| Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
|---|
| 02/24/2015 | US8966661 System for fabricating nanoscale probe and method thereof |
| 02/12/2015 | WO2015019090A1 Probe and sample exchange mechanism for a scanning probe microscope |
| 02/12/2015 | WO2015018674A1 Insulator coated conductive probe and method of production thereof |
| 02/12/2015 | DE102014111372A1 Iridium-spitze, gasfeld-ionenquelle, einrichtung eines fokussierten ionenstrahls, elektronenquelle, elektronenmikroskop, einrichtung zur analyse unter anwendung eines elektronenstrahls, ionen-elektronen- mehrfachstrahl-einrichtung, abtastsondenmikroskop und masken- reparatureinrichtung Iridium-top, gas field-ion source, a focused ion beam device, electron source, electron microscope, device for analysis under an electron beam, ion-electron multiple-jet device, scanning probe and mask-repair facility |
| 02/11/2015 | EP2835654A1 Insulator coated conductive probe and method of production thereof |
| 02/11/2015 | CN104345178A 一种金属探针的制备方法 Method for preparing a metal probe |
| 01/29/2015 | DE102014011272A1 Stimmgabelbasierte Nahfeldsonde für eine spektrale Messung, Nahfeldmikroskop, das selbige verwendet, und Spektralanalyseverfahren, das ein Nahfeldmikroskop verwendet Tuning fork based probes for spectral measurement, near-field microscope, the selbige used, and spectral analysis using a near-field microscope |
| 01/27/2015 | US8943611 Probe module, method for making and use of same |
| 01/13/2015 | US8932473 Method for making a 3D nanostructure having a nanosubstructure, and an insulating pyramid having a metallic tip, a pyramid having nano-apertures and horizontal and/or vertical nanowires obtainable by this method |
| 12/30/2014 | US8925111 Scanning probe microscope and method of operating the same |
| 12/30/2014 | US8920700 Telescopic nanotube device for hot nanolithography |
| 12/25/2014 | US20140380532 Scanning probe microscope and method of operating the same |
| 12/17/2014 | CN204028107U 一种可控大长径比纳米探针的制备装置 Preparation of a controlled device nanoprobes large aspect ratio |
| 12/11/2014 | US20140366230 Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof |
| 12/09/2014 | US8910311 Probe assembly for a scanning probe microscope |
| 11/25/2014 | US8898811 Metal nanopillars for surface-enhanced Raman spectroscopy (SERS) substrate and method for preparing same |
| 11/25/2014 | US8898810 High throughout reproducible cantilever functionalization |
| 11/18/2014 | US8893310 Scanned probe microscopy (SPM) probe having angled tip |
| 11/13/2014 | US20140338075 Vertical Embedded Sensor and Process of Manufacturing Thereof |
| 11/11/2014 | US8887311 Scanning probe microscope |
| 11/11/2014 | US8884608 AFM-coupled microscale radiofrequency probe for magnetic resonance imaging and spectroscopy |
| 11/11/2014 | US8884222 Mount for a scanning probe sensor package, scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package |
| 11/06/2014 | US20140331368 Probe module, method for making and use of same |
| 11/06/2014 | US20140331367 Motion sensor integrated nano-probe n/mems apparatus, method, and applications |
| 10/28/2014 | US8875311 Scanning probe microscopy cantilever comprising an electromagnetic sensor |
| 10/21/2014 | US8869310 Low drift scanning probe microscope |
| 09/12/2014 | WO2014138660A1 Method and apparatus of physical property measurement using a probe-based nano-localized light source |
| 09/09/2014 | US8828243 Scanning probe having integrated silicon tip with cantilever |
| 09/04/2014 | WO2014134484A1 Cartridge-based dispensing of nanostructure films |
| 09/04/2014 | US20140250553 Sensor for low force-noise detection in liquids |
| 09/03/2014 | EP2772765A1 Nano electrode and manufacturing method thereof |
| 08/28/2014 | US20140242805 Laser-enhanced chemical etching of nanotips |
| 08/26/2014 | US8819861 Nanometer-scale sharpening of conductor tips |
| 08/21/2014 | US20140237690 Afm-coupled microscale radiofrequency probe for magnetic resonance imaging and spectroscopy |
| 08/05/2014 | US8796651 Method and apparatus for specimen fabrication |
| 08/05/2014 | US8795495 Method for manufacturing a one-dimensional nano-structure-based device |
| 07/10/2014 | US20140196179 Ultra-compact nanocavity-enhanced scanning probe microscopy and method |
| 07/03/2014 | WO2014104892A1 A micromechanical system with a composite beam having an adjustable stiffness |
| 07/03/2014 | US20140183169 Metallic probe, and method and apparatus for fabricating the same |
| 07/02/2014 | EP2749890A1 A composite beam having an adjustable stiffness. |
| 07/01/2014 | US8766630 Method and apparatus for monitoring a property of a sample |
| 07/01/2014 | US8763475 Active damping of high speed scanning probe microscope components |
| 06/26/2014 | US20140179046 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
| 06/19/2014 | WO2014090938A1 Conductive atomic force microscope tips coated with graphene |
| 06/17/2014 | US8756710 Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof |
| 05/27/2014 | US8739310 Characterization structure for an atomic force microscope tip |
| 05/20/2014 | US8728286 Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same |
| 05/15/2014 | WO2014074374A1 Indented mold structures for diamond deposited probes |
| 05/13/2014 | US8726411 Charged probe and electric fields measurement method thereof |
| 05/08/2014 | WO2014051886A9 Nanoscale scanning sensors |
| 05/08/2014 | US20140130215 Indented Mold Structures For Diamond Deposited Probes |
| 05/06/2014 | US8716938 Thermionic emission device |
| 05/01/2014 | US20140123348 High throughout reproducible cantilever functionalization |
| 04/29/2014 | US8713711 Cantilevered probe detector with piezoelectric element |
| 04/17/2014 | WO2014057268A1 Multiple probe actuation |
| 04/15/2014 | US8701211 Method to reduce wedge effects in molded trigonal tips |
| 04/08/2014 | US8695111 Video rate-enabling probes for atomic force microscopy |
| 04/08/2014 | US8695110 Scanning probe microscope and sample observing method using the same |
| 04/08/2014 | US8695108 In-liquid potential measurement device and atomic force microscope |
| 04/03/2014 | WO2014051886A1 Nanoscale scanning sensors |
| 04/01/2014 | US8689361 Method of making thin film probe tip for atomic force microscopy |
| 04/01/2014 | US8689360 Probe head scanning probe microscope including the same |
| 04/01/2014 | US8689359 Apparatus and method for investigating surface properties of different materials |
| 03/25/2014 | US8680467 High frequency deflection measurement of IR absorption with a modulated IR source |
| 03/20/2014 | US20140082776 Fluid Delivery for Scanning Probe Microscopy |
| 03/06/2014 | WO2014035974A1 Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof |
| 03/06/2014 | WO2014033452A1 Multiple probe actuation |
| 03/06/2014 | WO2014033451A1 Multiple probe detection and actuation |
| 03/06/2014 | US20140068823 Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof |
| 03/05/2014 | EP2702416A2 Scanning probe microscope with compact scanner |
| 02/26/2014 | CN101855534B Method and apparatus of automatic scanning probe imaging |
| 02/25/2014 | US8661561 Metal tip for scanning probe applications and method of producing the same |
| 02/25/2014 | US8661560 Microcantilever microwave probe |
| 02/20/2014 | US20140051333 Methods and apparatus for nanolapping |
| 02/18/2014 | US8656511 Method for attaching a particle to a scanning probe tip through eutectic bonding |
| 02/13/2014 | US20140047585 Scanning probe microscopy cantilever comprising an electromagnetic sensor |
| 02/11/2014 | US8650661 Method and apparatus for characterizing a probe tip |
| 02/05/2014 | CN103562732A Scanning probe microscope with compact scanner |
| 01/30/2014 | US20140033374 System for fabricating nanoscale probe and method thereof |
| 01/28/2014 | US8639449 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
| 01/21/2014 | US8635711 High throughput reproducible cantilever functionalization |
| 01/16/2014 | WO2014011954A1 Multifunctional graphene coated scanning tips |
| 01/16/2014 | US20140014507 Hybrid microprobe for electrochemical and sers monitoring, scanning and feedback stimulation and the preparation method thereof |
| 01/14/2014 | US8631511 Method and apparatus for micromachines, microstructures, nanomachines and nanostructures |
| 01/09/2014 | WO2014006999A1 Scanning probe microscope |
| 01/08/2014 | EP2682759A1 High throughput microscopy device |
| 01/03/2014 | WO2014003901A1 Metallic nano-tip apparatus, methods, and applications |
| 01/03/2014 | WO2014003557A1 High throughput microscopy device |
| 01/03/2014 | WO2014003547A1 High throughput scanning probe microscopy device |
| 01/02/2014 | US20140007308 Scanned Probe Microscopy (SPM) Probe Having Angled Tip |
| 01/01/2014 | EP2680012A1 High throughput scanning probe microscopy device |
| 01/01/2014 | EP2678695A2 Integrated microscope and related methods and devices |
| 12/31/2013 | US8621660 Probe shape evaluation method for a scanning probe microscope |
| 12/31/2013 | US8621659 Cantilever for magnetic force microscope and method of manufacturing the same |
| 12/19/2013 | WO2013186622A1 Mounting systems for a surface forces apparatus |
| 12/19/2013 | CA2876127A1 Mounting systems for a surface forces apparatus |
| 12/18/2013 | CN102575975B Scanning probe microscope (SPM) and method for scanning surface of material by using same |
| 12/11/2013 | CN103439533A Nano-metal spiral shaft-cone probe needle |
| 12/11/2013 | CN103439532A Microelectrode technology for metal surface microcell current distribution in-situ detection |
| 12/04/2013 | EP2668132A1 Method for obtaining hollow nano-structures |