| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/17/2008 | CN100444419C Detecting wavelength adjustable terahertz photoelectric detector |
| 12/17/2008 | CN100444078C Synchronization between low frequency and high frequency digital signals |
| 12/17/2008 | CN100443912C Method and apparatus for measuring transfer characteristics of a semiconductor device |
| 12/17/2008 | CN100443911C Electronic device test system |
| 12/17/2008 | CN100443910C Active network defense system and method |
| 12/17/2008 | CN100443909C On-line test system for safety unit |
| 12/17/2008 | CN100443908C Detector and detection method employing the same |
| 12/17/2008 | CN100443907C Harmonic diagnosing method for electric facility |
| 12/17/2008 | CN100443906C Quasi-true examination for current mutual-inductor in substation |
| 12/17/2008 | CN100443901C Test adaptor card and test equipment |
| 12/16/2008 | US7467364 Database mining method and computer readable medium carrying instructions for coverage analysis of functional verification of integrated circuit designs |
| 12/16/2008 | US7467343 Apparatus and method for performing a multi-value polling operation in a JTAG data stream |
| 12/16/2008 | US7467342 Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systems |
| 12/16/2008 | US7467341 Boundary scan controller, semiconductor apparatus, semiconductor-circuit-chip identification method for semiconductor apparatus, and semiconductor-circuit-chip control method for semiconductor apparatus |
| 12/16/2008 | US7467340 TAP, ST, lockout, and IR SO enable output data control |
| 12/16/2008 | US7467339 Semiconductor integrated circuit and a method of testing the same |
| 12/16/2008 | US7467338 Apparatus and method for generating an error signal |
| 12/16/2008 | US7467336 Method and apparatus to measure and display data dependent eye diagrams |
| 12/16/2008 | US7467066 System and method for benchmarking correlated stream processing systems |
| 12/16/2008 | US7466852 Time resolved non-invasive diagnostics system |
| 12/16/2008 | US7466751 System and method for high-speed decoding and ISI compensation in a multi-pair transceiver system |
| 12/16/2008 | US7466706 Controlled transmissions across packet networks |
| 12/16/2008 | US7466651 Method and system for rapidly presenting network-element transient data |
| 12/16/2008 | US7466647 Efficient muxing scheme to allow for bypass and array access |
| 12/16/2008 | US7466646 Method and system for automatically rerouting logical circuit data from a logical circuit failure to dedicated backup circuit in a data network |
| 12/16/2008 | US7466162 Electronic load |
| 12/16/2008 | US7466161 Direct detect sensor for flat panel displays |
| 12/16/2008 | US7466160 Shared memory bus architecture for system with processor and memory units |
| 12/16/2008 | US7466159 Semiconductor integrated circuit having multiple semiconductor chips with signal terminals |
| 12/16/2008 | US7466158 Multilayer semiconductor device |
| 12/16/2008 | US7466157 Contactless interfacing of test signals with a device under test |
| 12/16/2008 | US7466156 System of digitally testing an analog driver circuit |
| 12/16/2008 | US7466155 Functional and stress testing of LGA devices |
| 12/16/2008 | US7466154 Conductive particle filled polymer electrical contact |
| 12/16/2008 | US7466153 Apparatuses for inspecting pogo pins of an electrical die sorting system and a method for performing the same |
| 12/16/2008 | US7466152 Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof |
| 12/16/2008 | US7466151 Electric-field distribution measurement method and apparatus for semiconductor device |
| 12/16/2008 | US7466150 Apparatus and method for generating a power signal from a load current |
| 12/16/2008 | US7466140 Signal generation circuit, jitter injection circuit, semiconductor chip and test apparatus |
| 12/16/2008 | US7466139 Method to determine current detection circuit failure |
| 12/16/2008 | US7466122 Test head docking system and method |
| 12/16/2008 | US7465591 Evaluating a geometric or material property of a multilayered structure |
| 12/16/2008 | US7465590 Measurement of a sample using multiple models |
| 12/16/2008 | US7464807 Transfer device of handler for testing semiconductor device |
| 12/13/2008 | CA2632677A1 Method, apparatus and computer-readable code for detecting an incipient ground fault in an electrical propulsion system |
| 12/11/2008 | WO2008150618A1 Integrated circuit with continuous testing of repetitive functional blocks |
| 12/11/2008 | WO2008150555A1 Method for compensation of process-induced performance variation in a mosfet integrated circuit |
| 12/11/2008 | WO2008150136A1 Arc detecting apparatus and arc monitoring method using the same |
| 12/11/2008 | WO2008149973A1 Test device and calibration device |
| 12/11/2008 | WO2008149830A1 Fuel cell system |
| 12/11/2008 | WO2008149729A1 Tcp testing method and tcp testing apparatus |
| 12/11/2008 | WO2008149675A1 Waveform generation device, waveform generation method, and program |
| 12/11/2008 | WO2008149454A1 Life testing device and method for rotation driving mechanism |
| 12/11/2008 | WO2008149287A1 Testable integrated circuit die and integrated circuit package |
| 12/11/2008 | WO2008148793A1 Increased reliability in the processing of digital signals |
| 12/11/2008 | WO2008148589A1 Method for monitoring the state of a force measuring device, force measuring device and force measuring module |
| 12/11/2008 | WO2008148428A1 Method and device to predict a state of a power system in the time domain |
| 12/11/2008 | WO2008148416A1 Electronic circuit device and method for operating an electronic circuit device |
| 12/11/2008 | WO2008113142A3 Real-time monitoring system for capacitance graded bushings |
| 12/11/2008 | WO2008070766A3 Fiber optic fault detection system and method for underground power lines |
| 12/11/2008 | WO2008057897A3 Method and apparatus for providing active compliance in a probe card assembly |
| 12/11/2008 | WO2008042581B1 Offset correction methods and arrangement for positioning and inspecting substrates |
| 12/11/2008 | WO2007146506A3 Apparatus for capturing multiple data packets in a data signal for analysis |
| 12/11/2008 | US20080307283 Complex Pattern Generator for Analysis of High Speed Serial Streams |
| 12/11/2008 | US20080307281 Trading propensity-based clustering of circuit elements in a circuit design |
| 12/11/2008 | US20080307280 Scan cells with minimized shoot-through and scan chains and integrated circuits using the same |
| 12/11/2008 | US20080307279 Serial scan chain in a star configuration |
| 12/11/2008 | US20080307278 Apparatus for efficiently loading scan and non-scan memory elements |
| 12/11/2008 | US20080307260 Semiconductor ic incorporating a co-debugging function and test system |
| 12/11/2008 | US20080306698 Method and Device for Estimating the Current Output By an Alternator for a Motor Vehicle |
| 12/11/2008 | US20080306697 Semiconductor device and noise measuring method |
| 12/11/2008 | US20080304417 Method, network apparatus, and tangible machine-readable medium thereof for detecting a looping network packet |
| 12/11/2008 | US20080304411 Bandwidth control system and method capable of reducing traffic congestion on content servers |
| 12/11/2008 | US20080304406 Method and apparatus for error messaging in a multimedia network |
| 12/11/2008 | US20080304342 Semiconductor memory device with redundancy ciruit |
| 12/11/2008 | US20080303725 Antenna Coupler |
| 12/11/2008 | US20080303543 Measuring Device |
| 12/11/2008 | US20080303542 Testing circuit and integrated circuit |
| 12/11/2008 | US20080303540 Probe card assembly |
| 12/11/2008 | US20080303539 Parametric testline with increased test pattern areas |
| 12/11/2008 | US20080303532 Combustible-gas sensor, fuel cell system, abnormality detecting method, and fuel cell system control method |
| 12/11/2008 | US20080303531 Methods for visually inspecting interferometric modulators for defects |
| 12/11/2008 | US20080303529 Vehicle, Power Supply Device of Vehicle, and Current Detection Device |
| 12/11/2008 | US20080303528 Method and Device for Measuring Internal Impedance of Stationary Battery |
| 12/11/2008 | US20080303510 Optical Sensor Arrangement for Electrical Switchgear |
| 12/11/2008 | US20080303173 Semiconductor device, a method of manufacturing a semiconductor device and a testing method of the same |
| 12/11/2008 | US20080303021 Optimized Thermally Conductive Plate and Attachment Method for Enhanced Thermal Performance and Reliability of Flip Chip Organic Packages |
| 12/11/2008 | US20080302964 Method and apparatus for inspecting integrated circuit pattern |
| 12/11/2008 | US20080302783 Actively controlled embedded burn-in board thermal heaters |
| 12/11/2008 | US20080301891 Robot mechanism for cleaning and inspection of live-line insulators |
| 12/11/2008 | DE112007000415T5 Sonde und elektrische Verbindungsvorrichtung, die sie verwendet Probe and electrical connection device that uses them |
| 12/11/2008 | DE112007000390T5 Testsystem und -verfahren zum Testen von elektronischen Bauelementen unter Verwendung einer pipelineartigen Testarchitektur Test system and method for testing electronic devices using a pipelined testing architecture |
| 12/11/2008 | DE102008025770A1 Signalformerzeugungsgerät, Setupzyklus-Korrekturverfahren und Halbleitertestgerät Waveform generation unit, setup cycle correction method and semiconductor test equipment |
| 12/11/2008 | DE102008017685A1 Battery i.e. motor vehicle battery, condition determining and displaying method, involves comparing state of charge with threshold value, and displaying request for charging battery by display unit during permanent shortfall of value |
| 12/11/2008 | DE102007026175A1 Method for detection of aging of electrical transformer, involves calculating aging rate of electrical transformer, and determining factor, where factor is combined with aging rate |
| 12/11/2008 | DE102007024175A1 Early failure detection method for e.g. metal oxide semiconductor FET, involves measuring direct current portion or direct current resistance at control electrode, and evaluating portion to determine failure tendency of arrangement |
| 12/11/2008 | DE102006037904B4 Kontaktierungseinheit für elektronische Bauelemente Contacting unit for electronic components |
| 12/11/2008 | CA2688259A1 Method for monitoring the state of a force measuring device, force measuring device and force measuring module |
| 12/10/2008 | EP2001074A1 System and method to determine the loss in capacity and energy of a battery determining the output capacity of a battery |
| 12/10/2008 | EP2000812A1 Testable integrated circuit die and integrated circuit package |