Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2008
07/17/2008WO2008085462A1 Test head vertical support system
07/17/2008WO2008084791A1 Lithium secondary cell degradation detection method, degradation detector, degradation suppressing device, and cell pack using the same, battery charger
07/17/2008WO2008046980A3 Method for controlling the end of the discharge of a rechargeable battery
07/17/2008WO2007136977A3 Methods and apparatus for testing delay locked loops and clock skew
07/17/2008WO2007084970B1 Method and apparatus for nondestructively evaluating light-emitting materials
07/17/2008WO2006138488A3 Reduced-pin-count-testing architectures for applying test patterns
07/17/2008US20080172588 System and method for testing multiple packet data transmitters
07/17/2008US20080172587 Lowering Power Consumption During Logic Built-In Self-Testing (LBIST) Via Channel Suppression
07/17/2008US20080172586 Direct scan access jtag
07/17/2008US20080172202 Short-circuit detection circuit, resolver-digital converter, and digital angle detection apparatus
07/17/2008US20080172195 Semiconductor device, and test circuit and test method for testing semiconductor device
07/17/2008US20080172190 Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems
07/17/2008US20080172189 Determining Die Health by Expanding Electrical Test Data to Represent Untested Die
07/17/2008US20080171452 Interposer, Probe Card and Method for Manufacturing the Interposer
07/17/2008US20080171141 Led array
07/17/2008US20080170502 Method and system for monitoring data flow in an IP network device
07/17/2008US20080170494 Communication control apparatus, method and program thereof
07/17/2008US20080170195 Display panel, method of inspecting the display panel and method of manufacturing the display panel
07/17/2008US20080169832 Automated loading/unloading of devices for burn-in testing
07/17/2008US20080169831 Batch-test system with a chip tray
07/17/2008US20080169823 Apparatus and Method for High-Speed SAS Link Protocol Testing
07/17/2008US20080169822 Substrate testing device and method thereof
07/17/2008US20080169821 Inspection methods for defects in electrophoretic display and related devices
07/17/2008US20080169820 Battery voltage measuring system
07/17/2008US20080169819 Internal Impedance Detecting Apparatus, Internal Impedance Detecting Method, Degradation Degree Detecting Apparatus, and Degradation Degree Detecting Method
07/17/2008US20080169818 Systems and methods for monitoring and storing performance and maintenance data related to an electrical component
07/17/2008US20080169804 Semiconductor device and electronics device
07/17/2008US20080169435 Ion beam monitoring arrangement
07/17/2008DE202008001948U1 Sockel, insbesondere Test- oder Programmiersockel, für ein elektronisches Bauelement Socket, in particular a test or programming socket, for an electronic component
07/17/2008DE102008003534A1 Messfühler für eine Hochfrequenz-Signalübertragung und Messfühlerkarte, die gleichen verwendet. Sensors for a high-frequency signal transmission and probe card using the same.
07/17/2008DE102007051831A1 Vorrichtung und Verfahren zum Identifiziern der Gegenwart von hohen Leitfähigkeits- oder Permittivitätszuständen in elektrisch isolierenden Materialien Apparatus and method for Identifiziern the presence of high conductivity or Permittivitätszuständen in electrically insulating materials
07/17/2008DE102007002176A1 Erfassungseinrichtung zum Erfassen des Schaltzustands eines elektromagnetischen Schaltgeräts Detecting means for detecting the switching state of an electromagnetic switching device
07/17/2008CA2675017A1 Method and system to measure series-connected cell voltages using a flying capacitor
07/16/2008EP1944674A1 Control assembly for producing a temperature compensated reference value for voltage or electric current
07/16/2008EP1944616A2 Battery residual quantity display method and electronic equipment
07/16/2008EP1944615A1 Detection of a malfunction of a digital counter
07/16/2008EP1944614A1 Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination
07/16/2008EP1943534A2 Analog ic having test arrangement and test method for such an ic
07/16/2008EP1943533A1 Ic testing methods and apparatus
07/16/2008EP1943532A1 Ic testing methods and apparatus
07/16/2008EP1943531A1 Ic testing methods and apparatus
07/16/2008EP1943530A1 Device for analyzing an integrated circuit
07/16/2008EP1943529A2 Memory scan testing
07/16/2008EP1430317B1 Tap switch for frequency response and partial discharge measurement
07/16/2008EP1177453B8 Apparatus and method for electrical measurements on conductors
07/16/2008CN201087880Y Connection port testing device
07/16/2008CN201087847Y Strip device testing jig with self-compensation function
07/16/2008CN201087841Y Testing clamp seat with airtight seal ring, its sorting machine and test machine
07/16/2008CN101223726A Emulation and debug interfaces for testing an integrated circuit with an asynchronous microcontroller
07/16/2008CN101223452A Ternary search process
07/16/2008CN101223451A Method of manufacturing a system in package
07/16/2008CN101223450A Low power transmission provisioning for wireless network devices
07/16/2008CN101223449A Apparatus, system and method for testing electronic elements
07/16/2008CN101222822A Printed wiring board unit for method of detecting rising level of electrically-conductive body in bore
07/16/2008CN101222489A Control of link supply power based on link port mode
07/16/2008CN101222208A Protection and automatic restoring system
07/16/2008CN101222075A Nickel-hydrogen battery charging method for mobile communication apparatus
07/16/2008CN101222073A Digital capacity measuring and repairing instrument for lead acid accumulator
07/16/2008CN101221524A Display equipment debugging system and method thereof
07/16/2008CN101221227A Test system and method for magnetic property of after-current actuating protector magnetic core
07/16/2008CN101221226A Automatic testing method and apparatus of electric power
07/16/2008CN101221225A Calibration method and device for battery voltage sampling
07/16/2008CN101221224A Method and system for monitoring an electrical energy storage device
07/16/2008CN101221223A Single slice battery essential resistance and voltage on-line testing system for fuel cell pile
07/16/2008CN101221222A Battery collection instrument and device for preventing collected battery set from short circuit
07/16/2008CN101221221A Bulb through-flow type hydraulic turbogenerator stator iron loss testing method
07/16/2008CN101221220A Generator set slow machine halt trouble discrimination method
07/16/2008CN101221219A Automatic checkout equipment of relay and its operation method
07/16/2008CN101221218A Measurement of analog coil voltage and coil current
07/16/2008CN101221217A SF6 gas density relay checking instrument and checking process
07/16/2008CN101221216A Path delay fault testing vector compression method and device
07/16/2008CN101221215A Simple tristate logic LED display circuit used for detecting digital circuit state
07/16/2008CN101221214A Microcontroller configuration interface
07/16/2008CN101221213A Analogue circuit fault diagnosis neural network method based on particle swarm algorithm
07/16/2008CN101221212A Inspection method, inspection apparatus and computer-readable storage medium storing program
07/16/2008CN101221211A Multi-field coupling experimental method and device based on analog IC service condition
07/16/2008CN101221210A Automatic testing and emendation system and method for finished circuit board
07/16/2008CN101221209A Circuit monitoring device
07/16/2008CN101221208A Motor vehicle signal lamp circuit monitoring device
07/16/2008CN101221207A Multi-core cable detecting device and method thereof
07/16/2008CN101221206A Method for diagnosing turn-to-turn short circuit of permanent magnet fault-tolerant motor
07/16/2008CN101221205A Mode control method of chip system
07/16/2008CN101221204A Method for confirming protection distance between extra-high voltage alternating current line and medium wave navigation station
07/16/2008CN101221194A High-frequency probe
07/16/2008CN101221135A Printed circuit board image skeletonization method based on FPGA
07/16/2008CN101221122A Adjustable light source and automatic optical detecting system with the same
07/16/2008CN101221109A Method for automatically testing and recording rated value of SF6 gas density relay
07/16/2008CN101221038A Polarizer axial measuring device and method thereof
07/16/2008CN101219053A Procedes et appareils pour des dispositifs alimentes par batteries.
07/16/2008CN100403506C Probe positioning and bonding device and probe bonding method
07/16/2008CN100403452C Method of measuring threshold voltage for a NAND flash memory device
07/16/2008CN100403449C Synchronized semiconductor memory
07/16/2008CN100403446C Multiport scanning chain register device and method
07/16/2008CN100403047C Memory output power test device
07/16/2008CN100403045C Plane constant speed transmission, integrated driving generator testing system
07/16/2008CN100403044C A circuit structure capable of automatic adjusting and measuring hysteresis window of hysteresis comparator
07/16/2008CN100403043C Pressing member and electronic component handling device
07/16/2008CN100403042C Insulating state on-line monitoring method of cross-linked PE cable
07/16/2008CN100403041C Automatic tuning and small current grounding failure wire selection system of master slave extinction coil
07/16/2008CN100403040C Lightning stroke test source with composite fiber overhead earth wire