| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/26/2008 | CN101149416A Power cable insulation state monitoring and life span management system |
| 03/26/2008 | CN101149415A Handler |
| 03/26/2008 | CN101149414A Electrostatic discharge test device and method |
| 03/26/2008 | CN101149413A Method for optimizing probe station pricking times |
| 03/26/2008 | CN101149412A Programmable controller digital-control type cycle voltage falling emulation generator |
| 03/26/2008 | CN101149411A Portable electronic device test system and method |
| 03/26/2008 | CN101149408A T-shaped transmission line zero-sequence resistance parameter live line measurement method and device |
| 03/26/2008 | CN101149407A Method and device for power frequency inference source live line measurement for mutual inductance line zero-sequence impedance parameter |
| 03/26/2008 | CN101149397A Ignition device for high voltage electric appliance experiment circuit |
| 03/26/2008 | CN101149396A Interface apparatus for electronic device test apparatus |
| 03/26/2008 | CN101149395A Connector assembly, receptacle type connector, and interface apparatus |
| 03/26/2008 | CN101149394A Pushing block and a handler with the pushing block |
| 03/26/2008 | CN101149392A Wafer test card over current protection method and related wafer test system |
| 03/26/2008 | CN101149391A Differential capacitance type sensor detection circuit |
| 03/26/2008 | CN101149310A Automobile electric chair noise and motor current detection device |
| 03/26/2008 | CN101148226A Picker and head assembly with the pickers |
| 03/26/2008 | CN100377517C Fault-tolerant broadcast router |
| 03/26/2008 | CN100377476C Manufacturing method of motor |
| 03/26/2008 | CN100377328C Direct calculation method of interface trap in MOS semiconductor field-effect rransistor |
| 03/26/2008 | CN100377260C Dynamic memory and method for testing dynamic memory |
| 03/26/2008 | CN100377102C Host panel functional test board |
| 03/26/2008 | CN100377101C Method and system for testing host computer board including interconnecting peripheries quickly |
| 03/26/2008 | CN100377098C Method and apparatus for customizing and monitoring multiple interfaces and implementing enhanced fault tolerance and isolation features |
| 03/26/2008 | CN100376901C Electronic unit testing set |
| 03/26/2008 | CN100376900C Transformer overload automatic test method |
| 03/26/2008 | CN100376899C Semiconductor integrated circuit, and electrostatic withstand voltage test method and apparatus therefor |
| 03/26/2008 | CN100376898C Test tool for membrane electrode group |
| 03/26/2008 | CN100376896C BGA tester on circuit board |
| 03/26/2008 | CN100376209C Method and device for diagnosing failure of blood oxygen sensor |
| 03/25/2008 | USRE40188 System and method for providing an integrated circuit with a unique identification |
| 03/25/2008 | US7350134 Method and apparatus of reloading erroneous configuration data frames during configuration of programmable logic devices |
| 03/25/2008 | US7350123 Test apparatus, correction value managing method, and computer program |
| 03/25/2008 | US7350122 Method, apparatus and computer program product for implementing scan-chain-specific control signals as part of a scan chain |
| 03/25/2008 | US7350121 Programmable embedded logic analyzer in an integrated circuit |
| 03/25/2008 | US7350120 Buffered memory module and method for testing same |
| 03/25/2008 | US7350106 Device for aiding the locating of failure of a complex system |
| 03/25/2008 | US7349816 Battery management system and apparatus with runtime analysis reporting |
| 03/25/2008 | US7349617 Test apparatus and cable guide unit |
| 03/25/2008 | US7349575 Pattern inspection method and apparatus, and pattern alignment method |
| 03/25/2008 | US7349506 Semiconductor integrated circuit and method for testing the same |
| 03/25/2008 | US7349418 Residue-based encoding of packet lengths of particular use in processing and scheduling packets |
| 03/25/2008 | US7349345 Method and apparatus for testing communications between a network edge device and a customer premises device |
| 03/25/2008 | US7349342 Traffic metering in data networks |
| 03/25/2008 | US7349341 Procedure for sorting flows in a transport network carrying circuit data flows |
| 03/25/2008 | US7349335 Packet metering in high-speed network units |
| 03/25/2008 | US7349334 Method, system and program product for actively managing central queue buffer allocation using a backpressure mechanism |
| 03/25/2008 | US7349332 Apparatus for queuing different traffic types |
| 03/25/2008 | US7349223 Enhanced compliant probe card systems having improved planarity |
| 03/25/2008 | US7348793 Method and apparatus for detection and prevention of bulk CMOS latchup |
| 03/25/2008 | US7348792 Packaging reliability super chips |
| 03/25/2008 | US7348791 High voltage, high frequency, high reliability, high density, high temperature automated test equipment (ATE) switch design |
| 03/25/2008 | US7348790 AC testing of leakage current in integrated circuits using RC time constant |
| 03/25/2008 | US7348789 Integrated circuit device with on-chip setup/hold measuring circuit |
| 03/25/2008 | US7348788 Probing card and inspection apparatus for microstructure |
| 03/25/2008 | US7348787 Wafer probe station having environment control enclosure |
| 03/25/2008 | US7348786 Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication |
| 03/25/2008 | US7348785 Method and apparatus for magnetically achieving electrical continuity |
| 03/25/2008 | US7348768 Tray transfer unit and automatic test handler having the same |
| 03/25/2008 | US7348761 Information terminal and battery remaining capacity calculating method |
| 03/25/2008 | US7348682 Method and structures for indexing dice |
| 03/25/2008 | US7348595 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
| 03/25/2008 | US7348559 Defect inspection and charged particle beam apparatus |
| 03/25/2008 | US7348558 Charged particle beam apparatus and automatic astigmatism adjustment method |
| 03/25/2008 | US7348190 Method of detecting a defect in a semiconductor device |
| 03/25/2008 | US7347702 Contact carriers (tiles) for populating larger substrates with spring contacts |
| 03/20/2008 | WO2008033479A2 Distributing metering responses for load balancing an amr network |
| 03/20/2008 | WO2008033428A2 Compliance partitioning in testing of integrated circuits |
| 03/20/2008 | WO2008033293A2 Distributing metering responses for load balancing an amr network |
| 03/20/2008 | WO2008033064A1 Method and device for automatic monitoring of battery insulation condition. |
| 03/20/2008 | WO2008032397A1 Electronic component testing apparatus |
| 03/20/2008 | WO2008032396A1 Test tray and electronic component testing apparatus provided with same |
| 03/20/2008 | WO2008032179A1 Hot testing of semiconductor devices |
| 03/20/2008 | WO2008031653A1 Loading device |
| 03/20/2008 | WO2008031404A1 Alternating current switch device and method for the monitoring or diagnosis of the operability of an alternating current switch device |
| 03/20/2008 | WO2008010038A3 Apparatus for testing an arc fault circuit interrupter |
| 03/20/2008 | WO2008009566A3 Method and device for analyzing electric cable networks |
| 03/20/2008 | WO2008008367A3 System-on-a-chip (soc) test interface security |
| 03/20/2008 | WO2008005112A3 Configurable voltage regulator |
| 03/20/2008 | WO2007111727A3 Ring oscillator for determining select-to-output delay of a multiplexer |
| 03/20/2008 | WO2007091123B1 System and method of determining the speed of digital application specific integrated circuits |
| 03/20/2008 | US20080072112 Sequential Scan Technique Providing Reliable Testing of an Integrated Circuit |
| 03/20/2008 | US20080072111 Method for performing a test case with a LBIST engine on an integrated circuit, integrated circuit and method for specifying an integrated circuit |
| 03/20/2008 | US20080072110 Circuitry and method to detect conditions of data |
| 03/20/2008 | US20080071513 Test generation for low power circuits |
| 03/20/2008 | US20080071486 Semiconductor device with its test time reduced and a test method therefor |
| 03/20/2008 | US20080071484 Device and method for battery state determination |
| 03/20/2008 | US20080071483 Battery health monitor |
| 03/20/2008 | US20080070438 Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same |
| 03/20/2008 | US20080070330 Fabrication method of semiconductor integrated circuit device |
| 03/20/2008 | US20080069003 Testing Apparatus And Testing Method |
| 03/20/2008 | US20080068994 Distributing metering responses for load balancing an AMR network |
| 03/20/2008 | US20080068987 Loop network system and data storage devices included therein |
| 03/20/2008 | US20080068984 Transmission device |
| 03/20/2008 | US20080068038 Systems and Methods for Controlling of Electro-Migration |
| 03/20/2008 | US20080068037 Semiconductor device, method for measuring characteristics of element to be measured, and characteristic management system of semiconductor device |
| 03/20/2008 | US20080068036 Semiconductor test system capable of virtual test and semiconductor test method thereof |
| 03/20/2008 | US20080068035 Knee probe having reduced thickness section for control of scrub motion |
| 03/20/2008 | US20080068034 Probe array wafer |
| 03/20/2008 | US20080068033 Method for re-registering an object to be aligned and storage medium storing a program for executing the method |
| 03/20/2008 | US20080068029 Capacitance measuring apparatus and capacitance measuring method |