Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2007
10/31/2007CN101063698A Power distribution network fault testing method based on topology picture
10/31/2007CN101063686A Probe card
10/31/2007CN101063641A Method for testing digital products and special equipment thereof
10/31/2007CN101063629A Judging functional failure of electromechanical by speech recognition technology
10/31/2007CN101063625A BGA packaging retainer apparatus and method for testing BGA packaging
10/31/2007CN100346548C Discriminiting element for developmental fault of high-voltage transmission line of power system
10/31/2007CN100346477C Circuit arrangement for setting a voltage supply for a test mode of an integrated memory
10/31/2007CN100346461C Non-volatile memory evaluating method and non-volatile memory
10/31/2007CN100346422C Semiconductor memory device and control method thereof
10/31/2007CN100346399C Optical disk drive, optical storage medium, optical storage medium inspection device, and optical storage inspection method
10/31/2007CN100346221C Liquid crystal display panel and testing method therefor
10/31/2007CN100346167C Low-power consumption sweep test method based on circuit division
10/31/2007CN100346164C Voltage detecting circuit
10/30/2007US7290194 System for performing automatic test pin assignment for a programmable device
10/30/2007US7290193 System verification using one or more automata
10/30/2007US7290192 Test apparatus and test method for testing plurality of devices in parallel
10/30/2007US7290191 Functional frequency testing of integrated circuits
10/30/2007US7290190 Semiconductor integrated circuit with a test circuit
10/30/2007US7290189 Compilation of calibration information for plural testflows
10/30/2007US7290188 Method and apparatus for capturing the internal state of a processor for second and higher order speepaths
10/30/2007US7290187 Segmented algorithmic pattern generator
10/30/2007US7290186 Method and apparatus for a command based bist for testing memories
10/30/2007US7290183 Method of testing semiconductor apparatus
10/30/2007US7289946 Methodology for verifying multi-cycle and clock-domain-crossing logic using random flip-flop delays
10/30/2007US7289587 Repeatability over communication links
10/30/2007US7289515 Buffer reading priority
10/30/2007US7289514 System and method for scheduling data traffic flows for a communication device
10/30/2007US7289498 Classifying and distributing traffic at a network node
10/30/2007US7289454 Non-invasive estimation of round trip time a packet-oriented acknowledge-based transmission system
10/30/2007US7289452 Transport block size (TBS) signaling enhancement
10/30/2007US7289446 Controller area network (CAN) communication device
10/30/2007US7289435 Method and system for manifesting alarms in a telecommunication network
10/30/2007US7289431 Packet transmission method
10/30/2007US7289430 Equipment monitoring system line swap fast recovery method
10/30/2007US7289428 Inter-working mesh telecommunications networks
10/30/2007US7289346 Semiconductor integrated circuit
10/30/2007US7289230 Wireless substrate-like sensor
10/30/2007US7289166 Information processing apparatus and method of displaying remaining battery capacity of the information processing apparatus
10/30/2007US7288956 Device and method for detecting rotor speed of a multiple phase motor with bipolar drive
10/30/2007US7288955 Panel and test method for display device
10/30/2007US7288954 Compliant contact pin test assembly and methods thereof
10/30/2007US7288953 Method for testing using a universal wafer carrier for wafer level die burn-in
10/30/2007US7288952 Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
10/30/2007US7288951 Burn-in system having multiple power modes
10/30/2007US7288950 Contacting component, method of producing the same, and test tool having the contacting component
10/30/2007US7288949 Semiconductor test interface
10/30/2007US7288948 Patterned wafer inspection method and apparatus therefor
10/30/2007US7288947 Method for simulating resistor characteristics at high electric fields
10/30/2007US7288940 Galvanically isolated signal conditioning system
10/30/2007US7288834 Semiconductor device, carrier, card reader, methods of initializing and checking authenticity
10/30/2007US7288446 Single and double-gate pseudo-FET devices for semiconductor materials evaluation
10/30/2007US7287903 Method and apparatus for rapid thermal testing
10/30/2007US7287421 Semiconductor probe with high resolution resistive tip and method of fabricating the same
10/25/2007WO2007121330A1 Test access port switch
10/25/2007WO2007121001A2 Method and apparatus for interactive generation of device response template and analysis
10/25/2007WO2007120990A2 Method and apparatus for automatic generation of system test libraries
10/25/2007WO2007120560A2 Methods and systems for testing radio frequency identification(rfid) tags having multiple antennas
10/25/2007WO2007119642A1 Electric car overhead line separation detecting device and electric car overhead line separation detecting method
10/25/2007WO2007119485A1 Test device and test method
10/25/2007WO2007119300A1 Test system of reconfigurable device and its method and reconfigurable device for use therein
10/25/2007WO2007119030A2 Method and device for characterising sensitivity to energy interactions in an electronic component
10/25/2007WO2007118823A1 Test system for classifying a transponder
10/25/2007WO2007118267A1 Improvements in communications links
10/25/2007WO2007095332A8 Electronic article surveillance marker
10/25/2007WO2007080498A3 System and method of determining the speed of digital application specific integrated circuits
10/25/2007WO2007072398A3 Method of evaluating a delay of an input/output circuit and corresponding device
10/25/2007WO2006127916A3 Method and apparatus for detecting and fixing faults in an inline-power capable ethernet system
10/25/2007WO2006088745A3 Detection algorithm for delivering inline power down four pairs of an ethernet cable to a single powered device
10/25/2007US20070250756 High reliability memory module with a fault tolerant address and command bus
10/25/2007US20070250749 Test generation methods for reducing power dissipation and supply currents
10/25/2007US20070250748 Logic circuit protected against transitory perturbations
10/25/2007US20070250747 Semiconductor integrated circuit
10/25/2007US20070250743 Test apparatus, adjustment apparatus, adjustment method and adjustment program
10/25/2007US20070250284 Semiconductor integrated circuit and testing method for the same
10/25/2007US20070249073 Method for determining the electrically active dopant density profile in ultra-shallow junction (USJ) structures
10/25/2007US20070248019 Method for Diagnosing the Router Which Supports Policy-Based Routing
10/25/2007US20070247181 Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method
10/25/2007US20070247180 Probe station having multiple enclosures
10/25/2007US20070247179 Surface mount component RF test fixture
10/25/2007US20070247178 Probe station with low inductance path
10/25/2007US20070247177 Test Apparatus For Semiconductor Elements On A Semiconductor Wafer, And A Test Method Using The Test Apparatus
10/25/2007US20070247176 Method of Manufacturing a Probe Card
10/25/2007US20070247175 Probe Structures With Electronic Components
10/25/2007US20070247167 Method to monitor critical dimension of IC interconnect
10/25/2007US20070247140 Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array
10/25/2007US20070246608 Fuel Tank System
10/25/2007DE202007011630U1 Identifizierbares Kabel Identifiable cable
10/25/2007DE112005002450T5 Prüfvorrichtung Tester
10/25/2007DE112005002437T5 Prüfvorrichtung Tester
10/25/2007DE102007016559A1 Verfahren und Befehle zum Ausgeben von Daten, die ein Datenverzeichnis aufweisen A method for outputting data and commands which have a data directory
10/25/2007DE102007001143A1 Diagnosesignalprozessor Diagnostic signal processor
10/25/2007DE102006018474A1 Testvorrichtung für Halbleiterelemente auf einem Halbleiterwafer sowie ein Testverfahren unter Verwendung der Testvorrichtung Test device for semiconductor elements on a semiconductor wafer and a test method using the test device
10/25/2007DE102006018471A1 Short-circuit point detecting and locating device for pipeline facility of railway track, has transponders activated or deactivated in short-circuit region by short circuit current, which exceeds preset threshold value
10/25/2007DE102006017889A1 Flurförderzeug mit einer Batterie und Verfahren zum Betrieb eines Flurförderzeugs mit einer Batterie Truck with a battery and method for operating a truck with a battery
10/25/2007DE102005061018B4 Vorrichtung zur Anschlussprüfung von Lautsprechern eines Audiosystems Apparatus for testing connection of speakers of an audio system
10/25/2007DE102004036352B4 Schaltkreis zur Strommessung und Stromüberwachung und deren Verwendung für eine Funktionseinheit Circuit for measuring the current and current monitoring and the use thereof for a functional unit
10/24/2007EP1847844A1 Digital data signal analysis by evaluating sampled values in conjuction with signal bit values
10/24/2007EP1847843A1 Digital data sampling by applying a plurality of time delayed trigger signals
10/24/2007EP1847842A1 Mixed signal display for a measurement instrument
10/24/2007EP1847841A1 Superconductive cable withstand voltage test method
1 ... 848 849 850 851 852 853 854 855 856 857 858 859 860 861 862 863 864 865 866 867 868 ... 1523