Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2009
01/20/2009US7480825 Method for debugging reconfigurable architectures
01/20/2009US7480736 Method of discovering and operating a payload node
01/20/2009US7480598 Characteristic evaluation apparatus for insulated gate type transistors
01/20/2009US7480520 Gateway relaying communication between a radio intelligent terminal and a server
01/20/2009US7480510 Method and apparatus for preventing paging channel overload
01/20/2009US7480358 CDR-based clock synthesis
01/20/2009US7480326 Channel diagnostic systems and methods
01/20/2009US7480250 Apparatus and method for establishing network
01/20/2009US7480249 System uses Internet electronic mail for requesting status of a monitored device from a monitoring device
01/20/2009US7480247 Using priority control based on congestion status within packet switch
01/20/2009US7480244 Apparatus and method for scalable call-processing system
01/20/2009US7480239 Method and apparatus for true priority based connection establishment within a PNNI ATM network
01/20/2009US7480237 Predictive upstream load balancing
01/20/2009US7479797 TDDB test pattern and method for testing TDDB of MOS capacitor dielectric
01/20/2009US7479796 Functional and stress testing of LGA devices
01/20/2009US7479795 Temperature control apparatus
01/20/2009US7479794 Spring loaded probe pin assembly
01/20/2009US7479793 Apparatus for testing semiconductor test system and method thereof
01/20/2009US7479792 Methods for making plated through holes usable as interconnection wire or probe attachments
01/20/2009US7479785 Control and testing of a micro electromechanical switch
01/20/2009US7479781 System and method for testing a link control card
01/20/2009US7479780 Tester for in-circuit testing bed of nails fixture and testing circuit thereof
01/20/2009US7479779 Image sensor test system
01/20/2009US7479776 Hand-held tester and method for local area network cabling
01/20/2009US7479710 Electrical supply network
01/20/2009CA2221525C System for locating patch cord ends
01/15/2009WO2009009703A1 Circuit having a local power block for leakage reduction
01/15/2009WO2009008458A1 Correction circuit and test device
01/15/2009WO2009007906A1 Circuitry for synchronous testing of an asynchronous logic module
01/15/2009WO2009007885A1 Method and device for determining the state of charge of a battery
01/15/2009WO2009007164A2 Junction-photovoltage method and apparatus for contactless determination of sheet resistance and leakage current of semiconductor
01/15/2009WO2009007161A1 Apparatus for indicating the state of charge of a storage battery
01/15/2009WO2009007043A2 Closure mechanism for pressure test chambers for testing electronic components, in particular ics
01/15/2009WO2008121955A3 In-line lithography and etch system
01/15/2009WO2007147078A3 Cooperative operation of network transport and network quality of service modules
01/15/2009US20090019331 Integrated circuit for a data transmission system and receiving device of a data transmission system
01/15/2009US20090019330 Integrated circuit having built-in self-test features
01/15/2009US20090019329 Serial scan chain control within an integrated circuit
01/15/2009US20090019328 Ic circuit with test access control circuit using a jtag interface
01/15/2009US20090019327 Generating device, generating method, program and recording medium
01/15/2009US20090018785 Model-based determination of power source replacement in wireless and other devices
01/15/2009US20090017564 Method to detect and predict metal silicide defects in a microelectronic device during the manufacture of an integrated circuit
01/15/2009US20090016240 Methods and systems for bandwidth measurement techniques
01/15/2009US20090016224 Multi-criteria optimization for relaying in multi-hop wireless ad hoc and sensor networks
01/15/2009US20090016222 Methods and systems for implementing time-slice flow control
01/15/2009US20090016214 Method and system for network recovery from multiple link failures
01/15/2009US20090016212 Method and Apparatus for Managing a Loop Network
01/15/2009US20090015288 Circuit testing apparatus
01/15/2009US20090015287 Apparatus for testing an object
01/15/2009US20090015286 Power supply voltage detection circuit and semiconductor integrated circuit device
01/15/2009US20090015285 Test structures for electrically detecting back end of the line failures and methods of making and using the same
01/15/2009US20090015282 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
01/15/2009US20090015281 Method of positioning an anisotropic conductive connector, method of positioning the anisotropic conductive connector and a circuit board for inspection, anisotropic conductive connector, and probe card
01/15/2009US20090015280 Method for correcting displacement of multi card and method for testing circuit element
01/15/2009US20090015278 Apparatus to monitor substrate viability
01/15/2009US20090015277 Device for testing electronic components, in particular ics, having a sealing board arranged inside a pressure test chamber
01/15/2009US20090015275 Ultra-Fine Area Array Pitch Probe Card
01/15/2009US20090015274 Method for automated stress testing of flip-chip packages
01/15/2009US20090015266 Resonator, printed board, and method for measuring complex dielectric constant
01/15/2009US20090015235 Method and apparatus for testing a system module
01/15/2009US20090015096 Ultrasound system
01/15/2009DE112006003729T5 Testzeitberechnungseinrichtung Test time calculator
01/15/2009DE102007033152A1 For the diagnosis of a direct current motor, it runs as a generator during the diagnosis time for the induced voltage to be analyzed for faults
01/15/2009DE102007032811A1 Verfahren zum Zuordnen eines Fehlerstroms zu einer der drei Phasenleitungen eines Drei-Phasen-Systems sowie Fehlerstromschutzschalter A method for allocating a leakage current to one of the three phase lines of a three-phase system and earth leakage circuit breaker
01/15/2009DE102007032627A1 Testvorrichtung Test device
01/15/2009DE102007032557A1 Vorrichtung zum Testen von elektronischen Bauelementen, insbesondere IC's, mit innerhalb einer Drucktestkammer angeordnetem Abdichtboard Apparatus for testing electronic components, in particular IC's, with arranged within a test chamber pressure Abdichtboard
01/15/2009DE102007032277A1 Multi-layer panel with module sections, for integrated circuits, has external test connections linked to internal test points unconnected to any components
01/15/2009DE102007007356B4 Hochfrequenzschaltung, Standardzelle, Entwurfsystem und Testverfahren High-frequency circuit, standard cell design system and test method
01/14/2009EP2015419A2 Method for assigning a residual current to one of the three phase currents of a three-phase system and residual current protection switch
01/14/2009EP2015310A2 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance
01/14/2009EP2015091A2 Cell monitoring and balancing
01/14/2009EP2015090A2 Model-based determination of power source replacement in wireless and other devices
01/14/2009EP2015089A1 Tester, circuit, and electronic device
01/14/2009EP2015088A1 Method of positioning an anisotropic conductive connector, method of positioning the anisotropic conductive connector and a circuit board for inspection, anisotropic conductive connector and probe card
01/14/2009EP2015087A1 Device for testing electronic components, in particular ICs, with a sealing board arranged within a pressure test chamber
01/14/2009EP2015086A1 Method for measuring an on-resistance of a load-path of a transistor
01/14/2009EP2015085A1 Method of testing an electronic system
01/14/2009EP2015084A2 Testing device for electric components
01/14/2009EP2013633A2 Method and apparatus for probing
01/14/2009EP2013632A2 Probe structures with electronic components
01/14/2009EP1817594B1 Monitoring physical operating parameters of an integrated circuit
01/14/2009EP1721174A4 Dual channel source measurement unit for semiconductor device testing
01/14/2009EP1610132B1 Fabricating interconnects using sacrificial substrates
01/14/2009EP1525488B1 Electronic circuit with asynchronously operating components
01/14/2009CN201181849Y Portable mobile phone charger for battery
01/14/2009CN201181428Y High voltage output control device used for series resonance pressure test
01/14/2009CN201181325Y Integrated tester for battery safety performance
01/14/2009CN201181324Y Simple battery detection apparatus
01/14/2009CN201181323Y Logic analyzer
01/14/2009CN201181322Y Electric network fault remote intelligent monitoring device
01/14/2009CN201181321Y Earthing detection circuit of locomotive control circuit
01/14/2009CN201181320Y Test device for computer opening/closing
01/14/2009CN201181319Y Direct current high voltage experimental device
01/14/2009CN201181312Y High voltage live display device
01/14/2009CN201181310Y High potential side electric current measurement apparatus
01/14/2009CN201181309Y Differential voltage detection type accumulator battery electric voltage monitoring device
01/14/2009CN201181300Y Voltage equalizing cover for high-tension testing apparatus
01/14/2009CN101346636A Charged state estimation device and charged state estimation method of secondary battery
01/14/2009CN101346635A TCP processing equipment and contraposition method for connection terminal in TCP processing equipment
01/14/2009CN101346634A System and method for a gatekeeper in a communications network