Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2009
01/28/2009CN101354431A Apparatus and method for recognizing battery types
01/28/2009CN101354430A Method for determining total conductivity and evaluating electric conduction performance of lithium battery positive pole active substance
01/28/2009CN101354429A Integrated circuit thermal vacuum test method
01/28/2009CN101354428A Trolley for probe card and operation method of probe card using the same
01/28/2009CN101354427A Method for testing leading edge shield parameter of power supply management chip
01/28/2009CN101354426A Device and method for simulating load for xenon discharge lamp electric ballast test
01/28/2009CN101354425A Test device of crosslinking polyethylene-insulated cable material water treeing resistance performance
01/28/2009CN101354424A Method for detecting electric network fault transient travelling wave signal
01/28/2009CN101354423A System and method for model building of impact load based on actual measurement
01/28/2009CN101354422A Method for testing shield performance of electric wire and cable industrial frequency / special frequency electromagnetic interference
01/28/2009CN101354421A System for detecting cascade programmed control frequency accidental resonance square wave
01/28/2009CN101354420A System for detecting programmed control distance-changing accidental resonance square wave
01/28/2009CN101354419A Non-space electric energy quality on-line monitoring device
01/28/2009CN101354418A Power transformer test method without disconnecting wire
01/28/2009CN101354417A Circuit board test device of electrical energy meter based on virtual instrument technique
01/28/2009CN101354416A Method for preparing small separation distance electrode on transmission electric mirror sample
01/28/2009CN101354415A Cable test terminal and test method thereof
01/28/2009CN101354414A System and method for detecting defect with multi-step output function
01/28/2009CN101354413A Apparatus for testing chip
01/28/2009CN101354408A Electric energy acquisition and operation management system and method based on platform zone centralized service terminal
01/28/2009CN101354403A Wafer carrying platform for wafer detection device and wafer detection device having the same
01/28/2009CN100456257C Apparatus and method for testing multiple hard disk drives using single computer
01/28/2009CN100456043C Method and apparatus for testing integrated circuits
01/28/2009CN100456042C Test apparatus
01/28/2009CN100456041C Window type online monitor for detecting gas insulation combined electric appliance (GIS)
01/28/2009CN100456040C Automatic test instrument for function of photography flash
01/27/2009US7484189 Method for searching for potential faults in a layout of an integrated circuit
01/27/2009US7484166 Semiconductor integrated circuit verification method and test pattern preparation method
01/27/2009US7484155 Analog base-band test apparatus and method by enhanced combination of JTAG and memory in mobile communication system
01/27/2009US7484154 Semiconductor integrated circuit, method for testing semiconductor integrated circuit, and computer readable medium for the same
01/27/2009US7484153 Systems and methods for LBIST testing using isolatable scan chains
01/27/2009US7484152 Securing the test mode of an integrated circuit
01/27/2009US7484151 Method and apparatus for testing logic circuit designs
01/27/2009US7484150 Semiconductor integrated circuit design apparatus and semiconductor integrated circuit design method
01/27/2009US7484149 Negative edge flip-flops for muxscan and edge clock compatible LSSD
01/27/2009US7484148 Interface error monitor system and method
01/27/2009US7484147 Semiconductor integrated circuit
01/27/2009US7484146 Method for capturing multiple data packets in a data signal for analysis
01/27/2009US7484145 Method for embedded integrated end-to-end testing
01/27/2009US7484141 Semiconductor device capable of performing test at actual operating frequency
01/27/2009US7484139 Amplifier fault detection circuit
01/27/2009US7484138 Method and system for improving reliability of memory device
01/27/2009US7484135 Semiconductor device having a mode of functional test
01/27/2009US7484118 Multi nodal computer system and method for handling check stops in the multi nodal computer system
01/27/2009US7483998 Software configurable cluster-based router using heterogeneous nodes as cluster nodes
01/27/2009US7483799 Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
01/27/2009US7483796 Method and apparatus for determining faults in an electric assist steering system
01/27/2009US7483769 Method and apparatus for latent temperature control for a device under test
01/27/2009US7483382 Device for securely monitoring data switching
01/27/2009US7483380 Method and apparatus for bandwidth management
01/27/2009US7483374 Method and apparatus for achieving dynamic capacity and high availability in multi-stage data networks using adaptive flow-based routing
01/27/2009US7483372 Communication network
01/27/2009US7483369 Method and apparatus for migrating to an alternate call controller
01/27/2009US7482830 Semiconductor device and method for testing semiconductor device
01/27/2009US7482829 Electric power applying circuit and test apparatus
01/27/2009US7482828 Methods and apparatus for device testing at the wafer level
01/27/2009US7482827 Integrated circuit with testable clock circuits
01/27/2009US7482826 Probe for scanning over a substrate and a data storage device
01/27/2009US7482825 Burn-in testing apparatus and method
01/27/2009US7482824 Polycrystalline contacting component and test tool having the contacting component
01/27/2009US7482823 Shielded probe for testing a device under test
01/27/2009US7482822 Apparatus and method for limiting over travel in a probe card assembly
01/27/2009US7482821 Probe card and the production method
01/27/2009US7482816 Voltage monitor and electrical storage device using the same
01/27/2009US7482815 Method of operating a shielded connection, and communication network
01/27/2009US7482800 Wired circuit board and connecting structure thereof
01/27/2009US7482784 Degradation judgment circuit for secondary battery
01/27/2009US7482179 Method of fabricating a thin film transistor using dual or multiple gates
01/27/2009CA2602980A1 Method and system for real time identification of voltage stability via identification of weakest lines and buses contributing to power system collapse
01/27/2009CA2428690C Method and apparatus for verifying a color of an led in a printed circuit board
01/27/2009CA2408376C Battery monitoring system
01/27/2009CA2257410C Method and device for testing differential protection relays or differential protection relay systems
01/27/2009CA2216524C Electric arc detector sensor circuit
01/25/2009CA2594703A1 Method and system of modeling energy flow for vehicle battery diagnostic monitoring
01/22/2009WO2009012006A1 Integrated circuit having built-in self-test features
01/22/2009WO2009011983A1 Integrated circuit having built-in self-test features
01/22/2009WO2009011875A2 Battery tester for electric vehicle
01/22/2009WO2009011696A1 A device and method for reparing a microelectromechanical system
01/22/2009WO2009011508A1 Opener and buffer table for test handler
01/22/2009WO2009011252A1 Testing apparatus and transmitting apparatus
01/22/2009WO2009011033A1 Testing apparatus, circuit apparatus and program
01/22/2009WO2009011028A1 Electronic device, host device, communication system, and program
01/22/2009WO2009010920A2 Semi-adaptive voltage scaling for low-energy digital vlsi-design
01/22/2009WO2009010720A1 Apparatus and method for measuring electrical potential of electrolyte
01/22/2009WO2009010169A1 Method for fault location in uncompensated power lines with two-end unsynchronized measurement
01/22/2009WO2009010069A1 Method of determining a class of a load connected to an amplifier output
01/22/2009WO2009010056A1 Method of determining a class of a load connected to an amplifier output
01/22/2009WO2008140497A4 Method and circuit for low-power detection of solder-joint network failures in digital electronic packages
01/22/2009WO2007137065A3 Probe card and temperature stabilizer for testing semiconductor devices
01/22/2009US20090024894 System and method for predicting iwarx and stwcx instructions in test pattern generation and simulation for processor design verification/validation in interrupt mode
01/22/2009US20090024893 Integrated circuit arrangement and design method
01/22/2009US20090024890 Circuit arrangement, data processing device comprising such circuit arrangement as well as method for identifying an attack on such circuit arrangement
01/22/2009US20090024889 Integrated circuit having built-in self-test features
01/22/2009US20090024888 Semiconductor device
01/22/2009US20090024861 Pulse latch circuit and semiconductor integrated circuit
01/22/2009US20090024346 Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component
01/22/2009US20090024339 Method and apparatus for confirming the charge amount and degradation state of a battery, a storage medium, an information processing apparatus, and an electronic apparatus
01/22/2009US20090024338 Remaining-Amount Estimation Device and Method For Secondary Battery
01/22/2009US20090022056 Tuning routing metrics to reduce maximum link utilization and/or provide failure resiliency
01/22/2009US20090022054 Apparatus and method for service flow management in a broadband wireless communication system