Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2009
01/13/2009US7477063 Universal insert tool for fixing a BGA package under test
01/13/2009US7477062 LSI test socket for BGA
01/13/2009US7477061 Probe card
01/13/2009US7477058 Current sensor for measuring an electrical current in a circuit having a plurality of electrical conductors
01/13/2009US7476555 Method of chip manufacturing
01/08/2009WO2009006175A2 Test structure, test structure formation and mask reuse in semiconductor processing
01/08/2009WO2009006152A2 Method and apparatus for a voltage/current probe test arrangements
01/08/2009WO2009005810A1 System and method for predictive maintenance of a battery assembly using temporal signal processing
01/08/2009WO2009005223A1 System and method for detecting partial discharge position
01/08/2009WO2009004968A1 Testing apparatus
01/08/2009WO2009004260A2 System for transmitting an electric pulse and device for capacitive disconnection for such a system.
01/08/2009WO2009004259A2 Device for determining a charge distribution in a dielectric element
01/08/2009WO2009004075A1 Method for the determination of the off-load voltage of an electrochemical energy store
01/08/2009WO2009004009A1 Method for determining the quiescent voltage of a motor vehicle battery
01/08/2009WO2009004007A1 Determination of a state variable correlated with the battery charge state of a motor vehicle battery
01/08/2009WO2009003629A2 Registering unit for recording input signals caused by mechanical action on said unit, and method for recording measured values and processing signals
01/08/2009WO2009003531A1 Manufacturing method for a plunger and such a plunger
01/08/2009WO2009003503A1 State of charge determination
01/08/2009WO2009003361A1 An online partial discharge monitoring system of generator and method thereof
01/08/2009WO2008129010A9 Test equipment for automated quality control of thin film solar modules
01/08/2009WO2008115755A3 A testing method using a scalable parametric measurement macro
01/08/2009WO2008005079A3 Method of providing a customer with increased integrated circuit performance
01/08/2009WO2006099582A9 Mini wave soldering system and method for soldering wires and pin configurations
01/08/2009US20090013230 Circuit arrangement and method of testing and/or diagnosing the same
01/08/2009US20090013229 Built-in self-test using embedded memory and processor in an application specific integrated circuit
01/08/2009US20090013228 Bist ddr memory interface circuit and method for testing the same
01/08/2009US20090013227 Method Using Non-Linear Compression to Generate a Set of Test Vectors for Use in Scan Testing an Integrated Circuit
01/08/2009US20090013226 Blocking the effects of scan chain testing upon a change in scan chain topology
01/08/2009US20090013225 Test mode control circuit
01/08/2009US20090012747 Multiple Line Width Electromigration Test Structure and Method
01/08/2009US20090012727 Detecting Partial Discharge in High Voltage Cables
01/08/2009US20090010526 Tungsten plug deposition quality evaluation method by ebace technology
01/08/2009US20090010172 Message substitution response system
01/08/2009US20090009220 Signal generating apparatus, periodic-signal observing system, integrated circuit, periodic-signal observing method, and method of testing integrated circuit
01/08/2009US20090009209 Multiple Point Gate Oxide Integrity Test Method and System for the Manufacture of Semiconductor Integrated Circuits
01/08/2009US20090009208 Semiconductor device and inspection method thereof
01/08/2009US20090009207 Sensor unit with safety system
01/08/2009US20090009206 Bist ddr memory interface circuit and method for testing the same
01/08/2009US20090009204 Test socket
01/08/2009US20090009203 Inspection apparatus and method
01/08/2009US20090009202 Methods of Retaining Semiconductor Component Configurations within Sockets
01/08/2009US20090009200 Method for Providing Alignment of a Probe
01/08/2009US20090009199 Systems and methods for testing packaged microelectronic devices
01/08/2009US20090009197 Probe for electrical test
01/08/2009US20090009186 Systems and Methods for Determining the State of a Programmable Fuse in an IC
01/08/2009US20090009185 Diagnostic System For Monitoring A Connector
01/08/2009US20090009184 Test circuit and test method
01/08/2009US20090009183 System and method for predictive maintenance of a battery assembly using temporal signal processing
01/08/2009US20090009182 Circuit to provide testability to a self-timed circuit
01/08/2009US20090009181 Current Differential Protection Relays
01/08/2009US20090009180 Directional fault current indicator
01/08/2009US20090009179 Apparatus and method for verifying a seal between mutiple chambers
01/08/2009US20090009178 Abnormal condition detection apparatus
01/08/2009US20090009177 Voltage monitoring method and circuit for electrical energy storage device
01/08/2009US20090009176 Electronic device, battery pack, and electronic device system
01/08/2009US20090009134 Method and device for measuring internal resistance of battery
01/08/2009US20090008799 Dual mirror chips, wafer including the dual mirror chips, multi-chip packages, methods of fabricating the dual mirror chip, the wafer, and multichip packages, and a method for testing the dual mirror chips
01/08/2009DE202008013982U1 Messsystem zum Bestimmen von Streuparametern Measuring system for determining scattering parameters
01/08/2009DE112007000507T5 Messvorrichtung, Messverfahren, Prüfvorrichtung, Prüfverfahren und elektronische Vorrichtung Measuring device, measuring methods, test apparatus, test methods and electronic device
01/08/2009DE102007051503A1 Testing device for determining preset characteristics of electronic component i.e. wafer, has transporting device moving holding devices from assembling position to measuring position, and measuring device determining preset characteristics
01/08/2009DE102007031566A1 Vorrichtung zur Anzeige des Ladezustandes eines Akkus Means for displaying the state of charge of a battery
01/08/2009DE102007031305A1 Verfahren zur Ermittlung der Ruhespannung eines elektrochemischen Energiespeichers Method for determining the open circuit voltage of an electrochemical energy storage device
01/08/2009DE102007031304A1 Verfahren zur Ermittlung der Ruhespannung einer Kraftfahrzeugbatterie Method for determining the open circuit voltage of a motor vehicle battery
01/08/2009DE102007031303A1 Verfahren und Vorrichtung zur Ermittlung einer mit dem Batterieladezustand korrelierenden Zustandsgröße einer Kraftfahrzeugbatterie unter Verwendung eines selbstlernenden Batteriemodells Method and apparatus for determining a correlation with the battery charge level state variable of a motor vehicle battery using a self-learning battery model
01/08/2009DE102007030714A1 Verfahren für die Überwachung eines Kraftfahrzeugenergieversorgungssystems Method for monitoring a motor vehicle power supply system
01/08/2009DE102007029746A1 Wiederaufladbare Energieversorgungseinrichtung mit einer Identifizierungseinrichtung Rechargeable power supply device with an identification device
01/08/2009DE102007029156A1 Voltage monitoring circuit for e.g. hybrid vehicle, has separation device and power supply connected with lower voltage-data outputs, where voltage signal is output to extra-low voltage-data output, which is separated from outputs
01/07/2009EP2012353A2 Method and apparatus for inspection and fault analysis
01/07/2009EP2012338A1 Power source control device, and relay malfunction detecting method
01/07/2009EP2012324A1 Compression of data traces for an integrated circuit with multiple memories
01/07/2009EP2012135A1 Stat-of-charge prediction program, wireless transportation system, and charging method
01/07/2009EP2012134A1 Device and method for determining replacement of storage battery
01/07/2009EP2012133A1 Directional fault current indicator
01/07/2009EP2011262A1 Apparatus for parallel/serial conversion of a plurality of signal variables which are each detected by a detector
01/07/2009EP2011011A2 Battery monitoring, warranty, and performance tracking system
01/07/2009EP2010991A2 Field device editor tool
01/07/2009EP2010927A1 Test access port switch
01/07/2009EP1866658B1 Test prepared rf integrated circuit
01/07/2009EP1763677B1 Circuit arrangement and method of testing an application circuit provided in said circuit arrangement
01/07/2009EP1634090B1 Automatic test system with easily modified software
01/07/2009EP1402684B1 Network documentation system with electronic modules
01/07/2009CN201178320Y Fast charging indication circuit of secondary battery pack
01/07/2009CN201177657Y Automatic battery moving and transferring apparatus for inner parameter automatic detection machine for cell of mobile phone
01/07/2009CN201177656Y Measuring system for charge state of vehicle power battery
01/07/2009CN201177655Y Residual capacity tester of accumulator
01/07/2009CN201177654Y Motor rotor test apparatus
01/07/2009CN201177653Y Circuit breaker life on-line monitoring system
01/07/2009CN201177652Y Test system for circuit board
01/07/2009CN201177651Y Test unit device for QFN integrated circuit testing separator
01/07/2009CN201177650Y Cage type induction motor having detection coil and detection apparatus for broken strip of rotor
01/07/2009CN201177649Y Automatic test equipment for temperature rising of winding
01/07/2009CN201177648Y Motor rotation-blocking detection circuit for electrical appliance
01/07/2009CN201177647Y Multiple waveform aging test apparatus of lightning arrester
01/07/2009CN201177646Y Partial discharge on-line detection apparatus of portable air insulation combined electrical equipment
01/07/2009CN201177645Y Live close distance observer of high-voltage electric appliance
01/07/2009CN201177641Y Secondary circuit wiring checking system
01/07/2009CN201177545Y High-voltage circuit-breaker cut-off great current spout gas pressure characteristic measuring apparatus
01/07/2009CN201177531Y Electric resistance strain type weighing sensor simulator
01/07/2009CN101341589A Defect inspecting method and defect inspecting apparatus
01/07/2009CN101341417A Method of evaluating a delay of an input/output circuit and corresponding device