Patents
Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251)
09/2004
09/07/2004US6788993 Sorting a group of integrated circuit devices for those devices requiring special testing
09/07/2004US6788086 Scanning probe system with spring probe
09/07/2004US6787779 Apparatus wherein ionizing radiation is generated
09/07/2004US6787769 Conductive probe for scanning microscope and machining method using the same
09/07/2004US6787768 Method and apparatus for tool and tip design for nanomachining and measurement
09/02/2004US20040172152 Sorting a group of integrated circuit devices for those devices requiring special testing
09/02/2004US20040171043 Thin filmed solid support comprising sulfated immobilized single-stranded nucleotide sequences for use in gene expression analysis; microarrays genomic patterning
09/02/2004US20040169136 Probe opening fabricating apparatus, and near-field optical microscope using the same
09/02/2004US20040169135 Probe opening fabricating apparatus, and near-field optical microscope using the same
09/02/2004US20040168527 Coated nanotube surface signal probe
09/01/2004EP1451374A1 Method and device for detecting and monitoring alcoholism and related diseases using microarrays
09/01/2004CN1526142A Actuating and sensing device for scanning probe microscopes
08/2004
08/31/2004US6784414 Probe opening fabricating apparatus, and near-field optical microscope using the same
08/26/2004US20040166505 Method of detecting an analyte in a sample using semiconductor nanocrystals as a detectable label
08/24/2004US6780766 Methods of forming regions of differing composition over a substrate
08/24/2004US6780664 Nanotube tip for atomic force microscope
08/19/2004WO2004038767A3 Doped nanoscale wires and method of manufacture
08/19/2004WO2003075372A3 Deposition method for nanostructure materials
08/19/2004WO2003038147A3 High resolution patterning method
08/19/2004US20040159786 Method of fabricating probe for scanning probe microscope
08/19/2004US20040159781 Actuating and sensing device for scanning probe microscopes
08/19/2004DE10304532A1 Scanning electron microscope probe tip sharpening method in which the tip is immersed in a soft material, especially single crystal platinum
08/18/2004CN1162911C Rewritable data storage with carbon material and its writing/reading method
08/17/2004US6777693 Lithographic method using ultra-fine probe needle
08/17/2004US6777637 Sharpening method of nanotubes
08/12/2004WO2004013603A3 A method of sample preparation for atom probes and source of specimens
08/12/2004US20040154744 Method and system for surface or cross-sectional processing and observation
08/12/2004US20040154367 Apparatus for forming optical aperture
08/05/2004WO2004033480A3 Peptide and protein arrays and direct-write lithographic printing of peptides and proteins
08/05/2004US20040150413 Scanning microscope; detector for scanning sample; electrode; dielectric; conductive wire
08/04/2004CN1518049A Electronic microscope
08/03/2004US6771012 Apparatus for producing a flux of charge carriers
07/2004
07/29/2004WO2004038430A3 Nanotube cantilever probes for nanoscale magnetic microscopy
07/29/2004WO2004027809A3 Charged particle beam system
07/29/2004WO2003021127A3 Apparatus for reducing sensitivity of an article to mechanical shock
07/29/2004US20040147031 having a coating layer on the surface with nanoparticles present, enabling the functional beads to emit light specific to the nanoparticles by applying a voltage to the functional beads in flow path; flow cytometry
07/29/2004US20040144922 Electron microscope
07/28/2004EP1441227A2 Functional beads, method for reading the same and bead-reading apparatus
07/27/2004US6768095 Near-field optical probe having cantilever and probe formed of transparent material, method for manufacturing near-field optical probe, and optical apparatus having near-field optical probe
07/27/2004US6767696 Positioning carrier on one side of exposure mask whose exposure section correlates to tip to be produced, applying photostructurable material, exposing from opposite side, hardening, removing unexposed material, separating carrier
07/22/2004WO2004061427A1 Measuring method and device for vibration frequency of multi-cantilever
07/22/2004US20040142409 Motion sensor for monitoring migration, vibrational movement, oscillations and fluctuation in semen, ear cilia, bacteria and kinesins
07/22/2004US20040142106 Patterning magnetic nanostructures
07/22/2004US20040140426 Scanning probe microscope with improved probe head mount
07/22/2004US20040140424 Scanning probe microscope with improved probe tip mount
07/22/2004US20040139794 Method of fabricating a surface probing device and probing device produced thereby
07/22/2004DE10342572A1 Verfahren und Vorrichtung zum elektrischen Charakterisieren von Tunnel-Junktion-Filmstapeln mit geringem oder ohne Prozessieren Method and apparatus for characterizing the electrical tunnel Junktion film stacks with little or no processing
07/22/2004DE10300988A1 Scanning probe microscope for determining topological and electrical characteristics has two electrical conductors separated at probe tip to form electric field
07/21/2004EP1439546A1 A nanotube based cantilever arm, a method of operating and manufacturing a nanotube based cantilever arm, and a storage device and a photonic crystal based on an array of nanotube based cantilever arms
07/15/2004US20040137663 Method of reducing internal stress in materials
07/15/2004US20040135183 Ferroelectric capacitor, process for production thereof and semiconductor device using the same
07/15/2004US20040134265 Multi-dimensional force sensing for scanning probe microscopy using carbon nanotube tips and carbon nanotube oscillators
07/15/2004US20040134264 Apparatus and method for isolating and measuring movement in a metrology apparatus
07/14/2004EP1436424A2 Differential tagging of polymers for high resolution linear analysis
07/08/2004WO2004027808A3 Particle-optical device and detection means
07/08/2004US20040131843 Nanolithography methods and products therefor and produced thereby
07/08/2004US20040129878 Apparatus for specimen fabrication and method for specimen fabrication
07/07/2004EP1292361A4 Methods utilizing scanning probe microscope tips and products therefor or produced thereby
07/06/2004US6759653 Probe for scanning microscope produced by focused ion beam machining
07/01/2004US20040127025 Processes for fabricating conductive patterns using nanolithography as a patterning tool
07/01/2004US20040126820 Using nanoparticles to identify and/or sequence biomolecules; forensic analysis; medical diagnostics
07/01/2004US20040126491 discharging electrode mounted on one side of the positioning platform whose position can be calibrated with the platform to cut the carbon nanotube; applying a voltage pulse to the electrode
07/01/2004US20040124356 Particle-optical device and detection means
07/01/2004US20040123651 Scanning probe system with spring probe
06/2004
06/30/2004EP1433184A1 Device for fixing a measuring probe for a raster scanning probe microscope
06/30/2004EP1157386A4 Nanocapsules containing charged particles, their uses and methods of forming the same
06/29/2004US6756584 Electrical atomic force microscopy; metallization; cantilever beams; etching, patterning
06/29/2004US6756236 Method of producing a ferroelectric memory and a memory device
06/29/2004US6756026 Catalytic end to end connecting of single wall nanotubes using gaseous carbon
06/29/2004US6756025 Injecting particle suspension containing attached catalysts into evaporation zone producing nanoparticle stream then introducing carbonaceous feedstock gas
06/29/2004US6755956 Catalyst-induced growth of carbon nanotubes on tips of cantilevers and nanowires
06/24/2004WO2004053862A1 Information recording/reading head and information recording/reproducing device
06/24/2004WO2004052489A2 Methods for assembly and sorting of nanostructure-containing materials and related articles
06/24/2004US20040119490 Parallel, individually addressable probes for nanolithography
06/24/2004US20040119485 Probe finger structure and method for making a probe finger structure
06/24/2004US20040118193 System for sensing a sample
06/24/2004US20040118192 Fluid delivery for scanning probe microscopy
06/17/2004US20040116034 Method of manufacturing an electronic device containing a carbon nanotube
06/17/2004US20040113621 Nanotube cantilever probes for nanoscale magnetic microscopy
06/16/2004EP1427983A2 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes
06/15/2004US6750450 Scanning magnetism detector and probe
06/15/2004US6749827 Method for growing continuous fiber
06/15/2004US6749776 Making ceramic materials for fluorescent lamps
06/15/2004US6748794 Method for replacing a probe sensor assembly on a scanning probe microscope
06/10/2004WO2004013603A9 A method of sample preparation for atom probes and source of specimens
06/10/2004US20040110360 Methods of Forming Regions of Differing Composition Over a Substrate
06/10/2004US20040107770 Device for contacting and/or modifying a surface having a cantilever and a method for production of said cantilever
06/08/2004US6747279 Objective lens for a charged particle beam device
06/08/2004US6747265 Optical cantilever having light shielding film and method of fabricating the same
06/05/2004WO2004038430A2 Nanotube cantilever probes for nanoscale magnetic microscopy
06/05/2004CA2499370A1 Nanotube cantilever probes for nanoscale magnetic microscopy
06/01/2004US6744030 Optical waveguide probe and manufacturing method of the same, and scanning near-field optical microscope
06/01/2004US6743408 Inserting a carbon nanotube tip assembly bearing metallic catalytic material into a cvd reactor; and exposing to a gaseous atmosphere comprising a carbon containing gas
05/2004
05/27/2004WO2004015455A9 Improved method and system for scanning apertureless fluorescence microscope
05/27/2004US20040102050 Method of patterning the surface of an article using positive microcontact printing
05/27/2004US20040101469 Apparatus, materials, and methods for fabrication and catalysis
05/26/2004EP1421025A1 Substituted donor atoms in silicon crystal for quantum computer
05/20/2004US20040096854 System and method for detecting molecules using an active pixel sensor
05/18/2004US6737331 Force sensing devices with multiple filled and/or empty channels and other attributes
05/13/2004US20040093179 Calibration of an analogue probe
1 ... 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 ... 33