Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
10/1990
10/30/1990US4967149 Drive device for an apparatus for electrical function testing of wiring matrices
10/30/1990US4967148 Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards
10/30/1990US4967147 Circuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assemblies
10/23/1990US4965865 Probe card for integrated circuit chip
10/23/1990US4965606 Antenna shroud tempest armor
10/23/1990US4965514 Apparatus for probing a microwave circuit
10/23/1990US4964809 Electrical test equipment
10/23/1990US4964808 Electrical device contactor
10/18/1990WO1990012326A1 Contact sensing for integrated circuit testing
10/18/1990WO1990012323A1 Device for testing printed circuit boards
10/18/1990WO1990010238A3 Thermo-optical current sensor and thermo-optical current sensing systems
10/17/1990EP0392830A2 Method and apparatus for detecting voltage
10/17/1990CN2064064U Watt-hour meter
10/16/1990US4963822 Method of testing circuit boards and the like
10/16/1990US4963821 Probe and method for testing a populated circuit board
10/16/1990US4963225 Depositing conductive material in opening of dielectric layer, depositing second dielectric layer, removing first layer so conductive material projects beyond it
10/16/1990US4963195 Thermocouples is connected to an silicon and germaniium alloy film; accuracy; heat resistance
10/11/1990DE3925505A1 Vorrichtung zum pruefen von leiterplatten Apparatus for testing circuit boards
10/11/1990DE3910929A1 Device for the magnetic shaft of an eddy current measuring mechanism
10/10/1990EP0391751A2 Resistance shunt
10/09/1990US4962439 Squaring circuit
10/09/1990US4962356 Integrated circuit test socket
10/04/1990WO1990011630A1 Plug contact arrangement
10/04/1990DE3912992A1 Circuit board testing contact device - has contact pin with spring section clamped in bore of current conductor plate
10/03/1990EP0390651A2 Fiberoptic techniques for measuring the magnitude of local microwave fields and power
10/03/1990EP0390642A1 Probe card for testing hyperfrequency semiconductor components
10/03/1990CN2063236U Practical multifunction pen of multimeter
10/02/1990US4961052 Probing plate for wafer testing
10/02/1990US4961050 Test fixture for microstrip assemblies
09/1990
09/26/1990EP0388485A1 Test fixture for microwave circuits
09/25/1990US4959511 Pen cord tensioning device
09/24/1990CA2012887A1 Board for testing microwave semiconductor components
09/20/1990CA2012407A1 Measuring mount for microwave components
09/19/1990EP0388217A1 Circuit protection apparatus
09/19/1990EP0387332A1 Apparatus for testing circuit boards
09/19/1990EP0387311A1 Guiding and insulation of microcontact pins and springs using complete multiple guide blocks and process for producing these multiple guide blocks
09/19/1990CN2062451U Mine electric charging meter
09/18/1990US4956923 For use at a test station
09/11/1990US4956604 Broad band contactor assembly for testing integrated circuit devices
09/11/1990US4956601 Apparatus for measuring an electrical quantity with an adjustable zero position and double pivot arrangement
09/07/1990WO1990010238A2 Thermo-optical current sensor and thermo-optical current sensing systems
09/07/1990WO1990008327A3 Interface system for measuring by logic analyser digital signals derived from an integrated circuit
09/05/1990EP0385628A2 Moving coil measuring instruments
09/05/1990EP0250620B1 Method and device for electrically testing printed circuits
09/04/1990US4954087 Static-free interrogating connector for electric components
08/1990
08/30/1990DE3925124C1 Lead tester for telephone exchange distributor - has adaptor with spring flaps at front of housing over outer contact surfaces
08/30/1990DE3906134A1 Measurement storage apparatus
08/30/1990DE3905569A1 Measuring conductor
08/29/1990EP0384599A1 Integrated circuit test structure and test process
08/29/1990CN2061286U Double indicating meter
08/28/1990US4952872 Apparatus for electrically testing printed circuit boards having contact pads in an extremely fine grid
08/28/1990US4952871 Method and apparatus of testing printed circuit boards and assembly employable therewith
08/28/1990US4952870 Compact taut band meter movement assembly
08/28/1990US4952869 Dual purpose probe for simultaneous voltage and current sampling
08/28/1990US4952272 Etching a protecting conductive layer on an electrode pad
08/28/1990US4951834 Molded gasket for instrument housing
08/28/1990US4951370 Method of making an intelligent multiprobe tip
08/23/1990WO1990009598A1 A device for monitoring and indicating a given minimum battery power reserve
08/22/1990EP0382923A2 Electrical connector
08/22/1990CN2060888U Popularized electric meter main part
08/21/1990US4950981 Apparatus for testing a circuit board
08/21/1990US4950980 Test socket for electronic device packages
08/21/1990CA1273130A1 Test point adapter for chip carrier sockets
08/16/1990EP0382428A2 Test fixture for microstrip assemblies
08/14/1990US4949032 Probe for dual in-line packages
08/14/1990US4949031 Environmental stress screening apparatus for electronic products
08/14/1990US4949029 Adjustment circuit and method for solid-state electricity meter
08/07/1990US4947112 Apparatus and method for testing printed circuit boards
08/07/1990US4947111 Test fixture for multi-GHZ microwave integrated circuits
08/07/1990US4946393 Separable connector access port and fittings
08/07/1990CA1272528A1 Pressure control apparatus for use in an integrated circuit testing station
08/01/1990EP0380342A2 Electrical contact
08/01/1990EP0265423B1 Presentation panel
07/1990
07/31/1990US4945445 Current sense circuit
07/26/1990WO1990008327A2 Interface system for measuring by logic analyser digital signals derived from an integrated circuit
07/25/1990EP0378670A1 Adjustment circuit and method for solid-state electricity meter
07/24/1990US4943768 Testing device for electrical circuit boards
07/24/1990US4943767 Automatic wafer position aligning method for wafer prober
07/24/1990US4943720 Electronic probe
07/24/1990US4943020 For manually positioning an object in space/maintaining position
07/17/1990US4942356 Modular electronic device
07/17/1990CA1271848A1 Wafer probe
07/10/1990US4940935 Automatic SMD tester
07/10/1990CA1271565A1 Adaptor in apparatus for electronically testing printed circuit boards
07/10/1990CA1271525A1 Device for compensating the response delay of a measure shunt
07/04/1990EP0375984A1 Capacitor power probe
07/03/1990US4939500 Electrode water circulation and processing system and hooded radiator for water rheostat
07/03/1990US4939454 Connector system for printed circuit board test facility
07/03/1990US4939452 Arrangement for testing printed-circuit boards
07/03/1990US4939451 Wide dynamic range a.c. current sensor
06/1990
06/28/1990WO1990007125A1 Electrical testing probe
06/27/1990EP0374434A1 Electrical test fixture
06/26/1990US4937203 Providing temporary connections for high speed testing
06/26/1990US4936800 Precision test connector
06/26/1990CA1270912A1 Low impedance switch attenuator
06/21/1990DE3841087A1 Vacuum adapter with bellows seal for making contact with mounted circuit boards in conventional and SMD construction
06/20/1990EP0373982A1 Measuring device for various electric quantities
06/19/1990US4935696 Test pin assembly for circuit board tester
06/19/1990US4935695 Board alignment system
06/19/1990US4935694 Probe card fixture
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