Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2007
10/17/2007CN101055303A Part align apparatus of in a apparatus for dual electronic part inspection and electronic part classification method
10/17/2007CN101055302A GPS clock signal based high voltage capacitive apparatus insulated on-line monitoring system and its implement method
10/17/2007CN101055256A Defect inspection apparatus
10/17/2007CN101055247A Passive Rb atom frequency standard locking indication and fault diagnosis method
10/17/2007CN101055168A Optical detection system
10/17/2007CN101054751A Method for detecting faucet of electronic jacquard machine and detection device using the same
10/17/2007CN100343923C Method of testing SDRAM device
10/17/2007CN100343686C Battery capacity calculating method
10/17/2007CN100343685C Boundry scanning chain test method
10/17/2007CN100343684C Composite tool for electronic and testing industry
10/17/2007CN100343683C Method and apparatus for detecting line signal disappearance
10/17/2007CN100343682C Testing device sensor and testing device
10/17/2007CN100343679C Method and system for generating testing pulse for driving tested electronic components
10/17/2007CN100343678C Probe for high electric current
10/17/2007CN100343677C Contact film probe and manufacturing method thereof
10/17/2007CN100343676C Probe for testing electric conduction
10/17/2007CN100343097C Fault diagnosing system for tractor of seat belt
10/16/2007US7284211 Extensible IO testing implementation
10/16/2007US7284178 Method and apparatus for testing a device in an electronic component
10/16/2007US7284177 Method and apparatus for functionally verifying a physical device under test
10/16/2007US7284176 Externally-loaded weighted random test pattern compression
10/16/2007US7284175 Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
10/16/2007US7284174 Enhanced JTAG interface
10/16/2007US7284173 Built-in self-test circuit for phase locked loops, test method and computer program product therefor
10/16/2007US7284172 Access method for embedded JTAG TAP controller instruction registers
10/16/2007US7284171 Integrated circuit device
10/16/2007US7284170 JTAG circuit transferring data between devices on TMS terminals
10/16/2007US7283931 Inspecting apparatus for semiconductor device
10/16/2007US7283920 Apparatus and method for testing semiconductor device
10/16/2007US7283918 Apparatus for analyzing fault of semiconductor integrated circuit, method for the same, and computer readable medium for the same
10/16/2007US7283915 Method and device of fault location
10/16/2007US7283482 Reverse data transmission apparatus and method in a mobile communication system
10/16/2007US7283480 Network system health monitoring using cantor set signals
10/16/2007US7283473 Apparatus, system and method for providing multiple logical channel adapters within a single physical channel adapter in a system area network
10/16/2007US7283470 Systems and methods for dropping data using a drop profile
10/16/2007US7283467 Procedures for improving call routing in PNNI networks
10/16/2007US7283466 Tracking physical route changes in optical switching network
10/16/2007US7283463 Non-disruptive reconfiguration of a publish/subscribe system
10/16/2007US7283409 Data monitoring for single event upset in a programmable logic device
10/16/2007US7283373 Electronic device
10/16/2007US7282945 Wafer scale high density probe assembly, apparatus for use thereof and methods of fabrication thereof
10/16/2007US7282944 Body capacitance electric field powered device for high voltage lines
10/16/2007US7282943 Inspection device for inspecting TFT
10/16/2007US7282942 Enhanced sampling methodology for semiconductor processing
10/16/2007US7282941 Method of measuring semiconductor wafers with an oxide enhanced probe
10/16/2007US7282940 Semiconductor device with electrode pads for test probe
10/16/2007US7282939 Circuit having a long device configured for testing
10/16/2007US7282938 Testing apparatus and method for providing temperature stress to electronic component
10/16/2007US7282937 On-chip frequency degradation compensation
10/16/2007US7282936 Die design with integrated assembly aid
10/16/2007US7282935 Regenerator probe
10/16/2007US7282934 Flexible microcircuit space transformer assembly
10/16/2007US7282933 Probe head arrays
10/16/2007US7282932 Compliant contact pin assembly, card system and methods thereof
10/16/2007US7282931 Full wafer contacter and applications thereof
10/16/2007US7282930 Device for testing thin elements
10/16/2007US7282925 Apparatus to facilitate functional shock and vibration testing of device connections and related method
10/16/2007US7282924 Computerized electricity system having an arc fault detecting sub-system
10/16/2007US7282922 Wire network mapping method and apparatus using impulse responses
10/16/2007US7282921 System, apparatus and method for detection of electrical faults
10/16/2007US7282905 System and method for IDDQ measurement in system on a chip (SOC) design
10/16/2007US7282890 Voltage detector of battery assembly
10/16/2007US7282811 Detection of short circuits in a vehicle
10/16/2007US7282795 Modifying a semiconductor device to provide electrical parameter monitoring
10/16/2007US7282378 Method of manufacturing inspection unit
10/16/2007US7282375 Wafer level package design that facilitates trimming and testing
10/11/2007WO2007115239A2 Composite mandrel
10/11/2007WO2007115218A2 Integrated circuit with improved test capability via reduced pin count
10/11/2007WO2007115130A2 Pressure-sensitive adhesive articles with non-woven backing having an elastomeric binder
10/11/2007WO2007114992A2 Liner tools and kit for cutting hair
10/11/2007WO2007114379A1 Variable delay circuit, testing apparatus and electronic device
10/11/2007WO2007114373A1 Test method, test system, and auxiliary substrate
10/11/2007WO2007114206A1 Signal-under-test analyzing device
10/11/2007WO2007114098A1 Jitter amplifier, jitter amplifying method, electronic device, test device and test method
10/11/2007WO2007113968A1 Semiconductor integrated circuit testing method and information recording medium
10/11/2007WO2007113940A1 Semiconductor test device
10/11/2007WO2007113918A1 Emergency stop device, electronic-component testing device with the same, and emergency stop method for electronic component testing device
10/11/2007WO2007113769A1 Integrated circuit with a capacitor bank and method for testing a capacitor bank
10/11/2007WO2007113199A1 Circuit for measuring and controlling differential voltages
10/11/2007WO2007112600A1 Fiber-optic current sensor with sum detection
10/11/2007WO2007062221A3 Systems and methods for testing conductive members employing electromagnetic back scattering
10/11/2007WO2007050283A3 Class-based bandwidth partitioning
10/11/2007WO2006120602A3 Battery power management in over-discharge situation
10/11/2007US20070240026 Method Evaluating Threshold Level of a Data Cell in a Memory Device
10/11/2007US20070240025 Method, system, and program product for controlling test data of a logic built-in self-test of an integrated circuit
10/11/2007US20070240024 Scan driving circuit and organic light emitting display using the same
10/11/2007US20070240023 Data shift capability for scannable register
10/11/2007US20070240021 Method, system and program product for autonomous error recovery for memory devices
10/11/2007US20070239976 Message displaying system and method
10/11/2007US20070239389 Method and Apparatus for Synchronizing Signals in a Testing System
10/11/2007US20070239385 Apparatus and Method for Tolerance Analysis for Digital and/or Digitized Measure Values
10/11/2007US20070239374 System and Method for Monitroing a Vehicle Battery
10/11/2007US20070239308 Sorting a group of integrated circuit devices for those devices requiring special testing
10/11/2007US20070238988 Body insertable system, receiving apparatus, and body insertable apparatus
10/11/2007US20070238206 System and apparatus for using test structures inside of a chip during the fabrication of the chip
10/11/2007US20070238204 Manufacturing Method of Semiconductor Device
10/11/2007US20070238202 Adaptive control method for rapid thermal processing of a substrate
10/11/2007US20070236244 Test method, semiconductor device, and display
10/11/2007US20070236243 Liquid crystal display driver including test pattern generating circuit
10/11/2007US20070236242 Integrated circuit with improved test capability via reduced pin count
1 ... 851 852 853 854 855 856 857 858 859 860 861 862 863 864 865 866 867 868 869 870 871 ... 1523