| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 06/19/1990 | US4934064 Alignment method in a wafer prober |
| 06/14/1990 | WO1990006518A1 Wireless test fixture |
| 06/13/1990 | EP0372666A1 Multicompatible holding fixture for printed-circuit boards or SMT devices to be tested, and for contact boards and supporting boards for use in testing apparatuses |
| 06/13/1990 | CN1043003A Adjustment circuit and method for solid-state electricity meter |
| 06/12/1990 | US4933632 Apparatus for ferromagnetic measurements of electrical quantities |
| 06/12/1990 | US4932883 Elastomeric connectors for electronic packaging and testing |
| 06/06/1990 | EP0371672A1 Antistatic mask for use with electronic test apparatus |
| 06/06/1990 | CN2058040U Linkage mechanism of probe and coax central conductor |
| 06/05/1990 | US4931798 Electromagnetic anechoic chamber with an inner electromagnetic wave reflection surface and an electromagnetic wave absorption small ball disposed in the chamber |
| 06/05/1990 | US4931726 Apparatus for testing semiconductor device |
| 06/05/1990 | CA1270069A1 Probe card with reconfigurable circuitry |
| 05/31/1990 | DE3937105A1 Semiconductor chips measuring needle centre |
| 05/30/1990 | EP0370616A2 A control arrangement for an air core gauge |
| 05/29/1990 | US4929892 Process for electrically testing a component in transit to assembly and component test chuck |
| 05/29/1990 | CA1269758A1 Electronic test fixture with cassette system |
| 05/23/1990 | EP0369554A2 Apparatus for automatically scrubbing a surface |
| 05/23/1990 | EP0369112A1 Adapter for electronic test devices for printed-circuit boards and the like |
| 05/22/1990 | US4928067 Non-intrusive fiber optic electromagnetic field probe apparatus and associated methods |
| 05/22/1990 | US4928062 Loading and accurate measurement of integrated dynamic parameters at point of contact in automatic device handlers |
| 05/22/1990 | US4928058 Electro-optic signal measurement |
| 05/22/1990 | US4927692 Antistatic mask for use with electronic test apparatus |
| 05/22/1990 | US4926549 Method of producing electrical connection members |
| 05/15/1990 | US4926119 Contact device for the testing of printed circuit boards or the like |
| 05/15/1990 | US4924589 Method of making and testing an integrated circuit |
| 05/09/1990 | EP0367542A2 Microwave wafer probe having replaceable probe tip |
| 05/09/1990 | EP0366999A1 Appliance for calibrating and testing ring-shaped current tongs |
| 05/08/1990 | US4924179 Method and apparatus for testing electronic devices |
| 05/08/1990 | US4923407 Adjustable low inductance probe |
| 05/08/1990 | CA1268820A1 Circuit testing |
| 05/02/1990 | EP0366507A1 Electrical apparatus with improved cell compartment |
| 05/02/1990 | EP0366353A1 Electrical test equipment |
| 05/02/1990 | CA2001258A1 Device for calibrating and testing ring-shaped current clamps |
| 05/01/1990 | US4922192 Elastic membrane probe |
| 05/01/1990 | US4922191 Electronic testing equipment interconnection assembly |
| 05/01/1990 | US4922190 Adaptor device for an arrangement for testing printed-circuit boards |
| 05/01/1990 | US4922186 Voltage detector |
| 05/01/1990 | US4922185 Diagnostic meter base |
| 04/24/1990 | US4920310 Voltage detector |
| 04/24/1990 | US4919624 Connection terminal structure of electronic equipment |
| 04/24/1990 | US4919623 Burn-in socket for integrated circuit device |
| 04/18/1990 | CN2056255U 电磁式仪表 Electromagnetic Meter |
| 04/18/1990 | CN1041456A Electrical checking apparatus for great area link line carrier |
| 04/17/1990 | US4918383 Membrane probe with automatic contact scrub action |
| 04/17/1990 | US4918376 A.C. capacitive gauging system |
| 04/17/1990 | US4918374 Method and apparatus for inspecting integrated circuit probe cards |
| 04/12/1990 | DE3831649C1 Device for simplifying the location of faults in cable networks having cable sleeves |
| 04/11/1990 | EP0362745A1 Electronic multimeter |
| 04/04/1990 | EP0361779A1 Micro-strip architecture for membrane test probe |
| 04/04/1990 | EP0361689A1 Electrical circuit test probe |
| 04/03/1990 | US4914061 Test probe apparatus |
| 03/29/1990 | DE3832759A1 Contact-making device for multipole SMD components |
| 03/28/1990 | EP0360396A2 Force delivery system for improved precision membrane probe |
| 03/28/1990 | EP0359937A2 Apparatus for gaining measuring signal access to a hollow conductor |
| 03/28/1990 | EP0359886A1 Device for measuring high currents |
| 03/28/1990 | EP0359861A1 Apparatus for electrically testing large circuit boards |
| 03/27/1990 | US4912403 Apparatus and method for isolating and connecting two electrical circuits |
| 03/27/1990 | US4912402 Fixture for measuring the static characteristics of microwave three-terminal active components |
| 03/27/1990 | US4912401 For accesssing the signals sed by an electronic device |
| 03/27/1990 | US4912400 Apparatus for testing circuit boards |
| 03/27/1990 | US4912399 Multiple lead probe for integrated circuits in wafer form |
| 03/27/1990 | US4912398 Moving iron instrument |
| 03/27/1990 | US4912397 Transducer linearizing system |
| 03/22/1990 | WO1990002954A1 Guiding and insulation of microcontact pins and springs using complete multiple guide blocks and process for producing these multiple guide blocks |
| 03/22/1990 | WO1990002953A1 Apparatus for testing circuit boards |
| 03/20/1990 | US4910455 Non-intrusive current measuring circuit |
| 03/20/1990 | US4910454 System for electrical signal sampling with ultrashort optical pulses |
| 03/15/1990 | DE3829689A1 Measuring pick-up for electrical measured objects |
| 03/13/1990 | US4908571 System for testing of electrical characteristics of semiconductor devices |
| 03/13/1990 | US4908568 Mechanical probe for optical measurement of electrical potentials |
| 03/13/1990 | US4907334 For safe removal of a glass enclosed electrical power device |
| 03/08/1990 | WO1990002340A1 Circuit testing |
| 03/07/1990 | EP0357439A2 High frequency test head using electro-optics |
| 03/07/1990 | EP0357438A2 Ultra-high-speed digital test system using electro-optic signal sampling |
| 03/06/1990 | US4906939 Device for automatically ascertaining capacitor breakdown voltage |
| 03/06/1990 | US4906920 Self-leveling membrane probe |
| 02/28/1990 | EP0356299A1 Strain gauge transducer with a low sensitivity to electrical interferences |
| 02/28/1990 | EP0355461A2 Monitoring device for electric storage battery and configuration therefor |
| 02/28/1990 | EP0355273A1 Probe card, method for measuring part to be measured by use thereof and electrical circuit member |
| 02/27/1990 | US4904935 Electrical circuit board text fixture having movable platens |
| 02/27/1990 | US4904933 Integrated circuit probe station |
| 02/27/1990 | US4904213 Low impedance electric connector |
| 02/27/1990 | US4904200 Test probe apparatus |
| 02/27/1990 | US4903830 Automatic mounting chip component |
| 02/27/1990 | CA1266333A1 Plug board with concentric grounding belt for testing integrated circuits |
| 02/27/1990 | CA1266300A1 Watchdog circuit for transmission line sensor module |
| 02/21/1990 | EP0354958A1 Apparatus for measuring data of living body |
| 02/15/1990 | DE3843877C1 Device for measuring the conductor resistances in insulated wires of electrical cables |
| 02/14/1990 | CN2052903U Photoelectric pointer metre |
| 02/13/1990 | US4901013 Apparatus having a buckling beam probe assembly |
| 02/13/1990 | US4901012 Circuit for measuring the dynamic characteristics of a package for high-speed integrated circuits and a method for measuring said dynamic characteristics |
| 02/13/1990 | US4901010 Current-measuring device |
| 02/07/1990 | EP0354080A1 Adapter frame for testing printed circuits of high density |
| 02/07/1990 | EP0354020A2 Electronic probe |
| 02/07/1990 | CN1039501A Electrode water circulation and processing system and hooded radiator for water rheostat |
| 02/06/1990 | US4899107 Discrete die burn-in for nonpackaged die |
| 02/06/1990 | US4899106 For use with a semiconductor wafer test set |
| 02/06/1990 | US4899104 Adapter for a printed circuit board testing device |
| 02/06/1990 | US4899099 Flex dot wafer probe |
| 01/31/1990 | EP0352929A1 Connector system for printed circuit board test facility |
| 01/30/1990 | US4897601 Test fixture for integrated circuit chips |