| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/04/2008 | US7340667 Method and/or apparatus implemented in hardware to discard bad logical transmission units (LTUs) |
| 03/04/2008 | US7340662 GBit/s transceiver with built-in self test features |
| 03/04/2008 | US7340660 Method and system for using statistical signatures for testing high-speed circuits |
| 03/04/2008 | US7340659 Method of testing multiple modules on an integrated circuit |
| 03/04/2008 | US7340658 Technique for combining scan test and memory built-in self test |
| 03/04/2008 | US7340657 On-chip high-speed serial data analyzers, systems, and associated methods |
| 03/04/2008 | US7340656 Method and apparatus for probing a computer bus |
| 03/04/2008 | US7340437 Circuit configuration and method for identifying error situations in interconnected systems |
| 03/04/2008 | US7340372 Apparatus and method for investigating parameters of layers deposited on semiconductor wafers |
| 03/04/2008 | US7340355 Compensated current differential relaying method and system for protecting transformer |
| 03/04/2008 | US7340313 Monitoring device for monitoring internal signals during initialization of an electronic circuit |
| 03/04/2008 | US7340312 Method and system for monitoring and control of complex systems based on a programmable network processor |
| 03/04/2008 | US7340242 Method for measuring service data amount of terminal |
| 03/04/2008 | US7339897 Cross-layer integrated collision free path routing |
| 03/04/2008 | US7339890 Scalable, high-resolution asynchronous transfer mode traffic shaper and method |
| 03/04/2008 | US7339889 Control plane architecture for automatically switched optical network |
| 03/04/2008 | US7339887 Multipoint protected switching ring |
| 03/04/2008 | US7339885 Method and apparatus for customizable surveillance of network interfaces |
| 03/04/2008 | US7339414 Method and circuit arrangement for monitoring the mode of operation of one or more load circuits, especially of a domestic appliance |
| 03/04/2008 | US7339394 Current sensing in a two-phase motor |
| 03/04/2008 | US7339393 Gate drive circuit for an insulated gate power transistor |
| 03/04/2008 | US7339392 Apparatus measuring substrate leakage current and surface voltage and related method |
| 03/04/2008 | US7339391 Defect detection method |
| 03/04/2008 | US7339390 Systems and methods for controlling of electro-migration |
| 03/04/2008 | US7339389 Semiconductor device incorporating characteristic evaluating circuit operated by high frequency clock signal |
| 03/04/2008 | US7339388 Intra-clip power and test signal generation for use with test structures on wafers |
| 03/04/2008 | US7339387 System and method for linked slot-level burn-in |
| 03/04/2008 | US7339386 Probe, printed circuit board testing device and printed circuit board testing method |
| 03/04/2008 | US7339385 Semiconductor test apparatus and interface plate |
| 03/04/2008 | US7339368 Methods and apparatus for testing circuit boards |
| 03/04/2008 | US7339363 Variable gain received signal strength indicator |
| 03/04/2008 | US7339351 Method and apparatus for estimating remaining capacity of secondary battery |
| 03/04/2008 | US7339152 Delay circuit and test apparatus |
| 03/04/2008 | US7338293 Circuit contact to test apparatus |
| 02/28/2008 | WO2008024822A2 Apparatus and method of synchronizing distribution of packet services across a distributed network |
| 02/28/2008 | WO2008024748A1 System and method for calculating battery state of charge |
| 02/28/2008 | WO2008024124A1 Probe with contact ring |
| 02/28/2008 | WO2008023865A1 Method for transferring test trays in a side-docking type test handler |
| 02/28/2008 | WO2008023730A1 Integrated circuit, electronic device and measuring method |
| 02/28/2008 | WO2008023636A1 Wireless ic device inspecting system and wireless ic device manufacturing method using the same |
| 02/28/2008 | WO2008023624A1 Variable delay circuit, timing generator and semiconductor testing apparatus |
| 02/28/2008 | WO2008023615A1 Testing apparatus and device manufacturing method using the testing apparatus |
| 02/28/2008 | WO2008023577A1 Failure predicting circuit and method, and semiconductor integrated circuit |
| 02/28/2008 | WO2008023528A1 Semiconductor integrated circuit and evaluation circuit for semiconductor integrated circuit |
| 02/28/2008 | WO2008023486A1 Signal generating apparatus, testing apparatus and circuit device |
| 02/28/2008 | WO2008023485A1 Threshold voltage control apparatus, testing apparatus and circuit device |
| 02/28/2008 | WO2008023169A1 Electronic apparatus dectector |
| 02/28/2008 | WO2008022653A1 Converting non-equidistant signals into equidistant signals |
| 02/28/2008 | WO2008022504A1 A boundary scan method, system and device |
| 02/28/2008 | WO2008022404A1 Current leakage detection method and device |
| 02/28/2008 | WO2008003898A3 Device for measuring parameters of an electrical power supply |
| 02/28/2008 | WO2007148245A3 Method of checking the integrity of an antenna arrangement, transmitter, receiver and transceiver |
| 02/28/2008 | US20080052587 Unit Test Extender |
| 02/28/2008 | US20080052585 Integrated testing apparatus, systems, and methods |
| 02/28/2008 | US20080052583 Method and apparatus for monitoring an optical network signal |
| 02/28/2008 | US20080052582 JTAG to system bus interface for accessing embedded analysis instruments |
| 02/28/2008 | US20080052581 Logic built-in self-test channel skipping during functional scan operations |
| 02/28/2008 | US20080052580 Signal output circuit, and test apparatus |
| 02/28/2008 | US20080052579 System and Method for Advanced Logic Built-in Self Test with Selection of Scan Channels |
| 02/28/2008 | US20080052578 Decompressors for low power decompression of test patterns |
| 02/28/2008 | US20080052577 Circuit and method for controlling quality of random numbers |
| 02/28/2008 | US20080052576 Processor Fault Isolation |
| 02/28/2008 | US20080052575 Digital apparatus and method of testing the same |
| 02/28/2008 | US20080052574 Circuits and associated methods for improved debug and test of an application integrated circuit |
| 02/28/2008 | US20080052573 Test mode for multi-chip integrated circuit packages |
| 02/28/2008 | US20080052572 Pipelined data processor with deterministic signature generation |
| 02/28/2008 | US20080052569 Error detection on programmable logic resources |
| 02/28/2008 | US20080052566 System and method for detecting routing problems |
| 02/28/2008 | US20080050982 Electronic module and method of manufacturing electronic module |
| 02/28/2008 | US20080049826 Graphics Accelerator |
| 02/28/2008 | US20080049608 Process for Securing Communication Connections and Associated Billing in a Redundant Communication Network |
| 02/28/2008 | US20080049607 Method and apparatus for checking maintenance association integrity and method and apparatus for adding maintenance end point |
| 02/28/2008 | US20080048767 Semiconductor device with surge protection circuit |
| 02/28/2008 | US20080048710 Detection and monitoring of partial discharge of a power line |
| 02/28/2008 | US20080048709 Module and method for detecting defect of thin film transistor substrate |
| 02/28/2008 | US20080048708 Method of testing liquid crystal display |
| 02/28/2008 | US20080048707 Characteristic evaluation apparatus for insulated gate type transistors |
| 02/28/2008 | US20080048706 Semiconductor device, semiconductor integrated circuit and bump resistance measurement method |
| 02/28/2008 | US20080048705 Threshold voltage control apparatus, test apparatus, and circuit device |
| 02/28/2008 | US20080048704 Apparatus and methods for testing microelectronic devices |
| 02/28/2008 | US20080048703 Semiconductor integrated circuit and testing method of same |
| 02/28/2008 | US20080048701 Probe with contact ring |
| 02/28/2008 | US20080048700 Integrated circuit probing apparatus having a temperature-adjusting mechanism |
| 02/28/2008 | US20080048699 Defective product inspection apparatus, probe positioning method and probe moving method |
| 02/28/2008 | US20080048696 Methods and apparatus for single-sided extension of electrical conductors beyond the edges of a substrate |
| 02/28/2008 | US20080048695 Circuit substrate, method for inspecting electric circuit, and method for manufacturing circuit substrate |
| 02/28/2008 | US20080048694 Systems and methods for testing packaged microelectronic devices |
| 02/28/2008 | US20080048693 Probe station having multiple enclosures |
| 02/28/2008 | US20080048691 High density integrated circuit apparatus, test probe and methods of use thereof |
| 02/28/2008 | US20080048690 High density integrated circuit apparatus, test probe and methods of use thereof |
| 02/28/2008 | US20080048689 Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same |
| 02/28/2008 | US20080048688 Methods for planarizing a semiconductor contactor |
| 02/28/2008 | US20080048687 Probe, method of manufacturing the probe and probe card having the probe |
| 02/28/2008 | US20080048686 Sheet-like Probe, Method of Producing the Probe, and Application of the Probe |
| 02/28/2008 | US20080048685 Probe card having vertical probes |
| 02/28/2008 | US20080048684 Circuit module testing apparatus and method |
| 02/28/2008 | US20080048683 Method and apparatus for detection and prevention of bulk cmos latchup |
| 02/28/2008 | US20080048671 Test signal generating apparatus semiconductor integrated circuit and method for generating the test signal |
| 02/28/2008 | US20080048670 Method for contact-free testing of antennas applied to a material web |
| 02/28/2008 | US20080048669 Topological mapping using a conductive infrastructure |