Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2008
11/25/2008US7456643 Methods for multi-modal wafer testing using edge-extended wafer translator
11/25/2008US7456642 Handheld electronic test probe assembly
11/25/2008US7456641 Probe card that controls a temperature of a probe needle, test apparatus having the probe card, and test method using the test apparatus
11/25/2008US7456640 Structure for coupling probes of probe device to corresponding electrical contacts on product substrate
11/25/2008US7456639 Compliant contact structure
11/25/2008US7456636 Test structures and method of defect detection using voltage contrast inspection
11/25/2008US7456635 Circuit arrangement comprising a multi-wire line for supplying current and emitting signals
11/25/2008US7456628 System and method for measuring negative bias thermal instability with a ring oscillator
11/25/2008US7456627 Voltage generating apparatus, current generating apparatus, and test apparatus
11/25/2008US7456613 Battery remaining capacity calculating method, battery remaining capacity calculating device, and battery remaining capacity calculating program
11/25/2008US7456612 Method for estimating polarization voltage of secondary cell, method and device for estimating remaining capacity of secondary cell, battery pack system, and vehicle
11/25/2008US7456083 Semiconductor device and manufacturing method of the same
11/25/2008US7456032 Method and system for measuring laser induced phenomena changes in a semiconductor device
11/25/2008US7455540 Electrical contactor, especially wafer level contactor, using fluid pressure
11/20/2008WO2008140497A1 Method and circuit for low-power detection of solder-joint network failures in digital electronic packages
11/20/2008WO2008140098A1 Battery state detector, reader and diagnostic device
11/20/2008WO2008139853A1 Electronic component testing apparatus, electronic component testing system and electronic component testing method
11/20/2008WO2008139579A1 Electronic part testing apparatus, electronic part testing system and method of testing electronic part
11/20/2008WO2008139498A1 A method of testing electronic circuits and related circuit
11/20/2008WO2008138463A1 Centering device for electronic components, particularly ics
11/20/2008WO2008138239A1 A method for measuring on-line internal impedance of storage battery, a current operation module and an apparatus for measuring on-line internal impedance of storage battery
11/20/2008WO2008103700A3 Process condition measuring device
11/20/2008WO2008096298A3 A method for detecting signals produced by partial electric discharges
11/20/2008WO2008094223A3 Probe skates for electrical testing of convex pa topologies
11/20/2008WO2008068567A3 Integrated circuit probe card analyzer
11/20/2008WO2007149164A3 Method and system for inbound content-based qos
11/20/2008WO2007095194A3 Method and apparatus for combinatorially varying materials, unit process and process sequence
11/20/2008US20080288843 Optimized jtag interface
11/20/2008US20080288842 Ic Testing Methods and Apparatus
11/20/2008US20080288841 System and methods of balancing scan chains and inserting the balanced-length scan chains into hierarchically designed integrated circuits.
11/20/2008US20080288840 Probeless testing of pad buffers on wafer
11/20/2008US20080288839 Jtag Test Architecture For Multi-Chip Pack
11/20/2008US20080288838 Nonvolatile semiconductor memory system
11/20/2008US20080288837 Testing of a Circuit That has an Asynchronous Timing Circuit
11/20/2008US20080288836 Semiconductor integrated circuit capable of testing with small scale circuit configuration
11/20/2008US20080288190 Systems and methods to determine an impedance mismatch
11/20/2008US20080288189 Arc detector
11/20/2008US20080285456 Method for Selective Load Compensation
11/20/2008US20080285454 System for compressing multi-field rule specifications
11/20/2008US20080285445 Packet Load Shedding
11/20/2008US20080285443 Method for monitoring channel eye characteristics in a high-speed serdes data link
11/20/2008US20080285438 Methods, systems, and computer program products for providing fault-tolerant service interaction and mediation function in a communications network
11/20/2008US20080285437 Ethernet protection switching system
11/20/2008US20080284664 Method of and Device for Determining at Least One Characteristic Parameter of a Resonant Structure
11/20/2008US20080284477 On-chip jitter measurement circuit
11/20/2008US20080284462 Mechanical stress characterization in semiconductor device
11/20/2008US20080284461 Active cancellation matrix for process parameter measurements
11/20/2008US20080284460 Method and apparatus for statistical cmos device characterization
11/20/2008US20080284459 Testing Using Independently Controllable Voltage Islands
11/20/2008US20080284457 Method and apparatus for control of a positioning device
11/20/2008US20080284456 Test Apparatus of Semiconductor Devices
11/20/2008US20080284454 Test interface with a mixed signal processing device
11/20/2008US20080284453 Ic test vector generator for synchronized physical probing
11/20/2008US20080284452 Semiconductor device and method of measuring sheet resisitance of lower layer conductive pattern thereof
11/20/2008US20080284449 Power converters with component stress monitoring for fault prediction
11/20/2008US20080284448 Test apparatus and pin electronics card
11/20/2008US20080284447 Method for determining location of phase-to earth fault
11/20/2008US20080284442 Control of Delivery of Current Through One or More Discharge Lamps
11/20/2008US20080284392 Constant voltage power supply circuit and method of testing the same
11/20/2008US20080284350 Bulb type detector for dimmer circuit and inventive resistance and short circuit detection
11/20/2008US20080283919 Single and double-gate pseudo-fet devices for semiconductor materials evaluation
11/20/2008DE102008022218A1 Verfahren und Schaltung zum Belasten von Zwischenverbindungen auf oberer Ebene bei Halbleiterbauelementen Method and circuit for biasing of upper level interconnects in semiconductor devices
11/20/2008DE102007021921A1 Vorrichtung zum Überwachen eines Energiespeichers An apparatus for monitoring an energy storage device
11/20/2008DE10123582B4 Mustergenerator für ein Halbleiterprüfsystem sowie Verfahren zur Prüfmustererzeugung Pattern generator for a semiconductor test system and method for test pattern generation
11/19/2008EP1992955A2 TAP multiplexer
11/19/2008EP1992954A1 Method for determining location of phase-to-earth fault
11/19/2008EP1991880A1 Voltage sensing member and battery module employed with the same
11/19/2008EP1570514A4 Integrated circuit and methods of measurement and preparation of measurement structure
11/19/2008EP1558936A4 Amperage control for valves
11/19/2008EP1381874B1 Method and device for contacless testing of non-fitted antennae
11/19/2008EP1315977B1 Electronic apparatus and control method
11/19/2008CN201153330Y Energy-saving burning device of electromagnetic furnace
11/19/2008CN201152972Y High-performance intelligent VXI bus test module based on M module
11/19/2008CN201152941Y Signal conversion isolation device and system for digital electro-hydraulic control system detection
11/19/2008CN201152937Y Power source idiot-proof apparatus
11/19/2008CN201152891Y High-temperature test system
11/19/2008CN201152890Y General test mold for printing circuit board
11/19/2008CN201152889Y Electric cable detection device
11/19/2008CN201152888Y Fault detection gauge
11/19/2008CN201152887Y Electronic device providing eye chart test
11/19/2008CN201152884Y Tobacco curing barn air door location detection circuit
11/19/2008CN201152881Y Chip type LED product suction mechanism
11/19/2008CN101310342A Test apparatus and test method
11/19/2008CN101310191A Integrated circuit arrangement and design method
11/19/2008CN101310190A Jig for inspecting substrate, and inspection probe
11/19/2008CN101309015A Cell controller, battery module and power supply system
11/19/2008CN101308833A Circuit substrate, molding semiconductor device, tray and inspection socket
11/19/2008CN101308820A Manufacturing method of semiconductor integrated circuit device and probe card
11/19/2008CN101308819A Manufacturing method of semiconductor integrated circuit device and probe card
11/19/2008CN101308749A Experiment test panel for plasma display
11/19/2008CN101308707A Sorting machine for memory IC detection
11/19/2008CN101308306A Liquid crystal display device possessing testing structure and related test method
11/19/2008CN101308261A LCD device drive chip fixture plate
11/19/2008CN101308196A Current integration measuring circuit
11/19/2008CN101308195A High -voltage switch secondary circuit signal emulation system
11/19/2008CN101308194A Probe apparatus
11/19/2008CN101308193A Probe apparatus
11/19/2008CN101308192A Function test device and method for central distribution box for car
11/19/2008CN101308191A Diode electrical characteristics test system
11/19/2008CN101308190A Medium voltage-resistant condition test method before burn in of tank-type plasma display board
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