Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2008
11/27/2008CA2826117A1 Smart charger alignment indicator
11/27/2008CA2688717A1 System and method for automation of hardware signal characterization and signal integrity verification
11/27/2008CA2688716A1 Systems and methods for validating power integrity of integrated circuits
11/26/2008EP1995602A1 Probe board, test fixture, method for making a probe board, and method for testing a Printed Circuit Board (PCB)
11/26/2008EP1995601A1 Distributor for proximity sensors
11/26/2008EP1995600A1 Table for mounting and/or testing test pieces
11/26/2008EP1995123A1 Battery state judging device
11/26/2008EP1994626A2 Power supply temperature sensor and system
11/26/2008EP1994550A2 Method and apparatus for combinatorially varying materials, unit process and process sequence
11/26/2008EP1994453A2 Underground monitoring system and method
11/26/2008EP1994421A2 Ic circuit with test access control circuit using a jtag interface
11/26/2008EP1994420A2 Apparatus and method for adjusting an operating parameter of an integrated circuit
11/26/2008EP1994419A2 Multi-stage test response compactors
11/26/2008EP1706775B1 System and method for optimizing character marking performance
11/26/2008CN201156705Y Continuously tunable DC load apparatus
11/26/2008CN201156347Y Electric driving experimental bench having mechanical driving apparatus
11/26/2008CN201156284Y Electric fire monitoring detector
11/26/2008CN201156081Y Gas dynamic 8 path load test instrument
11/26/2008CN201156080Y Accumulator electric quantity monitoring device in superaqueous navigation facility
11/26/2008CN201156079Y Single slice battery essential resistance and voltage on-line testing system for fuel cell pile
11/26/2008CN201156078Y Fuel cell accelerated starting and halting life test apparatus
11/26/2008CN201156077Y Motor testing apparatus based on computer
11/26/2008CN201156076Y Simulation test system of hoisting electric motor
11/26/2008CN201156075Y Automatic detection instrument of photoelectric approach switch
11/26/2008CN201156074Y Circuit board
11/26/2008CN201156073Y Visual positioning SMD wafer detection apparatus
11/26/2008CN201156072Y Multi-doubling inductive voltage durability test apparatus
11/26/2008CN201156071Y Holding device of insulation tool insulation property testing instrument
11/26/2008CN201156070Y Cable fault indicator
11/26/2008CN201156069Y Empty circuit board testing device
11/26/2008CN201156068Y Conductive wire cutting detector
11/26/2008CN201156067Y Simplified household circuit fault detector
11/26/2008CN201156066Y Resistive load detection device
11/26/2008CN201156065Y Comprehensive test instrument of on-line monitoring instrument for lightning arrester
11/26/2008CN201156064Y Channel extending apparatus
11/26/2008CN201156063Y Transformer tester
11/26/2008CN201156061Y Counter strike preventing mechanical megameter
11/26/2008CN201156060Y Insulation detector of motor
11/26/2008CN201156051Y High-frequency florescent lamp testing power supply apparatus
11/26/2008CN201156050Y Test plug
11/26/2008CN101313366A Semiconductor testing apparatus and semiconductor memory testing method
11/26/2008CN101313226A Dynamic estimation of semiconductor device life
11/26/2008CN101312298A Battery charger and control method therefor
11/26/2008CN101312278A Communication apparatus
11/26/2008CN101312261A Battery pack, charging device, control method thereof, electronic device and control method thereof
11/26/2008CN101311907A Test equipment, test system and test data storage method
11/26/2008CN101311742A Method for testing solar battery assembly efficiency
11/26/2008CN101311741A Automatic test method and its fixture
11/26/2008CN101311740A Electronic assembly test system
11/26/2008CN101311739A IC chip test platform energy supply structure
11/26/2008CN101311738A Reliability test analytical method and its parameter estimation method
11/26/2008CN101311737A Wafer quality control method
11/26/2008CN101311736A Intelligent type winding interturn impact voltage-withstand test instrument
11/26/2008CN101311735A Test equipment
11/26/2008CN101311731A Adsorption workbench
11/26/2008CN101311730A System for testing and sorting electronic components
11/26/2008CN101311705A Method for inspecting wafer defect
11/26/2008CN101311668A Device and method for generating probe tester map data
11/26/2008CN100438340C Method for detecting AD converter
11/26/2008CN100438265C Charging equipment
11/26/2008CN100438263C Sense amplifier, method for wake-up charging current and electronic device
11/26/2008CN100438251C A large electric system vulnerable line identifying method
11/26/2008CN100437962C Method for calibrating semiconductor test instrument
11/26/2008CN100437832C Fail analysis device
11/26/2008CN100437666C Active matrix panel inspection device, inspection method, and active matrix OLED panel manufacturing method
11/26/2008CN100437135C Battery capacity calculating method, battery capacity calculating apparatus, and battery capacity calculating program
11/26/2008CN100437134C Testing of electronic circuits
11/26/2008CN100437133C Low voltage replacement function detecting circuit
11/26/2008CN100437132C Method for burn-in test and measurement program for burn-in test
11/26/2008CN100437131C Testing device, device for setting standard to judge if qualified or not, testing method and program
11/26/2008CN100437130C Manufacture defect analysis system and detection method thereof
11/26/2008CN100437129C Testing apparatus and testing method using same
11/26/2008CN100437126C Voltage detector of universal serial bus interface
11/26/2008CN100437122C Contact actuator with contact force controlling mechanism
11/26/2008CN100437121C Test probe for electrical devices having low or no wedge depression
11/26/2008CN100437119C Microwave ceramic element detection clamp and device, and detection method thereof
11/26/2008CN100437017C Measurements using tunnelling current between elongate conductors
11/25/2008US7458042 Debugger of an electric circuit manufactured based on a program in hardware description language
11/25/2008US7458001 Sequential pattern extracting apparatus
11/25/2008US7458000 Automatic shutdown or throttling of a bist state machine using thermal feedback
11/25/2008US7457999 Debug port system for control and observation
11/25/2008US7457998 Scan register and methods of using the same
11/25/2008US7457996 Semiconductor integrated circuit capable of testing with small scale circuit configuration
11/25/2008US7457995 Method and apparatus for generating reference transmission signal for use in testing communications receivers
11/25/2008US7457992 Delay fault test circuitry and related method
11/25/2008US7457736 Automated creation of metrology recipes
11/25/2008US7457717 System for trouble shooting and verifying operation of spare assets
11/25/2008US7457454 Detailed grey scale inspection method and apparatus
11/25/2008US7457453 Pattern inspection method and apparatus
11/25/2008US7457297 Methods and apparatus for differentiated services over a packet-based network
11/25/2008US7457249 Alternate routing of media connections within a single communications system across public or private network facilities
11/25/2008US7457248 Graceful shutdown of network resources in data networks
11/25/2008US7457237 Shared risk group handling within a media gateway
11/25/2008US7457236 Method for providing fault-tolerant application cluster service
11/25/2008US7457235 High resiliency network infrastructure
11/25/2008US7456660 Semiconductor device and display device
11/25/2008US7456647 Liquid crystal display panel and testing and manufacturing methods thereof
11/25/2008US7456646 Wafer probe
11/25/2008US7456645 Inspection coaxial probe and inspection unit incorporating the same
11/25/2008US7456644 Functional and stress testing of LGA devices
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