Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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07/31/2008 | WO2007124514A3 Method and apparatus for a scalable hybrid architecture for polyvertexic extensible networks |
07/31/2008 | WO2006138583A3 Sequential scan test of interface between ic modules that operate at different frequencies |
07/31/2008 | US20080184084 Check Matrix Generating Apparatus and Communication Apparatus |
07/31/2008 | US20080184083 Circuit and Method for Physical Defect Detection of an Integrated Circuit |
07/31/2008 | US20080183416 Semiconductor integrated circuit |
07/31/2008 | US20080183408 Battery Condition Monitor |
07/31/2008 | US20080183407 System and method for testing power intensify of rfid tags |
07/31/2008 | US20080183406 Online IED Fault Diagnosis Device and Method for Substation Automation System Based on IEC61850 |
07/31/2008 | US20080182348 Impurity Introducing Method, Impurity Introducing Apparatus, and Electronic Device Produced by Using Those |
07/31/2008 | US20080181751 Electronic component handler having gap set device |
07/31/2008 | US20080181121 Self-Describing Device Interconnections |
07/31/2008 | US20080181101 Overhear-based transmitting control system in wlans |
07/31/2008 | US20080181100 Methods and apparatus to manage network correction procedures |
07/31/2008 | US20080181099 Methods, systems, and computer program products for using alarm data correlation to automatically analyze a network outage |
07/31/2008 | US20080181045 Calibration circuit of a semiconductor memory device and method of operating the same |
07/31/2008 | US20080180592 Liquid crystal display panel and testing system and method thereof |
07/31/2008 | US20080180588 Driver and driving method, and display device |
07/31/2008 | US20080180223 Diagnosing a radio frequency identification reader |
07/31/2008 | US20080180134 Electronic Circuit for Measurement of Transistor Variability and the Like |
07/31/2008 | US20080180127 On-chip self test circuit and self test method for signal distortion |
07/31/2008 | US20080180126 Device identifying method, device manufacturing method and electronic device |
07/31/2008 | US20080180124 Cooling apparatus for semiconductor device |
07/31/2008 | US20080180123 Ultra-fine pitch probe card structure |
07/31/2008 | US20080180121 Probe card assembly and kit |
07/31/2008 | US20080180119 Method for testing electronic components and test apparatus for carrying out the method |
07/31/2008 | US20080180118 Substrate for probe card assembly, method of manufacturing substrate for probe card assembly and method of inspecting semiconductor wafer |
07/31/2008 | US20080180117 Adjustable Force Electrical Contactor |
07/31/2008 | US20080180116 Systems and methods for defect testing of externally accessible integrated circuit interconnects |
07/31/2008 | US20080180109 Method and apparatus for implementing ic device testing with improved spql, reliability and yield performance |
07/31/2008 | US20080180108 Fault Detection Circuit |
07/31/2008 | US20080180107 Cable tester for stage lighting environment |
07/31/2008 | US20080180106 Battery montoring apparatus and daisy chain interface suitable for use in a battery monitoring apparatus |
07/31/2008 | US20080180064 Battery-capacity management device |
07/31/2008 | US20080180062 Battery remaining capacity predicting apparatus |
07/31/2008 | US20080179945 System and Method for Dealing With Ground Fault Conditions That Can Arise In An Electrical Propulsion System |
07/31/2008 | US20080179224 Venturi vacuum generator on an electric component handler |
07/31/2008 | DE19825809B4 Steuerungsvorrichtung für einen Ladegenerator A control apparatus for a charging generator |
07/31/2008 | DE19513441C5 Schaltungsanordnung zur Erzeugung einer Prüfspannung für die Prüfung elektrischer Betriebsmittel Circuit arrangement for generating a test voltage for testing of electrical equipment |
07/31/2008 | DE112006002751T5 Prüfvorrichtung, Programm und Aufzeichnungsmedium Tester, program, and recording medium |
07/31/2008 | DE112005003685T5 Vorrichtung zum Handhaben von Werkstücken An apparatus for handling workpieces |
07/31/2008 | DE102008004707A1 Verfahren zum Messen eines Metall-Anschlussstücks und Vorrichtung zum Messen davon A method for measuring a metal connecting piece and apparatus for measuring thereof |
07/31/2008 | DE102007057981A1 Verfahren und Vorrichtung zur Modellerstellung für eine Diffusion in einem Elektrochemischen System Method and apparatus for modeling a diffusion in an electrochemical system |
07/31/2008 | DE102007004555A1 Integrated circuit i.e. memory chip, is tested in test operation mode by adjusting operating condition of voltage generator for producing load voltage for associated integrated load as function of external control signal |
07/31/2008 | DE102007004488A1 Method for determining characteristic for actual condition of electro-chemical storage battery, involves determining actual characteristics relating to actual time interval depending on characteristics determined in past |
07/31/2008 | DE102007003830A1 Vorrichtung zur Messung eines durch einen elektrischen Leiter fließenden elektrischen Stroms A device for measuring a current flowing through an electrical conductor of electric current |
07/31/2008 | DE102007003169A1 Verfahren zum Erkennen der Schaltererstellung eines Trennschalters oder eines Erdungsschalters A method of detecting the creation of a switch disconnector or a grounding switch |
07/31/2008 | DE102007002953A1 Switching arrangement for outputting switching signal to e.g. machine controller, has switching unit generating analog measuring signal, whose characteristics are independent of type of error-free load by switching components |
07/31/2008 | DE102005055272B4 Verfahren und Vorrichtung zur Ermittlung von Leckströmen in batteriegespeisten Netzen Method and apparatus for determination of leakage current in battery powered systems |
07/31/2008 | DE102004019475B4 Anordnung und Verfahren zur Detektion und Lokalisierung von Kurzschlüssen in Membran-Elektroden-Anordnungen Arrangement and method for the detection and localization of a short circuit in the membrane electrode assemblies |
07/30/2008 | EP1950577A2 Method for verifying the integrity of a clock tree |
07/30/2008 | EP1950576A1 Guiding device and testing device for electronic assembly parts |
07/30/2008 | EP1950571A1 Method for manufacturing conductive contact holder, and conductive contact holder |
07/30/2008 | EP1949523A1 System, method, and article of manufacture for determining an estimated battery state vector |
07/30/2008 | EP1949488A1 Universal battery module and controller therefor |
07/30/2008 | EP1949296A2 High-speed transceiver tester incorporating jitter injection |
07/30/2008 | EP1949121A2 Method and system for testing backplanes utilizing a boundary scan protocol |
07/30/2008 | EP1949120A2 Method for testing a passive infrared sensor |
07/30/2008 | EP1949119A2 Optical ring networks using circulating optical probe in protection switching with automatic reversion |
07/30/2008 | EP1949118A1 Method, circuit board and test apparatus for testing solder joints |
07/30/2008 | EP1949117A2 Tandem handler system and method for reduced index time |
07/30/2008 | EP1949116A2 Pin electronics implemented system and method for reduced index time |
07/30/2008 | EP1709454B1 Test architecture and method |
07/30/2008 | CN201094145Y Low-voltage electrified wire netting ground fault positioning device |
07/30/2008 | CN201094134Y Residual current operation protector with self-diagnostic function |
07/30/2008 | CN201094107Y Self-scalping cable shield testing jig |
07/30/2008 | CN101233420A Timing generator and semiconductor test device |
07/30/2008 | CN101233419A Timing generator and semiconductor test instrument |
07/30/2008 | CN101233418A Method and device for monitoring a first voltage value |
07/30/2008 | CN101232279A Touching type switch apparatus of electronic cook ware and input method thereof |
07/30/2008 | CN101232176A Non-effective earthing distribution system fault locating method based on neutral point of transient traveling wave |
07/30/2008 | CN101231964A Semiconductor component voltage stabilization testing method and testing tool |
07/30/2008 | CN101231938A Element fixing device of automatic multitime return current machine |
07/30/2008 | CN101231834A Driver and driving method, and display device |
07/30/2008 | CN101231439A Display panel, method of inspecting the display panel and method of manufacturing the display panel |
07/30/2008 | CN101231422A Backlight tube protective circuit |
07/30/2008 | CN101231333A Portable metrology charge instrument |
07/30/2008 | CN101231328A Method for evaluating fuel cell durability of city carriage |
07/30/2008 | CN101231327A Apparatus and method for measuring battery allowance |
07/30/2008 | CN101231326A Device and method for testing general DVD-P/DVD-R front panel |
07/30/2008 | CN101231325A Test apparatus and method |
07/30/2008 | CN101231324A Test tray and handler using the test tray |
07/30/2008 | CN101231323A Distributed high-precision transmission line travelling wave positioning system |
07/30/2008 | CN101231322A Test connection method and apparatus for integrated circuit open circuit/ short-circuit |
07/30/2008 | CN101231321A Automatization test method and device for high steady crystal vibration |
07/30/2008 | CN101231320A Undervoltage collection copy system detecting device based on virtual electric energy meter module |
07/30/2008 | CN101231319A Electromagnetic interference scanning device and method |
07/30/2008 | CN101231318A Voltage sampling circuit of anti-syntype diverter |
07/30/2008 | CN101231317A Method for recognizing interface characteristics through two-side electricity property change of heterogeneity interface |
07/30/2008 | CN101231307A Test arrangement capable of preventing electromagnetic interference and test approach thereof |
07/30/2008 | CN101231306A Contact probe and socket for testing semiconductor chips |
07/30/2008 | CN100407423C 半导体器件以及半导体封装 A semiconductor device and a semiconductor package |
07/30/2008 | CN100407393C 半导体集成电路器件的制造方法 The method of manufacturing a semiconductor integrated circuit device |
07/30/2008 | CN100407392C 通过光学测量判断残留膜的方法 By optical measurement method to determine residual film |
07/30/2008 | CN100407390C 探测器装置和探测器测试方法 Detector means and detector test methods |
07/30/2008 | CN100406905C 混合电动汽车的蓄电池状态显示方法以及蓄电池状态显示装置 Hybrid electric vehicle battery condition display method, and a battery state display device |
07/30/2008 | CN100406904C 一种低电压差分信号交叉接续测试接口装置 A low-voltage differential signal cross connection test interface device |
07/30/2008 | CN100406903C 一种可编程逻辑器件配置的检测方法 A Method of programmable logic device configuration |
07/30/2008 | CN100406902C 有针对性应用的基于事件的半导体存储器测试系统 Semiconductor memory test system targeted event-based applications |
07/30/2008 | CN100406901C 电力线路故障指示器 Power line fault indicator |
07/30/2008 | CN100406900C 用于分组交换蜂窝网络中的上行链路宏分集的方法和设备 Method and apparatus for packet-switched cellular network uplink macrodiversity |