| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 03/01/1991 | CA2024321A1 Superconducting sensor for quench detection in a superconductor |
| 02/27/1991 | EP0414402A1 Silhouette illuminated instrument panel display apparatus |
| 02/27/1991 | EP0414378A2 An adapter for integrated circuit elements and a method using the adapter for testing assembled elements |
| 02/26/1991 | US4996478 Coaxial probe mounting system |
| 02/26/1991 | US4996476 Test clip for surface mount device |
| 02/26/1991 | US4996475 Electro-optic voltage detector having a transparent electrode |
| 02/26/1991 | US4995837 Precision test connector |
| 02/19/1991 | US4994737 System for facilitating planar probe measurements of high-speed interconnect structures |
| 02/19/1991 | US4994735 Flexible tester surface for testing integrated circuits |
| 02/19/1991 | US4994733 Potentiometer for voltage-measuring instrument |
| 02/19/1991 | US4993136 Method of converting a vacuum test fixture on a board testing apparatus to a mechanical test fixture |
| 02/14/1991 | DE3925552A1 Scanning head generating and picking up short electrical signals - is activated by opto-electronic switch and can contact selected points of integrated circuit paths |
| 02/13/1991 | EP0412119A1 Static-free interrogating connector for electric components. |
| 02/12/1991 | US4992850 Memory array |
| 02/12/1991 | US4992728 Electrical probe incorporating scanning proximity microscope |
| 02/06/1991 | EP0411106A1 Thermo-optical current sensor and thermo-optical current sensing systems |
| 02/05/1991 | US4991098 Computer-based controller and bipolar PWM driver arrangement for air core gauge control |
| 02/05/1991 | CA1279936C Multiple lead probe for integrated circuits in wafer form |
| 01/30/1991 | EP0410436A2 Apparatus and method for testing printed circuit boards |
| 01/30/1991 | EP0410234A2 Method and apparatus for measuring an electric field or an electric voltage |
| 01/29/1991 | CA1279700C System for compensating the return current asymmetry effect on the response of a current measure shunt |
| 01/28/1991 | CA2016003A1 Apparatus and method for testing printed circuit boards |
| 01/22/1991 | US4987365 Method and apparatus for testing integrated circuits |
| 01/22/1991 | US4987364 Printed circuit board |
| 01/22/1991 | US4986778 Carrier for use in testing circuit boards |
| 01/22/1991 | US4986760 Socket for tab burn-in and test |
| 01/22/1991 | CA1279303C Extended spindle electric gage mechanism |
| 01/16/1991 | CN2069562U High voltage dc measuring instrument |
| 01/16/1991 | CN1048599A Device and method for ac shift and kwh meter piecewise measurement |
| 01/15/1991 | US4984623 Electrode water circulation and processing system and hooded radiator for water rheostat |
| 01/10/1991 | DE4019399A1 Plug connector for semiconductor circuit modules |
| 01/09/1991 | EP0406919A2 Arrangement for electronically testing printed circuits with extremely fine contact-point screen |
| 01/09/1991 | EP0406764A2 Adapter for testing integrated circuits mounted on a film |
| 01/09/1991 | CN1048454A Eddy current meter |
| 01/08/1991 | US4983933 Waveguide-to-stripline directional coupler |
| 01/08/1991 | US4983910 Millimeter-wave active probe |
| 01/08/1991 | US4983909 Repetitive-switching |
| 01/08/1991 | US4983908 Probing card for wafer testing and method of manufacturing the same |
| 01/08/1991 | US4983907 Integrated circuits |
| 01/03/1991 | DE3920232A1 Pluggable wiring foil with conductive tracks - has several, loosely stacked foil circuits, with specified raster of soldering eyelets |
| 01/02/1991 | EP0405802A2 Electrooptic apparatus for the measurement of ultrashort electrical signals |
| 01/02/1991 | EP0405765A2 Configurable electronic circuit board, adapter therefor , and designing method of electronic circuit using the same board |
| 01/02/1991 | EP0405323A2 Elastic contact probe |
| 01/02/1991 | CN2068685U Miniature multifunction protector for watt-hour meter |
| 01/01/1991 | US4982172 Method of creating a measuring signal access to a waveguide arrangement |
| 01/01/1991 | US4982154 Method of engagement of electrical contacts to pipe members |
| 01/01/1991 | US4982152 Voltage detecting device |
| 01/01/1991 | US4982151 Voltage measuring apparatus |
| 01/01/1991 | US4981443 Diagnostic connector tap |
| 01/01/1991 | US4981441 Test clip for PLCC |
| 12/27/1990 | EP0403508A1 Device for testing printed circuit boards |
| 12/26/1990 | CN2068241U Multimeter device with keeping type indicator |
| 12/25/1990 | US4980638 Microcircuit probe and method for manufacturing same |
| 12/25/1990 | US4980637 Test probe for testing a test device |
| 12/25/1990 | US4980636 Universal nondestructive MM-wave integrated circuit test fixture |
| 12/19/1990 | EP0402490A1 Measuring-probe manipulator for a wafer-testing device |
| 12/18/1990 | US4978922 Superconducting sensor for quench detection in a superconductor |
| 12/18/1990 | US4978914 Laminated board for testing electronic components |
| 12/18/1990 | US4978912 Chip carrier socket test probe |
| 12/18/1990 | US4978910 Electrooptic apparatus for the measurement of ultrashort electrical signals |
| 12/18/1990 | US4978907 Apparatus and method for expanding the frequency range over which electrical signal amplitudes can be accurately measured |
| 12/18/1990 | US4978312 Tip attachment for circuit probe tester |
| 12/18/1990 | CA1278106C Tunable microwave wafer probe |
| 12/13/1990 | WO1990015517A1 Improved electrical connectors and ic chip tester embodying same |
| 12/13/1990 | WO1990015338A1 Reference-voltage supply circuit |
| 12/12/1990 | EP0402286A1 Method for testing electrical circuits of vehicles using a shunt and a control device |
| 12/11/1990 | US4977370 For fabricating a translator device |
| 12/05/1990 | EP0400094A1 Test fixture for tab circuits and devices |
| 12/05/1990 | CA2018202A1 Configurable electronic circuit board, adapter therefor, and designing method of electronic circuit using the same board |
| 12/04/1990 | US4975639 Test head with improved shielding |
| 12/04/1990 | US4975638 Test probe assembly for testing integrated circuit devices |
| 12/04/1990 | US4975637 Method and apparatus for integrated circuit device testing |
| 12/04/1990 | US4975079 Connector assembly for chip testing |
| 11/29/1990 | WO1990014170A1 Ultrasonic probe |
| 11/29/1990 | DE3917031A1 Overload protection for electrical measurement arrangement - using low-cost switch-off relay with manual reset, bistable relay, amplifier and delay circuits |
| 11/28/1990 | CN2066582U Coaxial type compensation probes for electric level meter |
| 11/28/1990 | CN1047224A 超声波探头 Ultrasonic probe |
| 11/27/1990 | US4973937 Electrical shunt apparatus |
| 11/27/1990 | US4973903 Adjustable probe for probe assembly |
| 11/27/1990 | US4973256 Device under test interface board and test electronic card interconnection in semiconductor test system |
| 11/27/1990 | US4973015 Manipulator apparatus for test head support and orientation |
| 11/22/1990 | EP0398506A2 Electrical socket for tab IC's |
| 11/20/1990 | US4972143 For establishing a detachable electrical connection |
| 11/15/1990 | WO1990013821A1 A method and an apparatus for testing the assembly of a plurality of electrical components on a substrate |
| 11/15/1990 | CA2016583A1 Ultrasonic probe |
| 11/14/1990 | EP0397543A1 Casing, particularly for an electric measuring apparatus, having a removable handle |
| 11/14/1990 | CN1046980A Automatic protector for small-measuring range galvanometer |
| 11/13/1990 | US4970460 Controlled impedance testsite |
| 11/13/1990 | US4970456 Temperature compensated power detector |
| 11/13/1990 | US4969828 Electrical socket for TAB IC's |
| 11/07/1990 | EP0396423A2 Circuit board carriers |
| 11/06/1990 | US4968930 Display device for measuring instruments |
| 11/06/1990 | US4968589 Large number of probes in precise configuration |
| 11/06/1990 | US4967605 Detector for force and acceleration using resistance element |
| 11/01/1990 | WO1990013039A1 Testing device for testing electrical or electronic test specimens |
| 11/01/1990 | WO1990013038A1 Ate jumper programmable interface board |
| 10/31/1990 | DE4012839A1 Test arrangement for electrical or electronic test objects - has contact needles connected to semiconducting plate via conducting blocks for close contact positioning |
| 10/31/1990 | CN1046623A Method and apparatus for generating reference nonlinear signal |
| 10/31/1990 | CN1046606A Self indicating current shunted voltmeter and voltage divided ammeter |
| 10/31/1990 | CN1046602A Probe for measuring negative offset of under ground pipe-line cathode protection potential |