Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2008
03/20/2008US20080068027 Power line surge arrestor monitoring system
03/20/2008US20080068026 Method of and a Monitoring Arrangement for Monitoring the Mercury Condensation in an Arc Tube
03/20/2008US20080067979 Electronic apparatus and display method of remaining battery level
03/20/2008US20080067963 Non-Intrusive Method For Extrapolating An Internal Stator Temperature
03/20/2008US20080067619 Stress sensor for in-situ measurement of package-induced stress in semiconductor devices
03/20/2008DE202005021434U1 Thermooptische Einspannvorrichtung Thermo-optical jig
03/20/2008DE112006001038T5 Prüfvorrichtung Tester
03/19/2008EP1901413A2 Battery management system and method
03/19/2008EP1901389A2 Power supply system and motor car
03/19/2008EP1901356A1 Testing circuit, wafer, measuring apparatus, device manufacturing method and display device
03/19/2008EP1901081A1 Device and method for determining the status of a battery
03/19/2008EP1901080A1 Semiconductor failure analyzing apparatus, semiconductor failure analyzing method, semiconductor failure analyzing program and semiconductor failure analyzing system
03/19/2008EP1901079A1 Semiconductor defect analyzing device, defect analyzing method, and defect analyzing program
03/19/2008EP1900259A1 Method and system for controling a luminaire
03/19/2008EP1900075A1 Method and apparatus of estimating state of health of battery
03/19/2008EP1899876A1 System and method for using model analysis to generate directed test vectors
03/19/2008EP1899739A1 Method for determining an asynchronous engine temperature and unit for controlling the power supply of an engine therefor
03/19/2008EP1899738A1 Test apparatus with tester channel availability identification
03/19/2008EP1815260B1 Method and device for detecting electric arc phenomenon on at least one electric cable
03/19/2008EP1808027B1 Arrangement for monitoring patch fields at distribution points in data networks
03/19/2008EP1561122B1 Retrofit kit for interconnect cabling system
03/19/2008EP1358500B1 Tap changer condition diagnosing
03/19/2008CN201039572Y Alarm high-voltage discharger
03/19/2008CN201038815Y Electronic rectified stabilizer for automobile
03/19/2008CN201038729Y Electric water heater electricity-proof device with time-sharing detection function
03/19/2008CN201038715Y Neutral conductor breakage detecting and protection device
03/19/2008CN201038268Y Collecting-distributing type power battery pack dynamic balance management device
03/19/2008CN201038264Y Lithium ion battery emulated three electrode system
03/19/2008CN201038234Y Double-electrode simulation battery
03/19/2008CN201038087Y Residual current operated protector dedicated switching device
03/19/2008CN201037866Y Single-sheet voltage high speed polling device for fuel battery
03/19/2008CN201037865Y Piezoresistance testing and sorting device
03/19/2008CN201037864Y Electric current working module for on-line measuring accumulator internal resistance and accumulator internal resistance on-line measuring instrument
03/19/2008CN201037863Y Voltage measurement module for on-line measuring accumulator internal resistance and accumulator internal resistance on-line measuring instrument
03/19/2008CN201037862Y Accumulator tester
03/19/2008CN201037861Y Improved carbon pile accumulator tester
03/19/2008CN201037860Y Battery testing device
03/19/2008CN201037859Y Test bench with multiple testing-bases and sequential arrangement charging area, testing area and discharging area
03/19/2008CN201037858Y Electronic product high-temperature aging low-temperature cooling device
03/19/2008CN201037857Y Device for testing output current of charger
03/19/2008CN201037846Y Measuring appliance
03/19/2008CN201037845Y Measuring rack
03/19/2008CN201037843Y Breaker detecting clamp
03/19/2008CN201037842Y Special-purpose mobile loading vehicle for set examination
03/19/2008CN101147264A Testing circuit, wafer, measuring device, component making method and display device
03/19/2008CN101147206A Test device and test method
03/19/2008CN101147204A Tester and selector
03/19/2008CN101147078A Maximum and minimum power limit calculator for batteries and battery subpacks
03/19/2008CN101147077A Simultaneous core testing in multi-core integrated circuits
03/19/2008CN101147076A Circuit arrangement and method of testing and/or diagnosing the same
03/19/2008CN101147075A Test device, test method, and test control program
03/19/2008CN101147074A Diagnostic program, a switching program, a testing apparatus, and a diagnostic method
03/19/2008CN101147073A Test apparatus, diagnosing program and diagnosing method therefor
03/19/2008CN101145770A Delay circuit, test apparatus, storage medium, semiconductor chip, initializing circuit and initializing method
03/19/2008CN101145686A Power tool
03/19/2008CN101145354A Optical driver and optical storage medium
03/19/2008CN101145122A Touch panel test machine platform
03/19/2008CN101145118A SPARC processor single particle effect detection device and method
03/19/2008CN101144851A Power supply device checking device
03/19/2008CN101144850A Fuel cell voltage attenuation quick determination method and device
03/19/2008CN101144849A Motor fault warning device
03/19/2008CN101144848A Multifunctional integrative life experimental platform and its control method
03/19/2008CN101144847A An integrated circuit and method for specifying an integrated circuit
03/19/2008CN101144846A Register circuit, scanning register circuit applying same and scanning method
03/19/2008CN101144845A Electric power semiconductor chip gate cathode junction pressurization test method and device
03/19/2008CN101144844A Chip welding quality checking method
03/19/2008CN101144843A On-line automatic test device for matrix array type signal sampling and method
03/19/2008CN101144842A Display device definition test card and its definition measuring method
03/19/2008CN101144837A Voltage detection circuit and control method
03/19/2008CN101144836A Voltage detection circuit and control method
03/19/2008CN101144830A Nonlinear resistor valve sheet for leakage detector and its preparation method
03/19/2008CN101144829A PC board checking device
03/19/2008CN101144741A Temperature detector
03/19/2008CN100375903C Normal work detecting method for drum type motor
03/19/2008CN100375902C Testing method for dynamic characterist ics of electromagnetic relay
03/18/2008US7346870 System and method for verifying trace widths of a PCB layout
03/18/2008US7346825 Error method, system and medium
03/18/2008US7346824 Match circuit for performing pattern recognition in a performance counter
03/18/2008US7346823 Automatic built-in self-test of logic with seeding from on-chip memory
03/18/2008US7346822 Integrated circuit
03/18/2008US7346821 IC with JTAG port, linking module, and off-chip TAP interface
03/18/2008US7346820 Testing of data retention latches in circuit devices
03/18/2008US7346819 Through-core self-test with multiple loopbacks
03/18/2008US7346814 System and method for controlling power sources of motherboards under test through networks
03/18/2008US7346788 Method and system for monitoring module power information in a communication device
03/18/2008US7346749 Method for storing register properties in a datastructure and related datastructure
03/18/2008US7346712 Semiconductor integrated circuit apparatus and circuit board and information readout method
03/18/2008US7346102 Channel with domain crossing
03/18/2008US7346002 Electronic control unit
03/18/2008US7346000 Method and apparatus for throttling selected traffic flows
03/18/2008US7345992 System and method for embedding a sub-channel in a block coded data stream
03/18/2008US7345579 Trailer illumination system test drive and method of use
03/18/2008US7345538 Measuring circuit for the output of a power amplifier and a power amplifier comprising the measuring circuit
03/18/2008US7345501 Electro-optical device, electronic apparatus, and mounting structure
03/18/2008US7345500 Method and system for device characterization with array and decoder
03/18/2008US7345499 Method of Kelvin current sense in a semiconductor package
03/18/2008US7345498 Method and measurement program for burn-in test of two semiconductor devices simultaneously
03/18/2008US7345497 Protection circuit for semiconductor device and semiconductor device including the same
03/18/2008US7345496 Semiconductor apparatus and test execution method for semiconductor apparatus
03/18/2008US7345495 Temperature and voltage controlled integrated circuit processes