Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group
Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251)
07/2003
07/17/2003US20030133324 Memory element, method for structuring a surface, and storage device
07/17/2003US20030132376 Tip calibration standard and method for tip calibration
07/17/2003US20030132191 Method for fabricating a scanning probe microscope probe
07/16/2003CN1114935C Electron beam aperture element
07/15/2003US6593571 Scanning probe microscope
07/10/2003WO2003056567A2 Method for the production of a probe tip, particularly for near-field optical microscopy, having a desired aperture
07/10/2003US20030128945 Optical near-field generating element and optical apparatus including the same
07/10/2003US20030127692 Strongly textured atomic ridge and dot MOSFETs, sensors and filters
07/08/2003US6590703 Optical system for scanning microscope
07/08/2003US6590208 Balanced momentum probe holder
07/08/2003CA2307363C Enhanced optical transmission apparatus with improved inter-surface coupling
07/03/2003US20030122073 Coated nanotube surface signal probe and method of attaching nanotube to probe holder
07/03/2003US20030122072 Probe for scanning probe microscope
06/2003
06/26/2003US20030121022 Method and its apparatus for manufacturing simiconductor device
06/26/2003US20030116722 Apparatus wherein ionizing radiation is generated
06/26/2003US20030116710 Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device
06/25/2003EP1321959A1 Ionizing radiation generating device
06/24/2003US6583412 Scanning tunneling charge transfer microscope
06/24/2003US6583411 Multiple local probe measuring device and method
06/24/2003US6583410 Polarimeter
06/19/2003WO2003050821A1 Force scanning probe microscope
06/19/2003US20030113940 Antibodies specific for nanotubes and related methods and compositions
06/19/2003US20030110844 Force scanning probe microscope
06/18/2003EP1319199A2 Pinhole defect repair by resist flow
06/17/2003US6580073 Monochromator for charged particles
06/17/2003US6580072 Method for performing failure analysis on copper metallization
06/17/2003US6580070 Time-of-flight mass spectrometer array instrument
06/17/2003US6580069 Atom probe
06/12/2003US20030107058 Method of fabricating a probe of a scanning probe microscope (SPM) having a field-effect transistor channel
06/12/2003US20030106998 Method for producing boron nitride coatings and fibers and compositions thereof
06/10/2003US6576900 Methods of sampling specimens for microanalysis
06/05/2003WO2003046926A2 Tailoring domain engineered structures in ferroelectric materials
06/05/2003WO2003046473A1 Method and apparatus for micromachines, microstructures, nanomachines and nanostructures
06/05/2003WO2003021127A8 Apparatus for reducing sensitivity of an article to mechanical shock
06/05/2003US20030104457 Apparatus for use in detection of nucleotide sequences associated with drinking disorders
06/05/2003US20030102441 Tailoring domain engineered structures in ferroelectric materials
06/05/2003US20030102222 Deposition method for nanostructure materials
06/04/2003EP1315968A2 Method for precipitating mono and multiple layers of organophosphoric and organophosphonic acids and the salts thereof in addition to use thereof
06/04/2003EP1315667A1 Single molecule array on silicon substrate for quantum computer
06/03/2003US6573369 Method and apparatus for solid state molecular analysis
06/03/2003US6571612 Probe scanning method
05/2003
05/30/2003WO2002014862A3 Method and device for characterising and/or for detecting a bonding complex
05/29/2003US20030100130 Crystal compound for use as tool in medical and nonmedical fluorescence microscopy, histology, flow cytometry, in situ hybridization, immunoassays and nucleotide sequences separation and determination
05/29/2003US20030099968 Semiconductor nanocrystal probes for biological applications and process for making and using such probes
05/29/2003US20030098347 Information storage apparatus using semiconductor probe
05/28/2003EP1315157A2 Information storage apparatus using semiconductor probe
05/27/2003US6570163 Electron detectors
05/22/2003WO2003042627A2 Field effect transistor sensor for a screen probe microscope
05/22/2003US20030094035 Carbon nanotube probe tip grown on a small probe
05/20/2003US6566650 Incorporation of dielectric layer onto SThM tips for direct thermal analysis
05/15/2003WO2003040414A1 Method and device for detecting and monitoring alcoholism and related diseases using microarrays
05/15/2003US20030089899 Nanoscale wires and related devices
05/15/2003US20030089859 Objective lens for a charged particle beam device
05/15/2003US20030089163 System for sensing a sample
05/15/2003US20030089162 Dual stage instrument for scanning a specimen
05/08/2003WO2003038409A1 Cantilever array sensor system
05/08/2003WO2003038147A2 High resolution patterning method
05/08/2003WO2003038033A2 Protein and peptide nanoarrays
05/07/2003CN1415963A Method and senser for detcting biomolecular conjunction through measuring shearing stress
05/02/2003EP1306449A2 Method and sensor for detecting the binding of biomolecules by shear stress measurement
05/01/2003WO2003036767A2 Parallel, individually addressable probes for nanolithography
05/01/2003US20030082658 Method for fixing a biological molecule on a support surface
04/2003
04/29/2003US6555362 Dna bound to carbon nanotubes
04/24/2003US20030077649 Method and sensor for detecting the binding of biomolecules by shear stress measurement
04/24/2003US20030075683 Near field optical probe and manufacturing method thereof
04/24/2003US20030075682 Method for forming composite arrays of single-wall carbon nanotubes and compositions thereof
04/22/2003US6552556 Prober for electrical measurement of potentials in the interior of ultra-fine semiconductor devices, and method of measuring electrical characteristics with said prober
04/17/2003US20030073250 Method and apparatus for solid state molecular analysis
04/16/2003EP1301939A2 Time-of-flight mass spectrometer array instrument
04/10/2003US20030068446 Nanoarray substrate, dots on the substrate, the dots comprising a patterning compound with proteins on the substrate
04/10/2003US20030068432 Carbon nanotube devices
04/10/2003US20030066962 Scanning atom probe
04/10/2003US20030066960 Apparatus for growing continuous single-wall carbon nanotube fiber
04/10/2003US20030066944 Optical near field generator
04/10/2003US20030066354 Touch sensor
04/08/2003US6545492 Multiple local probe measuring device and method
04/08/2003US6545470 Scanning probe microscope
04/08/2003US6545274 Methods and devices for determining times for maintenance activity performed on a charged-particle-beam microlithography apparatus, and microelectronic-device-manufacturing methods comprising same
04/08/2003US6545273 Use of multiple tips on AFM to deconvolve tip effects
04/08/2003US6544893 Method of manufacturing a glass substrate for an information recording medium, and method of manufacturing an information recording medium
04/03/2003WO2003028036A1 Device for fixing a measuring probe for a raster scanning probe microscope
04/03/2003WO2003027011A2 Catalyst-induced growth of carbon nanotubes on tips of cantilevers and nanowires
04/02/2003EP0868648B1 Integrated silicon profilometer and afm head
04/01/2003US6542455 Optical probe array head device
04/01/2003US6541755 Near field optical probe and manufacturing method thereof
03/2003
03/27/2003WO2003025540A2 Differential tagging of polymers for high resolution linear analysis
03/27/2003US20030059822 Differential tagging of polymers for high resolution linear analysis
03/26/2003CN1405546A Scanning probe-needle microscope
03/20/2003WO2002022499A9 Fabrication of nanotube microscopy tips
03/19/2003EP1292361A1 Methods utilizing scanning probe microscope tips and products therefor or produced thereby
03/19/2003CN1404617A Objective lens for a charged particle beam device
03/18/2003US6532806 Scanning evanescent electro-magnetic microscope
03/13/2003WO2003021127A2 Apparatus for reducing sensitivity of an article to mechanical shock
03/13/2003US20030049444 Carbon nanotube structure having a catalyst island
03/13/2003US20030049381 Methods utilizing scanning probe microscope tips and products therefor or produced thereby
03/12/2003EP1290431A1 Method for producing a device for simultaneously carrying out an electrochemical and a topographical near-field microscopy
03/12/2003EP1290404A1 Sample for simultaneously conducting electro-chemical and topographic near-field microscopy
03/11/2003US6530268 Apparatus and method for isolating and measuring movement in a metrology apparatus
03/06/2003WO2003019238A2 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes
03/06/2003WO2003018884A1 Method for producing optically transparent and electroconductive fibres and the sensor of scanning probe microscope made of this fibre
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