| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 01/30/1990 | US4897598 Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards |
| 01/30/1990 | US4897043 Resilient contact pin |
| 01/25/1990 | WO1990000740A1 Adjustment circuit and method for solid-state electricity meter |
| 01/24/1990 | EP0352001A2 Fixture latching mechanism |
| 01/23/1990 | US4896107 Test pin for an adapter for connecting test contacts on the grid of a printed circuit board testing device with test points of a test-piece on and/or off the grid |
| 01/17/1990 | EP0351291A1 Measuring appliance for an electric quantity |
| 01/17/1990 | EP0351174A2 Board alignment system |
| 01/17/1990 | EP0351086A2 Electrode water circulation and processing system for water rheostat |
| 01/17/1990 | EP0350609A2 Test appliance for circuit boards |
| 01/16/1990 | US4894612 Soft probe for providing high speed on-wafer connections to a circuit |
| 01/16/1990 | US4894607 Surface potential detecting apparatus |
| 01/11/1990 | EP0276280A4 Method for remotely detecting an electric field. |
| 01/09/1990 | US4893074 Electronic device testing system |
| 01/09/1990 | US4892122 Probe pin alignment tool |
| 01/02/1990 | US4891586 IC grabber probe |
| 01/02/1990 | US4891585 Multiple lead probe for integrated circuits in wafer form |
| 01/02/1990 | US4891583 Inspection mechanism for chip type circuit element |
| 01/02/1990 | US4891580 Electro-optic measurements of voltage waveforms on electrical conductors |
| 01/02/1990 | US4891579 Voltage detector |
| 01/02/1990 | US4891578 Device for the electrical function testing of wiring matrices, particularly of printed circuit boards |
| 01/02/1990 | US4891577 Of a semiconductor device |
| 12/28/1989 | EP0274529A4 Liquid crystal display. |
| 12/20/1989 | EP0346737A2 Strechable field of needles |
| 12/19/1989 | US4888550 Intelligent multiprobe tip |
| 12/19/1989 | US4887969 IC socket |
| 12/14/1989 | DE3917341A1 Method and test adaptor for making contact with test-pieces |
| 12/14/1989 | DE3819884A1 Device for the testing of electronic subassemblies |
| 12/14/1989 | DE3818728A1 Spring contact pin |
| 12/13/1989 | EP0346204A1 Measuring appliance for an electric quantity |
| 12/13/1989 | EP0346203A1 Ferromagnetic measuring appliance |
| 12/13/1989 | EP0345992A1 Improvements in or relating to measuring instruments |
| 12/13/1989 | CN1037980A Universal test and control module and its system |
| 12/12/1989 | US4887030 Testing device for electrical circuit boards |
| 12/12/1989 | US4887027 Leadless current-sensing system |
| 12/12/1989 | US4887026 Voltage detector for detecting a voltage developing in a selected area of an object |
| 12/12/1989 | US4886470 Burn-in socket for gull wing integrated circuit package |
| 12/07/1989 | DE3916580A1 Contact pin |
| 12/06/1989 | EP0344988A2 Connection terminal structure of electronic equipment |
| 12/06/1989 | EP0344720A2 Method of producing electrical connection members |
| 12/06/1989 | EP0344654A2 Process and interface for contacting test objects |
| 12/05/1989 | US4885533 Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region |
| 11/30/1989 | WO1989011659A1 Novel method of making, testing and test device for integrated circuits |
| 11/30/1989 | DE3817299A1 Measured value pick-up for a clip-on ammeter |
| 11/28/1989 | US4884171 Electromagnetic interference shielding device for a portable aircraft engine tester |
| 11/28/1989 | US4884024 Test pin assembly for circuit board tester |
| 11/28/1989 | US4883428 Test socket incorporating circuit elements |
| 11/23/1989 | EP0343021A1 Flex dot wafer probe |
| 11/22/1989 | CN1037397A Movable core measuring instrument |
| 11/21/1989 | US4881411 Specimen holder and rotary assembly |
| 11/16/1989 | DE3816019A1 Device for the electrical testing of electronic subassemblies |
| 11/16/1989 | DE3815573A1 Test adaptor |
| 11/15/1989 | EP0342101A1 Test device for a fuse used in an apparatus for measuring the intensity of a current |
| 11/15/1989 | EP0342045A2 Electronic device testing system |
| 11/14/1989 | CA1262885A1 Apparatus for automated testing of surface mounted components |
| 11/08/1989 | EP0341156A1 Device for supporting and thermally regulating a piece and semi-conductor circuit plates testing apparatus comprising such a device |
| 11/08/1989 | CN2047379U Kilowatt-hour meter with electric leakage and short-circuit protective function |
| 11/07/1989 | US4878852 Circuit tester construction |
| 11/07/1989 | US4878294 Electroformed chemically milled probes for chip testing |
| 11/02/1989 | WO1989010639A1 Static-free interrogating connector for electric components |
| 11/02/1989 | EP0339317A1 Squaring circuit |
| 10/31/1989 | US4878018 Electrical testing device |
| 10/25/1989 | CN2046626U Digital electric meter with preset stored counts and self-controlling backing-up function |
| 10/18/1989 | EP0337875A1 Tester comprising a contact tip and retractable protection jacket |
| 10/18/1989 | CN2046218U Protective and supervisory device of kilowatt-hour meter |
| 10/17/1989 | US4875152 Electrical tap switch |
| 10/17/1989 | US4875006 Ultra-high-speed digital test system using electro-optic signal sampling |
| 10/17/1989 | US4874086 Film carrier and a method for manufacturing a semiconductor device utilizing the same |
| 10/10/1989 | US4873655 Sensor conditioning method and apparatus |
| 10/10/1989 | US4873485 Electro-optic signal measurement |
| 10/10/1989 | US4872850 IC tester socket |
| 10/10/1989 | US4872356 Resistivity probe fixture |
| 10/05/1989 | WO1989009413A1 Electro-optic probe |
| 10/05/1989 | WO1989009410A1 Test fixture for tab circuits and devices |
| 10/03/1989 | US4871964 Integrated circuit probing apparatus |
| 09/28/1989 | DE3904542A1 Contact device |
| 09/28/1989 | DE3826457A1 Arrangement for measuring pulse-shaped high currents |
| 09/27/1989 | EP0334273A2 A fixture for measuring the static characteristics of microwave 3-terminal active components |
| 09/27/1989 | EP0333711A1 Current detection device having an extended frequency range of response |
| 09/26/1989 | US4870356 Multi-component test fixture |
| 09/26/1989 | US4870354 Apparatus for contacting a printed circuit board with an array of test probes |
| 09/26/1989 | US4870353 Pre-loaded compression spring assembly |
| 09/26/1989 | US4870352 Contactless current probe based on electron tunneling |
| 09/26/1989 | US4870347 Universal master breakout unit for testing avionic systems |
| 09/26/1989 | US4870343 High voltage detector |
| 09/26/1989 | CA1261418A1 Test clip for plcc |
| 09/20/1989 | EP0333160A2 Laminated board for testing electronic components |
| 09/20/1989 | CN2044472U High-speed electracardiogram testing probe |
| 09/19/1989 | US4868493 Device for the functional testing of integrated circuits and a method for operating the device |
| 09/19/1989 | US4868490 Method and apparatus for sheet resistance measurement of a wafer during a fabrication process |
| 09/19/1989 | EP0318549A4 Test meters. |
| 09/14/1989 | DE3906691A1 Contact-making device for testing devices for testing printed circuit boards or the like |
| 09/14/1989 | DE3804425C1 PCB testing arrangement using several pins - forms contact between test pins and board tracks by compression under vacuum of sheets |
| 09/13/1989 | EP0332560A2 Elastomeric connectors for electronic packaging and testing |
| 09/13/1989 | EP0332547A1 Current measuring circuit |
| 09/12/1989 | US4866578 Inspection fixture for the solder side of printed circuit boards |
| 09/12/1989 | US4866375 Universal test fixture |
| 09/12/1989 | US4866374 Contactor assembly for testing integrated circuits |
| 09/12/1989 | US4866372 Voltage detector having compensation for polarization change caused by spontaneous birefringence |
| 09/08/1989 | WO1989008265A1 Device for testing printed circuit boards |
| 09/07/1989 | DE3806238A1 Device for the highly accurate technical determination of the radio-frequency properties of microstrip circuit components, and arrangements for calibrating the device |