| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/30/2008 | CN100406899C 一种进行测试用的电源模拟装置 A power simulator test conducted |
| 07/30/2008 | CA2576590A1 Test circuit board and method for testing a technology used to manufacture circuit board assemblies |
| 07/29/2008 | US7406646 Multi-strobe apparatus, testing apparatus, and adjusting method |
| 07/29/2008 | US7406645 Test pattern generating apparatus, method for automatically generating test patterns and computer program product for executing an application for a test pattern generating apparatus |
| 07/29/2008 | US7406644 Monitoring a thermal processing system |
| 07/29/2008 | US7406643 Semiconductor integrated circuit device, method of manufacturing the device, and computer readable medium |
| 07/29/2008 | US7406642 Techniques for capturing signals at output pins in a programmable logic integrated circuit |
| 07/29/2008 | US7406641 Selective control of test-access ports in integrated circuits |
| 07/29/2008 | US7406640 Method and apparatus for testing a ring of non-scan latches with logic built-in self-test |
| 07/29/2008 | US7406639 Scan chain partition for reducing power in shift mode |
| 07/29/2008 | US7406638 System and method for optimized test and configuration throughput of electronic circuits |
| 07/29/2008 | US7406637 Semiconductor memory device capable of testing memory cells at high speed |
| 07/29/2008 | US7406389 State detecting system and device employing the same |
| 07/29/2008 | US7406191 Inspection data producing method and board inspection apparatus using the method |
| 07/29/2008 | US7406046 Scheduler for signaling a time out |
| 07/29/2008 | US7406043 Method for providing voice-over-IP service |
| 07/29/2008 | US7406034 Methods and apparatus for fibre channel frame delivery |
| 07/29/2008 | US7406031 Multihop nested tunnel restoration |
| 07/29/2008 | US7406030 Dynamic renegotiation of graceful restart time to avoid double-failure traffic loss |
| 07/29/2008 | US7406029 Fault tolerant optical data communication network having auto discovery |
| 07/29/2008 | US7405723 Apparatus for testing display device and method for testing the same |
| 07/29/2008 | US7405611 Semiconductor integrated circuit device |
| 07/29/2008 | US7405586 Ultra low pin count interface for die testing |
| 07/29/2008 | US7405585 Versatile semiconductor test structure array |
| 07/29/2008 | US7405584 Prober and probe contact method |
| 07/29/2008 | US7405583 Functional and stress testing of LGA devices |
| 07/29/2008 | US7405582 Measurement board for electronic device test apparatus |
| 07/29/2008 | US7405581 Probing system uses a probe device including probe tips on a surface of a semiconductor die |
| 07/29/2008 | US7405580 Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration |
| 07/29/2008 | US7405578 Device for monitoring the contact integrity of a joint |
| 07/29/2008 | US7405574 Signal detector |
| 07/29/2008 | US7405573 Electrical connector for semiconductor device test fixture and test assembly |
| 07/29/2008 | US7405570 Connector for a measurement element in a battery sensor |
| 07/29/2008 | US7405569 Monitoring system for high-voltage switches |
| 07/29/2008 | US7405091 Method for testing contact open in semicoductor device |
| 07/29/2008 | US7405090 Method of measuring an effective channel length and an overlap length in a metal-oxide semiconductor field effect transistor |
| 07/29/2008 | US7405089 Method and apparatus for measuring a surface profile of a sample |
| 07/29/2008 | CA2491236C Switchgear module and configurations, and method of fabrication and assembly thereof |
| 07/29/2008 | CA2334951C Voltage measuring device |
| 07/24/2008 | WO2008089458A2 Methods of performing electrostatic discharge testing on a payment card |
| 07/24/2008 | WO2008089430A2 Probing structure with fine pitch probes |
| 07/24/2008 | WO2008089341A2 System for fault determinations for high frequency electronic circuits |
| 07/24/2008 | WO2008088986A2 Integrated time and/or capacitance measurement system, method and apparatus |
| 07/24/2008 | WO2008088513A1 Testing inverter driven electric motor shut-off path |
| 07/24/2008 | WO2008088448A1 Systems and methods for electrical leakage detection and compensation |
| 07/24/2008 | WO2008087907A1 Semiconductor device provided with light receiving means, method for inspecting the semiconductor device, and semiconductor device inspecting apparatus |
| 07/24/2008 | WO2008087698A1 Tft array drive device |
| 07/24/2008 | WO2008087362A2 Method of locating a zone of reduced insulation in an insulator covering a conductor of a winding |
| 07/24/2008 | WO2008086997A1 Amplification circuit having an integrated test circuit |
| 07/24/2008 | WO2008086908A1 A method for determining the current return path integrity in an electric device connected or connectable to a further device |
| 07/24/2008 | WO2008058869A3 Measuring device and measuring method for inspecting the surface of a substrate |
| 07/24/2008 | WO2008016555A3 Sensors and sensing methods for three-phase, gas insulated devices |
| 07/24/2008 | WO2007137070A3 In-line test circuit and method for determining interconnect electrical properties and integrated circuit incorporating the same |
| 07/24/2008 | WO2004111662A8 Integrated circuit device for monitoring power supply |
| 07/24/2008 | US20080178055 Test pattern generation circuit having plural pseudo random number generation circuits supplied with clock signals at different timing respectively |
| 07/24/2008 | US20080177486 System for fault determinations for high frequency electronic circuits |
| 07/24/2008 | US20080176525 Dynamic regulation of power consumption of a high-speed communication system |
| 07/24/2008 | US20080176144 Determining acceptability of copper metal or alloy current collector based on color analysis; discharge capacity, cycle performance; reduced expansion and/or shrinkage |
| 07/24/2008 | US20080175152 Service differentiating and overload indication for downlink |
| 07/24/2008 | US20080175150 Controlled incremental multi-protocol label switching (mpls) traffic engineering |
| 07/24/2008 | US20080175144 Method, apparatus and system for establishing return label switch path in multi-protocol label switching system |
| 07/24/2008 | US20080175141 Distributed protection switching architecture for point-to-point microwave radio systems |
| 07/24/2008 | US20080174941 Notebook Computer Having an Off-Motherboard Keyboard Controller |
| 07/24/2008 | US20080174336 Circuit and method for detecting skew of transistor in semiconductor device |
| 07/24/2008 | US20080174335 Test apparatus for determining performance degradation |
| 07/24/2008 | US20080174334 Method for prediction of premature dielectric breakdown in a semiconductor |
| 07/24/2008 | US20080174332 Electrochemically fabricated microprobes |
| 07/24/2008 | US20080174331 Structure of test area for a semiconductor tester |
| 07/24/2008 | US20080174330 Rotational positioner and methods for semiconductor wafer test systems |
| 07/24/2008 | US20080174329 Method and device for determining an operational lifetime of an integrated circuit device |
| 07/24/2008 | US20080174328 Probing Structure With Fine Pitch Probes |
| 07/24/2008 | US20080174327 Electric signal connecting device and probe assembly and probing device using the same |
| 07/24/2008 | US20080174326 Probe, probe assembly and probe card for electrical testing |
| 07/24/2008 | US20080174325 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 07/24/2008 | US20080174320 Partial discharge sensor and partial discharge monitoring system utilizing current sensors |
| 07/24/2008 | US20080174319 Load Board Based Test Circuits |
| 07/24/2008 | US20080174318 Test apparatus |
| 07/24/2008 | US20080174317 Semiconductor device |
| 07/24/2008 | US20080174316 System and method for determining location of phase-to-earth fault |
| 07/24/2008 | US20080174299 Test tray and handler using the test tray |
| 07/24/2008 | US20080174298 Determining a State of a Receiver on a Transmission Line |
| 07/24/2008 | US20080174264 Information processing terminal and display control method |
| 07/24/2008 | US20080172870 Test device for electrical testing of a unit under test, as well as a method for production of a test drive |
| 07/24/2008 | DE112006002519T5 Prüfvorrichtung, Prüfverfahren, Analysevorrichtung und -programm Tester, test methods, apparatus and program analysis |
| 07/24/2008 | DE112006001998T5 Timing-Generator und Halbleitertestgerät Timing generator and semiconductor test equipment |
| 07/24/2008 | DE112006000019T5 Kontaktstößel, Kontaktarm und Prüfgerät für elektronische Bauelemente Contact plunger, contact and electronic component tester |
| 07/24/2008 | DE102007054698A1 Probe support for holding probes for electrically contacting test substrates in prober has probe card adapter which is electrically insulated from probe card holder, and electrically connected to shield |
| 07/24/2008 | DE102007054353A1 Prognose für einen Verlust einer Hochspannungsisolierung Forecast for a loss of a high-voltage insulation |
| 07/24/2008 | DE102007003306A1 Monitoring device for powerline, has two line sections, where both line sections are switched into series, and measuring instrument is so formed that current flows through former line section |
| 07/24/2008 | DE102007003230A1 Verfahren und Vorrichtung zur Bestimmung eines Zustands eines Empfängers an einer Übertragungsleitung Method and apparatus for determining a state of a receiver of a transmission line |
| 07/24/2008 | DE102007002934A1 Method for monitoring charging condition of accumulator for autonomous mobile robot, particularly autonomous window cleaner, which involves measuring static and dynamic behavior of terminal voltage by monitoring circuit |
| 07/23/2008 | EP1947467A1 Testing apparatus and performance board |
| 07/23/2008 | EP1947466A1 Test head positioning system |
| 07/23/2008 | EP1946134A1 Battery condition diagnosis apparatus |
| 07/23/2008 | EP1946133A1 Battery analysis system and method |
| 07/23/2008 | EP1946132A1 Integrated circuit test method and test apparatus |
| 07/23/2008 | EP1946131A1 Ic testing methods and apparatus |
| 07/23/2008 | EP1946130A2 Method for determining information about the internal workings of a chip based on electro-magnetic emissions therefrom |
| 07/23/2008 | EP1946128A2 Semi-automatic multiplexing system for automated semiconductor wafer testing |
| 07/23/2008 | EP1877809B1 Assembly for regulating the temperature of an integrated circuit |