| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/07/2009 | CN101341416A Circuit and data carrier with radio frequency interface |
| 01/07/2009 | CN101341415A Anistropic conductive connector, conversion adapter for inspection device having the anisotropic conductive connector, inspection device, and method for manufacturing the anistropic conductive connect |
| 01/07/2009 | CN101341414A Connection verification technique |
| 01/07/2009 | CN101341413A Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters |
| 01/07/2009 | CN101341411A Test adapter |
| 01/07/2009 | CN101340190A Semiconductor integrated circuit and method of testing same |
| 01/07/2009 | CN101340121A Transient simulation simplified model for internal fault of generator, modeling method and application thereof |
| 01/07/2009 | CN101340106A Power supply system of elevator |
| 01/07/2009 | CN101340086A Single-phase grounding fault determining, protecting method and system of neutral-point uneffective earthed electric grid |
| 01/07/2009 | CN101340075A Automatic switch control system for three-phase transmission line and electricity power control method thereof |
| 01/07/2009 | CN101339833A High-voltage power consuming apparatus using water as load |
| 01/07/2009 | CN101339748A Data line driver circuit for display panel and method of testing the same |
| 01/07/2009 | CN101339409A Digifax and mode number transition card identification method based on equivalent model transform |
| 01/07/2009 | CN101339302A ITO test board and test method |
| 01/07/2009 | CN101339231A Battery state monitoring circuit and battery apparatus |
| 01/07/2009 | CN101339230A Method and apparatus for measuring battery internal resistance |
| 01/07/2009 | CN101339229A High-voltage circuit-breaker status on-line monitoring method based on synchronous sampling |
| 01/07/2009 | CN101339228A Scanning tester |
| 01/07/2009 | CN101339227A Programmable logic device pin attribute rapid discrimination technology |
| 01/07/2009 | CN101339226A Test circuit and test method |
| 01/07/2009 | CN101339225A Test interface possessing hybrid signal processing apparatus |
| 01/07/2009 | CN101339224A Insulated gate two polar -type transistor open-shut time parameter test system |
| 01/07/2009 | CN101339223A Solar panel automatic detection machine |
| 01/07/2009 | CN101339222A Current mutual inductor coil excitation characteristic test wire winding tool equipment |
| 01/07/2009 | CN101339221A Test device for reactor volt-second characteristic of high voltage direct current transmission valve |
| 01/07/2009 | CN101339220A Panel test circuit structure |
| 01/07/2009 | CN101339219A Turn knob potentiometer rotating life-span tester |
| 01/07/2009 | CN101339218A Piezoresistor test method |
| 01/07/2009 | CN101339214A Accumulator internal resistance measurement method |
| 01/07/2009 | CN101339208A Voltage quality monitoring and perturb automatic classification method based on analysis in time-domain |
| 01/07/2009 | CN101339205A Electronic parts test device |
| 01/07/2009 | CN101339204A Disc conveyer device |
| 01/07/2009 | CN101339203A Automobile wheel speed sensor fault monitoring method |
| 01/07/2009 | CN101339092A LED chip / wafer/ epitaxial slice non-contact type checking method and checking device |
| 01/07/2009 | CN100450112C Providing automatic format conversion via an access gateway in a home |
| 01/07/2009 | CN100449921C Voltage detection circuit, power supply unit and semiconductor device |
| 01/07/2009 | CN100449859C Method for detecting state of secondary battery and device for detecting state of second battery |
| 01/07/2009 | CN100449857C Degradation judgment circuit for secondary battery |
| 01/07/2009 | CN100449734C 半导体器件 Semiconductor devices |
| 01/07/2009 | CN100449674C Light-spot fast repairing method of color tube |
| 01/07/2009 | CN100449324C Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device |
| 01/07/2009 | CN100449323C Detection method for speed sensitive winding earthing of generator exciter winding |
| 01/07/2009 | CN100449322C Measurement circuit with improved accuracy |
| 01/07/2009 | CN100449321C Method and control circuitry for accessing multiple taps (test access ports) via a single tap |
| 01/07/2009 | CN100449320C Vector generating method for testing plate sequence circuit |
| 01/07/2009 | CN100449319C Main circuit of general smart synthetic all-duty testing device |
| 01/07/2009 | CN100449318C Device and method for detecting whether circuit array is short circuit |
| 01/07/2009 | CN100449305C Automatic testing system for light transient |
| 01/06/2009 | US7475378 Method of designing semiconductor integrated circuit in which fault detection can be effected through scan-in and scan-out |
| 01/06/2009 | US7475319 Threshold voltage control apparatus, test apparatus, and circuit device |
| 01/06/2009 | US7475318 Method for testing the sensitive input range of Byzantine filters |
| 01/06/2009 | US7475317 Automatic test pattern generation |
| 01/06/2009 | US7475316 System, method and storage medium for providing a high speed test interface to a memory subsystem |
| 01/06/2009 | US7475315 Configurable built in self test circuitry for testing memory arrays |
| 01/06/2009 | US7475314 Mechanism for read-only memory built-in self-test |
| 01/06/2009 | US7475313 Unique pBIST features for advanced memory testing |
| 01/06/2009 | US7475312 Integrated circuit (IC) with on-board characterization unit |
| 01/06/2009 | US7475311 Systems and methods for diagnosing rate dependent errors using LBIST |
| 01/06/2009 | US7475310 Signal output circuit, and test apparatus |
| 01/06/2009 | US7475309 Parallel test mode for multi-core processors |
| 01/06/2009 | US7475308 implementing deterministic based broken scan chain diagnostics |
| 01/06/2009 | US7475307 Method, apparatus and computer program product for implementing scan-chain-specific control signals as part of a scan chain |
| 01/06/2009 | US7475306 Scan test method, integrated circuit, and scan test circuit |
| 01/06/2009 | US7475305 Method of high speed data rate testing |
| 01/06/2009 | US7475304 Bit error tester |
| 01/06/2009 | US7475303 HyperJTAG system including debug probe, on-chip instrumentation, and protocol |
| 01/06/2009 | US7475302 Decoded match circuit for performance counter |
| 01/06/2009 | US7475301 Increment/decrement circuit for performance counter |
| 01/06/2009 | US7475296 Serviceability and test infrastructure for distributed systems |
| 01/06/2009 | US7475172 Progressive extended compression mask for dynamic trace |
| 01/06/2009 | US7474999 Method for accounting for process variation in the design of integrated circuits |
| 01/06/2009 | US7474993 Selection of wavelengths for integrated circuit optical metrology |
| 01/06/2009 | US7474531 Circuit board testing jig |
| 01/06/2009 | US7474290 Semiconductor device and testing method thereof |
| 01/06/2009 | US7474121 Configurable memory design for masked programmable logic |
| 01/06/2009 | US7474115 Organic electronic device display defect detection |
| 01/06/2009 | US7474114 System and method for characterizing silicon wafers |
| 01/06/2009 | US7474113 Flexible head probe for sort interface units |
| 01/06/2009 | US7474112 Method and apparatus for non-invasively testing integrated circuits |
| 01/06/2009 | US7474111 Electrical probe assembly with guard members for the probes |
| 01/06/2009 | US7474110 Probe card |
| 01/06/2009 | US7474109 Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus |
| 01/06/2009 | US7474108 Apparatus and method for contacting of test objects |
| 01/06/2009 | US7474107 Buried short location determination using voltage contrast inspection |
| 01/06/2009 | US7474089 Contact mechanism cleaning |
| 01/06/2009 | US7474088 Power monitoring system |
| 01/06/2009 | US7472820 Code reading apparatus and method |
| 01/06/2009 | CA2403527C Vehicle lamp inspection system |
| 01/06/2009 | CA2372309C Pinched object detection apparatus for detecting object pinched by automatic door |
| 01/02/2009 | DE202008013687U1 Messanordnung mit Kalibriersubstrat und elektronischer Schaltung Measuring system with calibration substrate and electronic circuit |
| 01/02/2009 | DE112007000531T5 Testsignal-Erzeugungsvorrichtung Test signal generation means |
| 01/02/2009 | DE10319010B4 Lichtpolymerisationsvorrichtung The light polymerization |
| 01/02/2009 | DE102007050241A1 Wärmeübertragungsvorrichtung und Speichermodul Heat transfer device and memory module |
| 01/02/2009 | DE102007030391A1 Herstellungsverfahren für einen Stößel und derartiger Stößel Manufacturing method of a tappet and plunger such |
| 01/02/2009 | DE102007029956A1 Method for determining effective and actual capacity of accumulator, particularly lithium-ion battery, involves determining initial value of open-circuit voltage, and changing primary load by load difference value |
| 01/02/2009 | DE102007029824A1 Vorrichtung zum Erfassen von Quadratursignalen An apparatus for detecting quadrature signals |
| 01/02/2009 | DE102007029126A1 Errors e.g. assembly errors, locating device for electronic printed circuit board, has analysis device to detect level of supply current of sensor electronics as measure of strength of coupling of signals of board to capacitive sensor |
| 01/02/2009 | DE102007029123A1 System und Verfahren zur Erfassung der Kennlinien für eine Leuchtdioden-Anordnung System and method for detecting the characteristics of a light emitting diode assembly |
| 01/02/2009 | DE102007028704A1 Oil filling monitoring method for electrical transformer, involves comparing actual measured oil temperature with determined reference oil level, and outputting warning or alert depending on comparison |
| 01/02/2009 | DE102006009634B4 Hochpräzise Prüfung von Telematikeinrichtungen für Fahrzeuge High-precision testing of telematics devices for vehicles |