Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2008
12/18/2008WO2008152082A1 Electronic device and method for on chip jitter measurement
12/18/2008WO2008127365A3 Printed electronic device and methods of determining the electrical value thereof
12/18/2008WO2008109481B1 Generating test benches for pre-silicon validation of retimed complex ic designs against a reference design
12/18/2008WO2008069988A3 Method and apparatus for detecting high impedance fault
12/18/2008WO2008019765A3 Method for the allocation of addresses to the memory cells of a rechargeable energy accumulator
12/18/2008WO2008005054A3 Synchronous data communication
12/18/2008WO2005048314A3 Tapered dielectric and conductor structures and applications thereof
12/18/2008US20080313590 Method and system for evaluating timing in an integrated circuit
12/18/2008US20080313517 Debug circuit
12/18/2008US20080313516 Signal Generator and User Interface for Setting Test Sequences and Parameters of a Test Signal
12/18/2008US20080313515 System-on-chip (soc) having built-in-self-test circuits and a self-test method of the soc
12/18/2008US20080313514 On-chip ac self-test controller
12/18/2008US20080313513 Method and Apparatus for Synthesis of Multimode X-Tolerant Compressor
12/18/2008US20080313512 Multiple uses for bist test latches
12/18/2008US20080313511 System-in-package and method of testing thereof
12/18/2008US20080313499 Debug circuit
12/18/2008US20080313006 Systems, methods, and devices for managing emergency power supply systems
12/18/2008US20080312857 Input/output multiplexer bus
12/18/2008US20080312852 Wireless Battery Status Management for Medical Devices
12/18/2008US20080311769 Anistropic Conductive Connector, Conversion Adapter for Inspection Device Having the Anisotropic Conductive Connector, and Method for Manufacturing the Anistropic Conductive Connector
12/18/2008US20080311685 Methods relating to the reconstruction of semiconductor wafers for wafer level processing
12/18/2008US20080310313 Protocol data unit recovery
12/18/2008US20080310299 Virtual Path Restoration Scheme Using Fast Dynamic Mesh Restoration in an Optical Network
12/18/2008US20080309605 Liquid crystal display and method of testing the same
12/18/2008US20080309378 Semiconductor device
12/18/2008US20080309366 System and method for bearing fault detection using stator current noise cancellation
12/18/2008US20080309365 Method for Determining Time Dependent Dielectric Breakdown
12/18/2008US20080309364 Method and apparatus for calibrating internal pulses in an integrated circuit
12/18/2008US20080309363 Probe assembly with wire probes
12/18/2008US20080309361 Method of Monitoring Burn-In Apparatus
12/18/2008US20080309360 Testing apparatus for surface mounted connectors
12/18/2008US20080309359 Suspension system and adjustment mechanism for an integrated chip and method
12/18/2008US20080309358 Active wafer probe
12/18/2008US20080309355 Voltage clamp circuit and semiconductor device, overcurrent protection circuit, voltage measurement probe, voltage measurement device and semiconductor evaluation device respectively using the same
12/18/2008US20080309351 High Voltage Insulation Monitoring Sensor
12/18/2008US20080309350 Electro-optic displays, and materials and methods for production thereof
12/18/2008US20080309349 Flexible interposer system
12/18/2008US20080309347 Circuit tester device
12/18/2008US20080309321 Distributed Rf/Microwave Power Detector
12/18/2008US20080309318 Method and Device for Determining the Characteristics of the Voltage of an Electrical Installation
12/18/2008US20080308798 Semiconductor Device
12/18/2008US20080307909 Electrical condition monitoring method for polymers
12/18/2008DE112007000506T5 Messvorrichtung, Messverfahren, Prüfvorrichtung, Prüfverfahren und elektronische Vorrichtung Measuring device, measuring methods, test apparatus, test methods and electronic device
12/18/2008DE112004001739B4 Halbleiterschalter-Schaltung Semiconductor switch circuit
12/18/2008DE10318394B4 Automatisches Prüfverfahren und Prüfvorrichtung Automatic test methods and testing unit
12/18/2008DE102007027380A1 Nadelkartenanordnung The probe card assembly
12/18/2008DE102004057215B4 Verfahren und Vorrichtung zum Testen von Halbleiterwafern mittels einer Sondenkarte unter Verwendung eines temperierten Fluidstrahls Method and apparatus for testing semiconductor wafers by means of a probe card using a tempered fluid jet
12/17/2008EP2003771A1 Closed loop sensorless control of permanent magnet synchronous motors
12/17/2008EP2003653A1 Test device and test method
12/17/2008EP2003571A2 Network core access architecture
12/17/2008EP2003461A1 Method for detecting the loss of one or more phases in a permanent-magnet synchronous electric motor
12/17/2008EP2003460A1 Pin card assembly
12/17/2008EP2003459A1 Apparatus for manufacture of electronic assemblies
12/17/2008EP2003458A2 Electromagnetic effects test chamber
12/17/2008EP2002525A2 Battery charge indication methods, battery charge monitoring devices, rechargeable batteries, and articles of manufacture
12/17/2008EP2002274A1 Circuit for measuring and controlling differential voltages
12/17/2008EP2002270A2 High performance miniature rf sensor for use in microelectronics plasma processing tools
12/17/2008EP2002267A1 Fiber-optic current sensor with sum detection
12/17/2008EP1754070B1 Method and device for controlling the operation of an electric element of a motor vehicle
12/17/2008CN201167242Y Automobile charger
12/17/2008CN201167065Y Simulation striker for a fuse
12/17/2008CN201166916Y Intelligent remote integration monitoring system for a power equipment
12/17/2008CN201166908Y Global tracking surveillance matching terminal for PC archive/after-sale service of a large-sized transformer
12/17/2008CN201166758Y Detecting clamp
12/17/2008CN201166697Y Power cable monitoring device
12/17/2008CN201166696Y Machine for testing circuit board
12/17/2008CN201166695Y Fault detection case
12/17/2008CN201166694Y Portable tester for surge protector
12/17/2008CN201166693Y Detection apparatus for projection lamp wick
12/17/2008CN201166692Y Apparatus for detecting abnormal state of illuminating device
12/17/2008CN201166691Y Apparatus for analyzing failure of PLC design power station
12/17/2008CN201166690Y Cable test system
12/17/2008CN201166688Y Automatic tester for ground resistance
12/17/2008CN201166686Y Wide band high voltage intelligent resistance type current sensor
12/17/2008CN201166685Y Wide band high voltage intelligent resistance voltage division type voltage sensor
12/17/2008CN201166677Y Electric energy meter for recognizing carrier by resistance load
12/17/2008CN201166630Y Device for testing point and lineation of touch screen
12/17/2008CN101326446A Abnormality judgment device and abnormality judgment method of power supply unit
12/17/2008CN101326445A Method and device for measuring internal impedance of stationary battery
12/17/2008CN101325410A Delay circuit and related method thereof
12/17/2008CN101325332A Method for implementing element for measuring earthing distance without relevance to load current and ground resistance
12/17/2008CN101325331A Method for implementing element for measuring distance between phases without relevance to load current and ground resistance
12/17/2008CN101325330A Method for implementing earthing distance measurement element
12/17/2008CN101325329A Method for implementing earthing distance measurement element based on negative sequence fault current component
12/17/2008CN101325189A 半导体器件 Semiconductor devices
12/17/2008CN101324797A Electronic load device and circuit thereof
12/17/2008CN101324656A Method and apparatus for predicting battery charge electricity
12/17/2008CN101324655A Low cost batteries monomer battery voltage measuring circuit
12/17/2008CN101324654A Semiconductor integrated device
12/17/2008CN101324653A Boundary scanning test connecting apparatus, method and system
12/17/2008CN101324652A Method and device for testing reliability
12/17/2008CN101324651A Mobile on-site impact pressure-proof test apparatus and method of 750 V voltage grading GIS equipment
12/17/2008CN101324650A Method for monitoring single-phase earth fault and fault monitor using the same
12/17/2008CN101324649A Supersonic transducer power tester and test method thereof
12/17/2008CN101324648A High voltage switch cabinet fault early warning detection method
12/17/2008CN101324647A Method and apparatus for monitoring motorcycle electric appliance operation
12/17/2008CN101324641A Flow field plate for measuring fuel battery local current density
12/17/2008CN101324636A Guide connection module for detecting circuit board
12/17/2008CN101324480A Apparatus for insulator wind-tunnel test
12/17/2008CN100444463C Detaching-proof antenna