| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/02/2009 | DE102004036302B4 Einfache Optimalwertschätzeinrichtung für den Ladungszustand einer Bleileistungsquelle Simple optimum value estimator for the state of charge of a lead power source |
| 01/02/2009 | DE102004007696B4 Testvorrichtung zum Prüfen eines Halbleiterbauteils mit Kontaktflächen auf seiner Oberseite und seiner Unterseite und Verfahren zum Prüfen des Halbleiterbauteils Test apparatus for testing a semiconductor device with contact areas on its top and bottom and method for testing the semiconductor device |
| 01/01/2009 | US20090006917 Test circuit for supporting concurrent test mode in a semiconductor memory |
| 01/01/2009 | US20090006021 Method and apparatus for implementing scaled device tests |
| 01/01/2009 | US20090006013 Device and a Method For Estimating Transistor Parameter Variations |
| 01/01/2009 | US20090006010 Method and System for Remote Monitoring and Control of Wireless Cell-Sites |
| 01/01/2009 | US20090003227 Performance analysis of a circuit switched mobile telecommunications network |
| 01/01/2009 | US20090003224 T1 turnaround plug test adaptor |
| 01/01/2009 | US20090003223 Discovering configured tunnels between nodes on a path in a data communications network |
| 01/01/2009 | US20090003217 Network Optimisation System |
| 01/01/2009 | US20090003215 Method and system for unified overload and overflow control to support VoIP and multiple QOS flow traffic in communication network |
| 01/01/2009 | US20090003204 Lockless Bandwidth Management for Multiprocessor Networking Devices |
| 01/01/2009 | US20090003197 Isolation of unverified devices in a SAS expander |
| 01/01/2009 | US20090003193 Network Architecture for Data Communication |
| 01/01/2009 | US20090002717 Condition assessment system for a structure including a semiconductor material |
| 01/01/2009 | US20090002013 Testing circuit and testing method for liquid crystal display device |
| 01/01/2009 | US20090002012 Accurate Capacitance Measurement for Ultra Large Scale Integrated Circuits |
| 01/01/2009 | US20090002011 Inspecting method and storage medium for storing program of the method |
| 01/01/2009 | US20090002010 Active thermal control using a burn-in socket heating element |
| 01/01/2009 | US20090002007 Universal cover for a burn-in socket |
| 01/01/2009 | US20090002006 Manufacturing method of semiconductor device and semiconductor manufacturing apparatus |
| 01/01/2009 | US20090002003 Probe-testing device and method of semiconductor device |
| 01/01/2009 | US20090002002 Electrical Testing System |
| 01/01/2009 | US20090002001 Integrated light conditioning devices on a probe card for testing imaging devices, and methods of fabricating same |
| 01/01/2009 | US20090002000 Failure analysis method and failure analysis apparatus |
| 01/01/2009 | US20090001995 Circuit for detecting connection failure between printed circuit boards |
| 01/01/2009 | US20090001993 Systems and methods for detecting a faulty ground strap connection |
| 01/01/2009 | US20090001992 Charged State Estimating Device and Charged State Estimating Method of Secondary Battery |
| 01/01/2009 | US20090001991 Projection lamp test device |
| 01/01/2009 | US20090001990 Detector for an ultraviolet lamp system and a corresponding method for monitoring microwave energy |
| 01/01/2009 | US20090001370 Method and apparatus for extracting properties of interconnect wires and dielectrics undergoing planarization process |
| 01/01/2009 | US20090001368 Semiconductor device including semiconductor evaluation element, and evaluation method using semiconductor device |
| 01/01/2009 | US20090001366 Wafer Arrangement and Method for Manufacturing a Wafer Arrangement |
| 01/01/2009 | US20090000814 Multiple layer printed circuit board having misregistration testing pattern |
| 01/01/2009 | US20090000108 Method for structuring solar modules and structuring device |
| 12/31/2008 | WO2009003151A1 Selectable device options for characterizing semiconductor devices |
| 12/31/2008 | WO2009002737A1 Techniques for detecting wafer charging in a plasma processing system |
| 12/31/2008 | WO2009002348A1 A method and system for call admission control in a wireless mesh network |
| 12/31/2008 | WO2009002120A2 Measuring instrument for a resistive electric leakage current |
| 12/31/2008 | WO2009002067A1 Electric inspection apparatus |
| 12/31/2008 | WO2009001451A1 Detector and tester |
| 12/31/2008 | WO2009001237A1 Photodiode self-test |
| 12/31/2008 | WO2009001122A1 Embedded test system and method |
| 12/31/2008 | WO2009001001A2 Method for driving a micro-hybrid system for vehicle and an energy storage unit, and hybrid system for implementing same |
| 12/31/2008 | WO2009000822A1 Test system combination for testing several systems under test in parallel, comprising several test systems |
| 12/31/2008 | WO2009000569A1 Method for testing a container warning device of a compensation container, and testing apparatus for testing a container warning device |
| 12/31/2008 | WO2009000475A2 System and method for recording the characteristic curves of light-emitting diodes |
| 12/31/2008 | WO2009000469A1 Method for testing the current flow through single wires of a litz wire, and apparatus for carrying out said method |
| 12/31/2008 | WO2008109171A3 Image sensing integrated circuit test apparatus and method |
| 12/31/2008 | WO2008028171A3 Method and apparatus for switching tester resources |
| 12/31/2008 | EP2009455A1 Failure analysis method and failure analysis apparatus |
| 12/31/2008 | EP2009454A1 Method and system for carrying out non-contact testing of touch panel |
| 12/31/2008 | EP2008477A2 Integrating camp-on telephony feature with wlan resource management and admission control |
| 12/31/2008 | EP2008228A2 Methods and systems for semiconductor testing using a testing scenario language |
| 12/31/2008 | EP2008116A2 Method and apparatus for determining jitter and pulse width from clock signal comparisons |
| 12/31/2008 | EP2008115A2 Method and device for characterising sensitivity to energy interactions in an electronic component |
| 12/31/2008 | EP1656563B1 Calibration of tester and testboard by golden sample |
| 12/31/2008 | EP1563392B1 Interface circuit |
| 12/31/2008 | CN201174613Y Network monitoring management system for transforming plant DC equipment |
| 12/31/2008 | CN201174607Y On-line detection and activation apparatus for accumulator |
| 12/31/2008 | CN201174410Y Battery cooling construction of battery checking apparatus |
| 12/31/2008 | CN201173968Y Standard apparatus for vector transformation |
| 12/31/2008 | CN201173965Y Core technical parameter automatic test system of electric project DC power source equipment |
| 12/31/2008 | CN201173964Y Detection apparatus for lithium power cell |
| 12/31/2008 | CN201173963Y Analogue battery equipment |
| 12/31/2008 | CN201173962Y Multifunctional intelligent detector for accumulator |
| 12/31/2008 | CN201173961Y Large power simulation accumulator |
| 12/31/2008 | CN201173960Y Brake switch tester for spinning machine |
| 12/31/2008 | CN201173959Y Two stage type fixture for press |
| 12/31/2008 | CN201173958Y Testing transformer pressure regulating control device |
| 12/31/2008 | CN201173957Y Wire great current impact test device |
| 12/31/2008 | CN201173956Y DC infusion type route selecting positioning system |
| 12/31/2008 | CN201173955Y Solar electric power generation system monitoring system |
| 12/31/2008 | CN201173954Y Ten kv distributing transformator capacity tester |
| 12/31/2008 | CN201173947Y Battery voltage detection circuit |
| 12/31/2008 | CN201173946Y Microampere meter circuit |
| 12/31/2008 | CN201172393Y Automatic detection device for damage of vehicle lights |
| 12/31/2008 | CN201172217Y Multifunction insulating rod |
| 12/31/2008 | CN101336519A A method and a system for cable or subscriber loop investigation performing loop topology identification |
| 12/31/2008 | CN101336503A Method and adaptive distance protection relay for power transmission lines |
| 12/31/2008 | CN101335517A Amplifier |
| 12/31/2008 | CN101335478A Systems and methods to evaluate permanent magnet motors |
| 12/31/2008 | CN101335449A Power protection apparatus and electronic control unit |
| 12/31/2008 | CN101335352A Electronic load of fuel cell and manufacturing method |
| 12/31/2008 | CN101334542A TFT-LCD panel test system and its test method |
| 12/31/2008 | CN101334452A Battery tester |
| 12/31/2008 | CN101334451A Digital type battery internal resistance test method |
| 12/31/2008 | CN101334450A Four-terminal method test pen |
| 12/31/2008 | CN101334449A Circuit analysis method |
| 12/31/2008 | CN101334448A Test platform and method for testing PC board |
| 12/31/2008 | CN101334447A Processor, test tray transfer method and package chip manufacture method |
| 12/31/2008 | CN101334446A Device and method for transferring test trays and a handler having same, process for manufacturing semiconductor device |
| 12/31/2008 | CN101334445A Auxiliary fault detection system and method |
| 12/31/2008 | CN101334444A Chip, chip interconnection system and method for calibrating chip interconnection |
| 12/31/2008 | CN101334443A Gas discharge tube automatized ageing device |
| 12/31/2008 | CN101334442A Earth wire detector |
| 12/31/2008 | CN101334441A Detecting device and detecting method for printed circuit board |
| 12/31/2008 | CN101334440A Measurement apparatus for improving performance of standard cell library |
| 12/31/2008 | CN101334439A Electric network data integrated collection method and apparatus |
| 12/31/2008 | CN101334438A Test method for eliminating effluence of DC engineering grounding electrode electric current on alternating-current system |