| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/31/2008 | CN101334437A Multifunctional off-line detector capable of discriminating all kinds of low-voltage apparatus failure |
| 12/31/2008 | CN101334436A Test system |
| 12/31/2008 | CN101334435A Non-contact type touch control plate detection method and apparatus |
| 12/31/2008 | CN101334414A Defect checking machine platform matching method |
| 12/31/2008 | CN101334371A Evaluation method of separator for nonaqueous electrolyte battery, and nonaqueous electrolyte battery |
| 12/31/2008 | CN101334317A Detector for an ultraviolet lamp system and a corresponding method for monitoring microwave energy |
| 12/31/2008 | CN100448135C Float cut-off method for voltage of battery in UPS |
| 12/31/2008 | CN100448100C Nickel-hydride battery life determining method and life determining apparatus |
| 12/31/2008 | CN100447897C Semiconductor storage and its testing method |
| 12/31/2008 | CN100447616C Inspecting system of flat panel display |
| 12/31/2008 | CN100447577C Battery state-of-charge estimator |
| 12/31/2008 | CN100447576C Driver of resonant transducer and signal collector |
| 12/31/2008 | CN100447575C Method for identifying abnormal condition in power transformer |
| 12/31/2008 | CN100447559C Method for detecting surface COP of silicon sheet using Cu inducing |
| 12/30/2008 | US7472329 Shift register, data line driving circuit, scanning line driving circuit, electro-optical device, and electronic apparatus |
| 12/30/2008 | US7472327 Pattern generator and test apparatus |
| 12/30/2008 | US7472326 Semiconductor test system having multitasking algorithmic pattern generator |
| 12/30/2008 | US7472325 Method for segmenting BIST functionality in an embedded memory array into remote lower-speed executable instructions and local higher-speed executable instructions |
| 12/30/2008 | US7472324 Logic built-in self-test channel skipping during functional scan operations |
| 12/30/2008 | US7472323 Mechanism to stop instruction execution at a microprocessor |
| 12/30/2008 | US7472322 On-chip interface trap characterization and monitoring |
| 12/30/2008 | US7472321 Test apparatus for mixed-signal semiconductor device |
| 12/30/2008 | US7472320 Autonomous self-monitoring and corrective operation of an integrated circuit |
| 12/30/2008 | US7472319 Remote control signal receiver and remote control signal receiving method |
| 12/30/2008 | US7472206 Method and apparatus of communication control using direct memory access (DMA) transfer |
| 12/30/2008 | US7472035 Method for analyzing measurement data of device under test, program, measurement data analyzing system |
| 12/30/2008 | US7472034 System and method for test generation for system level verification using parallel algorithms |
| 12/30/2008 | US7472033 Apparatus for controlling semiconductor chip characteristics |
| 12/30/2008 | US7472026 Multi-ended fault location system |
| 12/30/2008 | US7472000 Sensor, controller and method for monitoring at least one sensor |
| 12/30/2008 | US7471941 Amplifier assembly including variable gain amplifier, parallel programmable amplifiers, and AGC |
| 12/30/2008 | US7471932 System and method for embedding OFDM in CDMA systems |
| 12/30/2008 | US7471819 Position detecting apparatus, a position detecting method and an electronic component carrying apparatus |
| 12/30/2008 | US7471631 Apparatus and method of designating virtual sites using policy informations in multiprotocol label switching networks |
| 12/30/2008 | US7471630 Systems and methods for performing selective flow control |
| 12/30/2008 | US7471629 Method and system for admission control in communication networks, related network and computer program product therefor |
| 12/30/2008 | US7471625 Fault recovery system and method for a communications network |
| 12/30/2008 | US7471624 Loop connection detecting method and device |
| 12/30/2008 | US7471240 Antenna connection detecting device and vehicle navigation device |
| 12/30/2008 | US7471220 Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit |
| 12/30/2008 | US7471102 Measuring threshold voltage of transistors in a circuit |
| 12/30/2008 | US7471101 Systems and methods for controlling of electro-migration |
| 12/30/2008 | US7471100 Semiconductor integrated circuit tester with interchangeable tester module |
| 12/30/2008 | US7471099 Semiconductor device with mechanism for leak defect detection |
| 12/30/2008 | US7471098 Testing device and method for an integrated circuit |
| 12/30/2008 | US7471097 Test probe with planar ground tip extending transversely from the ground barrel for a semiconductor package |
| 12/30/2008 | US7471096 Contactor for electronic parts and a contact method |
| 12/30/2008 | US7471095 Electrical connecting apparatus and method for use thereof |
| 12/30/2008 | US7471094 Method and apparatus for adjusting a multi-substrate probe structure |
| 12/30/2008 | US7471092 Test apparatus and test method |
| 12/30/2008 | US7471091 Nickel-hydride battery life determining method and life determining apparatus |
| 12/30/2008 | US7471079 Microscope enclosure system |
| 12/30/2008 | US7471078 Stiffener assembly for use with testing devices |
| 12/30/2008 | US7471077 Conveyor device, electronic device handling apparatus and conveying method in electronic device handling apparatus |
| 12/30/2008 | US7471075 Multi-test Arc fault circuit interrupter tester |
| 12/30/2008 | US7471065 Multi-series battery control system |
| 12/30/2008 | US7470968 T-coil apparatus and method for compensating capacitance |
| 12/30/2008 | US7470544 Sensor array using sail |
| 12/30/2008 | US7470149 Conductive-contact holder and conductive-contact unit |
| 12/30/2008 | CA2427147C Sensor for monitoring electronic detonation circuits |
| 12/30/2008 | CA2387916C A method and system for detecting incipient failures in a power inverter |
| 12/30/2008 | CA2291939C Method for diagnosing degradation in aircraft wiring |
| 12/30/2008 | CA2220053C Method and apparatus for detecting arcing in ac power systems by monitoring high frequency noise |
| 12/30/2008 | CA2216544C Circuit interrupter including an electric arc monitoring circuit |
| 12/25/2008 | US20080320432 Disabling unused IO resources in platform-based integrated circuits |
| 12/25/2008 | US20080320424 Validation of electrical performance of an electronic package prior to fabrication |
| 12/25/2008 | US20080320352 Methods for distribution of test generation programs |
| 12/25/2008 | US20080320351 Low power scan & delay test method and apparatus |
| 12/25/2008 | US20080320350 Ip core design supporting user-added scan register option |
| 12/25/2008 | US20080320349 eFuse Programming Data Alignment Verification Apparatus and Method |
| 12/25/2008 | US20080320345 System and method for testing wireless devices |
| 12/25/2008 | US20080319700 Test apparatus, pattern generator, test method and pattern generating method |
| 12/25/2008 | US20080319699 Detection of faults in an injector arrangement |
| 12/25/2008 | US20080319689 System and method to locate common path distortion on cable systems |
| 12/25/2008 | US20080316930 Robust Cable Connectivity Test Receiver For High-Speed Data Receiver |
| 12/25/2008 | US20080316929 Method and Network Element for Guaranteeing a Quality of Service in a Decentralized Network |
| 12/25/2008 | US20080316915 Method & apparatus for identifying the cause of communication session faults |
| 12/25/2008 | US20080315978 Method and apparatus for non-conductively interconnecting integrated circuits |
| 12/25/2008 | US20080315908 Direct detect sensor for flat panel displays |
| 12/25/2008 | US20080315907 Methods of Operating an Electronic Circuit for Measurement of Transistor Variability and the Like |
| 12/25/2008 | US20080315906 Faulty dangling metal route detection |
| 12/25/2008 | US20080315904 Method for registering probe card and a storage medium storing program thereof |
| 12/25/2008 | US20080315903 Method for measurement of a device under test |
| 12/25/2008 | US20080315902 Test device, test card, and test system |
| 12/25/2008 | US20080315901 Multilayer wiring board and method for manufacturing the same and probe apparatus |
| 12/25/2008 | US20080315900 High temperature ceramic socket configured to test packaged semiconductor devices |
| 12/25/2008 | US20080315899 Test Apparatus for Testing a Semiconductor Device, and Method for Testing the Semiconductor Device |
| 12/25/2008 | US20080315898 Acquiring Test Data From An Electronic Circuit |
| 12/25/2008 | US20080315893 Contact and connecting apparatus |
| 12/25/2008 | US20080315892 Methods and apparatus using one or more supernodes when testing for shorts between nodes of a circuit assembly |
| 12/25/2008 | US20080315891 Transmission line pulse testing with reflection control |
| 12/25/2008 | US20080315890 Image Display Device |
| 12/25/2008 | US20080315889 Fault isolation in interconnect systems |
| 12/25/2008 | US20080315888 Induction coil resistance tester |
| 12/25/2008 | US20080315885 Testing device for lighting means |
| 12/25/2008 | US20080315862 Smart parallel controller for semiconductor experiments |
| 12/25/2008 | US20080315838 Method of measuring the battery level in a mobile telephone |
| 12/25/2008 | US20080315407 Three-dimensional circuitry formed on integrated circuit device using two-dimensional fabrication |
| 12/25/2008 | US20080315196 Technique for evaluating a fabrication of a die and wafer |
| 12/25/2008 | US20080314168 Testing system for power supply |