method of Semiconductor Integrated Circuit Device
10/04/2007US20070230645 Metastability injector for a circuit description
10/04/2007US20070229114 Interconnections for plural and hierarchical p1500 test wrappers
10/04/2007US20070229110 Power supply method for semiconductor integrated circuit in test and CAD system for semiconductor integrated circuit
10/04/2007US20070229109 Carriage for liquid crystal module
10/04/2007US20070229108 Probe system
10/04/2007US20070229107 Stacked integrated circuit package system with connection protection
10/04/2007US20070229106 Measuring and identifying analog characteristics of a microelectronic component at a wafer level and a platform level
10/04/2007US20070229105 Desktop wafer analysis station
10/04/2007US20070229104 Micro Kelvin Probes and Micro Kelvin Probe Methodology with Concentric Pad Structures
10/04/2007US20070229103 Socket, a circuit component having the socket and an information processing system having the circuit component
10/04/2007US20070229102 Mechanically reconfigurable vertical tester interface for ic probing
10/04/2007US20070229101 Inspection method and inspection apparatus
10/04/2007US20070229100 High Performance Probe System
10/04/2007US20070229099 Resistive test probe tips and applications therefor
10/04/2007US20070229098 Detection method of probe's tip location, storage medium storing the method, and probe device
10/04/2007US20070229097 Probe, probe card, and testing device
10/04/2007US20070229096 System and method for detecting single event latchup in integrated circuits
10/04/2007US20070229093 Bi-Directional Three-Dimensional Microwave Scanning and Volumetric Mapping of a Whole Roll or Pallet of Paper
10/04/2007US20070229092 Test structures and method of defect detection using voltage contrast inspection
10/04/2007US20070229091 Method, apparatus and computer-readable code for detecting an incipient ground fault in an electrical propulsion system
10/04/2007US20070229090 Method, apparatus and computer-readable code for detecting an incipient ground fault in an electrical propulsion system
10/04/2007US20070229089 Method, apparatus and computer-readable code for detecting an incipient ground fault in an electrical propulsion system
10/04/2007US20070229088 Failure display unit and disk drive device with failure display function
10/04/2007US20070229084 Discharge Lamp Driving Circuit Having a Signal Detection Circuit Therein
10/04/2007US20070229054 Operating an Integrated Circuit at a Minimum Supply Voltage
10/04/2007US20070228371 Method for Evaluating Semiconductor Device
10/04/2007US20070228110 Method Of Wirebonding That Utilizes A Gas Flow Within A Capillary From Which A Wire Is Played Out
10/04/2007DE69936277T2 Synchron-Halbleiterspeichervorrichtung Synchronous semiconductor memory device
10/04/2007DE202007010784U1 Kontaktloses Messsystem Contact measuring system
10/04/2007DE112005000233T5 Kontaktstück, Kontaktanordnung mit Kontaktstücken, Probenkarte, Prüfgerät und Verfahren und Gerät zur Herstellung der Kontaktanordnung Contact piece contact assembly with contact pieces, sample card, tester and method and apparatus for manufacturing the contact assembly
10/04/2007DE10234662B4 Verfahren zur digitalen Phasendetektion und digitaler Phasendetektor zur Durchführung des Verfahrens A method of digital phase detection and digital phase detector for carrying out the method
10/04/2007DE102007016372A1 Electronic circuit`s impedance measuring method for e.g. MOSFET, involves determining error curve for value corresponding to error value and calculating impedance to be estimated for different values of measuring frequency of error value
10/04/2007DE102006013945A1 Coupling device e.g. personal computer coupling device, for e.g. motor vehicle, has base component and module with test interface controller configurable by software for communication with interface of device to be tested
10/03/2007EP1840585A1 Self test device and self test method for reconfigurable device mounted board
10/03/2007EP1840584A2 Methods of detecting arc faults characterized by consecutive periods of arcing
10/03/2007EP1840371A1 Diagnosis device for an ignition coil of an internal combustion engine
10/03/2007EP1839342A2 System and method for monitoring photovoltaic power generation systems
10/03/2007EP1839063A1 Method and apparatus for testing integrated circuits for susceptibility to latch-up
10/03/2007EP1839062A2 A method and apparatus for increasing the operating frequency of a system for testing electronic devices
10/03/2007EP1671141B1 Method and system for selectively masking test responses
10/03/2007EP1629290B1 Automatic test pattern generation
10/03/2007CN200956349Y Circuit breaker under-voltage action detecting device
10/03/2007CN200956052Y Automatic closing-opening test device for several type circuit breakers
10/03/2007CN200956051Y Test device for circuit breaker detection with track conveying device
10/03/2007CN200956050Y Leakage circuit breaker comprehensive test bed for leakage voltage withstand test common detection
10/03/2007CN200956049Y Transmission line short circuit fault position timely positioning and position wireless notice device
10/03/2007CN200956048Y Leakage detecting aircuit
10/03/2007CN200956047Y Air conditioner electronic control board split test tool
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