Patents
Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251)
07/2002
07/02/2002US6413880 Strongly textured atomic ridge and dot fabrication
06/2002
06/27/2002US20020082172 Accurate etching of an strontium titanate single crystal substrate by forming a patterned silica protective film and etching with phosphoric acid; superconducting quantum interfers; magnetic/electric field sensors; microscope probes
06/27/2002US20020080710 High speed/high density optical storage system using one-dimensional multi-function/multiple probe columns
06/27/2002US20020079463 Method and apparatus for specimen fabrication
06/27/2002US20020079445 Probe and method of manufacturing mounted AFM probes
06/18/2002US6408122 Probe for irradiating with or detecting light and method for manufacturing the same
06/13/2002WO2002046821A1 Micropositioning device
06/13/2002US20020072234 Semiconductor nanocrystal probes for biological applications and process for making and using such probes
06/13/2002US20020069505 Nanotube cartridge and a method for manufacturing the same
06/13/2002DE10061798A1 Monochromator for charged particles has Wien filters arranged serially in particle propagation direction, each rotated about optical axis in azimuth by 90 degrees relative to others
06/12/2002EP1213745A1 Method of producing a ferroelectric memory and memory device
06/12/2002EP0737299B1 Scanning force microscope with detector probe
06/11/2002US6401526 Carbon nanotubes and methods of fabrication thereof using a liquid phase catalyst precursor
06/06/2002WO2002045215A2 Nanolithography methods and products therefor and produced thereby
06/06/2002US20020067120 Method for rapid screening of emission-mix using a combinatorial chemistry approach
06/06/2002US20020066915 Method of producing a ferroelectric memory and a memory device
06/06/2002US20020066307 Apparatus for forming optical aperture
06/05/2002EP1211694A2 Apparatus for forming optical aperture
06/05/2002EP1211504A2 Apparatus for localized measurement of complex permittivity of a material
06/05/2002EP1210723A1 Shaped and low density focused ion beams
05/2002
05/30/2002WO2002042743A1 Probe for scanning microscope produced by focused ion beam machining
05/30/2002WO2002042742A1 Cantilever for vertical scanning microscope and probe for vertical scan microscope using it
05/30/2002WO2002042741A1 Conductive probe for scanning microscope and machining method using the same
05/30/2002WO2001090761A3 Methods of sampling specimens for microanalysis
05/30/2002US20020063213 Non-contact type atomic microscope and observation method using it
05/30/2002US20020063212 Methods utilizing scanning probe microscope tips and products therefor or produced thereby
05/29/2002EP1209737A2 Method and apparatus for specimen fabrication
05/29/2002EP1209689A2 Method of manufacturing integrated scanning probes
05/29/2002CN1351756A Electrostatically focused addressable field emission arraychips (AFEA' s) for high-speed maskless digital e-beam direct write lithography and scanning electron microscopy
05/28/2002US6396054 Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images
05/28/2002US6394409 Real time observable sample mounting fixture
05/23/2002US20020061603 Method of manufacturing a glass substrate for an information recording medium, and method of manufacturing an information recording medium
05/21/2002US6389886 Method and system for increasing the accuracy of a probe-based instrument measuring a heated sample
05/14/2002US6388249 Surface analyzing apparatus
05/14/2002US6388239 Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope
05/14/2002US6387851 Strontium titanate
05/08/2002EP1203749A1 Nanometer-order mechanical vibrator, production method thereof and measuring device using it
05/08/2002EP1203258A1 A device for micropositioning of an object
05/07/2002US6383823 Probe for scanning probe microscope (SPM) and SPM device
05/02/2002EP1202047A1 Method for manufacturing tips and probes for a STM or an AFM
05/02/2002EP1200979A1 Minimization of electron fogging in electron beam lithography
04/2002
04/25/2002US20020047091 Probe tip and method of manufacturing tips and probes for detecting microcurrent or microforce
04/25/2002US20020046953 Catalyst-induced growth of carbon nanotubes on tips of cantilevers and nanowires
04/23/2002US6376850 Electron beam aperture element
04/23/2002US6376833 Projection having a micro-aperture, probe or multi-probe having such a projection and surface scanner, aligner or information processor comprising such a probe
04/18/2002US20020043101 Scanning probe microscope with probe formed by single conductive material
04/18/2002DE19957824C2 Verfahren zur Herstellung von feinsten Spitzen im Subnanometerbereich Process for the preparation of finest peaks in the subnanometer range
04/17/2002EP1196939A1 Object inspection and/or modification system and method
04/11/2002US20020040884 Probe tip configuration and a method of fabrication thereof
04/09/2002US6369379 Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images
04/04/2002WO2002026624A1 Direct growth of nanotubes, and their use in nanotweezers
04/04/2002US20020038984 Single stage microactuator for multi-dimensional actuation
04/04/2002DE10057656C1 Production of an integrated stylus used in scanning electron microscopes comprises radiating a silicon substrate with ions, removing the areas radiated with the ions, and radiating the substrate with ions of different energy and/or dosage
04/03/2002EP1193216A1 Nanotweezers and nanomanipulator
04/03/2002EP1192442A1 Atomic force microscope and driving method therefor
04/02/2002US6365895 Apparatus for measuring a micro surface configuration and a method for manufacturing a probe incorporated in this measuring apparatus
03/2002
03/28/2002WO2002025375A2 Pinhole defect repair by resist flow
03/28/2002WO2002025246A1 Scanning type probe microscope probe and method of producing the same, and a scanning type probe microscope having this probe and polymer processing method using the same
03/27/2002EP1191331A2 Method for manufacturing tips and probes for a STM or an AFM
03/27/2002EP1190206A2 Tip structures, devices on their basis, and methods for their preparation
03/21/2002WO2002022889A2 Direct haplotyping using carbon nanotube probes
03/21/2002WO2002022499A1 Fabrication of nanotube microscopy tips
03/21/2002DE10043731A1 Measuring probe for detection of IC signals has lever arm of high conductivity material covered by insulation layer provided with window at apex of probe point
03/20/2002EP1189240A1 Multi-probe measuring device and method of use
03/20/2002EP1189016A1 Method for manufacturing mounted AFM probes by soldering
03/20/2002CN1341274A Methods utilizing scanning probe microscope tips and products therefor or produced method thereby
03/14/2002WO2002020873A2 Method for precipitating mono and multiple layers of organophosphoric and organophosphonic acids and the salts thereof in addition to use thereof
03/13/2002EP1185869A2 Ligand-anchor conjugates for producing a biosensor layer
03/12/2002US6356524 Method of recording/reproducing an information signal
03/12/2002US6354133 Use of carbon nanotubes to calibrate conventional tips used in AFM
03/07/2002WO2002018266A1 Single molecule array on silicon substrate for quantum computer
03/07/2002US20020027819 Nanocapsules containing charged particles, their uses and methods of forming same
03/06/2002CN1080456C High speed ashing method
03/05/2002US6353221 Method and apparatus for cleaning a tip of a probe of a probe-based measuring instrument
03/05/2002US6353219 Object inspection and/or modification system and method
02/2002
02/28/2002US20020024004 Probe with hollow waveguide and method for producing the same
02/26/2002US6349591 Device and method for controlling the interaction of a tip and a sample, notably for atomic force microscopy and nano-indentation
02/21/2002WO2002014862A2 Method and device for characterising and/or for detecting a bonding complex
02/21/2002US20020021139 Molecular probe station
02/21/2002US20020020805 Microprobe and scanning type probe apparatus using thereof
02/21/2002CA2418861A1 Method and device for characterising and/or for detecting a bonding complex
02/20/2002EP0948671B1 Method for preparation of metal intercalated fullerene-like metal chalcogenides
02/20/2002EP0818052A4 Combined scanning probe and scanning energy microscope
02/14/2002WO2001044853A3 Method for producing a probe for the scanning near-field optical microscopy and a probe produced according to said method
02/14/2002US20020017615 Scanning unit and scanning microscope having the same
02/14/2002US20020017614 Energy filter
02/13/2002EP1179185A1 A method of detecting an analyte using semiconductor nanocrystals
02/12/2002US6346189 Apparatus comprising substrate with top surface, catalyst island disposed on top surface of substrate, carbon nanotube extending from catalyst island
02/06/2002EP1177153A1 Bulk synthesis of long nanotubes of transition metal chalcogenides
01/2002
01/31/2002WO2001056056A3 Objective lens for a charged particle beam device
01/24/2002US20020009632 Rewritable data storage using carbonaceous material and writing/reading method thereof
01/24/2002US20020008304 Scanning probe microscope (SPM) probe having field effect transistor channel and method of fabricating the same
01/24/2002US20020007667 Method and apparatus for the controlled conditioning of scanning probes
01/23/2002EP1174994A1 Single stage microactuator for multi-dimensional actuation
01/22/2002US6340813 Variable-aperture optical near-field probe
01/17/2002US20020005481 Scanning tunneling charge transfer microscope
01/15/2002US6339217 Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
01/08/2002US6337479 Object inspection and/or modification system and method
01/03/2002WO2002001599A2 Time-of-flight mass spectrometer array instrument
01/02/2002EP1166118A1 Semiconductor nanocrystal probes for biological applications
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