Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2008
03/06/2008US20080059643 Compliance initiative navigation
03/06/2008US20080059107 Methods and apparatus for testing an ic using a plurality of i/o lines
03/06/2008US20080059089 Energy source monitoring and control system for power tools
03/06/2008US20080057745 Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same
03/06/2008US20080056559 Pattern Inspection Method And Apparatus
03/06/2008US20080056132 method and system of network communication receive load balancing
03/06/2008US20080056130 System and method for mapping end user identifiers to access device identifiers
03/06/2008US20080054932 Method and apparatus for measuring leakage current
03/06/2008US20080054931 Method and system for detecting or reviewing open contacts on a semiconductor device
03/06/2008US20080054930 Multi-channel pulse tester
03/06/2008US20080054928 Electric potential difference detection method and scanning probe microscope
03/06/2008US20080054926 Burn-in testing apparatus and method
03/06/2008US20080054925 Test chip socket
03/06/2008US20080054924 Contact for interconnect system
03/06/2008US20080054923 Probe for testing a device under test
03/06/2008US20080054922 Probe station with low noise characteristics
03/06/2008US20080054920 Method For Evaluating Soi Wafer
03/06/2008US20080054919 Vertical probe device
03/06/2008US20080054918 Vertical type high frequency probe card
03/06/2008US20080054917 Method and appartus for switching tester resources
03/06/2008US20080054916 Probe
03/06/2008US20080054910 Test apparatus for testing operation of a printed circuit board
03/06/2008US20080054908 Battery pack and method of calculating deterioration level thereof
03/06/2008US20080054885 Chuck for holding a device under test
03/06/2008US20080054884 Chuck for holding a device under test
03/06/2008US20080054883 Chuck for holding a device under test
03/06/2008US20080054880 Measurement device, method, program, and recording medium
03/06/2008US20080054847 Battery Characterization Technique
03/06/2008US20080054798 Organic light emitting display device and mother substrate of the same
03/06/2008US20080054261 Semiconductor package having test pads on top and bottom substrate surfaces and method of testing same
03/06/2008US20080054260 Semiconductor Integrated Circuit Device, Method For Testing The Semiconductor Integrated Circuit Device, Semiconductor Wafer And Burn-In Test Apparatus
03/06/2008US20080053715 Battery control apparatus, electric vehicle, and computer-readable medium storing a program that causes a computer to execute processing for estimating a state of charge of a secondary battery
03/06/2008US20080053123 Cooling air flow control valve for burn-in system
03/06/2008DE202006020292U1 Vorrichtung zur Batteriezustandsüberwachung Apparatus for battery state monitoring
03/06/2008DE112005003538T5 IC-Chip-Baustein, Testeinrichtung und Schnittstelle zum Ausführen eines Funktionstests eines in dem Chip-Baustein enthaltenen Chips IC chip module, test device and interface for performing a functional test of a chip contained in the chip-module
03/06/2008DE112005003533T5 Handhabungsvorrichtung für elektronische Bauelemente Handling device for electronic components
03/06/2008DE112004002723T5 Prüfvorrichtung und -verfahren für eine Halbleitervorrichtung Tester and method for a semiconductor device
03/06/2008DE102006041193A1 Output stage for use in current controlled valve of e.g. brake circuit of motor vehicle, has measuring device measuring resistances of coils or coil arrangement having coils of current controlled valves
03/06/2008DE102006040737A1 Electromagnetic valve output stage shunt recognizing device for motor vehicle`s brake circuit, has test pad arranged parallel to output stage-transitor to adjust current flow via coil, and comprising voltage comparator to measure variables
03/06/2008CA2662840A1 Distributed antenna communications system and methods of implementing thereof
03/05/2008EP1895711A2 Diagnostic system for a modular fieldbus board
03/05/2008EP1895313A1 Method and device to help diagnose battery failure in an automobile vehicle
03/05/2008EP1895312A1 Battery control device, battery control method, power source control device and electronic apparatus
03/05/2008EP1895311A1 Load calculation control method and apparatus
03/05/2008EP1894339A2 Device forming a logic gate for detecting a logic error
03/05/2008EP1894252A2 Monolithically integrated semiconductor assembly comprising a power component and method for producing a monolithically integrated semiconductor assembly
03/05/2008EP1894235A2 Method of preparing electrode
03/05/2008EP1894074A2 Methods and apparatus for optimizing environmental humidity
03/05/2008EP1894029A1 Rfid device variable test systems and methods
03/05/2008EP1894028A1 Method for recognising errors in signal processing circuit components, im particular for a measuring transducer
03/05/2008EP1894027A1 Apparatus for testing electronic devices
03/05/2008EP1893270A2 Pressure sensing device with test circuit
03/05/2008EP1828895A4 An efficient mechanism for fast recovery in case of border router node failure in a computer network
03/05/2008EP1695425B1 Method and device for detecting a broad-band noise source in a direct voltage distribution network
03/05/2008EP1606638B1 Method of precisely determining the location of a fault on an electrical transmision system
03/05/2008CN201032487Y Circuitry poor contact detector
03/05/2008CN201032486Y Mutual inductor connection correcting unit
03/05/2008CN101137969A Interface for compressed data transfer between host system and parallel data processing system
03/05/2008CN101137947A Apparatus and method for controlling temperature in a chuck system
03/05/2008CN101137912A Element substrate, inspection method, and manufacturing method of semiconductor device
03/05/2008CN101137911A Method and device for testing semiconductor wafers using a chuck device whose temperature can be regulated
03/05/2008CN101137074A Modularized equipment, management module and managed module
03/05/2008CN101136661A Non-contact type electrical apparatus line fault testing device
03/05/2008CN101136348A Semiconductor device and method for evaluating characteristics of the same
03/05/2008CN101136347A MOS pipe interface state testing method
03/05/2008CN101136297A System and method for producing flat display device
03/05/2008CN101136156A Array tester
03/05/2008CN101135896A On-off value data acquisition module
03/05/2008CN101135721A Topological circuit suitable for accumulator battery all-round property testing
03/05/2008CN101135720A System for detecting battery electric quantity and mobile phone thereof
03/05/2008CN101135719A Electric machine load simulate mechanism
03/05/2008CN101135718A Driver circuit
03/05/2008CN101135717A On-site programmable gate array duplex selector verification method
03/05/2008CN101135716A Method and apparatus for measuring leakage current
03/05/2008CN101135715A North direction interface data integrity verification method
03/05/2008CN101135714A Portrayal circuit substrate checking device
03/05/2008CN101135713A PCB non-contact type test method and apparatus
03/05/2008CN101135712A Multifunctional electrical cable detecting method and device thereof
03/05/2008CN101135711A Photoelectric device parameter monitoring equipment
03/05/2008CN101135710A Circuit for detecting radio-frequency power amplifier output terminal port communicating condition
03/05/2008CN101135709A Live line measurement method and apparatus for zero phase-sequence impedance parameter of mutual inductance circuit containing T type connection wire
03/05/2008CN101135708A Removable artificial mathematics chain circuit device for close-in fault experiment
03/05/2008CN101135707A Analysis method for electrical characteristic of parallel connection and parallel-serial connected piezoelectric voltage transformer
03/05/2008CN101135706A Wafer testing module
03/05/2008CN101135703A On-line measurement method of AC motor stator winding leakage current
03/05/2008CN101135700A Microcomputer electric detecting probe fasten with multiple layer elastic
03/05/2008CN101135698A Active wheel speed sensor tester
03/05/2008CN101135602A Double polar plate flow field liquid visual apparatus and method
03/05/2008CN101135599A Fuel battery membrane electrode leak detector
03/05/2008CN101135596A Measurement control method taking DC electric machine as force measuring device and realizing device thereof
03/05/2008CN100373772C On-chip fast signal generating circuit in alternating current sweep test
03/05/2008CN100373613C Test pattern of semiconductor device and test method using the same
03/05/2008CN100373346C Device and method for checking up bit wide confersion data
03/05/2008CN100373168C X diffraction in-situ testing device for electrode charge and discharge process
03/05/2008CN100373167C Cooling assembly with direct cooling of active electronic components
03/05/2008CN100373166C Device for detecting transformer winding state utilizing sweep frequency power source exciting
03/05/2008CN100373165C Ball grid array substrate detecting device and constructive method thereof
03/05/2008CN100373164C Testing system of IC card interface electric characteristics
03/05/2008CN100372703C Monitoring method and device with early warning for power supply on vehicle
03/04/2008US7340707 Automatic tuning of signal timing