Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/2008
02/28/2008US20080048668 Diagnostic methods for electrical cables utilizing axial tomography
02/28/2008US20080048667 Input detecting circuit used for electric-leakage protection devices with self-diagnostic fucntion
02/28/2008US20080048666 Apparatus and method for detecting a brush liftoff in a synchronous generator rotor circuit
02/28/2008US20080048665 Generation of System Power-Good Signal in Hot-Swap Power Controllers
02/28/2008US20080048662 Battery monitoring system
02/28/2008US20080048648 Chuck for holding a device under test
02/28/2008US20080048647 Chuck for holding a device under test
02/28/2008US20080048622 Method and apparatus to determine battery resonance
02/28/2008US20080048621 Hybrid battery and full charge capacity calculation method thereof
02/28/2008US20080048620 Charge and discharge control circuit and battery device
02/28/2008US20080048617 Remaining-capacity dispersion detecting apparatus and remaining-capacity control apparatus for battery pack
02/28/2008US20080048158 Pressing Member and Electronic Device Handling Apparatus
02/28/2008DE202007018066U1 Vorrichtung zur Kurzschlussortung an Isolatoren von Oberleitungsanlagen Device for short-circuit detection of insulators of overhead line systems
02/28/2008DE202005021435U1 Doppelseitige Prüfaufbauten Double-sided test setups
02/28/2008DE102007040168A1 Delay circuit has delaying elements, which delays input signal at delaying value and initialization circuit measures delaying value
02/28/2008DE102007035555A1 Examination method for connection between device and antenna, involves connecting antenna with device by antenna feed cable, where capacity is determined in device at connection point of antenna feed cable
02/28/2008DE102006037904A1 Electronic component`s i.e. integrated circuit component, connection contact contacting unit for testing device, has pairs of contact springs with respective contact regions, and adjustable stop unit restricting spring deflection of springs
02/28/2008DE102006037586A1 Vorrichtung und Verfahren zur Untersuchung der Stromflussverteilung in Solarzellen und Solarmodulen Apparatus and method for studying the flow of current distribution in solar cells and solar modules
02/28/2008DE10103879B4 Vorrichtung und Verfahren zur Jittermessung Apparatus and method for jitter measurement
02/27/2008EP1892725A2 Semiconductor integrated circuit and testing method of same
02/27/2008EP1892718A1 Charge sensing circuit
02/27/2008EP1892650A1 Method for contactless testing of an antenna mounted on a sheet of material
02/27/2008EP1892536A1 Battery monitoring system
02/27/2008EP1892535A1 Method of electrically testing an integrated circuit
02/27/2008EP1892534A1 Diagnostic method for electrical cables utilizing axial tomography technique
02/27/2008EP1891606A1 Method for the model-based diagnosis of a mechatronic system
02/27/2008EP1891454A1 Loss-free high current test station
02/27/2008EP1891453A1 Handler comprising an acceleration device for testing electronic components
02/27/2008EP1812803B1 Testable integrated circuit
02/27/2008EP1754075B1 Test method and test device for testing an integrated circuit
02/27/2008EP1390764B1 Method for determining the frequency of the current ripple in the armature current of a commutated d.c motor
02/27/2008EP1356561B1 Monitoring system
02/27/2008CN201029107Y Clamper of lithium battery detecting cabinet
02/27/2008CN201029103Y On-line monitoring and maintenance system for accumulator group
02/27/2008CN201029101Y Lower jig of lithium battery detecting cabinet and liquid injection machine
02/27/2008CN201029004Y Portable battery capacity checking instrument
02/27/2008CN201029001Y Arc strike detecting device
02/27/2008CN101133685A A method for detecting and locating a ground failure in an electrical line
02/27/2008CN101133654A Network connection sensing assembly
02/27/2008CN101133487A Method for manufacturing semiconductor IC device
02/27/2008CN101133417A Method for testing semiconductor circuit composed by branch circuits and manufacturing method thereof
02/27/2008CN101133340A Test decive, test method, electronic device manufacturing method, test simulator, and test simulation method
02/27/2008CN101133339A Compact representation of vendor hardware module revisions in an open architecture test system
02/27/2008CN101133338A Probe card with segmented substrate
02/27/2008CN101133337A Insulation inspecting apparatus
02/27/2008CN101132186A Portable electronic device automatically judging whether to charge
02/27/2008CN101132136A Charge and discharge control circuit and battery device
02/27/2008CN101132112A Semiconductor laser device for communication, its manufacturing method and light transmitting module
02/27/2008CN101131999A Semiconductor integrated circuit and testing method of same
02/27/2008CN101131805A Organic light emitting display device and mother substrate of the same
02/27/2008CN101131418A Image equipment AC power supply detecting method and device thereof
02/27/2008CN101131417A Battery monitoring system
02/27/2008CN101131416A Method for appraising sphere nickel fast charging and discharging performance
02/27/2008CN101131415A Method for appraising sphere nickel electro-chemistry performance
02/27/2008CN101131414A Method for appraising sphere nickel median voltage performance
02/27/2008CN101131413A Logic analyzer and its waveshape displaying method
02/27/2008CN101131412A Oscillator detecting fixture
02/27/2008CN101131411A Method for detecting device failure using channel electric leakage
02/27/2008CN101131410A Film electrode short detecting device for fuel batter with proton exchange film and detecting method thereof
02/27/2008CN101131409A Integrated circuit testing system and method thereof
02/27/2008CN101131400A Micro-electronmechanical manufacturing method for alloy probe
02/27/2008CN101131399A Test chip socket
02/27/2008CN101131398A Integrated circuit tester
02/27/2008CN101131337A Double-polar plate flow field fluid visualization apparatus and method thereof
02/27/2008CN100372167C Wireless battery management system
02/27/2008CN100371939C Method of defect management system
02/27/2008CN100371777C Projector for detecting plane displaying board and projecting method realized by same
02/27/2008CN100371728C Verification system for verifying authenticity of a battery and method thereof
02/27/2008CN100371727C Electronic circuit and method for testing
02/27/2008CN100371726C Chip needle detector
02/27/2008CN100371725C Semiconductor laser measuring device parameter
02/27/2008CN100371724C Earth fault line-selecting method for arc suppression coil earthing system
02/27/2008CN100371723C Short-circuit detecting circuit device
02/27/2008CN100371722C Three-phase lightning protector early fault on-line monitoring method and apparatus thereof
02/27/2008CN100371721C Display test system and method
02/26/2008USRE40105 Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits
02/26/2008US7337381 Memory tester having defect analysis memory with two storage sections
02/26/2008US7337380 Eye width characterization mechanism
02/26/2008US7337379 Apparatus and method for diagnosing integrated circuit
02/26/2008US7337377 Enhanced loopback testing of serial devices
02/26/2008US7337376 Method and system of self-test for a single infrared machine
02/26/2008US7337375 Diagnostics of cable and link performance for a high-speed communication system
02/26/2008US7337366 Microcomputer, a method for protecting memory and a method for performing debugging
02/26/2008US7337317 Memory data copying system for devices
02/26/2008US7337100 Physical resynthesis of a logic design
02/26/2008US7337088 Intelligent measurement modular semiconductor parametric test system
02/26/2008US7337079 Time-frequency domain reflectometry apparatus and method
02/26/2008US7336748 DDS circuit with arbitrary frequency control clock
02/26/2008US7336714 Phase adjustment apparatus and semiconductor test apparatus
02/26/2008US7336608 Method for adjusting a transmission rate to obtain the optimum transmission rate in a mobile ad hoc network environment
02/26/2008US7336606 Circular link list scheduling
02/26/2008US7336471 Charge eliminating mechanism for stage and testing apparatus
02/26/2008US7336094 Carriage for liquid crystal module
02/26/2008US7336093 Test circuit for flat panel display device
02/26/2008US7336092 Closed loop feedback control of integrated circuits
02/26/2008US7336091 Assembly for simultaneously testing multiple electronic components
02/26/2008US7336090 Frequency specific closed loop feedback control of integrated circuits
02/26/2008US7336089 Power line control circuit of semiconductor device
02/26/2008US7336088 Method and apparatus for determining IDDQ
02/26/2008US7336087 Circuit board test device comprising contact needles which are driven in diagonally protruding manner