Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2008
07/23/2008EP1649538A4 Battery float management
07/23/2008EP1397694B1 Method for monitoring a power supply of a control unit in a motor vehicle
07/23/2008CN201090984Y Electronic test pencil with five purposes
07/23/2008CN201090983Y Probe and vertical probe crystal element probe clip with the probe
07/23/2008CN201090976Y Automobile circuit detector with illumination device
07/23/2008CN101228452A Pin circuit driver
07/23/2008CN101228451A Testable integrated circuit, system in package and test instruction set
07/23/2008CN101228450A Direct detect sensor for flat panel displays
07/23/2008CN101228449A Electronic component test device
07/23/2008CN101228448A Pusher, pusher unit as well as semiconductor test device
07/23/2008CN101227183A Schmidt trigger circuit
07/23/2008CN101227152A High-capacity square wave impact current generator
07/23/2008CN101226712A Apparatus and method for testing substrate
07/23/2008CN101226233A Method and apparatus for testing chip testing mechanism
07/23/2008CN101226229A Fast search algorithm for finding initial diffusion voltage in electro-chemical systems
07/23/2008CN101226228A Device and method for determinacy self-testing test data compression
07/23/2008CN101226227A Test carrier plate
07/23/2008CN101226226A Method for searching channel number of on-line tester
07/23/2008CN101226225A Method for searching channel number of tester on-line
07/23/2008CN101226224A Test system and method for circuit board
07/23/2008CN101226223A Circuit board level self-test system
07/23/2008CN101226222A PCB multifunctional test system and implementing method
07/23/2008CN101226221A Semiconductor device, and test circuit and test method for testing semiconductor device
07/23/2008CN101226220A Reference current source circuit and infrared signal processing circuit
07/23/2008CN101226219A Voltage detection circuit in an integrated circuit and method of generating a trigger flag signal
07/23/2008CN101226218A Method for testing life of power condenser element
07/23/2008CN101226217A Instrument for detecting breaking characteristic of current limiting fuse
07/23/2008CN101226216A Method and apparatus for measurement of fuel cell high frequency resistance in the presence of large undesirable signals
07/23/2008CN101226213A Method and apparatus for detecting electric machine phase current
07/23/2008CN101226212A Voltage testing circuit
07/23/2008CN101224826A Display panel detecting section station
07/23/2008CN100405778C Method and system for rate shaping in packet-based computer networks
07/23/2008CN100405712C Rotation detecting structure of electric motor and its detecting method
07/23/2008CN100405566C Low profile pneumatically actuated docking module with power fault release
07/23/2008CN100405415C Sensor cable and amplifier-separated type sensor with the cable
07/23/2008CN100405075C Method for preventing detection mechanism misjudgement caused by voltage instant changing of battery
07/23/2008CN100405074C Test terminal negation circuit
07/23/2008CN100405073C Breakdown testing structure for capacitor of preventing damage caused by middle and large current of semiconductor device
07/23/2008CN100405072C LED screen dead pixel detection method and circuit therefor
07/23/2008CN100405071C Semiconductor test system with easily changed interface unit
07/23/2008CN100405070C Running and loading detection method for converter
07/23/2008CN100405069C Contactless detection device of display panel
07/23/2008CN100405068C Apparatus and method for testing organic electroluminescence display panel
07/23/2008CN100405006C Position detecting apparatus, a position detecting method and an electronic component carrying apparatus
07/22/2008US7404159 Critical area computation of composite fault mechanisms using Voronoi diagrams
07/22/2008US7404157 Evaluation device and circuit design method used for the same
07/22/2008US7404130 Method for optimizing a pattern generation program, a program, and a signal generator
07/22/2008US7404129 TAP IR control with TAP/WSP or WSP DR control
07/22/2008US7404128 Serial data I/O on JTAG TCK with TMS clocking
07/22/2008US7404127 Circuitry with multiplexed dedicated and shared scan path cells
07/22/2008US7404126 Scan tests tolerant to indeterminate states when employing signature analysis to analyze test outputs
07/22/2008US7404125 Compilable memory structure and test methodology for both ASIC and foundry test environments
07/22/2008US7404124 On-chip sampling circuit and method
07/22/2008US7404123 Automated test and characterization data analysis methods and arrangement
07/22/2008US7404122 Mapping logic for loading control of crossbar multiplexer select RAM
07/22/2008US7404121 Method and machine-readable media for inferring relationships between test results
07/22/2008US7404120 Verification of event handling
07/22/2008US7404119 Circuit for testing power down reset function of an electronic device
07/22/2008US7404117 Component testing and recovery
07/22/2008US7404115 Self-synchronising bit error analyser and circuit
07/22/2008US7404114 System and method for balancing delay of signal communication paths through well voltage adjustment
07/22/2008US7404109 Systems and methods for adaptively compressing test data
07/22/2008US7403870 Trouble sensing device
07/22/2008US7403865 System and method for fault indication on a substrate in maskless applications
07/22/2008US7403864 Method and system for centrally-controlled semiconductor wafer correlation
07/22/2008US7403560 Simultaneous physical and protocol layer analysis
07/22/2008US7403485 Optimum construction of a private network-to-network interface
07/22/2008US7403484 Switching fabrics and control protocols for them
07/22/2008US7403483 Optimum route calculation method and storage medium which stores optimum route calculation program
07/22/2008US7403482 Path provisioning for service level agreements in differentiated service networks
07/22/2008US7403481 Methodology and apparatus for solving lockup conditions while trunking in fibre channel switched arbitrated loop systems
07/22/2008US7403480 Data communication terminal for conducting data communication for a set of objective data to be transmitted/received
07/22/2008US7403477 Packet communicating apparatus
07/22/2008US7403475 Method and apparatus for allocating data packet pathways
07/22/2008US7403474 Redundant router set up
07/22/2008US7403368 Devices and methods for detecting operational failures of relays
07/22/2008US7403259 Lithographic processing cell, lithographic apparatus, track and device manufacturing method
07/22/2008US7403175 Methods and systems for compensating row-to-row brightness variations of a field emission display
07/22/2008US7403031 Measurement apparatus for FET characteristics
07/22/2008US7403030 Using parametric measurement units as a source of power for a device under test
07/22/2008US7403029 Massively parallel interface for electronic circuit
07/22/2008US7403028 Test structure and probe for differential signals
07/22/2008US7403027 Apparatuses and methods for outputting signals during self-heat burn-in modes of operation
07/22/2008US7403026 Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit
07/22/2008US7403025 Membrane probing system
07/22/2008US7403024 Contactor having contact electrodes of metal springs embedded in a plate-like structure
07/22/2008US7403023 Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leaving the vacancy defects substantially unaltered.
07/22/2008US7403022 Method for measuring peak carrier concentration in ultra-shallow junctions
07/22/2008US7403021 Testing circuit for a data interface
07/22/2008US7403018 Cable tester
07/22/2008US7403015 System for wireless monitoring of circuit breakers
07/22/2008US7402995 Jig device for transporting and testing integrated circuit chip
07/22/2008US7402994 Self-cleaning lower contact
07/22/2008US7402980 Methods apparatus and computer program products for battery monitoring using predetermined battery discharge characteristics
07/22/2008US7402444 Method and apparatus for manufacturing a semiconductor device
07/22/2008US7402443 Methods of providing families of integrated circuits with similar dies partially disabled using product selection codes
07/22/2008US7402257 Plasma state monitoring to control etching processes and across-wafer uniformity, and system for performing same
07/22/2008US7401471 Dynamic spray system
07/22/2008CA2360152C Battery recharging device and method and an automatic battery detection system and method therefor
07/17/2008WO2008085463A1 Test head positioning system and method