| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/03/1994 | DE4228798A1 Fault location mechanism test circuit e.g for asynchronous AC machine - provides winding taps on coils coupled to terminals of simulator, and connects several taps with each other to simulate fault-free or fault-contg. machine |
| 03/03/1994 | DE4228691A1 Electrical function test appts. for circuit boards - provides substrates having gas discharge channels on upper and lower sides of tested board, and applies HV to discharge electrode in one substrate, to ignite discharge path on in other substrate |
| 03/03/1994 | DE4225686A1 Microprocessor circuit arrangement for identifying and charging a battery pack - detects and displays electrical code, and processes signal from temp. sensor in battery pack |
| 03/03/1994 | CA2142854A1 Battery charge indicator apparatus and the method of operation thereof |
| 03/02/1994 | EP0585175A1 Appliance and method for measuring the aging of composite polymer insulation for a stator winding |
| 03/02/1994 | EP0585086A2 Method and apparatus for self-testing of delay faults |
| 03/02/1994 | EP0585024A2 Pressure detector circuit |
| 03/02/1994 | EP0584917A2 System and method for testing a programmable logic |
| 03/02/1994 | EP0584739A2 Semiconductor integrated circuit operative in different modes |
| 03/02/1994 | EP0584385A1 Method and system for testing an integrated circuit featuring scan design |
| 03/02/1994 | EP0584087A1 Integrated test circuit for display devices such as liquid cristal displays |
| 03/02/1994 | EP0395679B1 Process and arrangement for measuring the variation of a signal at a measuring point of a specimen |
| 03/02/1994 | CN1083291A Modulator test system |
| 03/01/1994 | US5291587 Graphical system for executing a process and for programming a computer to execute a process, including graphical variable inputs and variable outputs |
| 03/01/1994 | US5291535 Method and apparatus for detecting excess/insufficient solder defects |
| 03/01/1994 | US5291495 Method for designing a scan path for a logic circuit and testing of the same |
| 03/01/1994 | US5291449 IC memory testing apparatus |
| 03/01/1994 | US5291433 Semiconductor memory with leak-resistant bit lines |
| 03/01/1994 | US5291425 Test mode setting arrangement for use in microcomputer |
| 03/01/1994 | US5291285 Television signal level meter |
| 03/01/1994 | US5291142 Method and apparatus for measuring the resistance of conductive materials due to electromigration |
| 03/01/1994 | US5291140 Mixed domain spectrum measurement method |
| 03/01/1994 | US5291128 Motor testing apparatus utilizing inertial loading |
| 03/01/1994 | US5291127 Chip-lifetime testing instrument for semiconductor devices |
| 03/01/1994 | US5291118 Device for detecting connection or disconnection of a battery to an electric charger |
| 03/01/1994 | US5290710 Method for testing integrated circuits on a carrier substrate |
| 03/01/1994 | US5290134 Pick and place for automatic test handler |
| 03/01/1994 | US5289631 Method for testing, burn-in, and/or programming of integrated circuit chips |
| 02/28/1994 | CA2099415A1 Method and apparatus for self-testing of delay faults |
| 02/25/1994 | CA2104623A1 Ground fault detector and associated logic for an electronic ballast |
| 02/24/1994 | DE4236808C1 Testing procedure for telecommunications exchange - comparing test results data of exchange with those of reference exchange converted into suitable format |
| 02/24/1994 | DE4227827A1 Distributed signal lamp power supply and control system - uses microprocessor control and voltage sensors to deliver constant power to lamps and indicate failures |
| 02/24/1994 | DE4227149A1 Measuring resistance values in temperature sensor - measuring voltages across resistance and reference resistance for null and constant currents |
| 02/23/1994 | EP0583906A1 Battery unit and battery energy billing method |
| 02/23/1994 | EP0583812A1 Method for testing software, method for creating testable software, and system provided with testable software |
| 02/23/1994 | EP0583585A2 Individually powering-up unsingulated dies on a wafer |
| 02/23/1994 | EP0583348A1 Method for blocking smart card. |
| 02/23/1994 | EP0583275A1 Signal quality monitoring system |
| 02/23/1994 | EP0281620B1 Apparatus and method for testing an equipment and stimulating apparatus |
| 02/23/1994 | CN2157653Y Work state digital display for X-ray machine |
| 02/23/1994 | CN2157523Y Electronic induction test pencil |
| 02/22/1994 | US5289475 Semiconductor memory with inverted write-back capability and method of testing a memory using inverted write-back |
| 02/22/1994 | US5289425 Semiconductor integrated circuit device |
| 02/22/1994 | US5289134 Circuit for monitoring contact between the resistance track and the wiper of a potentiometer |
| 02/22/1994 | US5289119 Transparent enable test circuit |
| 02/22/1994 | US5289118 Programmer/tester with electronically switched bypass capacitor |
| 02/22/1994 | US5289117 Translator module |
| 02/22/1994 | US5289116 Apparatus and method for testing electronic devices |
| 02/22/1994 | US5289113 PROM for integrated circuit identification and testing |
| 02/22/1994 | US5288563 Hydrogen ion concentration sensor and lead-acid battery having the sensor |
| 02/22/1994 | US5288238 IC chip to PC board connector system |
| 02/22/1994 | US5287853 Adapter cable for connecting a pulsoximetry sensor unit to a medical measuring device |
| 02/22/1994 | US5287759 Method and apparatus of measuring state of IC lead frame |
| 02/22/1994 | US5287755 Process and apparatus for verifying the cut-off torque of an actuator |
| 02/22/1994 | US5287726 For purging coolant lines of transformers and/or dynamoelectric stators |
| 02/21/1994 | CA2104419A1 Method of determining and indicating battery state of charge |
| 02/17/1994 | WO1994003954A1 Fault detection device on a buried electric power distribution network |
| 02/17/1994 | WO1994003953A1 Fault detection device on an overhead electric power distribution network |
| 02/17/1994 | WO1994003820A1 Electric arc detector |
| 02/17/1994 | WO1994003307A1 Slide actuated holding clamp |
| 02/17/1994 | DE4300503C1 Semiconductor structure charge carrier profiling method - using HF pulses for atomic force microscopy scanning system short enough to prevent contact with sample |
| 02/17/1994 | CA2119024A1 Slide actuated holding clamp |
| 02/16/1994 | EP0583230A1 Method for determining the physical length of a telephone line |
| 02/16/1994 | EP0582918A2 Apparatus for computing power consumption of MOS transistor logic function block |
| 02/16/1994 | CN1081947A Accessories indexing mechanism |
| 02/15/1994 | US5287313 Method of testing data-holding capability of a semiconductor memory device |
| 02/15/1994 | US5287312 Dynamic random access memory |
| 02/15/1994 | US5287286 Low-battery state detecting system and method for detecting the residual capacity of a battery from the variation in battery voltage |
| 02/15/1994 | US5287064 Bonding point polarity determining apparatus |
| 02/15/1994 | US5287055 Circuit for measuring current in a power MOS transistor |
| 02/15/1994 | US5287022 Method and circuit for controlling voltage reflections on transmission lines |
| 02/15/1994 | US5287012 Semiconductor integrated circuit equipped with diagnostic circuit for checking reference voltage signal supplied to internal step-down circuit |
| 02/15/1994 | US5286962 IC card for prevention of fraudulent use |
| 02/10/1994 | DE4225994A1 Latching and contact fault test appts. for plug with attached cable - provides holder with plug receptacle and latching pin, which is coupled to drive motor by reversible eccentric cam |
| 02/09/1994 | EP0582527A1 Device for detection faults in cells of a battery |
| 02/09/1994 | EP0582526A1 Method for determining battery discharge time |
| 02/09/1994 | EP0582306A1 Semiconductor device having hollowed conductor |
| 02/09/1994 | EP0582071A2 Test dectector/shutoff and method for BiCMOS integrated circuit |
| 02/09/1994 | EP0581993A1 Circuit arrangement for the control of a load and the detection of line interruption |
| 02/09/1994 | CN2155575Y Compensated manual neutral-point measuring device |
| 02/09/1994 | CN2155574Y Multiple microcomputer pairing device |
| 02/09/1994 | CN2155573Y Cable pairing device |
| 02/09/1994 | CN2155572Y 中央信号装置 Central signaling devices |
| 02/09/1994 | CN2155569Y Mineral heat-sensitive parameter tester |
| 02/09/1994 | CN1081766A Testing method for dynamic characteristic of semiconductor light-sensitive tube |
| 02/08/1994 | US5285453 Test pattern generator for testing embedded arrays |
| 02/08/1994 | US5285418 Semiconductor device having a temperature detection circuit |
| 02/08/1994 | US5285409 Serial input/output memory with a high speed test device |
| 02/08/1994 | US5285163 Electrical cable continuity and voltage tester |
| 02/08/1994 | US5285153 Apparatus for facilitating scan testing of asynchronous logic circuitry |
| 02/08/1994 | US5285152 Apparatus and methods for testing circuit board interconnect integrity |
| 02/08/1994 | US5285151 Method and apparatus for measuring the breakdown voltage of semiconductor devices |
| 02/08/1994 | US5285150 Method and apparatus for testing LCD panel array |
| 02/08/1994 | US5285149 Method for loading an adapter for a device for testing printed circuit boards |
| 02/08/1994 | US5285143 Measurement of load current in a multi-phase power amplifier |
| 02/08/1994 | US5285119 Semiconductor integrated tri-state circuitry with test means |
| 02/08/1994 | US5285117 Output circuit with output enabling inputs |
| 02/08/1994 | US5285082 Integrated test circuits having pads provided along scribe lines |
| 02/08/1994 | US5284719 Method and apparatus for monitoring battery capacity |
| 02/08/1994 | CA1326907C Programmable tester with bubble memory |