Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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11/06/2007 | CA2457734C Method and apparatus for predicting the time to failure of electronic devices at high temperatures |
11/06/2007 | CA2312355C Method and device for testing digital protection devices |
11/01/2007 | WO2007124050A2 Probe structures with electronic components |
11/01/2007 | WO2007123647A2 Desktop wafer analysis station |
11/01/2007 | WO2007123390A1 A time alert device for use together with an earth leakage protection device |
11/01/2007 | WO2007123055A1 Testing apparatus, testing method, jitter filter circuit and jitter filtering method |
11/01/2007 | WO2007123054A1 Calibration device, calibration method, tester, and test method |
11/01/2007 | WO2007122990A1 Signal output device, signal detection device, tester, electron device, and program |
11/01/2007 | WO2007122950A1 Semiconductor device, semiconductor testing apparatus and semiconductor device testing method |
11/01/2007 | WO2007122195A1 System level testing for substation automation systems |
11/01/2007 | WO2007121752A1 Method for sheet resistance and leakage current density measurements on shallow semiconductor implants |
11/01/2007 | WO2007067378A3 Calibration circuitry |
11/01/2007 | WO2007037950A3 Compressed video packet scheduling system |
11/01/2007 | WO2006109273B1 Method and apparatus for providing stable voltage to analytical system |
11/01/2007 | WO2006053567A3 Compensation of simple fiberoptic faraday effect sensors |
11/01/2007 | US20070256040 Critical area computation of composite fault mechanisms using voronoi diagrams |
11/01/2007 | US20070255992 Semiconductor integrated circuit system, semiconductor integrated circuit, operating system, and control method for semiconductor integrated circuit |
11/01/2007 | US20070255991 Monitoring a thermal processing system |
11/01/2007 | US20070255990 Test access port switch |
11/01/2007 | US20070255989 Systems, methods and apparatus for synthesizing state events for a test data stream |
11/01/2007 | US20070255988 Computer-aided design (CAD) multiple-capture DFT system for detecting or locating crossing clock-domain faults |
11/01/2007 | US20070255987 Control signal synchronization of a scannable storage circuit |
11/01/2007 | US20070255986 Wrapper testing circuits and method thereof for system-on-a-chip |
11/01/2007 | US20070255985 Method and apparatus for disabling and swapping cores in a multi-core microprocessor |
11/01/2007 | US20070255984 Test Mode For Pin-Limited Devices |
11/01/2007 | US20070255983 Semiconductor integrated circuit and electronic device |
11/01/2007 | US20070254386 Measurement coordinate setting system and method |
11/01/2007 | US20070253328 System and method for active geographic redundancy |
11/01/2007 | US20070252614 Display device and method of testing sensing unit thereof |
11/01/2007 | US20070252613 Universal cmos device leakage characterization system |
11/01/2007 | US20070252612 Ball grid array connection monitoring system and method |
11/01/2007 | US20070252611 Semiconductor wafer having a dielectric reliability test structure, integrated circuit product and test method |
11/01/2007 | US20070252610 Containment of a wafer-chuck thermal interface fluid |
11/01/2007 | US20070252609 BGA package holder device and method for testing of BGA packages |
11/01/2007 | US20070252608 Contactor and test method using contactor |
11/01/2007 | US20070252607 Method of manufacturing circuit module, collective board for circuit module, and circuit module manufactured by the method |
11/01/2007 | US20070252605 Interface for detection and control of multiple test probes |
11/01/2007 | US20070252603 Systems, devices, and methods for arc fault detection |
11/01/2007 | US20070252601 Method for determining deterioration of accumulator battery, method for measuring internal impedance of secondary battery, equipment for measuring internal impedance of secondary battery, equipment for determining deterioration of secondary battery, and power supply system |
11/01/2007 | US20070252599 Circuit interrupter including manual selector selecting different point-on-wave switching characteristics |
11/01/2007 | US20070252584 Electric power controller for vehicle mounting |
11/01/2007 | US20070252583 Semiconductor integrated circuit device, measurement method therefore and measurement system for measuring AC characteristics thereof |
11/01/2007 | US20070252582 Test probe having modular components |
11/01/2007 | US20070252581 Method and apparatus for testing power switches using a logic gate tree |
11/01/2007 | CA2682386A1 Battery monitoring, warranty, and performance tracking system |
10/31/2007 | EP1850419A1 Composite conductive sheet, method for producing the same, anisotropic conductive connector, adapter, and circuit device electric inspection device |
10/31/2007 | EP1850142A1 System level testing for substation automation systems |
10/31/2007 | EP1850141A2 Apparatus and method for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array |
10/31/2007 | EP1850140A2 Switching assembly with at least one sensor and one evaluation unit |
10/31/2007 | EP1850139A1 Method and apparatus for silent detection |
10/31/2007 | EP1849019A1 Method and system for scheduling tests in a parallel test system |
10/31/2007 | EP1849018A2 Pin electronics with high voltage functionality |
10/31/2007 | EP1849017A1 Assembly comprising an electric conductor for transmitting electric energy and method for determining the load of an electric conductor |
10/31/2007 | EP1678513B1 Electronic circuit comprising a secret sub-module |
10/31/2007 | EP1664813B1 Method and circuit arrangement for determining a charge used during a specific period of time in mobile devices |
10/31/2007 | EP1620740B1 Data compression |
10/31/2007 | EP1495339B1 Semiconductor test system with easily changed interface unit |
10/31/2007 | DE19722414B4 Verfahren und Vorrichtung zum Testen eines Halbleiterspeichers Method and apparatus for testing a semiconductor memory |
10/31/2007 | DE112005002988T5 Leitungskurzschlussermittlung in LCD-Pixelanordnungen Short circuit determination in LCD pixel arrangements |
10/31/2007 | DE112005002693T5 Prüfgerät für elektronische Bauelemente und Verfahren zur Erkennung schadhafter Klemmen An electronic component tester and method for detecting defective terminals |
10/31/2007 | DE10331092B4 Anordnung zur Phasensynchronisation von mehreren zu einem Meßsystem zusammengefaßten elektronischen Meßgeräten Arrangement for phase synchronization of several combined into a measuring system electronic measuring instruments |
10/31/2007 | DE102006020086A1 Verfahren und Vorrichtung zur Prüfung von Stromwandlern mittels Hochstromimpuls Method and device for checking of current transformers by means of high current pulse |
10/31/2007 | DE102006019573A1 Motor vehicle main power supply`s load testing method, involves storing signal energies at output of Goertzel filter and/or Goertzel algorithm, and testing energies with respect to its gradient and end value on reaching minimum values |
10/31/2007 | DE102006019497A1 Sensor device for measuring e.g. current intensity of starter battery, has shunt unit for low resistance connection of terminal clamping unit with output unit, which is connectable with electrical load of motor vehicle |
10/31/2007 | DE102006019467A1 Electrical network`s short-circuit detecting method for use in e.g. industry, involves determining actual values as intensity of current flowing in electrical network, and detecting short-circuit when threshold value exceeds threshold value |
10/31/2007 | CN200969520Y Submicron mobile phone emergency chargers |
10/31/2007 | CN200969454Y Household electrical appliance creepage acousto-optic alarm wall socket |
10/31/2007 | CN200969206Y Organic luminous display unit module testing device |
10/31/2007 | CN200968984Y Coding combination loading box |
10/31/2007 | CN200968983Y Polymer battery testing cabinet |
10/31/2007 | CN200968982Y 聚合物电池测试机 Polymer battery tester |
10/31/2007 | CN200968981Y Battery automatic electricity checking machine |
10/31/2007 | CN200968980Y Test circuit for travel switch tester |
10/31/2007 | CN200968979Y Testing device for breaker detection having transferring device |
10/31/2007 | CN200968978Y Movable dark box solar cell detector |
10/31/2007 | CN200968977Y Insulation testing device for cable connecting socket |
10/31/2007 | CN200968976Y Circuit detection apparatus |
10/31/2007 | CN200968975Y High-voltage power line pollution flash point display apparatus |
10/31/2007 | CN200968974Y Water-based fire extinguishing device spray electrical insulating property testing device |
10/31/2007 | CN200968973Y Electric power experiment sampling protection unit |
10/31/2007 | CN200968964Y Simple testing needle |
10/31/2007 | CN200968963Y Clamp for testing machine |
10/31/2007 | CN200968962Y Pulley test ceiling device |
10/31/2007 | CN200968961Y Interface neilsbed |
10/31/2007 | CN101065681A Interface apparatus for semiconductor device tester |
10/31/2007 | CN101065680A Integrated circuit self-test architecture |
10/31/2007 | CN101065679A Integrated circuit and a method for testing a multi-tap integrated circuit |
10/31/2007 | CN101065678A Monitoring physical operating parameters of an integrated circuit |
10/31/2007 | CN101065677A Router configured for outputting update messages specifying a detected attribute change of a connected active path according to a prescribed routing protocol |
10/31/2007 | CN101065659A Wire disconnection inspecting device and method |
10/31/2007 | CN101065651A Non-intrusive or not very intrusive method for detecting stator defects by temperature measurements |
10/31/2007 | CN101064276A Method for regulating integrate circuit parameter |
10/31/2007 | CN101063706A Multichannel precision secondary batteries testing system |
10/31/2007 | CN101063705A Method for enquiring electric quantity of power supply |
10/31/2007 | CN101063704A Apparatus, system and method for processing signals between a tester and a plurality of devices under test |
10/31/2007 | CN101063703A Digital type alternating current-direct current partial discharge detecting method and device |
10/31/2007 | CN101063702A Cable checking device |
10/31/2007 | CN101063701A Electronically controlled memory type indicating fault apparatus |
10/31/2007 | CN101063700A Method and arrangement for implementing chip test |
10/31/2007 | CN101063699A Intelligent failure diagnosis method for vehicle power distribution unit |