Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2008
12/10/2008EP2000811A1 Method for determining location of phase-to-earth fault
12/10/2008EP1999846A2 Systems and methods for on-chip power management
12/10/2008EP1999767A2 Energy collection
12/10/2008EP1886155A4 Memory device and method having a data bypass path to allow rapid testing and calibration
12/10/2008EP1123513B1 Integrated multi-channel analog test instrument architecture
12/10/2008CN201163294Y Overloading prompter of single-phase motor with centrifugal switch
12/10/2008CN201163293Y Industrial frequency spark experiment machine
12/10/2008CN201163292Y Electric power engineering high-voltage resistor load implemented by phase-shifting control full-bridge converting circuit
12/10/2008CN201163291Y Multifunctional transformation ratio test device
12/10/2008CN201163290Y Vehicle electric signal test device
12/10/2008CN201163288Y Power supply voltage detecting circuit
12/10/2008CN201163285Y Anti-electricity theft supervisory system
12/10/2008CN201163244Y Test device for outdoor unit of air conditioner
12/10/2008CN101322309A Motor load monitoring unit
12/10/2008CN101322280A Battery pack, electronic device and method for detecting remaining quantity in battery
12/10/2008CN101322040A Apparatus and method of testing for battery
12/10/2008CN101322039A System, method, and article of manufacture for determining an estimated battery parameter vector
12/10/2008CN101322038A Ring oscillator for determing select-to-output delay of a multiplexer
12/10/2008CN101322037A Nanoscale fault isolation and measurement system
12/10/2008CN101320857A Switching test seat
12/10/2008CN101320548A Driver circuit of display unit separating amplifier and output terminal in response to test signal and method of controlling the same
12/10/2008CN101320542A Detecting device of organic electroluminescent device
12/10/2008CN101320080A Apparatuses and methods for detecting power source
12/10/2008CN101320079A Computing method for battery electric quantity state
12/10/2008CN101320078A Scanning chain fault diagnosis system and method, and diagnosis vector generation apparatus
12/10/2008CN101320077A Simple method and test circuit for integrated circuit test
12/10/2008CN101320076A Reverse dynamic drain current test method and test circuit for fast recovery diode
12/10/2008CN101320075A 连接器 Connector
12/10/2008CN101320074A Intelligent security isolation insulating tool experiment system
12/10/2008CN101320073A Method for determining location of phase-to-earth fault
12/10/2008CN101320072A Thermal analysis test system based on infrared sequence image super-resolution reconstruction method
12/10/2008CN101320071A Testing apparatus, system, and method for testing at least one device with a connection interface
12/10/2008CN101320070A Indication method and device of short circuit and ground fault of power distribution network
12/10/2008CN101320069A Indication method of open circuit fault of series battery
12/10/2008CN101320068A Nano-second electrostatic discharge current experiment equipment based on sheet type piezoresistor
12/10/2008CN101320067A Automatic testing equipment and method of multi-channel selector
12/10/2008CN101320066A Thunderbolt attack distance of electric power transmission line lightning shielding failure based on electric geometric model and method for confirming the same
12/10/2008CN101320065A Simulation test method of space flight optical remote sensor imaging circuit
12/10/2008CN101320064A 10KV distribution transformer capacity tester
12/10/2008CN101320057A Electric voltage allowance test device
12/10/2008CN101320052A Chain type high voltage micro-current detaching device especially for insulation tool experiment
12/10/2008CN101319963A Method for detecting looseness of electric motor rotor
12/10/2008CN100442628C Rechargeable battery pack for a power tool
12/10/2008CN100442383C Semiconductor integrated circuit device and error detecting method therefor
12/10/2008CN100442242C Apparatus and system for testing host slot
12/10/2008CN100442075C Method and system for electrical length matching
12/10/2008CN100442074C Connecting multiple test access port controllers through a single test access port
12/10/2008CN100442073C Test apparatus
12/10/2008CN100442072C Test circuit and test method thereof
12/10/2008CN100442071C Method and arrangement for protecting a chip and checking its authenticity
12/10/2008CN100442070C Method for parallelly detecting synchronous communication chips
12/10/2008CN100442069C Method for parallelly detecting multiple chips of synchronous communication
12/10/2008CN100442068C Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
12/10/2008CN100442067C Generating simulated diffraction signals for two-dimensional structures
12/10/2008CN100442066C Method for analyzing BEOL testing chip on-line failure
12/10/2008CN100442065C Synthetic insulator on-line detector based on pulse current method
12/10/2008CN100442064C Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chips
12/10/2008CN100442063C Distributed intelligent monitoring system for motor
12/10/2008CN100442058C Probe and probe manufacturing method
12/09/2008US7464357 Integrated circuit capable of locating failure process layers
12/09/2008US7464314 Method for validating an integrated circuit and related semiconductor product thereof
12/09/2008US7464312 Shift register, scanning line driving circuit, matrix type device, electro-optic device, and electronic device
12/09/2008US7464311 Apparatus and method for device selective scans in data streaming test environment for a processing unit having multiple cores
12/09/2008US7464310 Programmable state machine of an integrated circuit
12/09/2008US7464308 CAM expected address search testmode
12/09/2008US7464307 High performance serial bus testing methodology
12/09/2008US7464296 System and method for identifying failure candidates in a semiconductor apparatus
12/09/2008US7463919 Cardiac diagnostics using wall motion and perfusion cardiac MRI imaging and systems for cardiac diagnostics
12/09/2008US7463890 Method and apparatus for establishing ad hoc communications pathways between source and destination nodes in a communications network
12/09/2008US7463764 Probe area setting method and probe device
12/09/2008US7463653 Apparatus and method for compression of the timing trace stream
12/09/2008US7463587 System and method for identifying pre-computed paths in a policy-based routing network
12/09/2008US7463584 System and method for hub and spoke virtual private network
12/09/2008US7463579 Routed split multilink trunking
12/09/2008US7463050 System and method for controlling temperature during burn-in
12/09/2008US7463049 Inspection method for semiconductor device
12/09/2008US7463048 Packaged circuit module for improved installation and operation
12/09/2008US7463047 Increase productivity at wafer test using probe retest data analysis
12/09/2008US7463046 Arcuate blade probe with means for aligning the barrel and the shaft
12/09/2008US7463045 Method for pushing a contact probe against object to be measured
12/09/2008US7463044 Adapter for positioning of contact tips
12/09/2008US7463043 Methods of probing an electronic device
12/09/2008US7463042 Connector probing system
12/09/2008US7463041 High-density electroconductive contact probe with uncompressed springs
12/09/2008US7463038 Slant detection device
12/09/2008US7463037 Devices, systems, and methods for adaptive RF sensing in arc fault detection
12/09/2008US7463036 Measurement of analog coil voltage and coil current
12/09/2008US7463018 Carrier module for adapting non-standard instrument cards to test systems
12/09/2008US7463017 Functional and stress testing of LGA devices
12/09/2008US7463015 Time shifting signal acquisition probe system
12/09/2008US7462999 Brushless servo motor tester
12/09/2008US7462507 Structure of a CMOS image sensor and method for fabricating the same
12/09/2008US7462293 Method and apparatus for measuring electron density of plasma and plasma processing apparatus
12/08/2008CA2634309A1 Battery system and management method
12/04/2008WO2008148075A1 Machine condition assessment through power distribution networks
12/04/2008WO2008147803A1 Probe test system and method for testing a semiconductor package
12/04/2008WO2008147607A1 Method and apparatus for predicting a discharge rate of an energy storage system
12/04/2008WO2008147490A1 Temperature monitor for bus structure flex connector
12/04/2008WO2008146705A1 Fixing device of probe card
12/04/2008WO2008146642A1 Capacitor inspecting system