| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/14/2009 | CN101346632A Probe card |
| 01/14/2009 | CN101345822A Electronic apparatus |
| 01/14/2009 | CN101345553A Cable diagnosis system, method and system for configuring Ethernet port |
| 01/14/2009 | CN101345485A Simulation power supply of four-quadrant electric network |
| 01/14/2009 | CN101345458A Full anti-dizzy VPI impregnation stator line stick and its industrial frequency overpressure-resistant detection method |
| 01/14/2009 | CN101345415A Travelling wave analysis recognition method for thunderbolt shielding failure and counterattack discrimination of direct current transmission line |
| 01/14/2009 | CN101345414A Main electric power line integration fault location protection system based on GPS and fault transient signal |
| 01/14/2009 | CN101345408A Method for assigning a residual current to one of the three phase currents of a three-phase system and residual current protection switch |
| 01/14/2009 | CN101345406A Collocation method for 12 fluctuation bridge neutral earthing protection of back-to-back DC power transmission system |
| 01/14/2009 | CN101345020A Method for confirming brightness characteristic of vacuum fluorescent display |
| 01/14/2009 | CN101344579A Battery electric quantity detection apparatus and method |
| 01/14/2009 | CN101344578A Method and device for diagnosis of output parameter of DC machine |
| 01/14/2009 | CN101344577A Step motor test system and method |
| 01/14/2009 | CN101344576A Judging functional failure of electromechanical by speech recognition technology |
| 01/14/2009 | CN101344575A Relay reliability service life experiment system based on dynamic characteristic |
| 01/14/2009 | CN101344574A Mechanical endurance test instrument for high voltage switch |
| 01/14/2009 | CN101344573A Method and apparatus for testing a system module |
| 01/14/2009 | CN101344572A Chopped wave test circuit and method for semiconductor power device |
| 01/14/2009 | CN101344571A Socket, and test apparatus and method using the socket |
| 01/14/2009 | CN101344570A Inspection method and program recording medium recorded with inspection method |
| 01/14/2009 | CN101344569A Test device and method for interlaminar voltage resistance performance of copper clad plate |
| 01/14/2009 | CN101344568A Discharging fault positioning apparatus, system and method |
| 01/14/2009 | CN101344567A Method for determining location of phase-to-earth fault |
| 01/14/2009 | CN101344566A Test device and method for detecting winding deformation of power transformer |
| 01/14/2009 | CN101344565A Current transformer detection method and system |
| 01/14/2009 | CN101344564A Active phase array antenna electrical property prediction method based on mechanical, electric and thermal three-field coupling |
| 01/14/2009 | CN101344563A Automatic test equipment and method for touch device |
| 01/14/2009 | CN101344562A Test method and device for circuit printing plate component |
| 01/14/2009 | CN101344561A Integral detection bench of electric car electrical system |
| 01/14/2009 | CN101344560A Method for adjusting output amplitude of signal source in electromagnetic compatibility sensitivity test |
| 01/14/2009 | CN101344559A Signal source amplitude adjustment method in electromagnetic compatibility sensitivity test |
| 01/14/2009 | CN101344558A Data correcting method of radiation emission test |
| 01/14/2009 | CN101344557A Radiation sensitivity test method of protection power amplifier |
| 01/14/2009 | CN101344556A Method for enlarging effective dynamic range in electromagnetic compatibility test |
| 01/14/2009 | CN101344555A Live-wire examination method of extra-high voltage equipment |
| 01/14/2009 | CN101344554A Material high-temperature non-pressure electricity performance measurement system |
| 01/14/2009 | CN101344553A Filament temperature characteristic computing method of vacuum fluorescent display |
| 01/14/2009 | CN101344552A Grid system integrated protector tester |
| 01/14/2009 | CN101344551A Semi-conductor test structure |
| 01/14/2009 | CN101344550A Electric energy quality indication device and electric power monitoring equipment |
| 01/14/2009 | CN101344538A High/low-voltage isolation circuit |
| 01/14/2009 | CN101344537A General scarf joint tool for positioning ball lattice array packaging member to be measured |
| 01/14/2009 | CN101344536A IC picking device with uniformly-spaced movement |
| 01/14/2009 | CN101344379A Electric appliance dynamic test apparatus adopting high-speed camera |
| 01/14/2009 | CN101344369A Handcart once contact stroke test device for high-tension switch cabinet |
| 01/14/2009 | CN101342532A Memory body IC detecting and sorting machine |
| 01/14/2009 | CN101342531A Memory body IC detecting and sorting machine |
| 01/14/2009 | CN100452946C Method and device for manufacturing conductive patterns in a printed circuit board |
| 01/14/2009 | CN100452785C Location based directories via a broadband access gateway and control |
| 01/14/2009 | CN100452626C Battery state monitoring circuitry with low power consumption during a stand-by-state of a battery pack |
| 01/14/2009 | CN100452600C Anti-distort casing for electronic circuit |
| 01/14/2009 | CN100452598C Protection circuit for fault electric arc, and method for detecting fault electric arc |
| 01/14/2009 | CN100452551C 'Two-step contact' clamping mechanism of flexible printing circuit for magnetic-head suspending assembly |
| 01/14/2009 | CN100452529C Power system and its management method |
| 01/14/2009 | CN100452528C Remaining battery capacity computation system |
| 01/14/2009 | CN100452338C Die level testing using machine grooved storage tray with vacuum channels |
| 01/14/2009 | CN100452240C Multi-port memory device having serial i/o interface |
| 01/14/2009 | CN100452130C Short-circuit detecting device and picture element unit and display panel using the device |
| 01/14/2009 | CN100452129C Automatic laser auxiliary positioning system and method used for display device production line |
| 01/14/2009 | CN100451740C Tension precession evaluation test method and test frame |
| 01/14/2009 | CN100451670C Battery capacity detection apparatus and detection method |
| 01/14/2009 | CN100451669C Battery charged condition computing device and battery charged condition computing method |
| 01/14/2009 | CN100451668C Memory bus checking procedure |
| 01/14/2009 | CN100451663C Power supply level detector |
| 01/14/2009 | CN100451660C Electrical test device |
| 01/14/2009 | CN100451659C Sheetlike probe, its manufacturing method and its application |
| 01/14/2009 | CN100451658C Adapter for circuit board examination and device for circuit board examination |
| 01/13/2009 | US7478369 Method and device for optimising a test programme |
| 01/13/2009 | US7478345 Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits |
| 01/13/2009 | US7478333 Animation of a configuration diagram to visually indicate deployment of programs |
| 01/13/2009 | US7478305 Method and apparatus for interactive generation of device response templates and analysis |
| 01/13/2009 | US7478304 Apparatus for accelerating through-the-pins LBIST simulation |
| 01/13/2009 | US7478303 System and method for testing nodes in a network |
| 01/13/2009 | US7478302 Signal integrity self-test architecture |
| 01/13/2009 | US7478301 Partial good integrated circuit and method of testing same |
| 01/13/2009 | US7478300 Method for testing functional boundary logic at asynchronous clock boundaries of an integrated circuit device |
| 01/13/2009 | US7478299 Processor fault isolation |
| 01/13/2009 | US7478298 Method and system for backplane testing using generic boundary-scan units |
| 01/13/2009 | US7478297 Merged MISR and output register without performance impact for circuits under test |
| 01/13/2009 | US7478296 Continuous application and decompression of test patterns to a circuit-under-test |
| 01/13/2009 | US7478295 Method and apparatus of fault diagnosis for integrated logic circuits |
| 01/13/2009 | US7478294 Time controllable sensing scheme for sense amplifier in memory IC test |
| 01/13/2009 | US7478293 Method of securing the test mode of an integrated circuit via intrusion detection |
| 01/13/2009 | US7478287 Semiconductor integrated circuit and electronic device |
| 01/13/2009 | US7478178 Virtualization for device sharing |
| 01/13/2009 | US7478028 Method for automatically searching for functional defects in a description of a circuit |
| 01/13/2009 | US7478004 Method for testing a connection between an audio receiving device and a motherboard |
| 01/13/2009 | US7477684 Testing method, communication device, and testing system |
| 01/13/2009 | US7477610 Methods and devices for coordinating the transmissions of access points in WLANs |
| 01/13/2009 | US7477606 System and method for path failure recovery in a communications environment |
| 01/13/2009 | US7477603 Sharing line bandwidth among virtual circuits in an ATM device |
| 01/13/2009 | US7477602 Estimator for end-to-end throughput of wireless networks |
| 01/13/2009 | US7477595 Selector in switching matrix, line redundant method, and line redundant system |
| 01/13/2009 | US7477594 Method for restoring a virtual path in an optical network using 1:N protection |
| 01/13/2009 | US7477369 Apparatus for testing liquid crystal display device and testing method thereof |
| 01/13/2009 | US7477110 Method and device for testing a phase locked loop |
| 01/13/2009 | US7477078 Variable phase bit sampling with minimized synchronization loss |
| 01/13/2009 | US7477067 Semiconductor integrated circuit which can be burn-in-tested even when packaged and method of burn-in-testing semiconductor integrated circuit even when the semiconductor integrated circuit is packaged |
| 01/13/2009 | US7477065 Method for fabricating a plurality of elastic probes in a row |
| 01/13/2009 | US7477064 Probing apparatus and positional deviation acquiring method |