| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/16/2008 | CN100403039C Method for checking circuit schematic diagram |
| 07/16/2008 | CN100403038C Test circuit of double Rutherford horizontal dual diffusion field-effect transistor conducting resistor |
| 07/16/2008 | CN100402985C Outer casing of online monitoring apparatus for power transmission line |
| 07/15/2008 | US7401334 Method, apparatus and computer program product for managing message flow in a multithreaded, message flow environment |
| 07/15/2008 | US7401281 Remote BIST high speed test and redundancy calculation |
| 07/15/2008 | US7401280 Self-verification of configuration memory in programmable logic devices |
| 07/15/2008 | US7401279 Scan path circuit and semiconductor integrated circuit comprising the scan path circuit |
| 07/15/2008 | US7401278 Edge-triggered master + LSSD slave binary latch |
| 07/15/2008 | US7401277 Semiconductor integrated circuit and scan test method therefor |
| 07/15/2008 | US7401276 Semiconductor device with test circuit and test method of the same |
| 07/15/2008 | US7401275 Automated test and characterization web services |
| 07/15/2008 | US7401274 Method of performing programming and diagnostic functions for a microcontroller |
| 07/15/2008 | US7401273 Recovery from errors in a data processing apparatus |
| 07/15/2008 | US7401271 Testing system and method of using same |
| 07/15/2008 | US7401257 Microcomputer and method for developing system program |
| 07/15/2008 | US7401164 Methodology for performing register read/writes to two or more expanders with a common test port |
| 07/15/2008 | US7400996 Use of I2C-based potentiometers to enable voltage rail variation under BMC control |
| 07/15/2008 | US7400995 Device and method for testing integrated circuits |
| 07/15/2008 | US7400630 Call admission control with overbooking support and cell loss ratio and cell delay variation guarantee |
| 07/15/2008 | US7400581 Load-balancing utilizing one or more threads of execution for implementing a protocol stack |
| 07/15/2008 | US7400577 Methods and systems for streaming data |
| 07/15/2008 | US7400555 Built in self test circuit for measuring total timing uncertainty in a digital data path |
| 07/15/2008 | US7400162 Integrated circuit testing methods using well bias modification |
| 07/15/2008 | US7400161 Electronic device test system |
| 07/15/2008 | US7400160 Semiconductor integrated circuit device, measurement method therefore and measurement system for measuring AC characteristics thereof |
| 07/15/2008 | US7400159 Integrated complex nano probe card and method of making same |
| 07/15/2008 | US7400158 Test fixture and method for testing a semi-finished chip package |
| 07/15/2008 | US7400157 Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes |
| 07/15/2008 | US7400156 Vertical probe device |
| 07/15/2008 | US7400155 Membrane probing system |
| 07/15/2008 | US7400154 Apparatus and method for detecting photon emissions from transistors |
| 07/15/2008 | US7400152 Diagnostic method for monitoring a plug-in connection |
| 07/15/2008 | US7400151 Connector crosstalk and return loss cancellation |
| 07/15/2008 | US7400150 Remote fault monitoring in power lines |
| 07/15/2008 | US7400149 Method for assessment of the state of batteries in battery-supported power supply systems |
| 07/15/2008 | US7400135 Test fixture and method for circuit board testing |
| 07/15/2008 | US7400134 Integrated circuit device with multiple chips in one package |
| 07/15/2008 | US7400130 Integrated circuit device |
| 07/15/2008 | US7400003 Structure of a CMOS image sensor and method for fabricating the same |
| 07/15/2008 | US7399647 Multi beam scanning with bright/dark field imaging |
| 07/15/2008 | US7399635 Impurity measuring method for Ge substrates |
| 07/15/2008 | CA2487876C Frequency characterization of quartz crystals |
| 07/15/2008 | CA2410266C Electrical load disconnection detecting apparatus |
| 07/10/2008 | WO2008083404A1 Microcircuit testing interface having kelvin and signal contacts within a single slot |
| 07/10/2008 | WO2008083400A1 Apparatus for and method of detecting loss of signal in a radio frequency cable |
| 07/10/2008 | WO2008083269A1 Compensating for harmonic distortion in an instrument channel |
| 07/10/2008 | WO2008083265A1 Identifying periodic jitter in a signal |
| 07/10/2008 | WO2008082980A2 Contact mechanism cleaning |
| 07/10/2008 | WO2008082859A2 Stiffener assembly for use with testing devices |
| 07/10/2008 | WO2008082847A2 Rotating contact element and methods of fabrication |
| 07/10/2008 | WO2008082815A2 Resilient contact element and methods of fabrication |
| 07/10/2008 | WO2008082769A1 Application management based on battery life |
| 07/10/2008 | WO2008082288A1 Method and system for estimating the lifetime of a battery |
| 07/10/2008 | WO2008082150A2 Test socket for semiconductor |
| 07/10/2008 | WO2008082010A1 Accumulator control device and vehicle |
| 07/10/2008 | WO2008081347A1 Method for testing a variable digital delay line and a device having variable digital delay line testing capabilities |
| 07/10/2008 | WO2008081106A1 Method for determining the discharge end threshold of a rechargeable battery |
| 07/10/2008 | WO2008080763A1 Method for controlling the electrical elements of an engine |
| 07/10/2008 | WO2008053410A3 Apparatus and method for determination of the state-of-charge of a battery when the battery is not in equilibrium |
| 07/10/2008 | WO2008030660A3 Method and apparatus for performing anonymous source routing |
| 07/10/2008 | WO2007147099A3 Device testing architecture, and method, and system |
| 07/10/2008 | WO2007121206A3 Method and system for alert throttling in media quality monitoring |
| 07/10/2008 | WO2007115235A3 Application specific distributed test engine architecture system and method |
| 07/10/2008 | WO2006086512A3 High density interconnect system for ic packages and interconnect assemblies |
| 07/10/2008 | US20080168318 Voltage Identifier Sorting |
| 07/10/2008 | US20080168309 On-chip service processor |
| 07/10/2008 | US20080168161 Systems and methods for managing faults within a high speed network employing wide ports |
| 07/10/2008 | US20080167827 Two-stage high impedance fault detection |
| 07/10/2008 | US20080167826 Method of recognizing signal mis-wiring of a three-phase circuit |
| 07/10/2008 | US20080167754 Ozone and other molecules sensors for electric fault detection |
| 07/10/2008 | US20080165691 Method and apparatus for providing a gigabit ethernet circuit pack |
| 07/10/2008 | US20080165685 Methods, systems, and computer program products for managing network bandwidth capacity |
| 07/10/2008 | US20080165679 Method to mitigate fraudulent usage of QoS from mobile terminals using uplink packet marking |
| 07/10/2008 | US20080165462 Leak Current Breaker and Method |
| 07/10/2008 | US20080164902 Inspection device for inspecting tft |
| 07/10/2008 | US20080164899 Temperature Control Device and Temparature Control Method |
| 07/10/2008 | US20080164898 Probe card for test of semiconductor chips and method for test of semiconductor chips using the same |
| 07/10/2008 | US20080164897 Method for testing semiconductor memory device using probe and semiconductor memory device using the same |
| 07/10/2008 | US20080164895 Device for probe card power bus noise reduction |
| 07/10/2008 | US20080164894 System and method for testing semiconductor integrated circuit in parallel |
| 07/10/2008 | US20080164893 Probe card for testing wafer |
| 07/10/2008 | US20080164892 Probe and Probe Card |
| 07/10/2008 | US20080164891 Universal grid composite circuit board testing tool |
| 07/10/2008 | US20080164884 Powered device power classification with increased current limit |
| 07/10/2008 | US20080164883 Power cycle test method for testing an electronic equipment |
| 07/10/2008 | US20080164882 System and Method to Measure Series-Connected Cell Voltages and Verify Measurement Accuracy |
| 07/10/2008 | US20080164881 Battery voltage monitoring apparatus |
| 07/10/2008 | US20080164864 Compensation of simple fibre optic faraday effect sensors |
| 07/10/2008 | US20080164863 Sampling of Optical Signals |
| 07/10/2008 | US20080164848 Calculating remaining battery capacity based on battery-side end voltage and device-side end voltage |
| 07/10/2008 | US20080164777 Device for Determining a Shaft Center Deviation |
| 07/10/2008 | US20080164762 Electronic battery testing in circuit |
| 07/10/2008 | US20080164584 Method and structure for reduction of soft error rates in integrated circuits |
| 07/10/2008 | DE202007002974U1 Signaleinrichtung für elektrische Überwachungsgeräte Signaling device for electrical monitoring devices |
| 07/10/2008 | DE202006020417U1 Schaltfederkontaktstift Switch spring pin |
| 07/10/2008 | DE112006002481T5 Prüfvorrichtung, Prüfverfahren, Programm und Aufzeichnungsmedium Tester, test method, program, and recording medium |
| 07/10/2008 | DE112006002329T5 Diagnosevorrichtung für elektrische Anlagen von Kraftfahrzeugen Diagnostic apparatus for electrical equipment for motor vehicles |
| 07/10/2008 | DE112005003666T5 Prüfvorrichtung für elektronische Bauelemente Electronic device testing apparatus |
| 07/10/2008 | DE102007035897A1 TEG-Muster und Verfahren zum Testen eines Halbleiterbauteils mit demselben TEG pattern and method for testing a semiconductor device with the same |
| 07/10/2008 | DE102007001768A1 Safety switch has sensor, evaluation unit, switching element, another sensor and evaluation unit that is integrated in safety switch, where assembly condition of safety switch is detected on or at bracket |