| Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
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| 06/19/2001 | US6249503 Method of and apparatus for recording/reproducing an information signal, recording/reproducing head device, memory medium, and head element |
| 06/13/2001 | DE10057737A1 Imaging probe for image testing device, has charge-coupled device camera, optical imaging system and light source to illuminate work piece, with optics to focus work piece image to camera |
| 06/12/2001 | US6246054 Scanning probe microscope suitable for observing the sidewalls of steps in a specimen and measuring the tilt angle of the sidewalls |
| 06/12/2001 | US6245204 Vibrating tip conducting probe microscope |
| 06/05/2001 | US6242734 Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images |
| 05/31/2001 | DE19957824A1 Manufacturing very fine tips in sub nanometer range involves heat treating heterogeneous starting material, cooling base body, coarse and fine removal of material from base body |
| 05/30/2001 | EP1102961A2 Cantilever with whisker-grown probe and method for producing thereof |
| 05/29/2001 | US6239426 Scanning probe and scanning probe microscope |
| 05/22/2001 | US6236589 Ultra high density storage media and method thereof |
| 05/17/2001 | WO2001035080A1 System and method for detecting molecules using an active pixel sensor |
| 05/17/2001 | CA2391119A1 System and method for detecting molecules using an active pixel sensor |
| 05/15/2001 | US6232597 Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images |
| 05/09/2001 | EP1098210A2 Enhanced optical transmission apparatus utilizing metal films having apertures with or without periodic surface topography |
| 05/08/2001 | US6229609 Scanning near-field optic/atomic force microscope |
| 05/08/2001 | US6229141 Analysis of alkali elements in insulators using secondary ion mass spectrometry |
| 05/08/2001 | US6229138 Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images |
| 05/03/2001 | WO2001031656A1 Technique and process for the imaging and formation of various devices and surfaces |
| 05/02/2001 | EP1095294A1 Polarimeter |
| 04/24/2001 | US6221602 Functionalized nanocrystals and their use in labeling for strand synthesis or sequence determination |
| 04/19/2001 | WO2001027581A2 Force sensing devices with multiple filled and/or empty channels and other attributes |
| 04/19/2001 | US20010000279 Method and system for increasing the accuracy of a probe-based instrument measuring a heated sample |
| 04/17/2001 | US6217843 Heating metal compound with water in vacuum |
| 04/10/2001 | US6215137 Micromechanical sensor for scanning thermal imaging microscope and method of making the same |
| 04/10/2001 | US6215114 Optical probe for detecting or irradiating light and near-field optical microscope having such probe and manufacturing method of such probe |
| 04/04/2001 | EP1089066A1 Optical micro cantilever, method of manufacture thereof, and micro cantilever holder |
| 04/03/2001 | US6211685 Surface probe for determining physical properties of a semiconductor device |
| 04/03/2001 | US6211540 Semiconductor strain sensor and scanning probe microscope using the semiconductor strain sensor |
| 04/03/2001 | US6211532 Microprobe chip for detecting evanescent waves probe provided with the microprobe chip and evanescent wave detector, nearfield scanning optical microscope, and information regenerator provided with the microprobe chip |
| 03/29/2001 | WO2001022468A1 High bandwidth recoiless microactuator |
| 03/29/2001 | WO2001022065A1 Method for direct measurement of polycarbonate compositions by fluorescence |
| 03/29/2001 | WO2001021863A1 Patterned carbon nanotubes |
| 03/29/2001 | WO1999058925A8 Cantilever with whisker-grown probe and method for producing thereof |
| 03/27/2001 | US6207575 Local interconnect etch characterization using AFM |
| 03/27/2001 | US6207392 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
| 03/22/2001 | WO2000074107A3 Tip structures, devices on their basis, and methods for their preparation |
| 03/15/2001 | WO2001018866A1 Strongly textured atomic ridges and dots |
| 03/13/2001 | US6201226 Probe with tip having micro aperture for detecting or irradiating light, near-field optical microscope, recording/reproduction apparatus, and exposure apparatus using the probe, and method of manufacturing the probe |
| 03/07/2001 | EP1080340A1 Force sensing probe for scanning probe microscopy |
| 03/06/2001 | US6196061 AFM with referenced or differential height measurement |
| 02/27/2001 | US6195214 Microcolumn assembly using laser spot welding |
| 02/27/2001 | US6194711 Scanning near-field optical microscope |
| 02/27/2001 | US6193850 Directly determining concentration of target species such as fries product in a composition comprising aromatic carbonate chain units by irradiating composition with electromagnetic radiation at a wavelength to cause fluorescence, measuring |
| 02/13/2001 | US6185992 Method and system for increasing the accuracy of a probe-based instrument measuring a heated sample |
| 02/08/2001 | WO2001009921A1 Minimization of electron fogging in electron beam lithography |
| 02/08/2001 | WO2001009916A1 Microcolumn assembly using laser spot welding |
| 02/06/2001 | US6184533 Scanning probe microscope with the stage unit |
| 02/06/2001 | US6184519 Surface analyzing apparatus with anti-vibration table |
| 01/30/2001 | US6178813 Vibration distortion removal for scanning probe microscopes |
| 01/30/2001 | US6178653 Probe tip locator |
| 01/25/2001 | WO2001006516A1 Micromachined microprobe tip |
| 01/25/2001 | WO2001006205A1 Method and system for increasing the accuracy of a probe-based instrument measuring a heated sample |
| 01/25/2001 | WO2001005701A1 Nanometer-order mechanical vibrator, production method thereof and measuring device using it |
| 01/25/2001 | WO2000060632A3 Electrostatically focused addressable field emission arraychips (afea's) for high-speed maskless digital e-beam direct write lithography and scanning electron microscopy |
| 01/24/2001 | EP1070256A1 Method for fixing a biological molecule on a support surface |
| 01/24/2001 | EP1025416A4 Method and apparatus for obtaining improved vertical metrology measurements |
| 01/23/2001 | US6177291 Method of making aggregate of semiconductor micro-needles |
| 01/23/2001 | US6176122 Cantilever unit and scanning probe microscope utilizing the cantilever unit |
| 01/16/2001 | US6174727 Method of detecting microscopic defects existing on a silicon wafer |
| 01/16/2001 | US6173604 Scanning evanescent electro-magnetic microscope |
| 01/11/2001 | WO2001003157A1 Object inspection and/or modification system and method |
| 01/09/2001 | US6171437 Semiconductor manufacturing device |
| 01/03/2001 | EP0746857A4 Scanning probe microscope |
| 01/02/2001 | US6169281 Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions |
| 12/27/2000 | EP1063641A1 Information recording apparatus |
| 12/21/2000 | WO2000077553A1 A device for micropositioning of an object |
| 12/20/2000 | EP1061529A1 A probe tip for the investigation of a substrate and a method of fabrication therof |
| 12/19/2000 | US6163519 Scanning near-field optical microscope using the probe and recording and/or reproducing apparatus using the probe |
| 12/14/2000 | WO2000075627A1 Atomic force microscope and driving method therefor |
| 12/12/2000 | US6159742 Carbon-based tip for scanning probe microscopy; composed of a carbon-based nanotube with one end linked to a molecular probe and the other end adapted for attachment to a cantilever |
| 12/07/2000 | WO2000074107A2 Tip structures, devices on their basis, and methods for their preparation |
| 12/07/2000 | WO2000073796A2 Ligand-anchor conjugates for producing a biosensor layer |
| 12/07/2000 | CA2375120A1 Bioactive sensors |
| 12/05/2000 | US6156216 Etching top working surface of silicon wafer to make silicon stylus of a specific area with a base and an apex, depositing nitride film, spin coating a resist, etching specific area of nitride covered silcone stylus to expose apex of stylus |
| 12/05/2000 | US6156215 Method of forming a projection having a micro-aperture, projection formed thereby, probe having such a projection and information processor comprising such a probe |
| 11/30/2000 | DE19924606A1 Ligand-Anker-Konjugate The ligand-anchor conjugates |
| 11/29/2000 | CN1058905C High-intensity focus supersonic tumour scanning therapy system |
| 11/23/2000 | WO2000070296A1 System for sensing a sample |
| 11/22/2000 | EP1054249A1 Electronic device surface signal control probe and method of manufacturing the probe |
| 11/21/2000 | US6148662 High-sensitivity strain probe |
| 11/16/2000 | WO2000068692A1 A method of detecting an analyte using semiconductor nanocrystals |
| 11/16/2000 | CA2373146A1 A method of detecting an analyte using semiconductor nanocrystals |
| 11/14/2000 | US6146227 Method for manufacturing carbon nanotubes as functional elements of MEMS devices |
| 11/09/2000 | WO2000066485A1 Bulk synthesis of long nanotubes of transition metal chalcogenides |
| 11/08/2000 | EP1050322A1 A high intensity focused ultrasound system for scanning and curing tumor |
| 11/07/2000 | US6144037 Capacitor charging sensor |
| 11/07/2000 | US6144028 Scanning probe microscope assembly and method for making confocal, spectrophotometric, Near-Field, and Scanning probe measurements and associated images |
| 11/07/2000 | US6143190 Method of producing a through-hole, silicon substrate having a through-hole, device using such a substrate, method of producing an ink-jet print head, and ink-jet print head |
| 11/02/2000 | DE10007617A1 Magnetic field characterization process, especially for magnetic read/write heads, comprises providing a magnetosensitive layer between a component surface and a scanning force microscope sensor |
| 10/31/2000 | US6138503 Scanning probe microscope system including removable probe sensor assembly |
| 10/24/2000 | US6136208 Manufacturing method for planar microprobe including electrostatic actuator using sacrificial layer technology |
| 10/24/2000 | US6134955 Magnetic modulation of force sensor for AC detection in an atomic force microscope |
| 10/18/2000 | EP1045253A2 Prober for electrical measurements and method of measuring electrical characteristics with said prober |
| 10/12/2000 | WO2000060632A2 Electrostatically focused addressable field emission arraychips (afea's) for high-speed maskless digital e-beam direct write lithography and scanning electron microscopy |
| 10/10/2000 | US6130427 Scanning probe microscope with multimode head |
| 09/30/2000 | CA2303473A1 Prober for electrical measurement and method of measuring electrical characteristics with said prober |
| 09/26/2000 | US6123817 Metal wire and organic thin films and chemical absorption films |
| 09/21/2000 | WO2000055631A1 Semiconductor nanocrystal probes for biological applications |
| 09/21/2000 | WO2000055597A1 Optical micro cantilever, method of manufacture thereof, and micro cantilever holder |
| 09/19/2000 | US6122563 Method of sorting a group of integrated circuit devices for those devices requiring special testing |
| 09/19/2000 | US6121624 Method for controlled implantation of elements into the surface or near surface of a substrate |