Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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07/23/2008 | EP1649538A4 Battery float management |
07/23/2008 | EP1397694B1 Method for monitoring a power supply of a control unit in a motor vehicle |
07/23/2008 | CN201090984Y Electronic test pencil with five purposes |
07/23/2008 | CN201090983Y Probe and vertical probe crystal element probe clip with the probe |
07/23/2008 | CN201090976Y Automobile circuit detector with illumination device |
07/23/2008 | CN101228452A Pin circuit driver |
07/23/2008 | CN101228451A Testable integrated circuit, system in package and test instruction set |
07/23/2008 | CN101228450A Direct detect sensor for flat panel displays |
07/23/2008 | CN101228449A Electronic component test device |
07/23/2008 | CN101228448A Pusher, pusher unit as well as semiconductor test device |
07/23/2008 | CN101227183A Schmidt trigger circuit |
07/23/2008 | CN101227152A High-capacity square wave impact current generator |
07/23/2008 | CN101226712A Apparatus and method for testing substrate |
07/23/2008 | CN101226233A Method and apparatus for testing chip testing mechanism |
07/23/2008 | CN101226229A Fast search algorithm for finding initial diffusion voltage in electro-chemical systems |
07/23/2008 | CN101226228A Device and method for determinacy self-testing test data compression |
07/23/2008 | CN101226227A Test carrier plate |
07/23/2008 | CN101226226A Method for searching channel number of on-line tester |
07/23/2008 | CN101226225A Method for searching channel number of tester on-line |
07/23/2008 | CN101226224A Test system and method for circuit board |
07/23/2008 | CN101226223A Circuit board level self-test system |
07/23/2008 | CN101226222A PCB multifunctional test system and implementing method |
07/23/2008 | CN101226221A Semiconductor device, and test circuit and test method for testing semiconductor device |
07/23/2008 | CN101226220A Reference current source circuit and infrared signal processing circuit |
07/23/2008 | CN101226219A Voltage detection circuit in an integrated circuit and method of generating a trigger flag signal |
07/23/2008 | CN101226218A Method for testing life of power condenser element |
07/23/2008 | CN101226217A Instrument for detecting breaking characteristic of current limiting fuse |
07/23/2008 | CN101226216A Method and apparatus for measurement of fuel cell high frequency resistance in the presence of large undesirable signals |
07/23/2008 | CN101226213A Method and apparatus for detecting electric machine phase current |
07/23/2008 | CN101226212A Voltage testing circuit |
07/23/2008 | CN101224826A Display panel detecting section station |
07/23/2008 | CN100405778C Method and system for rate shaping in packet-based computer networks |
07/23/2008 | CN100405712C Rotation detecting structure of electric motor and its detecting method |
07/23/2008 | CN100405566C Low profile pneumatically actuated docking module with power fault release |
07/23/2008 | CN100405415C Sensor cable and amplifier-separated type sensor with the cable |
07/23/2008 | CN100405075C Method for preventing detection mechanism misjudgement caused by voltage instant changing of battery |
07/23/2008 | CN100405074C Test terminal negation circuit |
07/23/2008 | CN100405073C Breakdown testing structure for capacitor of preventing damage caused by middle and large current of semiconductor device |
07/23/2008 | CN100405072C LED screen dead pixel detection method and circuit therefor |
07/23/2008 | CN100405071C Semiconductor test system with easily changed interface unit |
07/23/2008 | CN100405070C Running and loading detection method for converter |
07/23/2008 | CN100405069C Contactless detection device of display panel |
07/23/2008 | CN100405068C Apparatus and method for testing organic electroluminescence display panel |
07/23/2008 | CN100405006C Position detecting apparatus, a position detecting method and an electronic component carrying apparatus |
07/22/2008 | US7404159 Critical area computation of composite fault mechanisms using Voronoi diagrams |
07/22/2008 | US7404157 Evaluation device and circuit design method used for the same |
07/22/2008 | US7404130 Method for optimizing a pattern generation program, a program, and a signal generator |
07/22/2008 | US7404129 TAP IR control with TAP/WSP or WSP DR control |
07/22/2008 | US7404128 Serial data I/O on JTAG TCK with TMS clocking |
07/22/2008 | US7404127 Circuitry with multiplexed dedicated and shared scan path cells |
07/22/2008 | US7404126 Scan tests tolerant to indeterminate states when employing signature analysis to analyze test outputs |
07/22/2008 | US7404125 Compilable memory structure and test methodology for both ASIC and foundry test environments |
07/22/2008 | US7404124 On-chip sampling circuit and method |
07/22/2008 | US7404123 Automated test and characterization data analysis methods and arrangement |
07/22/2008 | US7404122 Mapping logic for loading control of crossbar multiplexer select RAM |
07/22/2008 | US7404121 Method and machine-readable media for inferring relationships between test results |
07/22/2008 | US7404120 Verification of event handling |
07/22/2008 | US7404119 Circuit for testing power down reset function of an electronic device |
07/22/2008 | US7404117 Component testing and recovery |
07/22/2008 | US7404115 Self-synchronising bit error analyser and circuit |
07/22/2008 | US7404114 System and method for balancing delay of signal communication paths through well voltage adjustment |
07/22/2008 | US7404109 Systems and methods for adaptively compressing test data |
07/22/2008 | US7403870 Trouble sensing device |
07/22/2008 | US7403865 System and method for fault indication on a substrate in maskless applications |
07/22/2008 | US7403864 Method and system for centrally-controlled semiconductor wafer correlation |
07/22/2008 | US7403560 Simultaneous physical and protocol layer analysis |
07/22/2008 | US7403485 Optimum construction of a private network-to-network interface |
07/22/2008 | US7403484 Switching fabrics and control protocols for them |
07/22/2008 | US7403483 Optimum route calculation method and storage medium which stores optimum route calculation program |
07/22/2008 | US7403482 Path provisioning for service level agreements in differentiated service networks |
07/22/2008 | US7403481 Methodology and apparatus for solving lockup conditions while trunking in fibre channel switched arbitrated loop systems |
07/22/2008 | US7403480 Data communication terminal for conducting data communication for a set of objective data to be transmitted/received |
07/22/2008 | US7403477 Packet communicating apparatus |
07/22/2008 | US7403475 Method and apparatus for allocating data packet pathways |
07/22/2008 | US7403474 Redundant router set up |
07/22/2008 | US7403368 Devices and methods for detecting operational failures of relays |
07/22/2008 | US7403259 Lithographic processing cell, lithographic apparatus, track and device manufacturing method |
07/22/2008 | US7403175 Methods and systems for compensating row-to-row brightness variations of a field emission display |
07/22/2008 | US7403031 Measurement apparatus for FET characteristics |
07/22/2008 | US7403030 Using parametric measurement units as a source of power for a device under test |
07/22/2008 | US7403029 Massively parallel interface for electronic circuit |
07/22/2008 | US7403028 Test structure and probe for differential signals |
07/22/2008 | US7403027 Apparatuses and methods for outputting signals during self-heat burn-in modes of operation |
07/22/2008 | US7403026 Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit |
07/22/2008 | US7403025 Membrane probing system |
07/22/2008 | US7403024 Contactor having contact electrodes of metal springs embedded in a plate-like structure |
07/22/2008 | US7403023 Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leaving the vacancy defects substantially unaltered. |
07/22/2008 | US7403022 Method for measuring peak carrier concentration in ultra-shallow junctions |
07/22/2008 | US7403021 Testing circuit for a data interface |
07/22/2008 | US7403018 Cable tester |
07/22/2008 | US7403015 System for wireless monitoring of circuit breakers |
07/22/2008 | US7402995 Jig device for transporting and testing integrated circuit chip |
07/22/2008 | US7402994 Self-cleaning lower contact |
07/22/2008 | US7402980 Methods apparatus and computer program products for battery monitoring using predetermined battery discharge characteristics |
07/22/2008 | US7402444 Method and apparatus for manufacturing a semiconductor device |
07/22/2008 | US7402443 Methods of providing families of integrated circuits with similar dies partially disabled using product selection codes |
07/22/2008 | US7402257 Plasma state monitoring to control etching processes and across-wafer uniformity, and system for performing same |
07/22/2008 | US7401471 Dynamic spray system |
07/22/2008 | CA2360152C Battery recharging device and method and an automatic battery detection system and method therefor |
07/17/2008 | WO2008085463A1 Test head positioning system and method |