Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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01/20/2009 | US7480825 Method for debugging reconfigurable architectures |
01/20/2009 | US7480736 Method of discovering and operating a payload node |
01/20/2009 | US7480598 Characteristic evaluation apparatus for insulated gate type transistors |
01/20/2009 | US7480520 Gateway relaying communication between a radio intelligent terminal and a server |
01/20/2009 | US7480510 Method and apparatus for preventing paging channel overload |
01/20/2009 | US7480358 CDR-based clock synthesis |
01/20/2009 | US7480326 Channel diagnostic systems and methods |
01/20/2009 | US7480250 Apparatus and method for establishing network |
01/20/2009 | US7480249 System uses Internet electronic mail for requesting status of a monitored device from a monitoring device |
01/20/2009 | US7480247 Using priority control based on congestion status within packet switch |
01/20/2009 | US7480244 Apparatus and method for scalable call-processing system |
01/20/2009 | US7480239 Method and apparatus for true priority based connection establishment within a PNNI ATM network |
01/20/2009 | US7480237 Predictive upstream load balancing |
01/20/2009 | US7479797 TDDB test pattern and method for testing TDDB of MOS capacitor dielectric |
01/20/2009 | US7479796 Functional and stress testing of LGA devices |
01/20/2009 | US7479795 Temperature control apparatus |
01/20/2009 | US7479794 Spring loaded probe pin assembly |
01/20/2009 | US7479793 Apparatus for testing semiconductor test system and method thereof |
01/20/2009 | US7479792 Methods for making plated through holes usable as interconnection wire or probe attachments |
01/20/2009 | US7479785 Control and testing of a micro electromechanical switch |
01/20/2009 | US7479781 System and method for testing a link control card |
01/20/2009 | US7479780 Tester for in-circuit testing bed of nails fixture and testing circuit thereof |
01/20/2009 | US7479779 Image sensor test system |
01/20/2009 | US7479776 Hand-held tester and method for local area network cabling |
01/20/2009 | US7479710 Electrical supply network |
01/20/2009 | CA2221525C System for locating patch cord ends |
01/15/2009 | WO2009009703A1 Circuit having a local power block for leakage reduction |
01/15/2009 | WO2009008458A1 Correction circuit and test device |
01/15/2009 | WO2009007906A1 Circuitry for synchronous testing of an asynchronous logic module |
01/15/2009 | WO2009007885A1 Method and device for determining the state of charge of a battery |
01/15/2009 | WO2009007164A2 Junction-photovoltage method and apparatus for contactless determination of sheet resistance and leakage current of semiconductor |
01/15/2009 | WO2009007161A1 Apparatus for indicating the state of charge of a storage battery |
01/15/2009 | WO2009007043A2 Closure mechanism for pressure test chambers for testing electronic components, in particular ics |
01/15/2009 | WO2008121955A3 In-line lithography and etch system |
01/15/2009 | WO2007147078A3 Cooperative operation of network transport and network quality of service modules |
01/15/2009 | US20090019331 Integrated circuit for a data transmission system and receiving device of a data transmission system |
01/15/2009 | US20090019330 Integrated circuit having built-in self-test features |
01/15/2009 | US20090019329 Serial scan chain control within an integrated circuit |
01/15/2009 | US20090019328 Ic circuit with test access control circuit using a jtag interface |
01/15/2009 | US20090019327 Generating device, generating method, program and recording medium |
01/15/2009 | US20090018785 Model-based determination of power source replacement in wireless and other devices |
01/15/2009 | US20090017564 Method to detect and predict metal silicide defects in a microelectronic device during the manufacture of an integrated circuit |
01/15/2009 | US20090016240 Methods and systems for bandwidth measurement techniques |
01/15/2009 | US20090016224 Multi-criteria optimization for relaying in multi-hop wireless ad hoc and sensor networks |
01/15/2009 | US20090016222 Methods and systems for implementing time-slice flow control |
01/15/2009 | US20090016214 Method and system for network recovery from multiple link failures |
01/15/2009 | US20090016212 Method and Apparatus for Managing a Loop Network |
01/15/2009 | US20090015288 Circuit testing apparatus |
01/15/2009 | US20090015287 Apparatus for testing an object |
01/15/2009 | US20090015286 Power supply voltage detection circuit and semiconductor integrated circuit device |
01/15/2009 | US20090015285 Test structures for electrically detecting back end of the line failures and methods of making and using the same |
01/15/2009 | US20090015282 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion |
01/15/2009 | US20090015281 Method of positioning an anisotropic conductive connector, method of positioning the anisotropic conductive connector and a circuit board for inspection, anisotropic conductive connector, and probe card |
01/15/2009 | US20090015280 Method for correcting displacement of multi card and method for testing circuit element |
01/15/2009 | US20090015278 Apparatus to monitor substrate viability |
01/15/2009 | US20090015277 Device for testing electronic components, in particular ics, having a sealing board arranged inside a pressure test chamber |
01/15/2009 | US20090015275 Ultra-Fine Area Array Pitch Probe Card |
01/15/2009 | US20090015274 Method for automated stress testing of flip-chip packages |
01/15/2009 | US20090015266 Resonator, printed board, and method for measuring complex dielectric constant |
01/15/2009 | US20090015235 Method and apparatus for testing a system module |
01/15/2009 | US20090015096 Ultrasound system |
01/15/2009 | DE112006003729T5 Testzeitberechnungseinrichtung Test time calculator |
01/15/2009 | DE102007033152A1 For the diagnosis of a direct current motor, it runs as a generator during the diagnosis time for the induced voltage to be analyzed for faults |
01/15/2009 | DE102007032811A1 Verfahren zum Zuordnen eines Fehlerstroms zu einer der drei Phasenleitungen eines Drei-Phasen-Systems sowie Fehlerstromschutzschalter A method for allocating a leakage current to one of the three phase lines of a three-phase system and earth leakage circuit breaker |
01/15/2009 | DE102007032627A1 Testvorrichtung Test device |
01/15/2009 | DE102007032557A1 Vorrichtung zum Testen von elektronischen Bauelementen, insbesondere IC's, mit innerhalb einer Drucktestkammer angeordnetem Abdichtboard Apparatus for testing electronic components, in particular IC's, with arranged within a test chamber pressure Abdichtboard |
01/15/2009 | DE102007032277A1 Multi-layer panel with module sections, for integrated circuits, has external test connections linked to internal test points unconnected to any components |
01/15/2009 | DE102007007356B4 Hochfrequenzschaltung, Standardzelle, Entwurfsystem und Testverfahren High-frequency circuit, standard cell design system and test method |
01/14/2009 | EP2015419A2 Method for assigning a residual current to one of the three phase currents of a three-phase system and residual current protection switch |
01/14/2009 | EP2015310A2 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
01/14/2009 | EP2015091A2 Cell monitoring and balancing |
01/14/2009 | EP2015090A2 Model-based determination of power source replacement in wireless and other devices |
01/14/2009 | EP2015089A1 Tester, circuit, and electronic device |
01/14/2009 | EP2015088A1 Method of positioning an anisotropic conductive connector, method of positioning the anisotropic conductive connector and a circuit board for inspection, anisotropic conductive connector and probe card |
01/14/2009 | EP2015087A1 Device for testing electronic components, in particular ICs, with a sealing board arranged within a pressure test chamber |
01/14/2009 | EP2015086A1 Method for measuring an on-resistance of a load-path of a transistor |
01/14/2009 | EP2015085A1 Method of testing an electronic system |
01/14/2009 | EP2015084A2 Testing device for electric components |
01/14/2009 | EP2013633A2 Method and apparatus for probing |
01/14/2009 | EP2013632A2 Probe structures with electronic components |
01/14/2009 | EP1817594B1 Monitoring physical operating parameters of an integrated circuit |
01/14/2009 | EP1721174A4 Dual channel source measurement unit for semiconductor device testing |
01/14/2009 | EP1610132B1 Fabricating interconnects using sacrificial substrates |
01/14/2009 | EP1525488B1 Electronic circuit with asynchronously operating components |
01/14/2009 | CN201181849Y Portable mobile phone charger for battery |
01/14/2009 | CN201181428Y High voltage output control device used for series resonance pressure test |
01/14/2009 | CN201181325Y Integrated tester for battery safety performance |
01/14/2009 | CN201181324Y Simple battery detection apparatus |
01/14/2009 | CN201181323Y Logic analyzer |
01/14/2009 | CN201181322Y Electric network fault remote intelligent monitoring device |
01/14/2009 | CN201181321Y Earthing detection circuit of locomotive control circuit |
01/14/2009 | CN201181320Y Test device for computer opening/closing |
01/14/2009 | CN201181319Y Direct current high voltage experimental device |
01/14/2009 | CN201181312Y High voltage live display device |
01/14/2009 | CN201181310Y High potential side electric current measurement apparatus |
01/14/2009 | CN201181309Y Differential voltage detection type accumulator battery electric voltage monitoring device |
01/14/2009 | CN201181300Y Voltage equalizing cover for high-tension testing apparatus |
01/14/2009 | CN101346636A Charged state estimation device and charged state estimation method of secondary battery |
01/14/2009 | CN101346635A TCP processing equipment and contraposition method for connection terminal in TCP processing equipment |
01/14/2009 | CN101346634A System and method for a gatekeeper in a communications network |