Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2008
11/04/2008US7447155 Guaranteed service in a data network
11/04/2008US7447149 Virtual interface with active and backup physical interfaces
11/04/2008US7447148 Method for supporting scalable and reliable multicast in TDMA/TDD systems using feedback suppression techniques
11/04/2008US7446989 Device for protection of the bearing of an electrical machine against damaging passage of current
11/04/2008US7446749 Method and apparatus for measuring response time of liquid crystal, and method and apparatus for driving liquid crystal display device using the same
11/04/2008US7446556 Multiple testing bars for testing liquid crystal display and method thereof
11/04/2008US7446555 Apparatus to inspect TFT substrate and method of inspecting TFT substrate
11/04/2008US7446554 Direct current measuring apparatus and limiting circuit
11/04/2008US7446553 Semiconductor device testing
11/04/2008US7446552 Semiconductor device testing
11/04/2008US7446551 Integrated circuit testing module including address generator
11/04/2008US7446550 Enhanced signal observability for circuit analysis
11/04/2008US7446549 Semiconductor leakage current detector and leakage current measurement method, semiconductor leakage current detector with voltage trimming function and reference voltage trimming method, and semiconductor integrated circuit thereof
11/04/2008US7446548 Elastic micro probe and method of making same
11/04/2008US7446547 Cooling apparatus and testing machine using the same
11/04/2008US7446546 Method and system of trace pull test
11/04/2008US7446545 Anisotropically conductive sheet
11/04/2008US7446544 Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
11/04/2008US7446543 Non-contact electrical connections test device
11/04/2008US7446542 Apparatus and method for automated stress testing of flip-chip packages
11/04/2008US7446541 Solenoid test device
11/04/2008US7446539 Identifying apparatus for AC power supply arrangement
11/04/2008US7446538 Device for identifying AC power supply arrangement
11/04/2008US7446536 Scan tool for electronic battery tester
11/04/2008US7446522 Constant contact wheel for close interval survey devices
11/04/2008US7446509 Intelligent battery charging system
11/04/2008US7446277 Method for sorting integrated circuit devices
11/04/2008CA2417913C System for monitoring and testing of light sources
11/04/2008CA2392182C System and method for battery capacity reporting
11/04/2008CA2240514C Robust electrical utility meter
10/2008
10/30/2008WO2008131347A1 Jtag controlled self-repair after packaging
10/30/2008WO2008131144A1 State-monitoring memory element
10/30/2008WO2008131025A1 Secure one-way data transfer system using network interface circuitry
10/30/2008WO2008130965A1 Parsing out of order data packets at a content gateway of a network
10/30/2008WO2008130941A1 Method and apparatus for singulated die testing
10/30/2008WO2008130343A1 Method and apparatus for imaging a moving object
10/30/2008WO2008130184A1 Apparatus and method for patrolling medium voltage power distribution line and pin-pointing the degraded component before its failure
10/30/2008WO2008129755A1 Semiconductor device inspecting method and semiconductor device inspecting apparatus
10/30/2008WO2008129625A1 Leak current detector circuit, body bias control circuit, semiconductor device, and semiconductor device testing method
10/30/2008WO2008129615A1 Tft array inspection device
10/30/2008WO2008129614A1 Tft array inspection device
10/30/2008WO2008129613A1 Tft array inspection device
10/30/2008WO2008129149A1 Battery output housing comprising a shunt or measuring element
10/30/2008WO2008128871A1 Circuit breaker and examination device for a circuit breaker, in particular for a low-voltage circuit breaker
10/30/2008WO2008128427A1 A method for analysing performance of a valve control type lead-acid accumulator battery
10/30/2008WO2008128426A1 An expert diagnostic method for analyzing performance of an accumulator cell
10/30/2008WO2008128324A1 Method for locating a fault in a power grid on the basis of distributed voltage measurements
10/30/2008WO2008109481A3 Generating test benches for pre-silicon validation of retimed complex ic designs against a reference design
10/30/2008WO2008064182A9 Active voltage management system for energy storage device
10/30/2008WO2008051773A3 Probe card assembly with a mechanically decoupled wiring substrate
10/30/2008WO2008042520B1 Probe array wafer
10/30/2008WO2007146851A3 Method and apparatus for executing commands and generation of automation scripts and test cases
10/30/2008US20080270958 Method and system for debug and test using replicated logic
10/30/2008US20080270954 System for and Method of Integrating Test Structures into an Integrated Circuit
10/30/2008US20080270865 Vendor Independent Method to Merge Coverage Results for Different Designs
10/30/2008US20080270864 Difference signal path test and characterization circuit
10/30/2008US20080270863 Methods of synchronous digital operation and scan based testing of an integrated circuit using negative edge flip-flops for muxscan and edge clock compatible lssd
10/30/2008US20080270862 Method and apparatus for soft-error immune and self-correcting latches
10/30/2008US20080270861 Negative edge flip-flops for muxscan and edge clock compatible lssd
10/30/2008US20080270860 Integrated Circuit for Writing and Reading Registers Distributed Across a Semiconductor Chip
10/30/2008US20080270859 Scan test circuit and scan test control method
10/30/2008US20080270858 Device and Method for Configuring Input/Output Pads
10/30/2008US20080270856 Semiconductor memory device
10/30/2008US20080270828 Memory Redundancy Method and Apparatus
10/30/2008US20080270064 M1 Testable Addressable Array for Device Parameter Characterization
10/30/2008US20080270057 Increase productivity at wafer test using probe retest data analysis
10/30/2008US20080270050 Test system and failure parsing method thereof
10/30/2008US20080270049 System and method for monitoring reliability of a digital system
10/30/2008US20080269729 Uninterrupted power supply, especially for a refractive laser
10/30/2008US20080268556 Plate With An Indicator For Discerning Among Pre-Identified Probe Holes In The Plate
10/30/2008US20080267083 Automatic Discovery Of Service/Host Dependencies In Computer Networks
10/30/2008US20080267077 Real-Time Internet Error Correction
10/30/2008US20080267076 System and apparatus for maintaining a communication system
10/30/2008US20080267074 METHOD OF SETING QoS PACKET FLOW AND HANDLING QoS PACKET IN PACKET SWITCHING SYSTEM
10/30/2008US20080267073 Method and System for Ethernet Congestion Management
10/30/2008US20080267069 Method for signal adjustment through latency control
10/30/2008US20080267060 Method, system and computer program product for providing high speed fault tracing within a blade center system
10/30/2008US20080266985 Methods and apparatus for testing integrated circuits
10/30/2008US20080265933 Semiconductor Device Testing Apparatus and Power Supply Unit
10/30/2008US20080265932 Semiconductor test apparatus
10/30/2008US20080265931 On-chip electromigration monitoring
10/30/2008US20080265930 Semiconductor device including analog voltage output driver LSI chip having test circuit
10/30/2008US20080265929 Process Monitor for Monitoring and Compensating Circuit Performance
10/30/2008US20080265928 Semiconductor device and test method therefor
10/30/2008US20080265926 Test head
10/30/2008US20080265923 Leadframe Configuration to Enable Strip Testing of SOT-23 Packages and the Like
10/30/2008US20080265921 Probe card
10/30/2008US20080265920 Probe card
10/30/2008US20080265919 Scalable wideband probes, fixtures, and sockets for high speed ic testing and interconnects
10/30/2008US20080265918 Object-clamping lid subassembly of a test socket for testing electrical characteristics of an object
10/30/2008US20080265911 Power Sensing Module with Built-In Mismatch and Correction
10/30/2008US20080265906 Ic Testing Methods and Apparatus
10/30/2008US20080265905 System and method for detection of environmentally-induced damage of conductive elements in a circuit board
10/30/2008US20080265904 Trailer check
10/30/2008US20080265901 Voltage measuring device
10/30/2008US20080265900 Method and Apparatus for Monitoring the Operation of a Gas Discharge Lamp
10/30/2008US20080265819 Sensor calibration and parameter identification in a multi-phase motor drive
10/30/2008US20080265681 Self-Testing Power Supply Apparatus, Methods and Computer Program Products
10/30/2008US20080265262 Methods and systems for testing a functional status of a light unit
10/30/2008US20080263858 Method of mounting electronic component and electronic component mounting apparatus
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