| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 11/12/2008 | CN100433838C Decoding method and decoding apparatus |
| 11/12/2008 | CN100433497C A device for charging protection of the battery unit and detection of the charging and discharging feature of the battery |
| 11/12/2008 | CN100433446C Cell evaluation device |
| 11/12/2008 | CN100433330C Driver ic and inspection method for driver ic and output device |
| 11/12/2008 | CN100432947C Transparent re-mapping of parallel computational units |
| 11/12/2008 | CN100432876C Inspecting device and programming tool |
| 11/12/2008 | CN100432691C Automatic detection platform for performance of air compressor for fuel cell system |
| 11/12/2008 | CN100432690C Integrated test bench for creepage breaker |
| 11/12/2008 | CN100432689C Test device and test method |
| 11/12/2008 | CN100432688C Sensor signal detection device |
| 11/12/2008 | CN100432687C Inspection method and inspection equipment |
| 11/12/2008 | CN100432686C Circuit device of leakage current detector of lightning protector and its operating method |
| 11/12/2008 | CN100432685C Chip pin open circuit and short circuit tester and method therefor |
| 11/12/2008 | CN100432684C Production test method for communication equipment |
| 11/12/2008 | CN100432683C Fault arc detection method and protection circuit thereof |
| 11/12/2008 | CN100432679C Vertical probe card |
| 11/11/2008 | US7451373 Circuit for compression and storage of circuit diagnosis data |
| 11/11/2008 | US7451372 Circuit test pattern edition apparatus, circuit test pattern editing method, and signal-bearing medium embodying a program of circuit test pattern edition |
| 11/11/2008 | US7451371 Multiple-capture DFT system for scan-based integrated circuits |
| 11/11/2008 | US7451370 Input/output buffer test circuitry and leads additional to boundary scan |
| 11/11/2008 | US7451369 Scalable columnar boundary scan architecture for integrated circuits |
| 11/11/2008 | US7451368 Semiconductor device and method for testing semiconductor device |
| 11/11/2008 | US7451365 System and method for identifying nodes in a wireless network |
| 11/11/2008 | US7451146 Almost non-blocking linked stack implementation |
| 11/11/2008 | US7451053 On die thermal sensor of semiconductor memory device and method thereof |
| 11/11/2008 | US7451025 Test mode circuit and reset control method therefor |
| 11/11/2008 | US7450571 Resource allocation in multi-stream IP network for optimized quality of service |
| 11/11/2008 | US7450530 Cross link multiplexer bus configured to reduce cross-talk |
| 11/11/2008 | US7450529 Cross link multiplexer bus |
| 11/11/2008 | US7450522 Power control system using acknowledgments |
| 11/11/2008 | US7450521 Cost-based routing using backoff scheme |
| 11/11/2008 | US7450519 Auto-negotiation monitor system, repeating-transmission apparatus, and auto-negotiation monitor method used therefor |
| 11/11/2008 | US7450513 Network controlling apparatus and path controlling method therein |
| 11/11/2008 | US7450512 Recirculating retransmission queuing system and method |
| 11/11/2008 | US7450509 Adaptive flow control method and apparatus |
| 11/11/2008 | US7450505 System and method for topology constrained routing policy provisioning |
| 11/11/2008 | US7450494 Reconfigurable apparatus providing 1:N and 1:1 equipment redundancy for high speed broadband interfaces with 1+1 and 1:N automatic protection switching |
| 11/11/2008 | US7450237 Non-invasive electric-filed-detection device and method |
| 11/11/2008 | US7449912 Fault detection circuit |
| 11/11/2008 | US7449911 Method for determining electro-migration failure mode |
| 11/11/2008 | US7449910 Test system for semiconductor components having conductive spring contacts |
| 11/11/2008 | US7449909 System and method for testing one or more dies on a semiconductor wafer |
| 11/11/2008 | US7449908 Process monitor for monitoring an integrated circuit chip |
| 11/11/2008 | US7449907 Test unit to test a board having an area array package mounted thereon |
| 11/11/2008 | US7449906 Probe for testing an electrical device |
| 11/11/2008 | US7449905 Automated characterization system for laser chip on a submount |
| 11/11/2008 | US7449904 Integrated circuit burn-in methods and apparatus |
| 11/11/2008 | US7449903 Method and system for the optical inspection of contact faces at semiconductor devices with different appearances |
| 11/11/2008 | US7449902 Probe system |
| 11/11/2008 | US7449901 Grounding scheme for high speed probing with reduced loop area |
| 11/11/2008 | US7449900 Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof |
| 11/11/2008 | US7449899 Probe for high frequency signals |
| 11/11/2008 | US7449898 Method and apparatus for reviewing defects by detecting images having voltage contrast |
| 11/11/2008 | US7449892 Stray voltage detecting |
| 11/11/2008 | US7449891 Managing service life of a battery |
| 11/11/2008 | US7449875 Device for automatic detection of battery polarity |
| 11/11/2008 | US7449858 Variable-Structure diagnostics approach achieving optimized low-frequency data sampling for EMA motoring subsystem |
| 11/11/2008 | US7449784 Device package and methods for the fabrication and testing thereof |
| 11/11/2008 | US7449350 Structure and method for parallel testing of dies on a semiconductor wafer |
| 11/11/2008 | US7448279 Device for testing material properties with regard to combined tensile and shear loads, in particular for testing adhesives |
| 11/11/2008 | CA2630189A1 Systems, methods, and apparatus for measuring capacitance in a stator component |
| 11/06/2008 | WO2008134405A1 Test plate pocket for electronic handler |
| 11/06/2008 | WO2008134222A2 A system for and method of integrating test structures into an integrated circuit |
| 11/06/2008 | WO2008133922A1 Electric power distribution interruption risk assessment calculator |
| 11/06/2008 | WO2008133238A1 Testing apparatus and testing method |
| 11/06/2008 | WO2008133215A1 Semiconductor integrated circuit |
| 11/06/2008 | WO2008133081A1 Analog multiplexer with insulation power supply |
| 11/06/2008 | WO2008133052A1 Method for generating erroneous test-avoiding type test input in 2-pattern test of semiconductor integrated circuit |
| 11/06/2008 | WO2008133040A1 Semiconductor device |
| 11/06/2008 | WO2008132936A1 Tcp handling apparatus |
| 11/06/2008 | WO2008132935A1 Tcp handling apparatus |
| 11/06/2008 | WO2008132934A1 Tcp handling apparatus |
| 11/06/2008 | WO2008132857A1 Apparatus and method for detecting charged state of electric storage device |
| 11/06/2008 | WO2008132033A1 Monitoring reliability of a digital system |
| 11/06/2008 | WO2008131814A1 Measuring device having serial digital interface |
| 11/06/2008 | WO2008131497A1 An apparatus for sensing an electrical condition |
| 11/06/2008 | WO2008087362A3 Method of locating a zone of reduced insulation in an insulator covering a conductor of a winding |
| 11/06/2008 | WO2008075246A3 Battery low indication |
| 11/06/2008 | WO2008070466A3 Sharing resources in a system for testing semiconductor devices |
| 11/06/2008 | WO2008027213A3 Distributed antenna communications system and methods of implementing thereof |
| 11/06/2008 | WO2007149205A3 High accuracy in-situ resistance measurements methods |
| 11/06/2008 | WO2007146584A3 Contactor having a global spring structure and methods of making and using the contactor |
| 11/06/2008 | WO2007140366A3 Testing components of i/o paths of an integrated circuit |
| 11/06/2008 | WO2007130000A3 Method of increasing reliability of packaged semiconductor integrated circuit dice |
| 11/06/2008 | WO2007127561A3 Method of optimizing use of high-rate packet data resources |
| 11/06/2008 | WO2007115120A3 Method and apparatus to test the power-on-reset trip point of an integrated circuit |
| 11/06/2008 | WO2007109322A3 Speeding up defect diagnosis techniques |
| 11/06/2008 | WO2006115175A3 Test instrument, program and recording medium |
| 11/06/2008 | US20080276145 Integrated circuit having electrically isolatable test circuitry |
| 11/06/2008 | US20080276144 Method and System for Formal Verification of Partial Good Self Test Fencing Structures |
| 11/06/2008 | US20080276143 Method and apparatus for broadcasting scan patterns in a random access based integrated circuit |
| 11/06/2008 | US20080276142 Wafer scale testing using a 2 signal jtag interface |
| 11/06/2008 | US20080276141 Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit |
| 11/06/2008 | US20080276140 Semiconductor chip with a plurality of scannable storage elements and a method for scanning storage elements on a semiconductor chip |
| 11/06/2008 | US20080276139 Self-Synchronizing Pseudorandom Bit Sequence Checker |
| 11/06/2008 | US20080276133 Software-Controlled Dynamic DDR Calibration |
| 11/06/2008 | US20080275662 Generating transmission-code compliant test sequences |
| 11/06/2008 | US20080274702 Method and Device for Measuring Radio Interference Levels With Frequency Tracking |
| 11/06/2008 | US20080273640 Plural circuit selection using role reversing control inputs |
| 11/06/2008 | US20080273455 Retry Strategies for Use in a Streaming Environment |