| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/12/2008 | CN101142492A High-speed level sensitive scan design test scheme with pipelined test clocks |
| 03/12/2008 | CN101142491A Rfid application test systems and methods |
| 03/12/2008 | CN101142490A Wiring connected state inspecting instrument |
| 03/12/2008 | CN101142475A Semiconductor wafer metrology apparatus and methods |
| 03/12/2008 | CN101141316A Networking boundary scanning test control system and test approach |
| 03/12/2008 | CN101141125A Fet monitoring and protecting system |
| 03/12/2008 | CN101141077A Battery control device, battery control method, power source control device and electronic apparatus |
| 03/12/2008 | CN101141076A Battery management system and method |
| 03/12/2008 | CN101141016A Battery management system and method |
| 03/12/2008 | CN101141013A Battery management system and driving method thereof |
| 03/12/2008 | CN101141012A Collective and distributive type power batteries dynamic equilibria management system |
| 03/12/2008 | CN101140995A Method and apparatus for indicating extra battery power shortage state |
| 03/12/2008 | CN101140726A Panel lighting test machine and detecting method thereof |
| 03/12/2008 | CN101140725A System for producing display apparatus |
| 03/12/2008 | CN101140596A On-site programmable gate array research table verification method |
| 03/12/2008 | CN101140317A Assembled battery total voltage detection and leak detection apparatus |
| 03/12/2008 | CN101140316A Method and apparatus for monitoring the condition of a battery by measuring its internal resistance |
| 03/12/2008 | CN101140315A FPGA logical code downloading method under JTAG downloading mode and downloading system thereof |
| 03/12/2008 | CN101140314A On-site programmable gate array wire laying channel verification method and system thereof |
| 03/12/2008 | CN101140313A Methods and apparatus for inline measurement of switching delay history effects in pd-soi technology |
| 03/12/2008 | CN101140312A Plasma display board electric pole short circuit, broken circuit detecting method and device thereof |
| 03/12/2008 | CN101140311A Connector contact condition automatic detection device and method |
| 03/12/2008 | CN101140310A Detecting system of printed circuit boards half-finished product plate |
| 03/12/2008 | CN101140309A Detecting method of collector rail power supply quality |
| 03/12/2008 | CN101140308A Method for detecting false locking of phase-locked loop |
| 03/12/2008 | CN101140307A Automatically visual inspection method |
| 03/12/2008 | CN101140302A Detecting device of battery voltage reference position and detecting method thereof |
| 03/12/2008 | CN101140301A Zero waiting current accurate excess voltage comparators |
| 03/12/2008 | CN101140298A Reset device of test accesses terminal port of JTAG chain circuit used on board |
| 03/12/2008 | CN101140297A Apparatus and method for limiting over travel in a probe card assembly |
| 03/12/2008 | CN100375588C Vision inspection apparatus using a full reflection mirror |
| 03/12/2008 | CN100375362C Cell low-voltage protector |
| 03/12/2008 | CN100375322C Battery discriminating method |
| 03/12/2008 | CN100375277C Temperature compensating device of module type integrated circuit test processor |
| 03/12/2008 | CN100375199C Semiconductor integrated circuit device |
| 03/12/2008 | CN100375198C Semiconductor device equiped with memory and logical chips for testing memory ships |
| 03/12/2008 | CN100375197C Method for testing non-volatile memory |
| 03/12/2008 | CN100375194C Semiconductor integrated circuit device |
| 03/12/2008 | CN100374872C Semiconductor PN node diode device temperature rise measuring method and apparatus |
| 03/12/2008 | CN100374871C Detecting device and its method for DC system earthing fault |
| 03/12/2008 | CN100374870C Apparatus with interchangeable modules for measuring characteristics of cables and networks |
| 03/12/2008 | CN100374869C Apparatus for testing liquid crystal display device and testing method thereof |
| 03/12/2008 | CN100374867C Electro optical voltage sensor used for high voltage |
| 03/11/2008 | US7343579 Reconfigurable environmentally adaptive computing |
| 03/11/2008 | US7343571 Simulation model for a semiconductor device describing a quasi-static density of a carrier as a non-quasi-static model |
| 03/11/2008 | US7343558 Configurable automatic-test-equipment system |
| 03/11/2008 | US7343547 Semiconductor integrated circuit, and semiconductor system including that semiconductor integrated circuit |
| 03/11/2008 | US7343538 Programmable multi-function module for automatic test equipment systems |
| 03/11/2008 | US7343537 IC with protocol selection memory coupled to serial scan path |
| 03/11/2008 | US7343536 Scan based automatic test pattern generation (ATPG) test circuit, test method using the test circuit, and scan chain reordering method |
| 03/11/2008 | US7343535 Embedded testing capability for integrated serializer/deserializers |
| 03/11/2008 | US7343387 Algorithm for configuring clocking system |
| 03/11/2008 | US7343276 Recording media including code for estimating IC power consumption |
| 03/11/2008 | US7343259 Test apparatus and program therefor |
| 03/11/2008 | US7343254 Resolver digital converter |
| 03/11/2008 | US7342891 Port information display system and method for displaying port performance of network devices |
| 03/11/2008 | US7342890 Data duplication for transmission over computer networks |
| 03/11/2008 | US7342886 Method and apparatus for managing individual traffic flows |
| 03/11/2008 | US7342881 Backpressure history mechanism in flow control |
| 03/11/2008 | US7342880 Video information transmission system, and apparatus and program used for video information transmission system |
| 03/11/2008 | US7342878 Input port routing circuit that performs output port filtering |
| 03/11/2008 | US7342875 Space-time coded OFDM system for MMDS applications |
| 03/11/2008 | US7342874 High-availability packet forwarding apparatus and method |
| 03/11/2008 | US7342563 Substrate assembly, method of testing the substrate assembly, electrooptical device, method of manufacturing the electrooptical device, and electronic equipment |
| 03/11/2008 | US7342524 Waveform generator, waveform shaper, and testing apparatus |
| 03/11/2008 | US7342410 Display device and pixel testing method thereof |
| 03/11/2008 | US7342409 System for testing semiconductor components |
| 03/11/2008 | US7342408 Semiconductor test device using leakage current and compensation system of leakage current |
| 03/11/2008 | US7342407 Temperature compensation circuit and testing apparatus |
| 03/11/2008 | US7342406 Methods and apparatus for inline variability measurement of integrated circuit components |
| 03/11/2008 | US7342405 Apparatus for reducing power supply noise in an integrated circuit |
| 03/11/2008 | US7342404 Device for measurement and analysis of electrical signals of an integrated circuit component |
| 03/11/2008 | US7342402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features |
| 03/11/2008 | US7342400 Method and apparatus for measuring employing main and remote units |
| 03/11/2008 | US7342381 Method and system for battery protection employing sampling of measurements |
| 03/11/2008 | US7341193 Portable diagnostic device |
| 03/11/2008 | US7340972 Apparatus and method for balancing and for providing a compliant range to a test head |
| 03/11/2008 | CA2439248C Power supply for tetherless workstations |
| 03/11/2008 | CA2344241C Method and device for locating an insulation fault in an electric cable |
| 03/06/2008 | WO2008028171A2 Method and apparatus for switching tester resources |
| 03/06/2008 | WO2008026997A1 A method and a device for determining the moisture content in a part of the insulation of a power transformer during drying thereof |
| 03/06/2008 | WO2008026525A1 Secondary battery control system and hybrid vehicle equipped with same |
| 03/06/2008 | WO2008026477A1 Method and device for estimating soc value of secondary battery and degradation judging method and device |
| 03/06/2008 | WO2008026476A1 Method and device for estimating soc value of secondary battery and degradation judging method and device |
| 03/06/2008 | WO2008026392A1 Inspection apparatus for semiconductor integrated circuit |
| 03/06/2008 | WO2008026291A1 Partial discharge detection method and partial discharge detection device |
| 03/06/2008 | WO2008026177A1 Multi-clock system-on-chip with universal clock control modules for transition fault test at speed multi-core |
| 03/06/2008 | WO2008025308A1 Method for producing an error signal that indicates an error in a capacitor arrangement and electric protection device for carrying out said method |
| 03/06/2008 | WO2008008156A3 Electron induced chemical etching for device diagnosis |
| 03/06/2008 | WO2008004141A3 Circuit for detecting the duty cycle of clock signals |
| 03/06/2008 | WO2007021436A3 Directional power detection by quadrature sampling |
| 03/06/2008 | WO2006121882A3 Parallel input/output self-test circuit and method |
| 03/06/2008 | US20080059858 Load generating apparatus and load testing method |
| 03/06/2008 | US20080059857 Methods and apparatus for testing a scan chain to isolate defects |
| 03/06/2008 | US20080059856 Method of defining fault pattern of equipment and method of monitoring equipment using the same |
| 03/06/2008 | US20080059855 Selectively accessing test access ports in a multiple test access port environment |
| 03/06/2008 | US20080059854 Merged MISR and Output Register Without Performance Impact for Circuits Under Test |
| 03/06/2008 | US20080059853 Semiconductor Integrated Circuit |
| 03/06/2008 | US20080059848 Data transmission speed test system and method |
| 03/06/2008 | US20080059842 Dynamic verification traversal strategies |