| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 12/03/2008 | CN100439930C Method for testing product fault-tolerant performance and fault inserting device thereof |
| 12/03/2008 | CN100439924C Probe component of detecting device for plane display board detection |
| 12/03/2008 | CN100439923C Chip general detector and its structure method |
| 12/03/2008 | CN100439922C Detecting apparatus of display panel |
| 12/02/2008 | US7461319 System and method for downloading files over a network with real time verification |
| 12/02/2008 | US7461317 System and method for aligning a quadrature encoder and establishing a decoder processing speed |
| 12/02/2008 | US7461316 Multi-strobe generation apparatus, test apparatus and adjustment method |
| 12/02/2008 | US7461315 Method and system for improving quality of a circuit through non-functional test pattern identification |
| 12/02/2008 | US7461314 Test device |
| 12/02/2008 | US7461313 Test pattern generation |
| 12/02/2008 | US7461312 Digital signature generation for hardware functional test |
| 12/02/2008 | US7461311 Device and method for creating a signature |
| 12/02/2008 | US7461310 IC functional and delay fault testing |
| 12/02/2008 | US7461309 Systems and methods for providing output data in an LBIST system having a limited number of output ports |
| 12/02/2008 | US7461308 Method for testing semiconductor chips by means of bit masks |
| 12/02/2008 | US7461307 System and method for improving transition delay fault coverage in delay fault tests through use of an enhanced scan flip-flop |
| 12/02/2008 | US7461304 Integrated circuit test using clock signal modification |
| 12/02/2008 | US7460988 Test emulator, test module emulator, and record medium storing program therein |
| 12/02/2008 | US7460969 Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device |
| 12/02/2008 | US7460486 Method for time-stamping a message based on a recipient location |
| 12/02/2008 | US7460476 Automatic adaptive network traffic prioritization and shaping |
| 12/02/2008 | US7460474 Packet transmission control apparatus and packet transmission control method |
| 12/02/2008 | US7460471 System for motion control, method of using the system for motion control, and computer readable instructions for use with the system for motion control |
| 12/02/2008 | US7460470 Systems and methods of priority failover determination |
| 12/02/2008 | US7460469 Fast rerouting of traffic in a circuit switched mesh network |
| 12/02/2008 | US7460468 Method and system for automatically tracking the rerouting of logical circuit data in a data network |
| 12/02/2008 | US7460097 Semiconductor integrated circuit for driving liquid crystal panel |
| 12/02/2008 | US7459960 Semiconductor integrated circuit device, and adjustment method of semiconductor integrated circuit device |
| 12/02/2008 | US7459928 Cell with fixed output voltage for integrated circuit |
| 12/02/2008 | US7459926 Scan distributor loading scan paths simultaneous with loading test data |
| 12/02/2008 | US7459925 Probe card |
| 12/02/2008 | US7459924 Apparatus for providing electrical access to one or more pads of the wafer using a wafer translator and a gasket |
| 12/02/2008 | US7459923 Probe interposers and methods of fabricating probe interposers |
| 12/02/2008 | US7459922 Microcontactor probe assembly having a plunger and electric probe unit using the same |
| 12/02/2008 | US7459921 Method and apparatus for a paddle board probe card |
| 12/02/2008 | US7459917 Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for current and voltage distributions and apparatus therefor |
| 12/02/2008 | US7459914 Systems and methods for electrical leakage detection |
| 12/02/2008 | US7459913 Methods for the determination of film continuity and growth modes in thin dielectric films |
| 12/02/2008 | US7459912 Nickel-hydride battery life determining method and life determining apparatus |
| 12/02/2008 | US7459910 Contact welding detecting device for relay |
| 12/02/2008 | US7459903 Multi-level voltage detection circuit |
| 12/02/2008 | US7459902 Electronic device testing apparatus |
| 12/02/2008 | US7459884 Remaining capacity calculation method for secondary battery, and battery pack |
| 12/02/2008 | US7458837 Connector housing block, interface member and electronic device testing apparatus |
| 12/02/2008 | US7458818 Electric connector and electrical connecting apparatus using the same |
| 12/02/2008 | US7458123 Apparatuses and methods for cleaning test probes |
| 12/02/2008 | CA2370754C In-service testing of current transformers |
| 11/27/2008 | WO2008144574A1 Systems and methods for validating power integrity of integrated circuits |
| 11/27/2008 | WO2008144436A1 System and method for automation of hardware signal characterization and signal integrity verification |
| 11/27/2008 | WO2008144265A1 Semiconductor packages and method for fabricating semiconductor packages with discrete components |
| 11/27/2008 | WO2008144167A1 Balancing scan chains and inserting the balanced-length scan chains into hierarchically designed integrated circuits |
| 11/27/2008 | WO2008144081A1 Method and apparatus for determining a calibration signal |
| 11/27/2008 | WO2008143897A1 Transmission line pulse testing with reflection control |
| 11/27/2008 | WO2008143699A1 Troubleshooting temporal behavior in 'combinational' circuits |
| 11/27/2008 | WO2008143512A1 Probe board, test fixture, method for making a probe board, and method for testing a printed circuit board (pcb) |
| 11/27/2008 | WO2008142769A1 Semiconductor device testing device and testing method |
| 11/27/2008 | WO2008142754A1 Electronic component testing device and electronic component testing method |
| 11/27/2008 | WO2008142753A1 Means for storing trays, electronic part tester and tray-storing method |
| 11/27/2008 | WO2008142743A1 Testing device |
| 11/27/2008 | WO2008141560A1 Base station system, tower top amplifier, base station and method for measuring a length of a feeder line |
| 11/27/2008 | WO2008082859A3 Stiffener assembly for use with testing devices |
| 11/27/2008 | WO2008033428A3 Compliance partitioning in testing of integrated circuits |
| 11/27/2008 | WO2007143199A3 Methods and apparatuses for trimming circuits |
| 11/27/2008 | WO2007137202A3 User interface for monitoring a plurality of faulted circuit indicators |
| 11/27/2008 | US20080295045 Method for Creating Hdl Description Files of Digital Systems, and Systems Obtained |
| 11/27/2008 | US20080294955 Dynamically Reconfigurable Shared Scan-In Test Architecture |
| 11/27/2008 | US20080294954 System, method and program for processing read error |
| 11/27/2008 | US20080294953 Removing the effects of unknown test values from compacted test responses |
| 11/27/2008 | US20080294380 Battery characteristic simulating apparatus |
| 11/27/2008 | US20080294360 Method for detecting the loss of one or more phases in a permanent-magnet synchronous electric motor |
| 11/27/2008 | US20080293167 Fabrication method of semiconductor integrated circuit device |
| 11/27/2008 | US20080291836 Program, method and apparatus for collecting information |
| 11/27/2008 | US20080291823 Data driven connection fault management (ddcfm) in cfm maintenance points |
| 11/27/2008 | US20080291039 Detection of a broken wire between power sourcing equipment and a powered device |
| 11/27/2008 | US20080290946 Semiconductor integrated circuit device |
| 11/27/2008 | US20080290892 Evaluation device and evaluation method using evaluation device |
| 11/27/2008 | US20080290891 Method of performing parallel test on semiconductor devices by dividing voltage supply unit |
| 11/27/2008 | US20080290890 Testing system for testing electronic assembly |
| 11/27/2008 | US20080290889 Method of destructive testing the dielectric layer of a semiconductor wafer or sample |
| 11/27/2008 | US20080290887 Testing method for semiconductor device having ball-shaped external electrode |
| 11/27/2008 | US20080290885 Probe test system and method for testing a semiconductor package |
| 11/27/2008 | US20080290884 Probe card assembly with ZIF connectors, method of assembling, wafer testing system and wafer testing method introduced by the same |
| 11/27/2008 | US20080290883 Testboard with ZIF connectors, method of assembling, integrated circuit test system and test method introduced by the same |
| 11/27/2008 | US20080290882 Probe needle protection method for high current probe testing of power devices |
| 11/27/2008 | US20080290879 Capacitive measurements with fast recovery current return |
| 11/27/2008 | US20080290878 Ic Testing Methods and Apparatus |
| 11/27/2008 | US20080290877 Apparatus and Method of Testing for Battery |
| 11/27/2008 | US20080290341 Stacked semiconductor device and method of testing the same |
| 11/27/2008 | US20080289162 Method of manufacturing a piezoelectric vibrator |
| 11/27/2008 | DE112007000397T5 Messvorrichtung und Messverfahren Measuring apparatus and measurement procedures |
| 11/27/2008 | DE112007000337T5 Hybridfahrzeug-Batterielebensdauer-Bewertungsvorrichtung Hybrid vehicle battery life evaluating device |
| 11/27/2008 | DE10238589B4 Verfahren zum Reduzieren einer elektrostatischen Absorptionsladung eines Keramikkondensators A method for reducing an electrostatic charge of a ceramic capacitor absorption |
| 11/27/2008 | DE102008022750A1 Verbesserte JTAG-Schnittstelle Enhanced JTAG interface |
| 11/27/2008 | DE102007024407A1 Spark plug testing method for use in internal combustion engine, involves determining whether voltage drift occurs at plug by using filters, and selecting and sorting ignition plug when voltage drift occurs |
| 11/27/2008 | DE102007023901A1 Vehicle battery device, particularly for battery of hybrid motor vehicle, has unit, which is provided in addition that limits or adjusts characteristics as function of prognosis |
| 11/27/2008 | DE102007022690A1 Zentriervorrichtung für elektronische Bauelemente, insbesondere IC's Centering device for electronic components, in particular ICs |
| 11/27/2008 | DE102007009878B4 Vorrichtung und Verfahren zum Durchführen eines Tests von Halbleiter-Bauelementen mit optischer Schnittstelle Apparatus and method for performing a test of semiconductor devices with optical interface |
| 11/27/2008 | DE102006006524B4 Verfahren zur Überwachung eines Induktionsofens und Induktionsofen Method for monitoring an induction furnace and induction furnace |
| 11/27/2008 | DE10100183B4 Prüfstecker Test Plugs |
| 11/27/2008 | DE10001340B4 Verfahren zur Meßfehlerkompensation bei der Stromerfassung in einem Energiespeicher A method of measurement error in the current detection in an energy storage |