Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2008
11/06/2008US20080273454 Harq Failure Indication Over Iub-Interface
11/06/2008US20080272799 Electronic Device
11/06/2008US20080272798 Display device and liquid crystal television
11/06/2008US20080272797 Intergrated Circuit Self-Test Architecture
11/06/2008US20080272794 Method of manufacturing a probe card
11/06/2008US20080272793 Finger Tester for Testing Unpopulated Printed Circuit Boards and Method for Testing Unpopulated Printed Circuit Boards Using a Finger Tester
11/06/2008US20080272792 Method and Device for Testing of Non-Componented Circuit Boards
11/06/2008US20080272791 System to measure series-connected cell voltages using a flying capacitor
11/06/2008US20080272764 Test tray for test handler
11/06/2008DE10317582B4 Fahrzeuglichtmaschinen-Fehlerbestimmungsvorrichtung Vehicle alternator failure determination apparatus
11/06/2008DE102007020954A1 Signaling device for electrical monitoring unit, particularly for short and ground circuit indicator, has illuminant for optical and visual signal perception, and illuminant radiates predominant portion of its emitted light as main light
11/06/2008DE102006059156B4 Verfahren zum Testen eines integrierten Schaltkreischips mit zumindest zwei Schaltungskernen sowie integrierter Schaltkreischip und Testsystem A method for testing an integrated circuit chip with at least two cores and circuit integrated circuit chip and test system
11/06/2008DE102006012156B4 Programmgeber für eine Einrichtung zum Testen, Verfahren zum Herstellen eines Programmablaufs für einen Programmgeber, Computerprogramm zum Ausführen der Schritte des Verfahrens sowie Einrichtung und Verfahren zum Testen Programmer for a device for testing, method for producing a program run for a programmer, computer program for performing the steps of the method and apparatus and method for testing
11/06/2008DE102004040504B4 Testanordnung für molekulare Bauelemente Test arrangement for molecular devices
11/06/2008DE102004036291B4 Schaltungsanordnung und Verfahren zum Steuern einer Sicherheitseinrichtung für ein Fahrzeug Circuit arrangement and method for controlling a safety device for a vehicle
11/06/2008DE102004032908B4 Batterielastzustand-Erfassungssystem Battery load state detection system
11/06/2008CA2630760A1 Method of detecting a ground fault and electrical switching apparatus employing the same
11/05/2008EP1988540A2 Driver
11/05/2008EP1988404A1 Device for transmitting management information of a power battery
11/05/2008EP1987431A2 System and method for sharing a communications link between multiple communications protocols
11/05/2008EP1987367A2 Sensor element, device and method for inspecting a printed conductor structure, production method for sensor element
11/05/2008EP1987365A2 Systems and methods of improving performance of transport protocols
11/05/2008EP1986935A2 Apparatus for checking an electrical printed circuit board having a conductor track
11/05/2008EP1891453B1 Acceleration device for testing electronic components
11/05/2008EP1608990A4 Apparatus and method for distance extension of fibre-channel over transport
11/05/2008EP1440379A4 Admission control system for home video servers
11/05/2008CN201146581Y Signaling channel detection circuit and television containing the same
11/05/2008CN201146399Y Inverter for automobile
11/05/2008CN201146371Y Sampling circuit for open-phase and earth leakage protection
11/05/2008CN201146324Y Arrester and monitoring device thereof
11/05/2008CN201145800Y TFT array substrate for liquid crystal display being easy to measure
11/05/2008CN201145789Y Tester for LCD display module
11/05/2008CN201145736Y Tester for constant current discharging load of accumulator
11/05/2008CN201145735Y Device for testing electric leakage circuit breaker
11/05/2008CN201145734Y Gas-actuated relay calibration stand
11/05/2008CN201145733Y DC switch experimental device
11/05/2008CN201145732Y Returned material apparatus for flexible circuit board tester
11/05/2008CN201145731Y Apparatus for testing vehicle mounted acoustics system mainboard
11/05/2008CN201145730Y Device for detecting circuit board of vehicle mounted charger of electric automobile
11/05/2008CN201145729Y Circuit board test device
11/05/2008CN201145728Y Apparatus for testing chip
11/05/2008CN201145727Y Intelligence voltage stabilizing diode test pen
11/05/2008CN201145726Y Simple electric power transistor tester
11/05/2008CN201145725Y Alarm device for monitoring thyristor on-off state
11/05/2008CN201145724Y Translation circuit of charge switch of ultralong wave front-impulse voltage generator
11/05/2008CN201145723Y Portable electric apparatus local discharging ultrasonic detector
11/05/2008CN201145722Y Metallic brush spark voltage tester
11/05/2008CN201145721Y Multifunctional cable fault tester
11/05/2008CN201145720Y Apparatus for measuring inductance coil polarity
11/05/2008CN201145719Y Device for testing insulation resistance of lithium ion battery pole group
11/05/2008CN201145718Y Device for testing DC-DC convertor
11/05/2008CN201145717Y System for measuring temperature characteristic of LED
11/05/2008CN201145716Y Energy-saving apparatus for making switch power supply
11/05/2008CN201145715Y Apparatus for testing keyboard
11/05/2008CN201145714Y Electronic control module testing apparatus and system
11/05/2008CN201145713Y Experimental device for frequency conversion controller
11/05/2008CN201145712Y Apparatus for testing driller reader
11/05/2008CN201145708Y High precision conductive angle digital display device
11/05/2008CN201145705Y Battery voltage measuring circuit
11/05/2008CN101300500A IC testing methods and apparatus
11/05/2008CN101300499A Integrated circuit test method and test apparatus
11/05/2008CN101300495A Method for manufacturing conductive contact holder, and conductive contact holder
11/05/2008CN101299577A Power conversion apparatus and method of estimating power cycle life
11/05/2008CN101299538A Cable-aerial mixed line fault travelling wave ranging method
11/05/2008CN101299385A Electron type current transformer for ultrahigh voltage transmission lines and corona loss measurement device thereof
11/05/2008CN101299315A Test system for display panel
11/05/2008CN101299125A Array tester
11/05/2008CN101299059A Method for testing cycle life of rechargeable battery
11/05/2008CN101299058A Load angle direct measurement method of hydroelectric synchronous machine
11/05/2008CN101299057A Energy-saving lamp brightness test detector
11/05/2008CN101299056A Method for arranging connector in microwave product machine internal circuit to realize testing performance
11/05/2008CN101299055A Simulation integrated switch current circuit testing method based on wavelet-neural net
11/05/2008CN101299054A Measuring method of dye sensitization nano-film solar cell I-V characteristic and conversion efficiency characteristic
11/05/2008CN101299053A Electric network fault self-adapting diagnostic method based on element correlation analysis
11/05/2008CN101299052A Electric generator one time frequency modulation real time quantitative analysis method based on phasor measuring technique
11/05/2008CN101299051A Electric network destabilization on-line automatic recognition method based on phasor measuring technique
11/05/2008CN100431131C Object-to-be-treated carrying system and object-to-be-treated carrying method
11/05/2008CN100431095C Manufacturing method for semiconductor device
11/05/2008CN100431094C Manufacturing method for semiconductor device
11/05/2008CN100430972C Picture signal providing circuit and electrooptical panel
11/05/2008CN100430745C Delay time measuring device and method
11/05/2008CN100430744C Method and system for measuring partial discharge
11/05/2008CN100430743C Directional and positioning testing device for fault of direct application type cable sheath
11/05/2008CN100430738C Method and circuit arrangement for the self-testing of a reference voltage in electronic components
11/05/2008CN100430737C Method and circuit arrangement for the self-testing of a reference voltage in electronic components
11/05/2008CN100430735C Test probe alignment apparatus
11/05/2008CN100430734C Combined probe for integrated circuit test
11/04/2008US7447965 Offset test pattern apparatus and method
11/04/2008US7447964 Difference signal path test and characterization circuit
11/04/2008US7447963 Testing of electronic circuits
11/04/2008US7447962 JTAG interface using existing I/O bus
11/04/2008US7447961 Inversion of scan clock for scan cells
11/04/2008US7447960 Method of efficiently loading scan and non-scan memory elements
11/04/2008US7447959 Semiconductor integrated circuit and a method of testing the same
11/04/2008US7447958 Parallel input/output self-test circuit and method
11/04/2008US7447954 Method of testing a memory module and hub of the memory module
11/04/2008US7447953 Lane testing with variable mapping
11/04/2008US7447610 Method and system for reliability similarity of semiconductor devices
11/04/2008US7447606 Method of separating the process variation in threshold voltage and effective channel length by electrical measurements
11/04/2008US7447160 Method and apparatus for providing automatic crankback for emergency calls