Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2008
11/13/2008US20080282123 System and Method of Multi-Frequency Integrated Circuit Testing
11/13/2008US20080282122 Single scan clock in a multi-clock domain
11/13/2008US20080282118 Highly Reliable Distributed System
11/13/2008US20080281549 Test Apparatus for Control Unit, Pattern Signal Creating Apparatus, and Test Program Generating Apparatus
11/13/2008US20080281547 Test circuit
11/13/2008US20080281546 Test access port with address and commmand capability
11/13/2008US20080281545 Determining die test protocols based on process health
11/13/2008US20080281541 System and method for estimating reliability of components for testing and quality optimization
11/13/2008US20080281538 Test unit and test apparatus
11/13/2008US20080281536 Semiconductor cp (circuit probe) test management system and method
11/13/2008US20080280623 Method and Apparatus For Distributing Load on Application Servers
11/13/2008US20080279255 Measuring Device, Especially Temperature Measuring Transducer
11/13/2008US20080279115 Method And Device For Implementing Resource Control On An Access Layer For A VC In An L2VPN
11/13/2008US20080279108 Method for Processing Quality of Service of a Data Transport Channel
11/13/2008US20080279106 Switching fabrics and control protocols for them
11/13/2008US20080278871 Method of detecting a ground fault and electrical switching apparatus employing the same
11/13/2008US20080278341 System and method for monitoring motor
11/13/2008US20080278190 Testing fuse configurations in semiconductor devices
11/13/2008US20080278189 Test circuit for performing multiple test modes
11/13/2008US20080278188 Probe card and method for fabricating the same
11/13/2008US20080278187 Test pin, method of manufacturing same, and system containing same
11/13/2008US20080278186 Pipeline test apparatus and method
11/13/2008US20080278183 Fuel cell test system
11/13/2008US20080278175 Systems and apparatus for monitoring internal temperature of a gradient coil
11/13/2008US20080278174 Circuit and Method for Detecting a Dielectric Breakdown Fault
11/13/2008US20080278146 Guide device and test apparatus for electronic devices
11/13/2008US20080278115 Battery Management System
11/13/2008US20080278006 Battery communication system
11/13/2008US20080277660 Semiconductor Device, Manufacturing Method Thereof, and Measuring Method Thereof
11/13/2008DE202008011111U1 Messvorrichtung Measuring device
11/13/2008DE112007000253T5 Prüfvorrichtung und Prüfverfahren Tester and test methods
11/13/2008DE112006003595T5 Prüfvorrichtung, Prüfverfahren und Programm Tester, test procedures and program
11/13/2008DE102008022469A1 Schutzvorrichtung für eine Sekundärbatterie und integriertes Halbleiterschaltungsbauteil A protective device for a secondary battery and semiconductor integrated circuit device
11/13/2008DE102008022201A1 Vorrichtung und Verfahren zum Messen einer lokalen Oberflächentemperatur eines Halbleiterbauelements Apparatus and method for measuring a local surface temperature of a semiconductor device
11/13/2008DE102007020955A1 Short-circuit indicator for direct arrangement at electric conductor to distribute electrical energy, has spring element outwardly and coaxially enclosing housing' cylindrical outer contour relative to longitudinal axis of housing
11/13/2008DE102007020882A1 Einrichtung zur Überprüfung der Befestigung einer Leiterbahnplatte an einem Träger Means for checking the attachment of a printed-circuit board to a support
11/13/2008DE10142840B4 Verzögerungsschaltung Delay circuit
11/12/2008EP1990859A1 Battery pack, electronic device and method for detecting remaining quantity in battery
11/12/2008EP1990723A1 Information processing apparatus control method and information processing apparatus
11/12/2008EP1990646A1 Battery service life judging device and battery service life judging method
11/12/2008EP1990645A1 Abnormality judgment device and abnormality judgment method of power supply unit
11/12/2008EP1990644A2 Calibration apparatus, testing apparatus, and calibration method
11/12/2008EP1990643A1 Systems, methods, and apparatus for measuring capacitance in a stator component
11/12/2008EP1989563A1 System and method for determining both an estimated battery state vector and an estimated battery parameter vector
11/12/2008EP1989562A1 Dual-path, multimode sequential storage element
11/12/2008EP1989560A1 Method and circuit arrangement for simulating fault states in a control device
11/12/2008EP1989520A1 Method for analysing the electrolyte system of a battery and associated device
11/12/2008EP1989518A1 Method and system for determining the electrolyte filling level of a lead battery
11/12/2008EP1810043A4 System and method to decrease the route convergence time and find optimal routes in a wireless communication network
11/12/2008CN201150008Y Accumulator on-line monitoring type UPS uninterrupted power supply system
11/12/2008CN201150001Y Voltage, current recuperating apparatus for medium voltage power distribution network
11/12/2008CN201149990Y Intelligent protecting monitor for electric motor
11/12/2008CN201149967Y Intelligent earth controller
11/12/2008CN201149631Y High temperature test and mobile device for assistance of liquid crystal panel
11/12/2008CN201149617Y Portable load instrument for measurement specially
11/12/2008CN201149616Y Device for detecting motor fault
11/12/2008CN201149615Y Test arrangement for circuit board
11/12/2008CN201149614Y Signal switch plate of circuit board test control tool as well as used test system
11/12/2008CN201149613Y Door type skeleton tower for outdoor impact test site
11/12/2008CN201149612Y Device for monitoring circuit
11/12/2008CN201149611Y Instrument for detecting five series and ultra-five series cable
11/12/2008CN201149610Y Novel test structure and test system containing the same
11/12/2008CN201149609Y Device for detecting wafer
11/12/2008CN201149608Y Test apparatus for multi-son unit cable
11/12/2008CN201149607Y Apparatus for holding multiple line pair cables
11/12/2008CN201149604Y 电流传感器 Current Sensors
11/12/2008CN201149574Y Electricity measuring apparatus for scanning electron microscope home position
11/12/2008CN201148471Y Copper electrolysis pole bar conductive inspection examination device
11/12/2008CN201147924Y Manipulator clamp mechanism
11/12/2008CN101305334A Intelligent storage engine for disk drive operations with reduced local bus traffic
11/12/2008CN101305290A Battery condition diagnosis apparatus
11/12/2008CN101305289A Providing precise timing control within a standardized test instrumentation chassis
11/12/2008CN101305288A Methods and apparatuses for dynamic probe adjustment
11/12/2008CN101305287A Process and device for the fail-safe evaluation of a position indicator, in particular a potentiometer
11/12/2008CN101305286A Electronic parts tester and method of setting best press condition of electronic parts tester contact arm
11/12/2008CN101305285A Probe for testing integrated circuit devices
11/12/2008CN101303499A Liquid crystal display panel apparatus and test method thereof
11/12/2008CN101303462A Liquid crystal display panel testing circuit and method
11/12/2008CN101303397A Method and apparatus for computing lithium ion batteries residual electric energy
11/12/2008CN101303396A System for monitoring fuel battery performance
11/12/2008CN101303395A Inverse soft instrument of synchronous generator
11/12/2008CN101303394A Device and method for testing hydroelectric generating set electricity generator stator core
11/12/2008CN101303393A Monitoring system and monitoring method of motor operation
11/12/2008CN101303392A Digital logic chip and method capable of testing design
11/12/2008CN101303391A Pipeline test apparatus and method
11/12/2008CN101303390A Method for judging MOS device performance degeneration
11/12/2008CN101303389A Test method and apparatus thereof
11/12/2008CN101303388A Test system and method
11/12/2008CN101303387A Direct current injection type route selecting positioning system and method thereof
11/12/2008CN101303386A Sensor device for detecting high voltage circuit electrical parameter
11/12/2008CN101303385A Tester machine platform
11/12/2008CN101303384A Test device and test method of rapid response electronic device response speed
11/12/2008CN101303383A System and method for positioning machine fault
11/12/2008CN101303382A Semiconductor CP (circuit probe) test management system and method
11/12/2008CN101303381A Systems, methods, and apparatus for measuring capacitance in stator component
11/12/2008CN101303380A Method for testing capacitance type mutual inductor on site high voltage dielectric loss
11/12/2008CN101303371A Probe card and method for fabricating the same
11/12/2008CN101303370A Probe unit and detection apparatus
11/12/2008CN101303369A Test sockets, test equipment including the same and methods of testing semiconductor packages using the same
11/12/2008CN101303368A Battery detecting electrode made by sheet metal stretch forming method