Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
07/1991
07/03/1991CN2080180U Low voltage overhead line load detector
07/03/1991CN2080179U New measuring mechanism of megger
07/02/1991US5029296 Electrical gauge structure
07/02/1991CA1285616C Test adapter for integrated circuit carrier
06/1991
06/26/1991EP0433604A2 Electrical probe incorporating scanning proximity microscope
06/26/1991CN2079756U Line selecting device of microcomputer grounding for dc system
06/25/1991US5027063 Vacuum-actuated test fixture for testing electronic components
06/25/1991US5027062 Electroformed chemically milled probes for chip testing
06/25/1991US5027061 Electromagnetic and thermal shield for electronic energy meter
06/19/1991EP0432870A2 Electrical test probe
06/18/1991US5025212 Circuit for measuring the dynamic characteristics of a package for high-speed integrated circuits and a method for measuring said dynamic characteristics
06/18/1991US5025211 Technique for reducing electromagnetic interference
06/12/1991EP0431034A1 Circuit testing.
06/12/1991EP0430950A1 Reference-voltage supply circuit.
06/12/1991CN2078883U Multi-functional test pencil for multitester
06/11/1991US5023557 Testing process for electronic devices
06/11/1991US5023545 Circuit probing system
06/05/1991EP0430661A2 Apparatus for detecting a change in light intensity
06/05/1991EP0430392A2 Breakaway switch probe
06/05/1991CN2078446U Multi-purpose meter probes with hooked points
06/04/1991US5021731 Thermo-optical current sensor and thermo-optical current sensing systems
06/04/1991US5021000 Zero insertion force socket with low inductance and capacitance
06/04/1991US5020998 Test socket
06/04/1991US5020219 Method of making a flexible tester surface for testing integrated circuits
05/1991
05/30/1991WO1991007667A1 Fluidics head for testing chemical and ionic sensors
05/30/1991WO1991007666A1 Potential sensor using electro-optical crystal and method of measuring potential
05/29/1991EP0428987A1 Test adapter
05/29/1991EP0428681A1 Improved electrical connectors and ic chip tester embodying same
05/28/1991US5019945 Backplane interconnection system
05/28/1991US5019771 Contact sensing for integrated circuit testing
05/28/1991US5018988 Electrical contact mechanism for ultrasonic transducers on fasteners
05/21/1991US5017865 Coaxial microwave device test fixture
05/21/1991CA1284356C Diagnostic meter base
05/16/1991WO1991006871A1 Multi-axis universal circuit board test fixture
05/15/1991EP0427521A2 Electrical cable assembly for a signal measuring instrument and method
05/14/1991US5015947 Low capacitance probe tip
05/14/1991US5015946 High density probe
05/14/1991CA1284181C Probe for testing electronic components
05/08/1991EP0426275A2 Electrical test probe
05/08/1991EP0425744A1 Membrane probe with automatic contact scrub action
05/08/1991CN1012592B Movable core measuring instrument
05/07/1991US5014004 Sprung contact pin for testing testpieces
05/07/1991US5014003 Conductive pattern for electric test of semiconductor chips
05/07/1991US5014002 ATE jumper programmable interface board
05/07/1991US5014001 Test probe manipulator for wafer-probing apparatus
05/07/1991US5014000 Vibratory screening fixture
05/07/1991US5013254 Latching mechanism for test probe apparatus
05/07/1991US5012924 Carriers for integrated circuits and the like
05/02/1991WO1991006203A1 A carrier board
05/02/1991DE3935851A1 Measuring appts. with adjusting elements accessible from front - has two concentric setting spindles, outer being joined to indicator and inner zero setter via coupling
04/1991
04/30/1991US5012187 Method for parallel testing of semiconductor devices
04/30/1991US5012186 Electrical probe with contact force protection
04/30/1991US5012184 Adjustment of disposition of rotation axis in moving coil measuring instruments to correct for their non-ideal operation
04/30/1991US5012181 Apparatus for and method of internally calibrating an electrical calibrator
04/24/1991EP0424105A2 Method of fabricating a contact device
04/23/1991US5010446 Multi-edge extender board
04/23/1991US5010296 Wafer prober
04/23/1991US5010295 Ball screw supported Z stage
04/23/1991US5009613 Spring contact twister probe for testing electrical printed circuit boards
04/23/1991CA1283448C Device for measuring the characteristics of a microwave component
04/17/1991EP0422546A2 Electrical contact mechanism for ultrasonic transducers on fasteners
04/16/1991US5008913 Measuring and damping resistor arrangement for a high-voltage apparatus
04/16/1991US5008616 Fluidics head for testing chemical and ionic sensors
04/16/1991US5008615 Means and method for testing integrated circuits attached to a leadframe
04/16/1991US5007843 High-density contact area electrical connectors
04/16/1991US5007841 Integrated-circuit chip interconnection system
04/16/1991US5007163 Non-destructure method of performing electrical burn-in testing of semiconductor chips
04/09/1991US5006793 High-frequency active probe having replaceable contact needles
04/09/1991US5006792 Flip-chip test socket adaptor and method
04/09/1991US5006789 Electro-optic signal measurement
04/09/1991US5006668 Connecting mechanism of central conductors of a coaxial cable and a probe
04/09/1991US5006295 Method for making a plurality of like printed circuit board test pieces and arranging them relative to one another cutting along a hole row center plane
04/09/1991CA1282857C Terminal base assembly for meter sockets
04/06/1991CA2025288A1 Waveguide-to-stripline directional coupler
04/04/1991DE3931974A1 Measuring arrangement for electrical and magnetic fields - has spiral pipe measurement probe with filling and emptying valves and pump
04/03/1991EP0420690A2 Electric inspection unit using anisotropically electroconductive sheet and process for producing the anisotropically electroconductive sheet
04/03/1991EP0420544A2 Electromagnetic and thermal shield for electronic energy meter
04/03/1991EP0419725A1 Measuring spot for microwave components
04/03/1991EP0185714B1 A connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine
04/02/1991US5004977 Contact probe
04/02/1991US5004974 Electric current sensing device
03/1991
03/30/1991CA2026369A1 Measuring position for microwave components
03/27/1991EP0418525A2 Device under test interface board and test electronic card interconnection in semiconductor test system
03/27/1991CN1012213B Electronic appliance
03/26/1991US5003255 Electric contact probe
03/26/1991US5003254 Multi-axis universal circuit board test fixture
03/26/1991US5003253 Millimeter-wave active probe system
03/26/1991US5002895 Wire bonding method with a frame, for connecting an electronic component for testing and mounting
03/21/1991WO1991003742A1 Automatic smd tester
03/20/1991CN2073587U Electric measuring probe clamping head with safety, portability and reliable-contact
03/19/1991US5001422 VLSI tester backplane
03/19/1991US5001421 Assembly to be fitted in a cylinder of a probe provided with a function to hold an electric parts unit
03/12/1991US4999023 For and electronic component
03/12/1991CA1281395C Automatic circuit adjusting system and circuit adjusting tool therefor
03/07/1991WO1991002986A1 Device for the operational electrical testing of wired areas, especially printed circuit boards
03/06/1991EP0415712A2 A superconducting sensor for quench detection in a superconductor
03/06/1991EP0415601A2 Precision test connector
03/06/1991EP0415560A1 Separable connector access port and fittings
03/05/1991US4998062 Probe device having micro-strip line structure
03/05/1991US4998060 Fault indicator with hot stick clamping mechanism
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