| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 11/19/2008 | CN101308189A Medium insulation properties measuring apparatus for gas-liquid two-phase fluid state |
| 11/19/2008 | CN101308188A Safety checking system and method when large current passing cable assembly |
| 11/19/2008 | CN101308187A Method and terminal for detecting earphones plug inserting to position |
| 11/19/2008 | CN101308186A Plasma display device panel electrode test pen |
| 11/19/2008 | CN101308185A Direct current supply line electrical leakage detection circuit |
| 11/19/2008 | CN101308184A Method and system for analyzing and detecting inserting element using image |
| 11/19/2008 | CN101308183A Detection device and its detection method |
| 11/19/2008 | CN101308182A Synchronous torsional vibration excitation method simultaneously excitating multi-turbine generator set torsional vibration |
| 11/19/2008 | CN101308181A Apparatus and mehtods for diagnosing motor-resolver system faults |
| 11/19/2008 | CN101308180A Arc detector |
| 11/19/2008 | CN101308179A Powder dust electrical behavior multi- behavior simulation test system |
| 11/19/2008 | CN101308178A ARM7 based debugging device |
| 11/19/2008 | CN101308165A Probe array and method of its manufacture |
| 11/19/2008 | CN101308164A Probe assembly and inspection device |
| 11/19/2008 | CN101308162A Penetration type probe and method for packaging body test by the probe |
| 11/19/2008 | CN101308099A Optical inspection device |
| 11/19/2008 | CN100435317C Manufacturing method of semiconductor integrated circuit device and probe card |
| 11/19/2008 | CN100435104C Device for testing storage modular |
| 11/19/2008 | CN100434927C Test apparatus and write control circuit |
| 11/19/2008 | CN100434926C Gasinsulation combined electric device local discharge analog experimental apparatus and experimental method |
| 11/19/2008 | CN100434925C Examining instrument for liquid crystal panel |
| 11/19/2008 | CN100434923C Method for detecting paper shredder blocking and rotation and paper shredder having blocking and rotation detector |
| 11/19/2008 | CN100434893C Automatic measuring system for visual angle of liquid crystal display |
| 11/18/2008 | US7454728 Metastability injector for a circuit description |
| 11/18/2008 | US7454727 Method and Apparatus for Solving Sequential Constraints |
| 11/18/2008 | US7454723 Validation of electrical performance of an electronic package prior to fabrication |
| 11/18/2008 | US7454681 Automatic test system with synchronized instruments |
| 11/18/2008 | US7454680 Method, system and computer program product for improving efficiency in generating high-level coverage data for a circuit-testing scheme |
| 11/18/2008 | US7454679 Test apparatus, computer readable program for test apparatus, test pattern recording medium, and method for controlling test apparatus |
| 11/18/2008 | US7454678 Scan stream sequencing for testing integrated circuits |
| 11/18/2008 | US7454677 Two boundary scan cell switches controlling input to output buffer |
| 11/18/2008 | US7454676 Method for testing semiconductor chips using register sets |
| 11/18/2008 | US7454675 Testing of a programmable device |
| 11/18/2008 | US7454674 Digital jitter detector |
| 11/18/2008 | US7454396 Method for compressing multi-field rule specifications |
| 11/18/2008 | US7454306 Frequency margin testing |
| 11/18/2008 | US7454305 Method and apparatus for storing circuit calibration information |
| 11/18/2008 | US7454252 Redundant fieldbus system |
| 11/18/2008 | US7453935 Multi-pair gigabit ethernet transceiver having decision feedback equalizer |
| 11/18/2008 | US7453932 Test device and setting method |
| 11/18/2008 | US7453891 Clusters of devices, softwares and methods for improved handling of a gatekeeper load in VoIP communication |
| 11/18/2008 | US7453821 Methods of detecting signaling information in a wireless communication system |
| 11/18/2008 | US7453820 System and method for measuring data network quality |
| 11/18/2008 | US7453817 Central traffic correlation system |
| 11/18/2008 | US7453816 Method and apparatus for automatic recovery from a failed node concurrent maintenance operation |
| 11/18/2008 | US7453813 Methods for constructing PNNI networks with optimized architecture |
| 11/18/2008 | US7453811 Apparatus and methods for updating stale link state packets and routing table entries |
| 11/18/2008 | US7453807 Efficient rendezvous point tree to shortest path tree switch-over process |
| 11/18/2008 | US7453806 Dynamic data packet flow control for packet switching node |
| 11/18/2008 | US7453804 Aggregate network resource utilization control scheme |
| 11/18/2008 | US7453796 Method and apparatus for designing networks to support fast restoration |
| 11/18/2008 | US7453699 Digital electronic apparatus with suppressed radiant noise |
| 11/18/2008 | US7453293 High frequency divider state correction circuit |
| 11/18/2008 | US7453282 Input and output circuit of an integrated circuit and a method for testing the same |
| 11/18/2008 | US7453280 Method for testing semiconductor devices |
| 11/18/2008 | US7453279 Functional and stress testing of LGA devices |
| 11/18/2008 | US7453278 Methods of using a blade probe for probing a node of a circuit |
| 11/18/2008 | US7453277 Apparatus for full-wafer test and burn-in mechanism |
| 11/18/2008 | US7453276 Probe for combined signals |
| 11/18/2008 | US7453275 Probe card |
| 11/18/2008 | US7453274 Detection of defects using transient contrast |
| 11/18/2008 | US7453273 Method and apparatus for analyzing current in an integrated circuit under test |
| 11/18/2008 | US7453272 Electrical open/short contact alignment structure for active region vs. gate region |
| 11/18/2008 | US7453267 Branch circuit monitor system |
| 11/18/2008 | US7453261 Method of and system for monitoring the functionality of a wafer probe site |
| 11/18/2008 | US7453260 Testing circuits on substrate |
| 11/18/2008 | US7453259 Loading a socket and/or adapter device with a semiconductor component |
| 11/18/2008 | US7453258 Method and apparatus for remotely buffering test channels |
| 11/18/2008 | US7453169 Integrity testing of isolation means in an uninterruptible power supply |
| 11/18/2008 | US7452734 Method of making a monitoring pattern to measure a depth and a profile of a shallow trench isolation |
| 11/18/2008 | US7452733 Method of increasing reliability of packaged semiconductor integrated circuit dice |
| 11/18/2008 | US7452248 Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same |
| 11/18/2008 | CA2413518C Integrated circuit testing system and method |
| 11/18/2008 | CA2313527C Lithium-polymer type battery and control system |
| 11/14/2008 | CA2630186A1 Arc detector |
| 11/13/2008 | WO2008137980A1 Production testing of a capacitive touch sensing device |
| 11/13/2008 | WO2008137918A1 Fuel cell stack performance monitoring |
| 11/13/2008 | WO2008137458A2 Generating test sequences for testing circuit channels |
| 11/13/2008 | WO2008137291A1 Test pin, method of manufacturing same, and system containing same |
| 11/13/2008 | WO2008136646A1 Multilayer substrate and electrical tester having the same |
| 11/13/2008 | WO2008136395A1 Probe card |
| 11/13/2008 | WO2008136301A1 Test instrument and test method |
| 11/13/2008 | WO2008136153A1 Liquid crystal display panel and its inspecting method |
| 11/13/2008 | WO2008135917A1 Ic testing methods and apparatus |
| 11/13/2008 | WO2008135821A1 Method and device for aligning a test system and an electric member to be tested |
| 11/13/2008 | WO2008135499A1 Battery sensor and method for the detection of battery-specific parameters |
| 11/13/2008 | WO2008135183A1 Device for checking the attachment of a circuit board on a carrier |
| 11/13/2008 | WO2008135052A1 Apparatus, method and computer program for obtaining a time-domain-reflection response-information |
| 11/13/2008 | WO2008134995A1 Method and device for capturing a fault in an electrical supply grid |
| 11/13/2008 | WO2008098655A3 Contacting station for testing test samples under thermal conditions |
| 11/13/2008 | WO2008070590A3 Probing apparatus with guarded signal traces |
| 11/13/2008 | WO2008068128A3 Method for exchanging data |
| 11/13/2008 | WO2008056385A8 Method for detecting partial discharges in an electric machine and detecting device of partial discharges |
| 11/13/2008 | WO2008008546A3 Universal reconfigurable scan architecture |
| 11/13/2008 | WO2008008105A3 Detection and monitoring of partial discharge of a power line |
| 11/13/2008 | WO2007142718A3 Floor control templates for use in push-to-talk applications |
| 11/13/2008 | WO2007106388A8 Long line monitoring and locating system |
| 11/13/2008 | WO2007098430A3 Sampling a device bus |
| 11/13/2008 | WO2007019077A3 Obtaining test data for a device |
| 11/13/2008 | US20080282210 System And Method For Product Yield Prediction |